Sharad Saxena

Person

Richardson, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Test structures for measuring silicon thickness in fully depleted s...
- Patent number 10,852,337
- Issue date Dec 1, 2020
- PDF Solutions, Inc.
- Sharad Saxena
- G01 - MEASURING TESTING
Information Patent Grant
Method for applying charge-based-capacitance-measurement with switc...
- Patent number 10,641,804
- Issue date May 5, 2020
- PDF Solutions, Inc.
- Sharad Saxena
- G01 - MEASURING TESTING
Information Patent Grant
Test structures and method for electrical measurement of FinFET fin...
- Patent number 10,529,631
- Issue date Jan 7, 2020
- PDF Solutions, Inc.
- Sharad Saxena
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for accurate measurement of leaky capacitors using charge ba...
- Patent number 9,952,268
- Issue date Apr 24, 2018
- PDF Solutions, Inc.
- Sharad Saxena
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test structures and methods for measuring silicon thickness in full...
- Patent number 9,691,669
- Issue date Jun 27, 2017
- PDF Solutions, Inc.
- Sharad Saxena
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for detecting and monitoring nickel-silicide pr...
- Patent number 7,932,105
- Issue date Apr 26, 2011
- PDF Solutions
- Sharad Saxena
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for reducing layout printability effects on semiconductor de...
- Patent number 7,644,388
- Issue date Jan 5, 2010
- PDF Solutions, Inc.
- Lidia Daldoss
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for optimizing the characteristics of integrated circuits co...
- Patent number 7,047,505
- Issue date May 16, 2006
- PDF Solutions, Inc.
- Sharad Saxena
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methodology for the optimization of testing and diagnosis of analog...
- Patent number 7,003,742
- Issue date Feb 21, 2006
- PDF Solutions, Inc.
- Sharad Saxena
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Efficient method for modeling and simulation of the impact of local...
- Patent number 6,978,229
- Issue date Dec 20, 2005
- PDF Solutions, Inc.
- Sharad Saxena
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for predicting an operational lifetime of a tr...
- Patent number 6,530,064
- Issue date Mar 4, 2003
- Texas Instruments Incorporated
- Karthik Vasanth
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrating dual supply voltages using a single extra mask level
- Patent number 6,388,288
- Issue date May 14, 2002
- Texas Instruments Incorporated
- Karthik Vasanth
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for using response-surface methodologies to deter...
- Patent number 6,381,564
- Issue date Apr 30, 2002
- Texas Instruments Incorporated
- Joseph C. Davis
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for non-parametric modeling of processed induced...
- Patent number 6,317,640
- Issue date Nov 13, 2001
- Texas Instruments Incorporated
- Suraj Rao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Design of microelectronic process flows for manufacturability and p...
- Patent number 6,311,096
- Issue date Oct 30, 2001
- Texas Instruments Incorporated
- Sharad Saxena
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrating dual supply voltage by removing the drain extender impl...
- Patent number 6,157,062
- Issue date Dec 5, 2000
- Texas Instruments Incorporated
- Karthik Vasanth
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Process flow design at the module effects level through the use of...
- Patent number 5,912,678
- Issue date Jun 15, 1999
- Texas Instruments Incorporated
- Sharad Saxena
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Controlling process modules using site models and monitor wafer con...
- Patent number 5,751,582
- Issue date May 12, 1998
- Texas Instruments Incorporated
- Sharad Saxena
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method of diagnosing malfunctions in semiconductor manufacturing eq...
- Patent number 5,642,296
- Issue date Jun 24, 1997
- Texas Instruments Incorporated
- Sharad Saxena
- G05 - CONTROLLING REGULATING
Information Patent Grant
Use of spatial models for simultaneous control of various non-unifo...
- Patent number 5,546,312
- Issue date Aug 13, 1996
- Texas Instruments Incorporated
- Purnendu K. Mozumder
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automated diagnosis using wafer tracking databases
- Patent number 5,483,636
- Issue date Jan 9, 1996
- Texas Instruments Incorporated
- Sharad Saxena
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-variable statistical process controller for discrete manufact...
- Patent number 5,408,405
- Issue date Apr 18, 1995
- Texas Instruments Incorporated
- Purnendu K. Mozumder
- G05 - CONTROLLING REGULATING

Patents Applicationslast 30 patents

Information Patent Application
TEST STRUCTURES FOR MEASURING SILICON THICKNESS IN FULLY DEPLETED S...
- Publication number 20170309524
- Publication date Oct 26, 2017
- PDF Solutions, Inc.
- Sharad Saxena
- G01 - MEASURING TESTING
Information Patent Application
Method for optimizing the characteristics of integrated circuits co...
- Publication number 20040064296
- Publication date Apr 1, 2004
- Sharad Saxena
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Methodology for the optimization of testing and diagnosis of analog...
- Publication number 20040015793
- Publication date Jan 22, 2004
- Sharad Saxena
- G06 - COMPUTING CALCULATING COUNTING

Sharad Saxena

Person

Patents Grantslast 30 patents

Test structures for measuring silicon thickness in fully depleted s...

Method for applying charge-based-capacitance-measurement with switc...

Test structures and method for electrical measurement of FinFET fin...

Method for accurate measurement of leaky capacitors using charge ba...

Test structures and methods for measuring silicon thickness in full...

Systems and methods for detecting and monitoring nickel-silicide pr...

Method for reducing layout printability effects on semiconductor de...

Method for optimizing the characteristics of integrated circuits co...

Methodology for the optimization of testing and diagnosis of analog...

Efficient method for modeling and simulation of the impact of local...

Method and apparatus for predicting an operational lifetime of a tr...

Integrating dual supply voltages using a single extra mask level

Method and system for using response-surface methodologies to deter...

System and method for non-parametric modeling of processed induced...

Design of microelectronic process flows for manufacturability and p...

Integrating dual supply voltage by removing the drain extender impl...

Process flow design at the module effects level through the use of...

Controlling process modules using site models and monitor wafer con...

Method of diagnosing malfunctions in semiconductor manufacturing eq...

Use of spatial models for simultaneous control of various non-unifo...

Automated diagnosis using wafer tracking databases

Multi-variable statistical process controller for discrete manufact...

Patents Applicationslast 30 patents

TEST STRUCTURES FOR MEASURING SILICON THICKNESS IN FULLY DEPLETED S...

Method for optimizing the characteristics of integrated circuits co...

Methodology for the optimization of testing and diagnosis of analog...