Martin J. Koxxy

Person

Hillsboro, OR, US

People

Patents Grantslast 30 patents

Information Patent Grant
Membrane probing method using improved contact
- Patent number 8,451,017
- Issue date May 28, 2013
- Cascade Microtech, Inc.
- K. Reed Gleason
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Membrane probing method using improved contact
- Patent number 7,761,986
- Issue date Jul 27, 2010
- Cascade Microtech, Inc.
- Reed Gleason
- G01 - MEASURING TESTING
Information Patent Grant
Membrane probing system
- Patent number 7,681,312
- Issue date Mar 23, 2010
- Cascade Microtech, Inc.
- Reed Gleason
- G01 - MEASURING TESTING
Information Patent Grant
Wafer probe station having environment control enclosure
- Patent number 7,595,632
- Issue date Sep 29, 2009
- Cascade Microtech, Inc.
- Warren K. Harwood
- A46 - BRUSHWARE
Information Patent Grant
Membrane probing system
- Patent number 7,403,025
- Issue date Jul 22, 2008
- Cascade Microtech, Inc.
- Paul A. Tervo
- G01 - MEASURING TESTING
Information Patent Grant
Membrane probing system
- Patent number 7,400,155
- Issue date Jul 15, 2008
- Cascade Microtech, Inc.
- Reed Gleason
- G01 - MEASURING TESTING
Information Patent Grant
Wafer probe station having environment control enclosure
- Patent number 7,348,787
- Issue date Mar 25, 2008
- Cascade Microtech, Inc.
- Warren K. Harwood
- A46 - BRUSHWARE
Information Patent Grant
Membrane probing system
- Patent number 7,266,889
- Issue date Sep 11, 2007
- Cascade Microtech, Inc.
- Reed Gleason
- G01 - MEASURING TESTING
Information Patent Grant
Membrane probing system
- Patent number 7,148,711
- Issue date Dec 12, 2006
- Cascade Microtech, Inc.
- Paul A. Tervo
- G01 - MEASURING TESTING
Information Patent Grant
Wafer probe station having environment control enclosure
- Patent number 7,009,383
- Issue date Mar 7, 2006
- Cascade Microtech, Inc.
- Warren K. Harwood
- A46 - BRUSHWARE
Information Patent Grant
Membrane probing system
- Patent number 6,930,498
- Issue date Aug 16, 2005
- Cascade Microtech, Inc.
- Paul A. Tervo
- G01 - MEASURING TESTING
Information Patent Grant
Probe construction using a recess
- Patent number 6,860,009
- Issue date Mar 1, 2005
- Cascade Microtech, Inc.
- Reed Gleason
- G01 - MEASURING TESTING
Information Patent Grant
Membrane probing system
- Patent number 6,838,890
- Issue date Jan 4, 2005
- Cascade Microtech, Inc.
- Paul A. Tervo
- G01 - MEASURING TESTING
Information Patent Grant
Membrane probing system
- Patent number 6,825,677
- Issue date Nov 30, 2004
- Cascade Microtech, Inc.
- Reed Gleason
- G01 - MEASURING TESTING
Information Patent Grant
Wafer probe station having environment control enclosure
- Patent number 6,801,047
- Issue date Oct 5, 2004
- Cascade Microtech, Inc.
- Warren K. Harwood
- A46 - BRUSHWARE
Information Patent Grant
Method for probing an electrical device having a layer of oxide the...
- Patent number 6,708,386
- Issue date Mar 23, 2004
- Cascade Microtech, Inc.
- Reed Gleason
- G01 - MEASURING TESTING
Information Patent Grant
Wafer probe station having environment control enclosure
- Patent number 6,636,059
- Issue date Oct 21, 2003
- Cascade Microtech, Inc.
- Warren K. Harwood
- A46 - BRUSHWARE
Information Patent Grant
Wafer probe station having environment control enclosure
- Patent number 6,486,687
- Issue date Nov 26, 2002
- Cascade Microtech, Inc.
- Warren K. Harwood
- A46 - BRUSHWARE
Information Patent Grant
Wafer probe station having environment control enclosure
- Patent number 6,380,751
- Issue date Apr 30, 2002
- Cascade Microtech, Inc.
- Warren K. Harwood
- A46 - BRUSHWARE
Information Patent Grant
Wafer probe station having environment control enclosure
- Patent number 6,313,649
- Issue date Nov 6, 2001
- Cascade Microtech, Inc.
- Warren K. Harwood
- G01 - MEASURING TESTING
Information Patent Grant
Membrane probing system
- Patent number 6,256,882
- Issue date Jul 10, 2001
- Cascade Microtech, Inc.
- Reed Gleason
- G01 - MEASURING TESTING
Information Patent Grant
Wafer probe station having environment control enclosure
- Patent number 5,604,444
- Issue date Feb 18, 1997
- Cascade Microtech, Inc.
- Warren K. Harwood
- A46 - BRUSHWARE
Information Patent Grant
Wafer probe station having environment control enclosure
- Patent number 5,532,609
- Issue date Jul 2, 1996
- Cascade Microtech, Inc.
- Warren K. Harwood
- A46 - BRUSHWARE
Information Patent Grant
Wafer probe station with integrated environment control enclosure
