Mikhail I. Yavor

Person

St. Petersburg, RU

People

Patents Grantslast 30 patents

Information Patent Grant
Ion mirror for multi-reflecting mass spectrometers
- Patent number 12,125,694
- Issue date Oct 22, 2024
- Micromass UK Limited
- Anatoly Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Accelerator for multi-pass mass spectrometers
- Patent number 11,817,303
- Issue date Nov 14, 2023
- Micromass UK Limited
- Anatoly Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion mirror for multi-reflecting mass spectrometers
- Patent number 11,756,782
- Issue date Sep 12, 2023
- Micromass UK Limited
- Anatoly Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion mirror for multi-reflecting mass spectrometers
- Patent number 11,239,067
- Issue date Feb 1, 2022
- Micromass UK Limited
- Anatoly Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fields for multi-reflecting TOF MS
- Patent number 11,049,712
- Issue date Jun 29, 2021
- Micromass UK Limited
- Anatoly Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass analyser having extended flight path
- Patent number 10,950,425
- Issue date Mar 16, 2021
- Micromass UK Limited
- Anatoly Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-reflecting TOF mass spectrometer
- Patent number 10,741,376
- Issue date Aug 11, 2020
- Micromass UK Limited
- John Brian Hoyes
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion mirror and ion-optical lens for imaging
- Patent number 10,636,646
- Issue date Apr 28, 2020
- Micromass UK Limited
- John Brian Hoyes
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Imaging mass spectrometer
- Patent number 10,629,425
- Issue date Apr 21, 2020
- Micromass UK Limited
- John Brian Hoyes
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Imaging mass spectrometer
- Patent number 10,593,533
- Issue date Mar 17, 2020
- Micromass UK Limited
- John Brian Hoyes
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-reflecting time-of-flight analyzer
- Patent number 10,163,616
- Issue date Dec 25, 2018
- Leco Corporation
- Anatoly N. Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Quasi-planar multi-reflecting time-of-flight mass spectrometer
- Patent number 10,141,175
- Issue date Nov 27, 2018
- Leco Corporation
- Anatoli N. Verentchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-reflecting mass spectrometer
- Patent number 9,865,445
- Issue date Jan 9, 2018
- Leco Corporation
- Anatoly N. Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Quasi-planar multi-reflecting time-of-flight mass spectrometer
- Patent number 9,425,034
- Issue date Aug 23, 2016
- Leco Corporation
- Anatoli N. Verentchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrostatic ion mirrors
- Patent number 9,396,922
- Issue date Jul 19, 2016
- Leco Corporation
- Anatoly N. Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-reflecting time-of-flight mass spectrometer and method of use
- Patent number 7,385,187
- Issue date Jun 10, 2008
- Leco Corporation
- Anatoli Verentchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-reflecting time-of-flight mass spectrometer with isochronous...
- Patent number 7,326,925
- Issue date Feb 5, 2008
- Leco Corporation
- Anatoli N. Verentchikov
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
ION MIRROR FOR MULTI-REFLECTING MASS SPECTROMETERS
- Publication number 20240030018
- Publication date Jan 25, 2024
- Micromass UK Limited
- Anatoly Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ACCELERATOR FOR MULTI-PASS MASS SPECTROMETERS
- Publication number 20230170204
- Publication date Jun 1, 2023
- Micromass UK Limited
- Anatoly Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION MIRROR FOR MULTI-REFLECTING MASS SPECTROMETERS
- Publication number 20220148872
- Publication date May 12, 2022
- Micromass UK Limited
- Anatoly Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION MIRROR FOR MULTI-REFLECTING MASS SPECTROMETERS
- Publication number 20200373143
- Publication date Nov 26, 2020
- Micromass UK Limited
- Anatoly Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ACCELERATOR FOR MULTI-PASS MASS SPECTROMETERS
- Publication number 20200373145
- Publication date Nov 26, 2020
- Micromass UK Limited
- Anatoly Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FIELDS FOR MULTI-REFLECTING TOF MS
- Publication number 20200168448
- Publication date May 28, 2020
- Anatoly Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS ANALYSER HAVING EXTENDED FLIGHT PATH
- Publication number 20190206669
- Publication date Jul 4, 2019
- Micromass UK Limited
- Anatoly Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMAGING MASS SPECTROMETER
- Publication number 20180366313
- Publication date Dec 20, 2018
- Micromass UK Limited
- John Brian Hoyes
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMPROVED ION MIRROR AND ION-OPTICAL LENS FOR IMAGING
- Publication number 20180358219
- Publication date Dec 13, 2018
- Micromass UK Limited
- John Brian Hoyes
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMAGING MASS SPECTROMETER
- Publication number 20180330936
- Publication date Nov 15, 2018
- Micromass UK Limited
- John Brian Hoyes
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTI-REFLECTING TOF MASS SPECTROMETER
- Publication number 20180144921
- Publication date May 24, 2018
- Micromass UK Limited
- John Brian Hoyes
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
A Multi-Reflecting Time-of-Flight Analyzer
- Publication number 20170338094
- Publication date Nov 23, 2017
- Leco Corporation
- Anatoly N. Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Quasi-Planar Multi-Reflecting Time-of-Flight Mass Spectrometer
- Publication number 20160358764
- Publication date Dec 8, 2016
- Leco Corporation
- Anatoli N. Verentchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Multi-Reflecting Mass Spectrometer
- Publication number 20160035558
- Publication date Feb 4, 2016
- Leco Corporation
- Anatoly N. Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electrostatic Ion Mirrors
- Publication number 20140312221
- Publication date Oct 23, 2014
- Anatoly N. Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
QUASI-PLANAR MULTI-REFLECTING TIME-OF-FLIGHT MASS SPECTROMETER
- Publication number 20110186729
- Publication date Aug 4, 2011
- LECO CORPORATION
- Anatoli N. Verentchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTI-REFLECTING TIME-OF-FLIGHT MASS SPECTROMETER WITH ISOCHRONOUS...
- Publication number 20060214100
- Publication date Sep 28, 2006
- Leco Corporation
- Anatoli N. Verentchikov
- H01 - BASIC ELECTRIC ELEMENTS

