Kelly T. Hurley

Person

Boise, ID, US

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor processing methods
- Patent number 7,271,060
- Issue date Sep 18, 2007
- Micron Technology, Inc.
- Sukesh Sandhu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Modified source/drain re-oxidation method and system
- Patent number 7,271,435
- Issue date Sep 18, 2007
- Micron Technology, Inc.
- Paul J. Rudeck
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optimized flash memory cell
- Patent number 7,091,087
- Issue date Aug 15, 2006
- Micron Technology, Inc.
- Kelly T. Hurley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Modified source/drain re-oxidation method and system
- Patent number 7,037,860
- Issue date May 2, 2006
- Micron Technology, Inc.
- Paul J. Rudeck
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Stacked gate region of a memory cell in a memory device
- Patent number 6,949,792
- Issue date Sep 27, 2005
- Micron Technology, Inc.
- Kelly T. Hurley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Self-aligned floating gate flash cell system and method
- Patent number 6,808,989
- Issue date Oct 26, 2004
- Micron Technology, Inc.
- Kelly T. Hurley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Metal local interconnect self-aligned source flash cell
- Patent number 6,790,721
- Issue date Sep 14, 2004
- Micron Technology, Inc.
- Kelly T. Hurley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Stacked gate region of a nonvolatile memory cell for a computer
- Patent number 6,759,708
- Issue date Jul 6, 2004
- Micron Technology, Inc.
- Kelly T. Hurley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Modified source/drain re-oxidation method and system
- Patent number 6,756,268
- Issue date Jun 29, 2004
- Micron Technology, Inc.
- Paul J. Rudeck
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optimized flash memory cell
- Patent number 6,706,594
- Issue date Mar 16, 2004
- Micron Technology, Inc.
- Kelly T. Hurley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
FLASH memory circuitry
- Patent number 6,690,051
- Issue date Feb 10, 2004
- Micron Technology, Inc.
- Kelly T. Hurley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Flash memory circuitry
- Patent number 6,674,145
- Issue date Jan 6, 2004
- Micron Technology, Inc.
- Kelly T. Hurley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and structure for an oxide layer overlying an oxidation-resi...
- Patent number 6,653,683
- Issue date Nov 25, 2003
- Micron Technology, Inc.
- Paul J. Rudeck
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of forming FLASH memory
- Patent number 6,624,022
- Issue date Sep 23, 2003
- Micron Technology, Inc.
- Kelly T. Hurley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Variable temperature LOCOS process
- Patent number 6,387,777
- Issue date May 14, 2002
- Kelly T. Hurley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Silicon nitride deposition method
- Patent number 6,350,708
- Issue date Feb 26, 2002
- Micron Technology, Inc.
- Kelly T. Hurley
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Method and structure for an oxide layer overlaying an oxidation-res...
- Patent number 6,297,092
- Issue date Oct 2, 2001
- Micron Technology, Inc.
- Paul J. Rudeck
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Silicon nitride deposition method
- Patent number 6,204,206
- Issue date Mar 20, 2001
- Micron Technology, Inc.
- Kelly T. Hurley
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Silicon nitride deposition method for use in forming a memory cell...
- Patent number 6,127,287
- Issue date Oct 3, 2000
- Micron Technology, Inc.
- Kelly T. Hurley
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Silicon nitride deposition method
- Patent number 5,939,333
- Issue date Aug 17, 1999
- Micron Technology, Inc.
- Kelly T. Hurley
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Methods for measuring surface area
- Patent number 5,899,702
- Issue date May 4, 1999
- Micron Technology, Inc.
- Michael Nuttall
- G01 - MEASURING TESTING
Information Patent Grant
Methods for measuring the surface area of a semiconductor wafer
- Patent number 5,578,505
- Issue date Nov 26, 1996
- Micron Technology, Inc.
- Michael Nuttall
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Semiconductor processing methods
- Publication number 20060292793
- Publication date Dec 28, 2006
- Sukesh Sandhu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Modified source/drain re-oxidation method and system
- Publication number 20050272203
- Publication date Dec 8, 2005
- Paul J. Rudeck
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Polysilicon structure in a stacked gate region of a semiconductor d...
- Publication number 20040245565
- Publication date Dec 9, 2004
- Kelly T. Hurley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Modified source/drain re-oxidation method and system
- Publication number 20040185620
- Publication date Sep 23, 2004
- Paul J. Rudeck
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Opitmized flash memory cell
- Publication number 20040166631
- Publication date Aug 26, 2004
- Kelly T. Hurley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and structure for an oxide layer overlying an oxidation-resi...
- Publication number 20040113196
- Publication date Jun 17, 2004
- Paul J. Rudeck
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Flash memory circuitry
- Publication number 20030151080
- Publication date Aug 14, 2003
- Kelly T. Hurley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FLASH memory circuitry
- Publication number 20030034511
- Publication date Feb 20, 2003
- Kelly T. Hurley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Self-aligned floating gate flash cell system and method
- Publication number 20030030098
- Publication date Feb 13, 2003
- Kelly T. Hurley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Metal local interconnect self-aligned source flash cell
- Publication number 20030011023
- Publication date Jan 16, 2003
- Kelly T. Hurley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Optimized flash memory cell
- Publication number 20030013253
- Publication date Jan 16, 2003
- Kelly T. Hurley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Flash floating gate using epitaxial overgrowth
- Publication number 20030011018
- Publication date Jan 16, 2003
- Kelly T. Hurley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Self-aligned floating gate flash cell system and method
- Publication number 20020197798
- Publication date Dec 26, 2002
- Kelly T. Hurley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Self-aligned floating gate flash cell system and method
- Publication number 20020130357
- Publication date Sep 19, 2002
- Kelly T. Hurley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Modified source/drain re-oxidation method and system
- Publication number 20020132427
- Publication date Sep 19, 2002
- Paul J. Rudeck
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Modified source/drain re-oxidation method and system
- Publication number 20020096707
- Publication date Jul 25, 2002
- Paul J. Rudeck
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Modified source/drain re-oxidation method and system
- Publication number 20020096706
- Publication date Jul 25, 2002
- Paul J. Rudeck
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and structure for an oxide layer overlying an oxidation-resi...
- Publication number 20020014654
- Publication date Feb 7, 2002
- Paul J. Rudeck
- H01 - BASIC ELECTRIC ELEMENTS

