Naoki Kasai

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
MRAM and data read/write method for MRAM
- Patent number 7,848,137
- Issue date Dec 7, 2010
- NEC Corporation
- Shunsuke Fukami
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Semiconductor memory device with memory cells having same character...
- Patent number 6,768,151
- Issue date Jul 27, 2004
- NEC Corporation
- Naoki Kasai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device comprising high density integrated circuit hav...
- Patent number 6,653,690
- Issue date Nov 25, 2003
- NEC Electronics Corporation
- Naoki Kasai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Embedded LSI having a FeRAM section and a logic circuit section
- Patent number 6,465,826
- Issue date Oct 15, 2002
- NEC Corporation
- Naoki Kasai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
DRAM having a stacked capacitor and a method for fabricating the same
- Patent number 6,448,597
- Issue date Sep 10, 2002
- NEC Corporation
- Naoki Kasai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing semiconductor device in which hot carrier r...
- Patent number 6,352,891
- Issue date Mar 5, 2002
- NEC Corporation
- Naoki Kasai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device with reduced number of intermediate level inte...
- Patent number 6,348,408
- Issue date Feb 19, 2002
- NEC Corporation
- Naoki Kasai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Characteristic-evaluating storage capacitors
- Patent number 6,300,647
- Issue date Oct 9, 2001
- NEC Corporation
- Takehiko Hamada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and fabrication method thereof
- Patent number 6,255,218
- Issue date Jul 3, 2001
- NEC Corporation
- Naoki Kasai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method for manufacturing same
- Patent number 6,235,575
- Issue date May 22, 2001
- NEC Corporation
- Naoki Kasai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Embedded LSI having a FeRAM section and a logic circuit section
- Patent number 6,218,197
- Issue date Apr 17, 2001
- NEC Corporation
- Naoki Kasai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
MOS semiconductor device and method of manufacturing the same
- Patent number 6,190,987
- Issue date Feb 20, 2001
- NEC Corporation
- Naoki Kasai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor memory device having memory cells similarly layouted...
- Patent number 6,034,384
- Issue date Mar 7, 2000
- NEC Corporation
- Naoki Kasai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for manufacturing a semiconductor device having contact plug...
- Patent number 6,030,894
- Issue date Feb 29, 2000
- NEC Corporation
- Hiromitsu Hada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device with marginless contact hole
- Patent number 5,973,371
- Issue date Oct 26, 1999
- NEC Corporation
- Naoki Kasai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit pattern lithography method capable of reducing t...
- Patent number 5,968,692
- Issue date Oct 19, 1999
- NEC Corporation
- Naoki Kasai
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Process for fabricating semiconductor device having semiconductor l...
- Patent number 5,946,570
- Issue date Aug 31, 1999
- NEC Corporation
- Naoki Kasai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of making a self-aligning type contact hole for a semiconduc...
- Patent number 5,913,121
- Issue date Jun 15, 1999
- NEC Corporation
- Naoki Kasai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
MOS semiconductor device and method of manufacturing the same
- Patent number 5,912,509
- Issue date Jun 15, 1999
- NEC Corporation
- Naoki Kasai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device having contact plug and method for manufacturi...
- Patent number 5,909,059
- Issue date Jun 1, 1999
- NEC Corporation
- Hiromitsu Hada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device capable of easily filling contact conductor pl...
- Patent number 5,907,788
- Issue date May 25, 1999
- NEC Corporation
- Naoki Kasai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of forming a MOS transistor having gate insulators of differ...
- Patent number 5,905,283
- Issue date May 18, 1999
- NEC Corporation
- Naoki Kasai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and fabrication process thereof
- Patent number 5,895,948
- Issue date Apr 20, 1999
- NEC Corporation
- Hidemitsu Mori
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Small-sized multi-valued semiconductor memory device with coupled c...
- Patent number 5,856,938
- Issue date Jan 5, 1999
- NEC Corporation
- Naoki Kasai
- G11 - INFORMATION STORAGE
Information Patent Grant
Method for manufacturing contact structure capable of avoiding shor...
- Patent number 5,840,621
- Issue date Nov 24, 1998
- NEC Corporation
- Naoki Kasai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device having a self-aligned type contact hole
- Patent number 5,821,594
- Issue date Oct 13, 1998
- NEC Corporation
- Naoki Kasai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of forming MOS transistors having gate insulators of differe...
- Patent number 5,811,336
- Issue date Sep 22, 1998
- NEC Corporation
- Naoki Kasai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test device for insulated-gate field effect transistor and testing...
- Patent number 5,760,600
- Issue date Jun 2, 1998
- NEC Corporation
- Naoki Kasai
- G01 - MEASURING TESTING
Information Patent Grant
Method for manufacturing contact structure capable of avoiding shor...
- Patent number 5,654,236
- Issue date Aug 5, 1997
- NEC Corporation
- Naoki Kasai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor memory device with improved step protection and manuf...
- Patent number 5,381,030
- Issue date Jan 10, 1995
- NEC Corporation
- Naoki Kasai
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
WAFER TEST SYSTEM, PROBE CARD REPLACING METHOD, AND PROBER
- Publication number 20240369623
- Publication date Nov 7, 2024
- TOKYO SEIMITSU CO., LTD.
- Akira YAMAGUCHI
- G01 - MEASURING TESTING
Information Patent Application
INFORMATION PROCESSING DEVICE, INFORMATION PROCESSING METHOD, AND R...
- Publication number 20170262044
- Publication date Sep 14, 2017
- NEC Corporation
- Takashi TAKENAKA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MRAM AND DATA READ/WRITE METHOD FOR MRAM
- Publication number 20090251955
- Publication date Oct 8, 2009
- NEC CORPORATION
- Shunsuke Fukami
- G11 - INFORMATION STORAGE
Information Patent Application
Field-effect transistor, complementary field-effect transistor, and...
- Publication number 20060049430
- Publication date Mar 9, 2006
- NEC ELECTRONICS CORPORATION
- Naoki Kasai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor memory device with memory cells having same character...
- Publication number 20030104674
- Publication date Jun 5, 2003
- NEC Corporation
- Naoki Kasai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor memory device with memory cells having same character...
- Publication number 20020173111
- Publication date Nov 21, 2002
- NEC Corporation
- Naoki Kasai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device with reduced number of intermediate interconne...
- Publication number 20020056919
- Publication date May 16, 2002
- NEC Corporation
- Naoki Kasai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Embedded LSI having a FeRAM section and a logic circuit section
- Publication number 20010020708
- Publication date Sep 13, 2001
- Naoki Kasai
- H01 - BASIC ELECTRIC ELEMENTS