- Patent number 5,266,889
- Issue date Nov 30, 1993
- Cascade Microtech, Inc.
- Warren K. Harwood
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
MEMBRANE PROBING METHOD USING IMPROVED CONTACT
- Publication number 20130321018
- Publication date Dec 5, 2013
- Cascade Microtech, Inc.
- Reed Gleason
- G01 - MEASURING TESTING
Information Patent Application
MEMBRANE PROBING METHOD USING IMPROVED CONTACT
- Publication number 20100271060
- Publication date Oct 28, 2010
- Cascade Microtech, Inc.
- Reed Gleason
- G01 - MEASURING TESTING
Information Patent Application
Membrane probing system
- Publication number 20080252316
- Publication date Oct 16, 2008
- Cascade Microtech, Inc.
- Paul A. Tervo
- G01 - MEASURING TESTING
Information Patent Application
Wafer probe station having environment control enclosure
- Publication number 20080106290
- Publication date May 8, 2008
- Cascade Microtech, Inc.
- Warren K. Harwood
- A46 - BRUSHWARE
Information Patent Application
Membrane probing system
- Publication number 20070283555
- Publication date Dec 13, 2007
- Cascade Microtech, Inc.
- Reed Gleason
- G01 - MEASURING TESTING
Information Patent Application
Membrane probing system
- Publication number 20070245536
- Publication date Oct 25, 2007
- Cascade Microtech,, Inc.
- Reed Gleason
- G01 - MEASURING TESTING
Information Patent Application
Membrane probing system
- Publication number 20060284630
- Publication date Dec 21, 2006
- Cascade Microtech, Inc.
- Paul A. Tervo
- G01 - MEASURING TESTING
Information Patent Application
Wafer probe station having environment control enclosure
- Publication number 20060132157
- Publication date Jun 22, 2006
- Cascade Microtech, Inc.
- Warren K. Harwood
- A46 - BRUSHWARE
Information Patent Application
Membrane probing system
- Publication number 20050248359
- Publication date Nov 10, 2005
- Cascade Microtech, Inc.
- Paul A. Tervo
- G01 - MEASURING TESTING
Information Patent Application
Membrane probing system
- Publication number 20050136562
- Publication date Jun 23, 2005
- Reed Gleason
- G01 - MEASURING TESTING
Information Patent Application
Wafer probe station having environment control enclosure
- Publication number 20050017741
- Publication date Jan 27, 2005
- Warren K. Harwood
- A46 - BRUSHWARE
Information Patent Application
Membrane probing system
- Publication number 20050007131
- Publication date Jan 13, 2005
- Cascade Microtech, Inc.
- Paul A. Tervo
- G01 - MEASURING TESTING
Information Patent Application
Membrane probing system
- Publication number 20040154155
- Publication date Aug 12, 2004
- Reed Gleason
- G01 - MEASURING TESTING
Information Patent Application
Membrane probing system
- Publication number 20040093716
- Publication date May 20, 2004
- Reed Gleason
- G01 - MEASURING TESTING
Information Patent Application
Wafer probe station having environment control enclosure
- Publication number 20030205997
- Publication date Nov 6, 2003
- Cascade Microtech, Inc., an Oregon corporation
- Warren K. Harwood
- A46 - BRUSHWARE
Information Patent Application
Membrane probing system
- Publication number 20030132767
- Publication date Jul 17, 2003
- Paul A. Tervo
- G01 - MEASURING TESTING
Information Patent Application
Wafer probe station having environment control enclosure
- Publication number 20030048110
- Publication date Mar 13, 2003
- Warren K. Harwood
- G01 - MEASURING TESTING
Information Patent Application
Wafer probe station having environment control enclosure
- Publication number 20020093353
- Publication date Jul 18, 2002
- Warren K. Harwood
- G01 - MEASURING TESTING
Information Patent Application
Wafer probe station having environment control enclosure
- Publication number 20010040461
- Publication date Nov 15, 2001
- Warren K. Harwood
- G01 - MEASURING TESTING
Information Patent Application
Membrane probing system
- Publication number 20010030549
- Publication date Oct 18, 2001
- Reed Gleason
- G01 - MEASURING TESTING
Information Patent Application
Membrane probing system
- Publication number 20010010468
- Publication date Aug 2, 2001
- Reed Gleason
- G01 - MEASURING TESTING
Information Patent Application
Membrane probing system
- Publication number 20010009061
- Publication date Jul 26, 2001
- Reed Gleason
- G01 - MEASURING TESTING
Information Patent Application
WAFER PROBE STATION HAVING ENVIRONMENT CONTROL ENCLOSURE
- Publication number 20010001538
- Publication date May 24, 2001
- WARREN K. HARWOOD
- G01 - MEASURING TESTING

