Paul Fechner

Person

Plymouth, MN, US

People

Patents Grantslast 30 patents

Information Patent Grant
Stabilization gas environments in a proton-exchanged lithium niobat...
- Patent number 9,817,254
- Issue date Nov 14, 2017
- Honeywell International Inc.
- Nancy E. Iwamoto
- G02 - OPTICS
Information Patent Grant
Compact self-aligned implantation transistor edge resistor for SRAM...
- Patent number 9,773,808
- Issue date Sep 26, 2017
- Honeywell International Inc.
- Paul S. Fechner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
ph sensor with bonding agent disposed in a pattern
- Patent number 9,671,362
- Issue date Jun 6, 2017
- Honeywell International Inc.
- Donald Horkheimer
- C03 - GLASS MINERAL OR SLAG WOOL
Information Patent Grant
pH sensor with substrate or bonding layer configured to maintain pi...
- Patent number 9,664,641
- Issue date May 30, 2017
- Honeywell International Inc.
- Donald Horkheimer
- G01 - MEASURING TESTING
Information Patent Grant
Integrated radiation sensitive circuit
- Patent number 9,618,635
- Issue date Apr 11, 2017
- Honeywell International Inc.
- Paul S. Fechner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Converter for analog inputs
- Patent number 9,246,501
- Issue date Jan 26, 2016
- Honeywell International Inc.
- James L. Tucker
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
CMOS logic circuit using passive internal body tie bias
- Patent number 8,975,952
- Issue date Mar 10, 2015
- Honeywell International Inc.
- Paul S. Fechner
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Integrated comparative radiation sensitive circuit
- Patent number 8,933,412
- Issue date Jan 13, 2015
- Honeywell International Inc.
- Paul S. Fechner
- G01 - MEASURING TESTING
Information Patent Grant
Programmable electrical fuse with temperature gradient between anod...
- Patent number 8,901,702
- Issue date Dec 2, 2014
- Honeywell International Inc.
- Eric E. Vogt
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for digital programmable optimization of mixed-signal circuits
- Patent number 8,742,831
- Issue date Jun 3, 2014
- Honeywell International Inc.
- Paul S. Fechner
- G05 - CONTROLLING REGULATING
Information Patent Grant
Integrated circuit cumulative dose radiation sensor
- Patent number 8,575,560
- Issue date Nov 5, 2013
- Honeywell International Inc.
- Paul S. Fechner
- G01 - MEASURING TESTING
Information Patent Grant
Neutron detector cell efficiency
- Patent number 8,399,845
- Issue date Mar 19, 2013
- Honeywell International Inc.
- Paul S. Fechner
- G11 - INFORMATION STORAGE
Information Patent Grant
Neutron detector cell efficiency
- Patent number 8,153,985
- Issue date Apr 10, 2012
- Honeywell International Inc.
- Todd Andrew Randazzo
- G11 - INFORMATION STORAGE
Information Patent Grant
Direct contact to area efficient body tie process flow
- Patent number 7,964,897
- Issue date Jun 21, 2011
- Honeywell International Inc.
- Paul S. Fechner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Metal semiconductor field effect transistor (MESFET) silicon-on-ins...
- Patent number 7,939,865
- Issue date May 10, 2011
- Honeywell International Inc.
- Paul Fechner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of forming a body-tie
- Patent number 7,732,287
- Issue date Jun 8, 2010
- Honeywell International Inc.
- Paul S. Fechner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Non-planar silicon-on-insulator device that includes an “area-effic...
- Patent number 7,679,139
- Issue date Mar 16, 2010
- Honeywell International Inc.
- Bradley J. Larsen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Self-aligned body tie for a partially depleted SOI device structure
- Patent number 7,192,816
- Issue date Mar 20, 2007
- Honeywell International Inc.
- Paul S. Fechner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Bit end design for pseudo spin valve (PSV) devices
- Patent number 7,183,042
- Issue date Feb 27, 2007
- Honeywell International Inc.
- Romney R. Katti
- G11 - INFORMATION STORAGE
Information Patent Grant
Self-aligned body tie for a partially depleted SOI device structure
- Patent number 6,960,810
- Issue date Nov 1, 2005
- Honeywell International Inc.
- Paul Fechner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Frontside contact on silicon-on-insulator substrate
- Patent number 6,603,166
- Issue date Aug 5, 2003
- Honeywell International Inc.
- Paul S. Fechner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Formation of a frontside contact on silicon-on-insulator substrate
- Patent number 6,576,508
- Issue date Jun 10, 2003
- Honeywell International Inc.
- Paul S. Fechner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High performance output buffer with ESD protection
- Patent number 6,433,983
- Issue date Aug 13, 2002
- Honeywell Inc.
- Paul S. Fechner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for forming a frontside contact to the silicon substrate of...
- Patent number 6,300,666
- Issue date Oct 9, 2001
- Honeywell Inc.
- Paul S. Fechner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit impedance device and method of manufacture therefor
- Patent number 6,180,984
- Issue date Jan 30, 2001
- Honeywell Inc.
- Keith W. Golke
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
SEU hardening circuit
- Patent number 6,058,041
- Issue date May 2, 2000
- Honeywell Inc.
- Keith W. Golke
- G11 - INFORMATION STORAGE
Information Patent Grant
MOS device having a gate to body connection with a body injection c...
- Patent number 5,753,955
- Issue date May 19, 1998
- Honeywell Inc.
- Paul S. Fechner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Random access memory cell resistant to radiation induced upsets
- Patent number 5,631,863
- Issue date May 20, 1997
- Honeywell Inc.
- Paul S. Fechner
- G11 - INFORMATION STORAGE
Information Patent Grant
Method for electrically characterizing the insulator in SOI devices
- Patent number 5,519,336
- Issue date May 21, 1996
- Honeywell Inc.
- Michael S. Liu
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