Mikhail I. Yavor

Person

Patents Grantslast 30 patents

Ion mirror for multi-reflecting mass spectrometers

Accelerator for multi-pass mass spectrometers

Ion mirror for multi-reflecting mass spectrometers

Ion mirror for multi-reflecting mass spectrometers

Fields for multi-reflecting TOF MS

Mass analyser having extended flight path

Multi-reflecting TOF mass spectrometer

Ion mirror and ion-optical lens for imaging

Imaging mass spectrometer

Imaging mass spectrometer

Multi-reflecting time-of-flight analyzer

Quasi-planar multi-reflecting time-of-flight mass spectrometer

Multi-reflecting mass spectrometer

Quasi-planar multi-reflecting time-of-flight mass spectrometer

Electrostatic ion mirrors

Multi-reflecting time-of-flight mass spectrometer and method of use

Multi-reflecting time-of-flight mass spectrometer with isochronous...

Patents Applicationslast 30 patents

ION MIRROR FOR MULTI-REFLECTING MASS SPECTROMETERS

ACCELERATOR FOR MULTI-PASS MASS SPECTROMETERS

ION MIRROR FOR MULTI-REFLECTING MASS SPECTROMETERS

ION MIRROR FOR MULTI-REFLECTING MASS SPECTROMETERS

ACCELERATOR FOR MULTI-PASS MASS SPECTROMETERS

FIELDS FOR MULTI-REFLECTING TOF MS

MASS ANALYSER HAVING EXTENDED FLIGHT PATH

IMAGING MASS SPECTROMETER

IMPROVED ION MIRROR AND ION-OPTICAL LENS FOR IMAGING

IMAGING MASS SPECTROMETER

MULTI-REFLECTING TOF MASS SPECTROMETER

A Multi-Reflecting Time-of-Flight Analyzer

Quasi-Planar Multi-Reflecting Time-of-Flight Mass Spectrometer

Multi-Reflecting Mass Spectrometer

Electrostatic Ion Mirrors

QUASI-PLANAR MULTI-REFLECTING TIME-OF-FLIGHT MASS SPECTROMETER

MULTI-REFLECTING TIME-OF-FLIGHT MASS SPECTROMETER WITH ISOCHRONOUS...