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Toshihiro NAKAYAMA
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Saitama-Ken, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Adapter device for image capturing device
Patent number
7,587,738
Issue date
Sep 8, 2009
Hoya Corporation
Shintaro Nakamura
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Image processing computer system for photogrammetric analytical mea...
Patent number
6,954,217
Issue date
Oct 11, 2005
PENTAX Corporation
Toshihiro Nakayama
G01 - MEASURING TESTING
Information
Patent Grant
Optical member inspecting apparatus and method of inspection thereof
Patent number
6,804,386
Issue date
Oct 12, 2004
Asahi Kogaku Kogyo Kabushiki Kaisha
Toshihiro Nakayama
G01 - MEASURING TESTING
Information
Patent Grant
Optical member inspecting apparatus and method of inspection thereof
Patent number
6,788,804
Issue date
Sep 7, 2004
Asahi Kogaku Kogyo Kabushiki Kaisha
Toshihiro Nakayama
G01 - MEASURING TESTING
Information
Patent Grant
Photogrammetric image processing apparatus and method
Patent number
6,768,813
Issue date
Jul 27, 2004
PENTAX Corporation
Toshihiro Nakayama
G01 - MEASURING TESTING
Information
Patent Grant
Image processing computer system for photogrammetric analytical mea...
Patent number
6,762,766
Issue date
Jul 13, 2004
PENTAX Corporation
Toshihiro Nakayama
G01 - MEASURING TESTING
Information
Patent Grant
Target for photogrammetric analytical measurement system
Patent number
6,717,683
Issue date
Apr 6, 2004
PENTAX Corporation
Shigeru Wakashiro
G01 - MEASURING TESTING
Information
Patent Grant
Optical member inspecting apparatus and method of inspection thereof
Patent number
6,697,513
Issue date
Feb 24, 2004
Asahi Kogaku Kogyo Kabushiki Kaisha
Toshihiro Nakayama
G01 - MEASURING TESTING
Information
Patent Grant
Image processing computer system for a photogrammetric analytical m...
Patent number
6,693,650
Issue date
Feb 17, 2004
PENTAX Corporation
Shigeru Wakashiro
G01 - MEASURING TESTING
Information
Patent Grant
Optical member inspecting apparatus and method of inspection thereof
Patent number
6,636,625
Issue date
Oct 21, 2003
Asahi Kogaku Kogyo Kabushiki Kaisha
Toshihiro Nakayama
G01 - MEASURING TESTING
Information
Patent Grant
Device for calculating positional data of standard points of photog...
Patent number
6,628,803
Issue date
Sep 30, 2003
PENTAX Corporation
Shigeru Wakashiro
G01 - MEASURING TESTING
Information
Patent Grant
Image processing computer system for photogrammetric analytical mea...
Patent number
6,618,498
Issue date
Sep 9, 2003
PENTAX Corporation
Toshihiro Nakayama
G01 - MEASURING TESTING
Information
Patent Grant
Photogrammetric image processing apparatus and method
Patent number
6,618,497
Issue date
Sep 9, 2003
PENTAX Corporation
Toshihiro Nakayama
G01 - MEASURING TESTING
Information
Patent Grant
Camera for use in photogrammetric analytical measurement
Patent number
6,600,511
Issue date
Jul 29, 2003
PENTAX Corporation
Atsumi Kaneko
G01 - MEASURING TESTING
Information
Patent Grant
Optical member inspecting apparatus and method of inspection thereof
Patent number
6,535,627
Issue date
Mar 18, 2003
Asahi Kogaku Kogyo Kabushiki Kaisha
Toshihiro Nakayama
G01 - MEASURING TESTING
Information
Patent Grant
Optical member inspecting apparatus and method of inspection thereof
Patent number
6,476,909
Issue date
Nov 5, 2002
Asahi Kogaku Kogyo Kabushiki Kaisha
Toshihiro Nakayama
G01 - MEASURING TESTING
Information
Patent Grant
Optical member inspecting apparatus and method of inspection thereof
Patent number
6,477,264
Issue date
Nov 5, 2002
Asahi Kogaku Kogyo Kabushiki Kaisha
Toshihiro Nakayama
G01 - MEASURING TESTING
Information
Patent Grant
Optical member inspecting apparatus and method of inspection thereof
Patent number
6,434,263
Issue date
Aug 13, 2002
Asahi Kogaku Kogyo Kabushiki Kaisha
Toshihiro Nakayama