COMPACT SELF-ALIGNED IMPLANTATION TRANSISTOR EDGE RESISTOR FOR SRAM...
- Publication number 20160329349
- Publication date Nov 10, 2016
- Honeywell International Inc.
- Paul S. Fechner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STABILIZATION GAS ENVIRONMENTS IN A PROTON-EXCHANGED LITHIUM NIOBAT...
- Publication number 20160246079
- Publication date Aug 25, 2016
- Honeywell International Inc.
- Nancy E. Iwamoto
- G02 - OPTICS
Information Patent Application
CONVERTER FOR ANALOG INPUTS
- Publication number 20150311909
- Publication date Oct 29, 2015
- Honeywell International Inc.
- James L. Tucker
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
pH SENSOR WITH BONDING AGENT DISPOSED IN A PATTERN
- Publication number 20150028395
- Publication date Jan 29, 2015
- Honeywell International Inc.
- Donald Horkheimer
- B32 - LAYERED PRODUCTS
Information Patent Application
pH SENSOR WITH SUBSTRATE OR BONDING LAYER CONFIGURED TO MAINTAIN PI...
- Publication number 20150028396
- Publication date Jan 29, 2015
- Honeywell International Inc.
- Donald Horkheimer
- G01 - MEASURING TESTING
Information Patent Application
PROGRAMMABLE ELECTRICAL FUSE WITH TEMPERATURE GRADIENT BETWEEN ANOD...
- Publication number 20140332922
- Publication date Nov 13, 2014
- Honeywell International Inc.
- Eric E. Vogt
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CMOS LOGIC CIRCUIT USING PASSIVE INTERNAL BODY TIE BIAS
- Publication number 20140132306
- Publication date May 15, 2014
- Honeywell International Inc.
- Paul S. Fechner
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
INTEGRATED COMPARATIVE RADIATION SENSITIVE CIRCUIT
- Publication number 20130341521
- Publication date Dec 26, 2013
- Honeywell International Inc.
- Paul S. Fechner
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED RADIATION SENSITIVE CIRCUIT
- Publication number 20130341522
- Publication date Dec 26, 2013
- Honeywell International Inc.
- Paul S. Fechner
- G01 - MEASURING TESTING
Information Patent Application
NEUTRON DETECTOR CELL EFFICIENCY
- Publication number 20120228513
- Publication date Sep 13, 2012
- Honeywell International Inc.
- Paul S. Fechner
- G01 - MEASURING TESTING
Information Patent Application
NEUTRON SENSOR WITH THIN INTERCONNECT STACK
- Publication number 20110186940
- Publication date Aug 4, 2011
- Honeywell International Inc.
- Todd Andrew Randazzo
- G01 - MEASURING TESTING
Information Patent Application
Neutron Detector Cell Efficiency
- Publication number 20110089331
- Publication date Apr 21, 2011
- Honywell International Inc.
- Todd Andrew Randazzo
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DIGITAL PROGRAMMABLE OPTIMIZATION OF MIXED-SIGNAL CIRCUITS
- Publication number 20100214009
- Publication date Aug 26, 2010
- Honeywell International Inc.
- Paul S. Fechner
- G05 - CONTROLLING REGULATING
Information Patent Application
METAL SEMICONDUCTOR FIELD EFFECT TRANSISTOR (MESFET) SILICON-ON-INS...
- Publication number 20100181603
- Publication date Jul 22, 2010
- Honeywell International Inc.
- Paul Fechner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH VOLTAGE SOI CMOS DEVICE AND METHOD OF MANUFACTURE
- Publication number 20100117153
- Publication date May 13, 2010
- Honeywell International Inc.
- Thomas B. Lucking
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Direct Contact to Area Efficient Body Tie Process Flow
- Publication number 20100019320
- Publication date Jan 28, 2010
- Honeywell International Inc.
- Paul Fechner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Non-Planar Silicon-On-Insulator Device that Includes an "Area-Effic...
- Publication number 20090065866
- Publication date Mar 12, 2009
- Honeywell International Inc.
- Bradley J. Larsen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Fabrication process for silicon-on-insulator field effect transisto...
- Publication number 20080254590
- Publication date Oct 16, 2008
- Eric E. Vogt
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Integrated Resistor Capacitor Structure
- Publication number 20080233704
- Publication date Sep 25, 2008
- Honeywell International Inc.
- Paul S. Fechner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of forming a body-tie
- Publication number 20070257317
- Publication date Nov 8, 2007
- Honeywell International Inc.
- Paul S. Fechner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of straining a silicon island for mobility improvement
- Publication number 20070224838
- Publication date Sep 27, 2007
- Honeywell International Inc.
- Eric E. Vogt
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Self-aligned body tie for a partially depletion SOI device structure
- Publication number 20050173764
- Publication date Aug 11, 2005
- Honeywell International Inc.
- Paul Fechner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Bit end design for pseudo spin valve (PSV) devices
- Publication number 20050101079
- Publication date May 12, 2005
- Honeywell International Inc.
- Romney R. Katti
- G11 - INFORMATION STORAGE
Information Patent Application
Self-aligned body tie for a partially depleted SOI device structure
- Publication number 20030222313
- Publication date Dec 4, 2003
- Honeywell International Inc.
- Paul Fechner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
High speed SOI transistors
- Publication number 20030189227
- Publication date Oct 9, 2003
- Honeywell International Inc.
- Michael S. Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
On chip smart capacitors
- Publication number 20030103301
- Publication date Jun 5, 2003
- Paul S. Fechner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Formation of a frontside contact on silicon-on-insulator substrate
- Publication number 20020195638
- Publication date Dec 26, 2002
- Honeywell International Inc.
- Paul S. Fechner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Formation of a frontside contact on silicon-on-insulator substrate
- Publication number 20020130347
- Publication date Sep 19, 2002
- Honeywell International Inc.
- Paul S. Fechner
- H01 - BASIC ELECTRIC ELEMENTS

