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Eugene H. Cloud
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Boise, ID, US
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Patents Grants
last 30 patents
Information
Patent Grant
Transmission lines for CMOS integrated circuits
Patent number
7,869,242
Issue date
Jan 11, 2011
Micron Technology, Inc.
Leonard Forbes
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for isolating a short-circuited integrated circuit (IC) from...
Patent number
7,567,091
Issue date
Jul 28, 2009
Micron Technology, Inc.
Warren M. Farnworth
G01 - MEASURING TESTING
Information
Patent Grant
Transmission lines for CMOS integrated circuits
Patent number
7,554,829
Issue date
Jun 30, 2009
Micron Technology, Inc.
Leonard Forbes
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Device and method for isolating a short-circuited integrated circui...
Patent number
7,323,896
Issue date
Jan 29, 2008
Micron Technology, Inc.
Warren M. Farnworth
G01 - MEASURING TESTING
Information
Patent Grant
System for isolating a short-circuited integrated circuit (IC) from...
Patent number
7,315,179
Issue date
Jan 1, 2008
Micron Technology, Inc.
Warren M. Farnworth
G01 - MEASURING TESTING
Information
Patent Grant
Compensation methods and systems for imaging detectors
Patent number
7,297,915
Issue date
Nov 20, 2007
Micron Technology, Inc.
David J. McElroy
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Device and method for isolating a short-circuited integrated circui...
Patent number
7,276,927
Issue date
Oct 2, 2007
Micron Technology, Inc.
Warren M. Farnworth
G01 - MEASURING TESTING
Information
Patent Grant
Method for isolating a short-circuited integrated circuit (IC) from...
Patent number
7,276,926
Issue date
Oct 2, 2007
Micron Technology, Inc.
Warren M. Farnworth
G01 - MEASURING TESTING
Information
Patent Grant
Double-packaged multi-chip semiconductor module
Patent number
7,259,450
Issue date
Aug 21, 2007
Micron Technology, Inc.
Alan G. Wood
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Redundant imaging systems
Patent number
7,129,457
Issue date
Oct 31, 2006
Micron Technology, Inc.
David J. McElroy
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Transmission lines for CMOS integrated circuits
Patent number
7,101,778
Issue date
Sep 5, 2006
Micron Technology, Inc.
Leonard Forbes
G11 - INFORMATION STORAGE
Information
Patent Grant
Electrical device allowing for increased device densities
Patent number
7,084,351
Issue date
Aug 1, 2006
Micron Technology, Inc.
Salman Akram
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Device and method for isolating a short-circuited integrated circui...
Patent number
7,034,561
Issue date
Apr 25, 2006
Micron Technology, Inc.
Warren M. Farnworth
G01 - MEASURING TESTING
Information
Patent Grant
DRAM technology compatible processor/memory chips
Patent number
7,023,040
Issue date
Apr 4, 2006
Micron Technology, Inc.
Leonard Forbes
G11 - INFORMATION STORAGE
Information
Patent Grant
Compact system module with built-in thermoelectric cooling
Patent number
7,022,553
Issue date
Apr 4, 2006
Micron Technology, Inc.
Kie Y. Ahn
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Data compression circuit and method for testing memory devices
Patent number
RE38956
Issue date
Jan 31, 2006
Micron Technology, Inc.
Ray Beffa
365 - Static information storage and retrieval
Information
Patent Grant
Die to die connection method and assemblies and packages including...
Patent number
6,984,544
Issue date
Jan 10, 2006
Micron Technology, Inc.
Eugene H. Cloud
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
DRAM technology compatible processor/memory chips
Patent number
6,924,194
Issue date
Aug 2, 2005
Micron Technology, Inc.
Leonard Forbes
G11 - INFORMATION STORAGE
Information
Patent Grant
Electrical device allowing for increased device densities
Patent number
6,914,198
Issue date
Jul 5, 2005
Micron Technology, Inc.
