Gamma- or X-ray microscopes

Industry

CPC
G21K7/00

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Parent Industries

GPHYSICS G21Nuclear engineering G21KTECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR IRRADIATION DEVICES GAMMA RAY OR X-RAY MICROSCOPES

Current Industry

G21K7/00Gamma- or X-ray microscopes

Industries

Patents Grantslast 30 patents

Information Patent Grant
Method for scanning a sample by means of X-ray optics and an appara...
- Patent number 12,106,867
- Issue date Oct 1, 2024
- Bruker Nano GmbH
- Ulrich Waldschläger
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Method for imaging a region of interest of a sample using a tomogra...
- Patent number 12,056,894
- Issue date Aug 6, 2024
- Carl Zeiss SMT, Inc.
- Thomas Anthony Case
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Imaging optical arrangement to image an object illuminated by X-rays
- Patent number 12,040,103
- Issue date Jul 16, 2024
- Carl Zeiss SMT GmbH
- Johannes Ruoff
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 11,977,038
- Issue date May 7, 2024
- Canon Anelva Corporation
- Takeo Tsukamoto
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 11,971,370
- Issue date Apr 30, 2024
- Canon Anelva Corporation
- Takeo Tsukamoto
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 11,940,394
- Issue date Mar 26, 2024
- Canon Anelva Corporation
- Takeo Tsukamoto
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 11,927,554
- Issue date Mar 12, 2024
- Canon Anelva Corporation
- Takeo Tsukamoto
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 11,921,059
- Issue date Mar 5, 2024
- Canon Anelva Corporation
- Takeo Tsukamoto
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Light field X-ray optics
- Patent number 11,894,160
- Issue date Feb 6, 2024
- Lawrence Livermore National Security, LLC
- Bernard J. Kozioziemski
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Optical three-dimensional scanning for collision avoidance in micro...
- Patent number 11,821,860
- Issue date Nov 21, 2023
- Carl Zeiss X-ray Microscopy Inc.
- Lars Omlor
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Table-top ultra supercontinuum and higher harmonic generation sourc...
- Patent number 11,817,669
- Issue date Nov 14, 2023
- Robert R. Alfano
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Detection system for X-ray inspection of an object
- Patent number 11,817,231
- Issue date Nov 14, 2023
- Carl Zeiss SMT GmbH
- Johannes Ruoff
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Specimen radiography system comprising cabinet and a specimen drawe...
- Patent number 11,730,434
- Issue date Aug 22, 2023
- Hologic, Inc.
- Kenneth Defreitas
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray photoemission system for 3-D laminography
- Patent number 11,619,596
- Issue date Apr 4, 2023
- David L. Adler
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Microscopic system for testing structures and defects on EUV lithog...
- Patent number 11,615,897
- Issue date Mar 28, 2023
- RI Research Institute GmbH
- Rainer Lebert
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Sensing for automated biological cell injection
- Patent number 11,567,096
- Issue date Jan 31, 2023
- Mekonos Limited
- Arunava Steven Banerjee
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Grant
System and method for high-resolution high contrast x-ray ghost dif...
- Patent number 11,402,342
- Issue date Aug 2, 2022
- Bar Ilan University
- Sharon Shwartz
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Devices processed using x-rays
- Patent number 11,373,778
- Issue date Jun 28, 2022
- Bruker Nano, Inc.
- David Lewis Adler
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
X-ray photoemission apparatus for inspection of integrated devices
- Patent number 11,307,152
- Issue date Apr 19, 2022
- David L. Adler
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Radiograph density detection device
- Patent number 11,266,368
- Issue date Mar 8, 2022
- SCARLET IMAGING RADIOLOGY, LLC
- Michael Scott Echols
- G01 - MEASURING TESTING
Information Patent Grant
X-ray imaging with a detector capable of resolving photon energy
- Patent number 11,201,000
- Issue date Dec 14, 2021
- SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
- Peiyan Cao
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
X-ray microscope
- Patent number 11,189,392
- Issue date Nov 30, 2021
- Osaka University
- Satoshi Matsuyama
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Nanoscale X-ray tomosynthesis for rapid analysis of integrated circ...
- Patent number 11,152,130
- Issue date Oct 19, 2021
- Massachusetts Institute of Technology
- Akintunde I. Akinwande