Naoki Kasai

Person

Patents Grantslast 30 patents

MRAM and data read/write method for MRAM

Semiconductor memory device with memory cells having same character...

Semiconductor device comprising high density integrated circuit hav...

Embedded LSI having a FeRAM section and a logic circuit section

DRAM having a stacked capacitor and a method for fabricating the same

Method of manufacturing semiconductor device in which hot carrier r...

Semiconductor device with reduced number of intermediate level inte...

Characteristic-evaluating storage capacitors

Semiconductor device and fabrication method thereof

Semiconductor device and method for manufacturing same

Embedded LSI having a FeRAM section and a logic circuit section

MOS semiconductor device and method of manufacturing the same

Semiconductor memory device having memory cells similarly layouted...

Method for manufacturing a semiconductor device having contact plug...

Semiconductor device with marginless contact hole

Integrated circuit pattern lithography method capable of reducing t...

Process for fabricating semiconductor device having semiconductor l...

Method of making a self-aligning type contact hole for a semiconduc...

MOS semiconductor device and method of manufacturing the same

Semiconductor device having contact plug and method for manufacturi...

Semiconductor device capable of easily filling contact conductor pl...

Method of forming a MOS transistor having gate insulators of differ...

Semiconductor device and fabrication process thereof

Small-sized multi-valued semiconductor memory device with coupled c...

Method for manufacturing contact structure capable of avoiding shor...

Semiconductor device having a self-aligned type contact hole

Method of forming MOS transistors having gate insulators of differe...

Test device for insulated-gate field effect transistor and testing...

Method for manufacturing contact structure capable of avoiding shor...

Semiconductor memory device with improved step protection and manuf...

Patents Applicationslast 30 patents

WAFER TEST SYSTEM, PROBE CARD REPLACING METHOD, AND PROBER

INFORMATION PROCESSING DEVICE, INFORMATION PROCESSING METHOD, AND R...

MRAM AND DATA READ/WRITE METHOD FOR MRAM

Field-effect transistor, complementary field-effect transistor, and...

Semiconductor memory device with memory cells having same character...

Semiconductor memory device with memory cells having same character...

Semiconductor device with reduced number of intermediate interconne...

Embedded LSI having a FeRAM section and a logic circuit section