Yoshiro Nakata

Person

Kyoto, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Inspection apparatus and method for semiconductor IC
- Patent number 7,589,546
- Issue date Sep 15, 2009
- Panasonic Corporation
- Naomi Miyake
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor integrated circuit testing system and method
- Patent number 6,784,681
- Issue date Aug 31, 2004
- Matsushita Electric Industrial Co., Ltd.
- Keiichi Fujimoto
- G01 - MEASURING TESTING
Information Patent Grant
Method of testing semiconductor integrated circuits and testing boa...
- Patent number 6,781,400
- Issue date Aug 24, 2004
- Matsushita Electric Industrial Co., Ltd.
- Yoshiro Nakata
- G01 - MEASURING TESTING
Information Patent Grant
Probe card
- Patent number 6,518,779
- Issue date Feb 11, 2003
- Matsushita Electrical Industrial Do., Ltd.
- Yoshiro Nakata
- G01 - MEASURING TESTING
Information Patent Grant
Method of testing semiconductor integrated circuits and testing boa...
- Patent number 6,400,175
- Issue date Jun 4, 2002
- Matsushita Electric Industrial Co., Ltd.
- Yoshiro Nakata
- G01 - MEASURING TESTING
Information Patent Grant
Wafer burn-in cassette and method of manufacturing probe card for u...
- Patent number 6,297,658
- Issue date Oct 2, 2001
- Matsushita Electric Industrial Co., Ltd.
- Yoshiro Nakata
- G01 - MEASURING TESTING
Information Patent Grant
Method of testing electrical characteristics of multiple semiconduc...
- Patent number 6,229,329
- Issue date May 8, 2001
- Matsushita Electric Industrial Co., Ltd.
- Yoshiro Nakata
- G01 - MEASURING TESTING
Information Patent Grant
Probe card for wafer-level measurement, multilayer ceramic wiring b...
- Patent number 6,215,321
- Issue date Apr 10, 2001
- Matsushita Electric Industrial Co., Ltd.
- Yoshiro Nakata
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor integrated circuit having a plurality of chips
- Patent number 5,983,331
- Issue date Nov 9, 1999
- Matsushita Electric Industrial Co., Ltd.
- Hironori Akamatsu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor integrated circuit device having failure detection ci...
- Patent number 5,892,368
- Issue date Apr 6, 1999
- Matsushita Electric Industrial Co., Ltd.
- Yoshiro Nakata
- G01 - MEASURING TESTING
Information Patent Grant
Method of manufacturing probe card
- Patent number 5,829,126
- Issue date Nov 3, 1998
- Matsushita Electric Industrial Co., Ltd.
- Koichi Nagao
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor integrated circuit device
- Patent number 5,825,193
- Issue date Oct 20, 1998
- Matsushita Electric Industrial Co., Ltd.
- Yoshiro Nakata
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device checking method
- Patent number 5,665,610
- Issue date Sep 9, 1997
- Matsushita Electric Industrial Co., Ltd.
- Yoshiro Nakata
- G01 - MEASURING TESTING
Information Patent Grant
Inspecting method for semiconductor devices
- Patent number 5,605,844
- Issue date Feb 25, 1997
- Matsushita Electric Industrial Co., Ltd.
- Shinichi Oki
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor memory device in which a capacitor electrode of a mem...
- Patent number 5,399,890
- Issue date Mar 21, 1995
- Matsushita Electric Industrial Co., Ltd.
- Shozo Okada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for testing a semiconductor integrated circuit having self t...
- Patent number 5,355,081
- Issue date Oct 11, 1994
- Matsushita Electric Industrial Co., Ltd.
- Yoshiro Nakata
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor memory device and a manufacturing method thereof
- Patent number 5,315,543
- Issue date May 24, 1994
- Matsushita Electric Industrial Co., Ltd.
- Naoto Matsuo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device having a semiconductor substrate with reduced...
- Patent number 5,300,814
- Issue date Apr 5, 1994
- Matsushita Electric Industrial Co., Ltd.
- Susumu Matsumoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor integrated circuit and a method of testing the same
- Patent number 5,248,936
- Issue date Sep 28, 1993
- Matsushita Electric Industrial Co., Ltd.
- Yoshiro Nakata
- G01 - MEASURING TESTING
Information Patent Grant
Dram with concentric adjacent capacitors
- Patent number 5,241,201
- Issue date Aug 31, 1993
- Matsushita Electric Industrial Co., Ltd.
- Naoto Matsuo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for making semiconductor integration circuit with stacked ca...
- Patent number 5,217,914
- Issue date Jun 8, 1993
- Matsushita Electric Industrial Co., Ltd.
- Susumu Matsumoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Thin-film semiconductor device and method of fabricating the same
- Patent number 5,214,296
- Issue date May 25, 1993
- Matsushita Electric Industrial Co., Ltd.
- Yoshiro Nakata
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of evaluating a semiconductor device and an apparatus for pe...
- Patent number 5,006,717
- Issue date Apr 9, 1991
- Matsushita Electric Industrial Co., Ltd.
- Noriko Tsutsu
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Inspection apparatus and method for semiconductor IC
- Publication number 20090289653
- Publication date Nov 26, 2009
- Panasonic Corporation
- Naomi Miyake
- G01 - MEASURING TESTING
Information Patent Application
Inspection apparatus and method for semiconductor IC
- Publication number 20070278662
- Publication date Dec 6, 2007
- Matsushita Electric Industrial Co., Ltd.
- Naomi Miyake
- G01 - MEASURING TESTING
Information Patent Application
Method of testing semiconductor integrated circuits and testing boa...
- Publication number 20030090288
- Publication date May 15, 2003
- Matsushita Electric Industrial Co., Ltd.
- Yoshiro Nakata
- G01 - MEASURING TESTING
Information Patent Application
Method of testing semiconductor integrated circuits and testing boa...
- Publication number 20020190743
- Publication date Dec 19, 2002
- Matsushita Electric Industrial Co., Ltd.
- Yoshiro Nakata
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor integrated circuit testing system and method
- Publication number 20020105354
- Publication date Aug 8, 2002
- Keiichi Fujimoto
- G01 - MEASURING TESTING
Information Patent Application
Method of testing semiconductor integrated circuits and testing boa...
- Publication number 20010011906
- Publication date Aug 9, 2001
- Yoshiro Nakata
- G01 - MEASURING TESTING