Salman Akram
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Programmable memory cell using charge trapping in a gate oxide
Patent number
6,909,635
Issue date
Jun 21, 2005
Micron Technology, Inc.
Leonard Forbes
G11 - INFORMATION STORAGE
Information
Patent Grant
Electrical device allowing for increased device densities
Patent number
6,909,055
Issue date
Jun 21, 2005
Micron Technology, Inc.
Salman Akram
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Assemblies and packages including die-to-die connections
Patent number
6,906,408
Issue date
Jun 14, 2005
Micron Technology, Inc.
Eugene H. Cloud
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
High density storage scheme for semiconductor memory
Patent number
6,862,662
Issue date
Mar 1, 2005
Micron Technology, Inc.
Eugene H. Cloud
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Reduced terminal testing system
Patent number
6,852,999
Issue date
Feb 8, 2005
Micron Technology, Inc.
Warren M. Farnworth
G11 - INFORMATION STORAGE
Information
Patent Grant
Device and method for isolating a short-circuited integrated circui...
Patent number
6,831,475
Issue date
Dec 14, 2004
Micron Technology, Inc.
Warren M. Farnworth
G01 - MEASURING TESTING
Information
Patent Grant
Reduced terminal testing system
Patent number
6,815,968
Issue date
Nov 9, 2004
Micron Technology, Inc.
Warren M. Farnworth
G11 - INFORMATION STORAGE
Information
Patent Grant
DRAM technology compatible processor/memory chips
Patent number
6,809,985
Issue date
Oct 26, 2004
Micron Technology, Inc.
Leonard Forbes
G11 - INFORMATION STORAGE
Information
Patent Grant
Imaging system having redundant pixel groupings
Patent number
6,756,576
Issue date
Jun 29, 2004
Micron Technology, Inc.
David J. McElroy
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
DRAM technology compatible processor/memory chips
Patent number
6,741,519
Issue date
May 25, 2004
Micron Technology, Inc.
Leonard Forbes
G11 - INFORMATION STORAGE
Information
Patent Grant
Programmable mosfet technology and programmable address decode and...
Patent number
6,700,821
Issue date
Mar 2, 2004
Micron Technology, Inc.
Leonard Forbes
G11 - INFORMATION STORAGE
Patents Applications
last 30 patents
Information
Patent Application
SYSTEM FOR ISOLATING A SHORT-CIRCUITED INTEGRATED CIRCUIT (IC) FROM...
Publication number
20090273360
Publication date
Nov 5, 2009
Micron Technology, Inc.
Warren M. Farnworth
G01 - MEASURING TESTING
Information
Patent Application
NOVEL TRANSMISSION LINES FOR CMOS INTEGRATED CIRCUITS
Publication number
20090207641
Publication date
Aug 20, 2009
Leonard Forbes
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method for Isolating a Short-Circuited Integrated Circuit (IC) From...
Publication number
20080111574
Publication date
May 15, 2008
Micron Technology, Inc.
Warren M. Farnworth
G01 - MEASURING TESTING
Information
Patent Application
Device and method for isolating a short-circuited integrated circui...
Publication number
20070103167
Publication date
May 10, 2007
Warren M. Farnworth
G01 - MEASURING TESTING
Information
Patent Application
Device and method for isolating a short-circuited integrated circui...
Publication number
20070075723
Publication date
Apr 5, 2007
Warren M. Farnworth
G01 - MEASURING TESTING
Information
Patent Application
Device and method for isolating a short-circuited integrated circui...
Publication number
20070075725
Publication date
Apr 5, 2007
Warren M. Farnworth
G01 - MEASURING TESTING
Information
Patent Application
Device and method for isolating a short-circuited integrated circui...
Publication number
20070075722
Publication date
Apr 5, 2007
Warren M. Farnworth
G01 - MEASURING TESTING
Information
Patent Application
Electrical device allowing for increased device densities
Publication number
20060201705
Publication date
Sep 14, 2006
Micron Technology, Inc.