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
System and method for nanoscale X-ray imaging of biological specimen
- Patent number 11,145,431
- Issue date Oct 12, 2021
- Massachusetts Institute of Technology
- Richard C. Lanza
- G01 - MEASURING TESTING
Information Patent Grant
Specimen radiography system comprising cabinet and a specimen drawe...
- Patent number 11,083,426
- Issue date Aug 10, 2021
- Hologic, Inc.
- Kenneth Defreitas
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Semiconductor X-ray detector
- Patent number 11,013,479
- Issue date May 25, 2021
- SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
- Peiyan Cao
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Semiconductor X-ray detector
- Patent number 11,009,614
- Issue date May 18, 2021
- SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
- Peiyan Cao
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Semiconductor x-ray detector
- Patent number 10,820,867
- Issue date Nov 3, 2020
- SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
- Peiyan Cao
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Lamella-shaped targets for x-ray generation
- Patent number 10,746,672
- Issue date Aug 18, 2020
- FEI Company
- Jorge Filevich
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
3-dimensional x-ray imager
- Patent number 10,741,297
- Issue date Aug 11, 2020
- Lawrence Livermore National Security, LLC
- Bernard J. Kozioziemski
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20240369502
- Publication date Nov 7, 2024
- Canon ANELVA Corporation
- Takeo TSUKAMOTO
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
FREESTANDING HIGH-ASPECT-RATIO GOLD MASKS FOR LOW-ENERGY, PHASE-BAS...
- Publication number 20240312665
- Publication date Sep 19, 2024
- CREATV MICROTECH, INC.
- Olga V. Makarova
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
IMAGING DEVICE AND IMAGE GENERATION METHOD
- Publication number 20240096515
- Publication date Mar 21, 2024
- KIOXIA Corporation
- Takeshi YAMANE
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
SPECIMEN RADIOGRAPHY SYSTEM COMPRISING CABINET AND A SPECIMEN DRAWE...
- Publication number 20230404499
- Publication date Dec 21, 2023
- HOLOGIC, INC.
- Kenneth DEFREITAS
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
IMAGING OPTICAL ARRANGEMENT TO IMAGE AN OBJECT ILLUMINATED BY X-RAYS
- Publication number 20230050439
- Publication date Feb 16, 2023
- Carl Zeiss SMT GMBH
- Johannes Ruoff
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
MICROSCOPIC SYSTEM FOR TESTING STRUCTURES AND DEFECTS ON EUV LITHOG...
- Publication number 20220392660
- Publication date Dec 8, 2022
- RI Research Instruments GmbH
- Rainer LEBERT
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
FOURIER PTYCHOGRAPHIC IMAGING SYSTEMS, DEVICES, AND METHODS
- Publication number 20220254538
- Publication date Aug 11, 2022
- California Institute of Technology
- Guoan Zheng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
X-RAY PHOTOEMISSION SYSTEM FOR 3-D LAMINOGRAPHY
- Publication number 20220236199
- Publication date Jul 28, 2022
- David L. Adler
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
LIGHT FIELD X-RAY OPTICS
- Publication number 20220223311
- Publication date Jul 14, 2022
- LAWRENCE LIVERMORE NATIONAL SECURITY, LLC
- Bernard J. Kozioziemski
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
TABLE-TOP UTRA SUPERCONTINUUM AND HIGHER HARMONIC GENERATION SOURCE...
- Publication number 20220166177
- Publication date May 26, 2022
- ROBERT R. ALFANO
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
SPECIMEN RADIOGRAPHY SYSTEM COMPRISING CABINET AND A SPECIMEN DRAWE...
- Publication number 20220039766
- Publication date Feb 10, 2022
- HOLOGIC, INC.
- Kenneth DEFREITAS
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
METHOD FOR IMAGING A REGION OF INTEREST OF A SAMPLE USING A TOMOGRA...
- Publication number 20210407127
- Publication date Dec 30, 2021
- Carl Zeiss SMT Inc.
- Thomas Anthony Case
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Optical three-dimensional scanning for collision avoidance in micro...
- Publication number 20210116401
- Publication date Apr 22, 2021
- Carl Zeiss X-ray Microscopy Inc.
- Lars Omlor
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
FOURIER PTYCHOGRAPHIC IMAGING SYSTEMS, DEVICES, AND METHODS
- Publication number 20210082595
- Publication date Mar 18, 2021
- California Institute of Technology
- Guoan Zheng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CODED X-RAY TARGET
- Publication number 20200365361
- Publication date Nov 19, 2020
- Sigray, Inc.
- Wenbing Yun
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
RADIOGRAPH DENSITY DETECTION DEVICE
- