Jun Osanai

Person

Chiba, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Reference voltage generator
- Patent number 9,213,415
- Issue date Dec 15, 2015
- Seiko Instruments Inc.
- Hideo Yoshino
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor device
- Patent number 9,111,951
- Issue date Aug 18, 2015
- Seiko Instruments Inc.
- Keisuke Uemura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor reference voltage generating device
- Patent number 9,041,156
- Issue date May 26, 2015
- Seiko Instruments Inc.
- Hideo Yoshino
- G05 - CONTROLLING REGULATING
Information Patent Grant
Semiconductor device
- Patent number 8,933,541
- Issue date Jan 13, 2015
- Seiko Instruments Inc.
- Shinjiro Kato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Trench MOS transistor and method of manufacturing the same
- Patent number 8,803,231
- Issue date Aug 12, 2014
- Seiko Instruments, Inc.
- Tomomitsu Risaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Memory circuit
- Patent number 8,760,926
- Issue date Jun 24, 2014
- Seiko Instruments Inc.
- Jun Osanai
- G11 - INFORMATION STORAGE
Information Patent Grant
Field effect transistor formed on an insulating substrate and integ...
- Patent number 8,450,799
- Issue date May 28, 2013
- Seiko Instruments Inc.
- Yutaka Hayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Trench MOS transistor and method of manufacturing the same
- Patent number 8,168,494
- Issue date May 1, 2012
- Seiko Instruments Inc.
- Tomomitsu Risaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for manufacturing semiconductor device
- Patent number 8,071,460
- Issue date Dec 6, 2011
- Seiko Instruments Inc.
- Tomomitsu Risaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of high voltage operation of field effect transistor
- Patent number 8,012,835
- Issue date Sep 6, 2011
- Seiko Instruments Inc.
- Yutaka Hayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device
- Patent number 7,952,128
- Issue date May 31, 2011
- Seiko Instruments Inc.
- Shinjiro Kato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of fusing trimming for semiconductor device
- Patent number 7,829,354
- Issue date Nov 9, 2010
- Seiko Instruments Inc.
- Akiko Tsukamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of high voltage operation of a field effect transistor
- Patent number 7,816,212
- Issue date Oct 19, 2010
- Seiko Instruments Inc.
- Yutaka Hayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device manufacturing method with spin-coating of phot...
- Patent number 7,790,555
- Issue date Sep 7, 2010
- Seiko Instruments Inc.
- Akiko Tsukamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing semiconductor integrated circuit device
- Patent number 7,749,880
- Issue date Jul 6, 2010
- Seiko Instruments Inc.
- Jun Osanai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing a semiconductor device
- Patent number 7,737,027
- Issue date Jun 15, 2010
- Seiko Instruments Inc.
- Akiko Tsukamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High voltage operating field effect transistor, bias circuit theref...
- Patent number 7,545,018
- Issue date Jun 9, 2009
- Seiko Instruments Inc.
- Yutaka Hayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for manufacturing semiconductor device
- Patent number 7,528,032
- Issue date May 5, 2009
- Seiko Instruments Inc.
- Hisashi Hasegawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High voltage operating field effect transistor, and bias circuit th...
- Patent number 7,432,568
- Issue date Oct 7, 2008
- Seiko Instruments Inc.
- Yutaka Hayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for manufacturing semiconductor device
- Patent number 7,351,595
- Issue date Apr 1, 2008
- Seiko Instruments Inc.
- Kazutoshi Ishii
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor integrated circuit device
- Patent number 7,352,046
- Issue date Apr 1, 2008
- Seiko Instruments Inc.
- Jun Osanai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for manufacturing semiconductor device
- Patent number 7,335,518
- Issue date Feb 26, 2008
- Seiko Instruments Inc.
- Kazutoshi Ishii
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Field effect transistor formed on an insulating substrate and integ...
- Patent number 7,282,763
- Issue date Oct 16, 2007
- Seiko Instruments Inc.
- Yutaka Hayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor integrated circuit device
- Patent number 7,227,231
- Issue date Jun 5, 2007
- Seiko Instruments Inc.
- Jun Osanai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Thin film memory, array, and operation method and manufacture metho...
- Patent number 7,211,867
- Issue date May 1, 2007
- Seiko Instruments Inc.
- Yutaka Hayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Manufacturing method for a semiconductor device
- Patent number 7,192,790
- Issue date Mar 20, 2007
- Seiko Instruments Inc.
- Kazutoshi Ishii
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Insulated gate transistor
- Patent number 7,190,032
- Issue date Mar 13, 2007
- Seiko Instruments Inc.
- Yutaka Hayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for manufacturing semiconductor device
- Patent number 7,129,099
- Issue date Oct 31, 2006
- Seiko Instruments Inc.
- Kazutoshi Ishii
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for manufacturing semiconductor device utilizing monitor wafers
- Patent number 7,043,328