Kelly T. Hurley

Person

Patents Grantslast 30 patents

Semiconductor processing methods

Modified source/drain re-oxidation method and system

Optimized flash memory cell

Modified source/drain re-oxidation method and system

Stacked gate region of a memory cell in a memory device

Self-aligned floating gate flash cell system and method

Metal local interconnect self-aligned source flash cell

Stacked gate region of a nonvolatile memory cell for a computer

Modified source/drain re-oxidation method and system

Optimized flash memory cell

FLASH memory circuitry

Flash memory circuitry

Method and structure for an oxide layer overlying an oxidation-resi...

Method of forming FLASH memory

Variable temperature LOCOS process

Silicon nitride deposition method

Method and structure for an oxide layer overlaying an oxidation-res...

Silicon nitride deposition method

Silicon nitride deposition method for use in forming a memory cell...

Silicon nitride deposition method

Methods for measuring surface area

Methods for measuring the surface area of a semiconductor wafer

Patents Applicationslast 30 patents

Semiconductor processing methods

Modified source/drain re-oxidation method and system

Polysilicon structure in a stacked gate region of a semiconductor d...

Modified source/drain re-oxidation method and system

Opitmized flash memory cell

Method and structure for an oxide layer overlying an oxidation-resi...

Flash memory circuitry

FLASH memory circuitry

Self-aligned floating gate flash cell system and method

Metal local interconnect self-aligned source flash cell

Optimized flash memory cell

Flash floating gate using epitaxial overgrowth

Self-aligned floating gate flash cell system and method

Self-aligned floating gate flash cell system and method

Modified source/drain re-oxidation method and system

Modified source/drain re-oxidation method and system

Modified source/drain re-oxidation method and system

Method and structure for an oxide layer overlying an oxidation-resi...