Yoshiro Nakata

Person

Patents Grantslast 30 patents

Inspection apparatus and method for semiconductor IC

Semiconductor integrated circuit testing system and method

Method of testing semiconductor integrated circuits and testing boa...

Probe card

Method of testing semiconductor integrated circuits and testing boa...

Wafer burn-in cassette and method of manufacturing probe card for u...

Method of testing electrical characteristics of multiple semiconduc...

Probe card for wafer-level measurement, multilayer ceramic wiring b...

Semiconductor integrated circuit having a plurality of chips

Semiconductor integrated circuit device having failure detection ci...

Method of manufacturing probe card

Semiconductor integrated circuit device

Semiconductor device checking method

Inspecting method for semiconductor devices

Semiconductor memory device in which a capacitor electrode of a mem...

Method for testing a semiconductor integrated circuit having self t...

Semiconductor memory device and a manufacturing method thereof

Semiconductor device having a semiconductor substrate with reduced...

Semiconductor integrated circuit and a method of testing the same

Dram with concentric adjacent capacitors

Method for making semiconductor integration circuit with stacked ca...

Thin-film semiconductor device and method of fabricating the same

Method of evaluating a semiconductor device and an apparatus for pe...

Patents Applicationslast 30 patents

Inspection apparatus and method for semiconductor IC

Inspection apparatus and method for semiconductor IC

Method of testing semiconductor integrated circuits and testing boa...

Method of testing semiconductor integrated circuits and testing boa...

Semiconductor integrated circuit testing system and method

Method of testing semiconductor integrated circuits and testing boa...