- Issue date May 9, 2006
- Seiko Instruments Inc.
- Kazutoshi Ishii
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing a semiconductor device
- Patent number 6,972,232
- Issue date Dec 6, 2005
- Seiko Instruments Inc.
- Jun Osanai
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20140217594
- Publication date Aug 7, 2014
- Seiko Instruments Inc.
- Keisuke UEMURA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
REFERENCE VOLTAGE GENERATOR
- Publication number 20130207636
- Publication date Aug 15, 2013
- Seiko Instruments Inc.
- Hideo YOSHINO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEMORY CIRCUIT
- Publication number 20130016563
- Publication date Jan 17, 2013
- Jun OSANAI
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
- Publication number 20120187476
- Publication date Jul 26, 2012
- Seiko Instruments, Inc.
- Tomomitsu Risaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device
- Publication number 20100059832
- Publication date Mar 11, 2010
- Hideo Yoshino
- G05 - CONTROLLING REGULATING
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20100044765
- Publication date Feb 25, 2010
- Shinjiro Kato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device
- Publication number 20100001377
- Publication date Jan 7, 2010
- Shinjiro Kato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20090200613
- Publication date Aug 13, 2009
- SEIKO INSTRUMENTS INC.
- Keisuke Uemura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for manufacturing semiconductor device
- Publication number 20090156009
- Publication date Jun 18, 2009
- Tomomitsu Risaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Field effect transistor formed on an insulating substrate and integ...
- Publication number 20090101973
- Publication date Apr 23, 2009
- Yutaka Hayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of manufacturing a semiconductor device
- Publication number 20090061620
- Publication date Mar 5, 2009
- Akiko Tsukamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
High voltage operating field effect transistor, bias circuit theref...
- Publication number 20090014765
- Publication date Jan 15, 2009
- Yutaka Hayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
High voltage operating field effect transistor, and bias circuit th...
- Publication number 20090014816
- Publication date Jan 15, 2009
- Yutaka Hayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of fusing trimming for semiconductor device
- Publication number 20080248601
- Publication date Oct 9, 2008
- Akiko Tsukamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
- Publication number 20080185639
- Publication date Aug 7, 2008
- SEIKO INSTRUMENTS INC.
- Tomomitsu Risaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device manufacturing method and semiconductor device
- Publication number 20070272984
- Publication date Nov 29, 2007
- Akiko Tsukamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of manufacturing semiconductor integrated circuit device
- Publication number 20060079043
- Publication date Apr 13, 2006
- Jun Osanai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor integrated circuit device
- Publication number 20060033159
- Publication date Feb 16, 2006
- Jun Osanai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of manufacturing semiconductor device
- Publication number 20060014389
- Publication date Jan 19, 2006
- Jun Osanai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Insulated gate transistor
- Publication number 20050194618
- Publication date Sep 8, 2005
- Yutaka Hayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor integrated circuit device
- Publication number 20050190628
- Publication date Sep 1, 2005
- Jun Osanai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
High voltage operating field effect transistor, bias circuit theref...
- Publication number 20050184349
- Publication date Aug 25, 2005
- Yutaka Hayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
High voltage operating field effect transistor, and bias circuit th...
- Publication number 20050184350
- Publication date Aug 25, 2005
- Yutaka Hayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for manufacturing semiconductor device
- Publication number 20050142673
- Publication date Jun 30, 2005
- Kazutoshi Ishii
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for manufacturing semiconductor device
- Publication number 20050130332
- Publication date Jun 16, 2005
- Kazutoshi Ishii
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for manufacturing semiconductor device
- Publication number 20050124082
- Publication date Jun 9, 2005
- Kazutoshi Ishii
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Manufacturing method for a semiconductor device
- Publication number 20050124081
- Publication date Jun 9, 2005
- Kazutoshi Ishii
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for manufacturing semiconductor device
- Publication number 20050124083
- Publication date Jun 9, 2005
- Kazutoshi Ishii
- G01 - MEASURING TESTING
Information Patent Application
Method for manufacturing semiconductor device
- Publication number 20050074929
- Publication date Apr 7, 2005
- Hisashi Hasegawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of manufacturing a semiconductor device
- Publication number 20050037559
- Publication date Feb 17, 2005
- Jun Osanai
- H01 - BASIC ELECTRIC ELEMENTS