Martin J. Koxxy

Person

Patents Grantslast 30 patents

Membrane probing method using improved contact

Membrane probing method using improved contact

Membrane probing system

Wafer probe station having environment control enclosure

Membrane probing system

Membrane probing system

Wafer probe station having environment control enclosure

Membrane probing system

Membrane probing system

Wafer probe station having environment control enclosure

Membrane probing system

Probe construction using a recess

Membrane probing system

Membrane probing system

Wafer probe station having environment control enclosure

Method for probing an electrical device having a layer of oxide the...

Wafer probe station having environment control enclosure

Wafer probe station having environment control enclosure

Wafer probe station having environment control enclosure

Wafer probe station having environment control enclosure

Membrane probing system

Wafer probe station having environment control enclosure

Wafer probe station having environment control enclosure

Wafer probe station with integrated environment control enclosure

Patents Applicationslast 30 patents

MEMBRANE PROBING METHOD USING IMPROVED CONTACT

MEMBRANE PROBING METHOD USING IMPROVED CONTACT

Membrane probing system

Wafer probe station having environment control enclosure

Membrane probing system

Membrane probing system

Membrane probing system

Wafer probe station having environment control enclosure

Membrane probing system

Membrane probing system

Wafer probe station having environment control enclosure

Membrane probing system

Membrane probing system

Membrane probing system

Wafer probe station having environment control enclosure

Membrane probing system

Wafer probe station having environment control enclosure

Wafer probe station having environment control enclosure

Wafer probe station having environment control enclosure

Membrane probing system

Membrane probing system

Membrane probing system

WAFER PROBE STATION HAVING ENVIRONMENT CONTROL ENCLOSURE