G01 - MEASURING TESTING
Information
Patent Grant
Optical member inspecting apparatus and method of inspection thereof
Patent number
6,430,310
Issue date
Aug 6, 2002
Asahi Kogaku Kogyo Kabushiki Kaisha
Toshihiro Nakayama
G01 - MEASURING TESTING
Information
Patent Grant
Optical member inspecting apparatus and method of inspection thereof
Patent number
6,427,023
Issue date
Jul 30, 2002
Asahi Kogaku Kogyo Kabushiki Kaisha
Toshihiro Nakayama
G01 - MEASURING TESTING
Information
Patent Grant
Optical member inspecting apparatus and method of inspection thereof
Patent number
6,363,165
Issue date
Mar 26, 2002
Asahi Kogaku Kogyo Kabushiki Kaisha
Toshihiro Nakayama
G01 - MEASURING TESTING
Information
Patent Grant
Optical member inspecting apparatus and method of inspection thereof
Patent number
6,351,554
Issue date
Feb 26, 2002
Asahi Kugaku Kogyo Kabushiki Kaisha
Toshihiro Nakayama
G01 - MEASURING TESTING
Information
Patent Grant
Optical member inspecting apparatus and method of inspection thereof
Patent number
6,349,145
Issue date
Feb 19, 2002
Asahi Kogaku Kogyo Kabushiki Kaisha
Toshihiro Nakayama
G01 - MEASURING TESTING
Information
Patent Grant
Standard measurement scale and markers for defining standard measur...
Patent number
6,339,683
Issue date
Jan 15, 2002
Asahi Kogaku Kogyo Kabushiki Kaisha
Toshihiro Nakayama
G01 - MEASURING TESTING
Information
Patent Grant
Optical member inspecting apparatus and method of inspection thereof
Patent number
6,314,200
Issue date
Nov 6, 2001
Asahi Kogaku Kogyo Kabushiki Kaisha
Toshihiro Nakayama
G01 - MEASURING TESTING
Information
Patent Grant
Photogrammetric analytical measurement system
Patent number
6,304,669
Issue date
Oct 16, 2001
Asahi Kogaku Kogyo Kabushiki Kaisha
Atsumi Kaneko
G01 - MEASURING TESTING
Information
Patent Grant
Optical member inspecting apparatus and method of inspection thereof
Patent number
6,148,097
Issue date
Nov 14, 2000
Asahi Kogaku Kogyo Kabushiki Kaisha
Toshihiro Nakayama
G01 - MEASURING TESTING
Information
Patent Grant
Photogrammetric analytical measurement system
Patent number
6,144,761
Issue date
Nov 7, 2000
Asahi Kogaku Kogyo Kabushiki Kaisha
Atsumi Kaneko
G01 - MEASURING TESTING
Information
Patent Grant
Standard measurement scale and markers for defining standard measur...
Patent number
6,108,497
Issue date
Aug 22, 2000
Asahi Kogaku Kogyo Kabushiki Kaisha
Toshihiro Nakayama
G01 - MEASURING TESTING
Information
Patent Grant
Camera with distance-measuring sensor unit for use in photogrammetr...
Patent number
5,995,765
Issue date
Nov 30, 1999
Asahi Kogaku Kogyo Kabushiki Kaisha
Atsumi Kaneko
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
ADAPTER DEVICE FOR IMAGE CAPTURING DEVICE
Publication number
20090290031
Publication date
Nov 26, 2009
HOYA CORPORATION
Shintaro NAKAMURA
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
Download system and downloading device
Publication number
20040117461
Publication date
Jun 17, 2004
PENTAX CORPORATION
Toshihiro Nakayama
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Adapter device for image capturing device
Publication number
20030177500
Publication date
Sep 18, 2003
PENTAX CORPORATION
Shintaro Nakamura
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
Schematic illustration drawing apparatus and method
Publication number
20020060650
Publication date
May 23, 2002
ASAHI KOGAKU KOGYO KABUSHIKI KAISHA
Shigeru Wakashiro
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
OPTICAL MEMBER INSPECTING APPARATUS AND METHOD OF INSPECTION THEREOF
Publication number
20020057428
Publication date
May 16, 2002
Toshihiro Nakayama
G01 - MEASURING TESTING
Information
Patent Application
Image-processing computer system for photogrammetric analytical mea...
Publication number
20010024209
Publication date
Sep 27, 2001
ASAHI KOGAKU KOGYO KABUSHIKI KAISHA
Shigeru Wakashiro
G01 - MEASURING TESTING