Person

Patents Grantslast 30 patents

Reference voltage generator

Semiconductor device

Semiconductor reference voltage generating device

Semiconductor device

Trench MOS transistor and method of manufacturing the same

Memory circuit

Field effect transistor formed on an insulating substrate and integ...

Trench MOS transistor and method of manufacturing the same

Method for manufacturing semiconductor device

Method of high voltage operation of field effect transistor

Semiconductor device

Method of fusing trimming for semiconductor device

Method of high voltage operation of a field effect transistor

Semiconductor device manufacturing method with spin-coating of phot...

Method of manufacturing semiconductor integrated circuit device

Method of manufacturing a semiconductor device

High voltage operating field effect transistor, bias circuit theref...

Method for manufacturing semiconductor device

High voltage operating field effect transistor, and bias circuit th...

Method for manufacturing semiconductor device

Semiconductor integrated circuit device

Method for manufacturing semiconductor device

Field effect transistor formed on an insulating substrate and integ...

Semiconductor integrated circuit device

Thin film memory, array, and operation method and manufacture metho...

Manufacturing method for a semiconductor device

Insulated gate transistor

Method for manufacturing semiconductor device

Method for manufacturing semiconductor device utilizing monitor wafers

Method of manufacturing a semiconductor device

Patents Applicationslast 30 patents

SEMICONDUCTOR DEVICE

REFERENCE VOLTAGE GENERATOR

MEMORY CIRCUIT

SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME

Semiconductor device

SEMICONDUCTOR DEVICE

Semiconductor device

SEMICONDUCTOR DEVICE

Method for manufacturing semiconductor device

Field effect transistor formed on an insulating substrate and integ...

Method of manufacturing a semiconductor device

High voltage operating field effect transistor, bias circuit theref...

High voltage operating field effect transistor, and bias circuit th...

Method of fusing trimming for semiconductor device

SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME

Semiconductor device manufacturing method and semiconductor device

Method of manufacturing semiconductor integrated circuit device

Semiconductor integrated circuit device

Method of manufacturing semiconductor device

Insulated gate transistor

Semiconductor integrated circuit device

High voltage operating field effect transistor, bias circuit theref...

High voltage operating field effect transistor, and bias circuit th...

Method for manufacturing semiconductor device

Method for manufacturing semiconductor device

Method for manufacturing semiconductor device

Manufacturing method for a semiconductor device

Method for manufacturing semiconductor device

Method for manufacturing semiconductor device

Method of manufacturing a semiconductor device