Paul Fechner

Person

Patents Grantslast 30 patents

Stabilization gas environments in a proton-exchanged lithium niobat...

Compact self-aligned implantation transistor edge resistor for SRAM...

ph sensor with bonding agent disposed in a pattern

pH sensor with substrate or bonding layer configured to maintain pi...

Integrated radiation sensitive circuit

Converter for analog inputs

CMOS logic circuit using passive internal body tie bias

Integrated comparative radiation sensitive circuit

Programmable electrical fuse with temperature gradient between anod...

Method for digital programmable optimization of mixed-signal circuits

Integrated circuit cumulative dose radiation sensor

Neutron detector cell efficiency

Neutron detector cell efficiency

Direct contact to area efficient body tie process flow

Metal semiconductor field effect transistor (MESFET) silicon-on-ins...

Method of forming a body-tie

Non-planar silicon-on-insulator device that includes an “area-effic...

Self-aligned body tie for a partially depleted SOI device structure

Bit end design for pseudo spin valve (PSV) devices

Self-aligned body tie for a partially depleted SOI device structure

Frontside contact on silicon-on-insulator substrate

Formation of a frontside contact on silicon-on-insulator substrate

High performance output buffer with ESD protection

Method for forming a frontside contact to the silicon substrate of...

Integrated circuit impedance device and method of manufacture therefor

SEU hardening circuit

MOS device having a gate to body connection with a body injection c...

Random access memory cell resistant to radiation induced upsets

Method for electrically characterizing the insulator in SOI devices

Patents Applicationslast 30 patents

COMPACT SELF-ALIGNED IMPLANTATION TRANSISTOR EDGE RESISTOR FOR SRAM...

STABILIZATION GAS ENVIRONMENTS IN A PROTON-EXCHANGED LITHIUM NIOBAT...

CONVERTER FOR ANALOG INPUTS

pH SENSOR WITH BONDING AGENT DISPOSED IN A PATTERN

pH SENSOR WITH SUBSTRATE OR BONDING LAYER CONFIGURED TO MAINTAIN PI...

PROGRAMMABLE ELECTRICAL FUSE WITH TEMPERATURE GRADIENT BETWEEN ANOD...

CMOS LOGIC CIRCUIT USING PASSIVE INTERNAL BODY TIE BIAS

INTEGRATED COMPARATIVE RADIATION SENSITIVE CIRCUIT

INTEGRATED RADIATION SENSITIVE CIRCUIT

NEUTRON DETECTOR CELL EFFICIENCY

NEUTRON SENSOR WITH THIN INTERCONNECT STACK

Neutron Detector Cell Efficiency

METHOD FOR DIGITAL PROGRAMMABLE OPTIMIZATION OF MIXED-SIGNAL CIRCUITS

METAL SEMICONDUCTOR FIELD EFFECT TRANSISTOR (MESFET) SILICON-ON-INS...

HIGH VOLTAGE SOI CMOS DEVICE AND METHOD OF MANUFACTURE

Direct Contact to Area Efficient Body Tie Process Flow

Non-Planar Silicon-On-Insulator Device that Includes an "Area-Effic...

Fabrication process for silicon-on-insulator field effect transisto...

Integrated Resistor Capacitor Structure

Method of forming a body-tie

Method of straining a silicon island for mobility improvement

Self-aligned body tie for a partially depletion SOI device structure

Bit end design for pseudo spin valve (PSV) devices

Self-aligned body tie for a partially depleted SOI device structure

High speed SOI transistors

On chip smart capacitors

Formation of a frontside contact on silicon-on-insulator substrate

Formation of a frontside contact on silicon-on-insulator substrate