Membership
Tour
Register
Log in
Masayuki Sugiura
Follow
Person
Saitama-ken, JP
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Optical member inspecting apparatus and method of inspection thereof
Patent number
6,804,386
Issue date
Oct 12, 2004
Asahi Kogaku Kogyo Kabushiki Kaisha
Toshihiro Nakayama
G01 - MEASURING TESTING
Information
Patent Grant
Optical member inspecting apparatus and method of inspection thereof
Patent number
6,788,804
Issue date
Sep 7, 2004
Asahi Kogaku Kogyo Kabushiki Kaisha
Toshihiro Nakayama
G01 - MEASURING TESTING
Information
Patent Grant
Optical member inspecting apparatus and method of inspection thereof
Patent number
6,697,513
Issue date
Feb 24, 2004
Asahi Kogaku Kogyo Kabushiki Kaisha
Toshihiro Nakayama
G01 - MEASURING TESTING
Information
Patent Grant
Optical member inspection apparatus, image-processing apparatus, im...
Patent number
6,687,396
Issue date
Feb 3, 2004
PENTAX Corporation
Masayuki Sugiura
G01 - MEASURING TESTING
Information
Patent Grant
Optical member inspecting apparatus and method of inspection thereof
Patent number
6,636,625
Issue date
Oct 21, 2003
Asahi Kogaku Kogyo Kabushiki Kaisha
Toshihiro Nakayama
G01 - MEASURING TESTING
Information
Patent Grant
Optical member inspecting apparatus and method of inspection thereof
Patent number
6,535,627
Issue date
Mar 18, 2003
Asahi Kogaku Kogyo Kabushiki Kaisha
Toshihiro Nakayama
G01 - MEASURING TESTING
Information
Patent Grant
Optical member inspecting apparatus and method of inspection thereof
Patent number
6,476,909
Issue date
Nov 5, 2002
Asahi Kogaku Kogyo Kabushiki Kaisha
Toshihiro Nakayama
G01 - MEASURING TESTING
Information
Patent Grant
Optical member inspecting apparatus and method of inspection thereof
Patent number
6,477,264
Issue date
Nov 5, 2002
Asahi Kogaku Kogyo Kabushiki Kaisha
Toshihiro Nakayama
G01 - MEASURING TESTING
Information
Patent Grant
Optical member inspecting apparatus and method of inspection thereof
Patent number
6,434,263
Issue date
Aug 13, 2002
Asahi Kogaku Kogyo Kabushiki Kaisha
Toshihiro Nakayama
G01 - MEASURING TESTING
Information
Patent Grant
Optical member inspecting apparatus and method of inspection thereof
Patent number
6,430,310
Issue date
Aug 6, 2002
Asahi Kogaku Kogyo Kabushiki Kaisha
Toshihiro Nakayama
G01 - MEASURING TESTING
Information
Patent Grant
Optical member inspecting apparatus and method of inspection thereof
Patent number
6,427,023
Issue date
Jul 30, 2002
Asahi Kogaku Kogyo Kabushiki Kaisha
Toshihiro Nakayama
G01 - MEASURING TESTING
Information
Patent Grant
Optical member inspecting apparatus and method of inspection thereof
Patent number
6,363,165
Issue date
Mar 26, 2002
Asahi Kogaku Kogyo Kabushiki Kaisha
Toshihiro Nakayama
G01 - MEASURING TESTING
Information
Patent Grant
Optical member inspecting apparatus and method of inspection thereof
Patent number
6,351,554
Issue date
Feb 26, 2002
Asahi Kugaku Kogyo Kabushiki Kaisha
Toshihiro Nakayama
G01 - MEASURING TESTING
Information
Patent Grant
Optical member inspecting apparatus and method of inspection thereof
Patent number
6,349,145
Issue date
Feb 19, 2002
Asahi Kogaku Kogyo Kabushiki Kaisha
Toshihiro Nakayama
G01 - MEASURING TESTING
Information
Patent Grant
Optical member inspecting apparatus and method of inspection thereof
Patent number
6,314,200
Issue date
Nov 6, 2001
Asahi Kogaku Kogyo Kabushiki Kaisha
Toshihiro Nakayama
G01 - MEASURING TESTING
Information
Patent Grant
Optical-member inspection apparatus and holder for inspection targe...
Patent number
6,208,475
Issue date
Mar 27, 2001
Asahi Kogaku Kogyo Kabushiki Kaisha
Kiyoshi Yamamoto
G02 - OPTICS
Information
Patent Grant
Optical member inspecting apparatus and method of inspection thereof
Patent number
6,148,097
Issue date
Nov 14, 2000
Asahi Kogaku Kogyo Kabushiki Kaisha
Toshihiro Nakayama
G01 - MEASURING TESTING
Information
Patent Grant
Optical member inspection apparatus
Patent number
6,034,766
Issue date
Mar 7, 2000
Asahi Kogaku Kogyo Kabushiki Kaisha
Masayuki Sugiura
G01 - MEASURING TESTING
Information
Patent Grant
Optical element inspecting apparatus
Patent number
5,847,822
Issue date
Dec 8, 1998
Asahi Kogaku Kogyo Kabushiki Kaisha
Masayuki Sugiura
G01 - MEASURING TESTING
Information
Patent Grant
Optical member inspecting apparatus
Patent number
5,835,207
Issue date
Nov 10, 1998
Asahi Kogaku Kogyo Kabushiki Kaisha
Masayuki Sugiura
G01 - MEASURING TESTING
Information
Patent Grant
Optical element inspecting apparatus
Patent number
5,828,500
Issue date
Oct 27, 1998
Asahi Kogaku Kogyo Kabushiki Kaisha
Atsushi Kida
G01 - MEASURING TESTING
Information
Patent Grant
High-quality character generating system and method for use therein
Patent number
5,426,727
Issue date
Jun 20, 1995
Asahi Kogaku Kogyo K.K.
Masayuki Sugiura
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
Information
Patent Application
OPTICAL MEMBER INSPECTING APPARATUS AND METHOD OF INSPECTION THEREOF
Publication number
20020057428
Publication date
May 16, 2002
Toshihiro Nakayama
G01 - MEASURING TESTING