Akram Salman
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Application
Device and method for isolating a short-circuited integrated circui...
Publication number
20060192582
Publication date
Aug 31, 2006
Warren M. Farnworth
G01 - MEASURING TESTING
Information
Patent Application
Novel transmission lines for CMOS integrated circuits
Publication number
20060131702
Publication date
Jun 22, 2006
Micron Technology, Inc.
Leonard Forbes
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
DRAM technology compatible processor/memory chips
Publication number
20060124981
Publication date
Jun 15, 2006
Micron Technology, Inc.
Leonard Forbes
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
Compact system module with built-in thermoelectric cooling
Publication number
20060128059
Publication date
Jun 15, 2006
Micron Technology, Inc.
Kie Y. Ahn
G02 - OPTICS
Information
Patent Application
Die-to-die connection method and assemblies and packages including...
Publication number
20060115929
Publication date
Jun 1, 2006
Eugene H. Cloud
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Device and method for isolating a short-circuited integrated circui...
Publication number
20050093566
Publication date
May 5, 2005
Warren M. Farnworth
G01 - MEASURING TESTING
Information
Patent Application
Redundant imaging methods and systems
Publication number
20040222355
Publication date
Nov 11, 2004
Micron Technology, Inc.
David J. McElroy
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
Redundant imaging methods and systems
Publication number
20040222356
Publication date
Nov 11, 2004
Micron Technology, Inc.
David J. McElroy
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
Programmable memory cell using charge trapping in a gate oxide
Publication number
20040151029
Publication date
Aug 5, 2004
Micron Technology, Inc.
Leonard Forbes
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
Device and method for isolating a short-circuited integrated circui...
Publication number
20040130345
Publication date
Jul 8, 2004
Warren M. Farnworth
G01 - MEASURING TESTING
Information
Patent Application
Compact system module with built-in thermoelectric cooling
Publication number
20040084781
Publication date
May 6, 2004
Micron Technology, Inc.
Kie Y. Ahn
G02 - OPTICS
Information
Patent Application
Reduced terminal testing system
Publication number
20030178692
Publication date
Sep 25, 2003
Warren M. Farnworth
G01 - MEASURING TESTING
Information
Patent Application
Die to die connection method and assemblies and packages including...
Publication number
20030160321
Publication date
Aug 28, 2003
Eugene H. Cloud
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Double-packaged multi-chip semiconductor module
Publication number
20030155649
Publication date
Aug 21, 2003
Alan G. Wood
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Electrical device allowing for increased device densities
Publication number
20030076665
Publication date
Apr 24, 2003
Salman Akram
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Application
Electrical device allowing for increased device densities
Publication number
20030031000
Publication date
Feb 13, 2003
Salman Akram
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Electrical device allowing for increased device densities
Publication number
20030007340
Publication date
Jan 9, 2003
Salman Akram
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Reduced terminal testing system
Publication number
20030003606
Publication date
Jan 2, 2003
Warren M. Farnworth
G01 - MEASURING TESTING
Information
Patent Application
Device and method for isolating a short-circuited integrated circui...
Publication number
20020190707
Publication date
Dec 19, 2002
Warren M. Farnworth
G01 - MEASURING TESTING
Information
Patent Application
Dram technology compatible processor/memory chips
Publication number
20020176313
Publication date
Nov 28, 2002
Micron Technology, Inc.
Leonard Forbes
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Dram technology compatible processor/memory chips
Publication number
20020176314
Publication date
Nov 28, 2002
Micron Technology, Inc.
Leonard Forbes
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
DRAM technology compatible processor/memory chips
Publication number
20020176293
Publication date
Nov 28, 2002
Micron Technology, Inc.
Leonard Forbes
H01 - BASIC ELECTRIC ELEMENTS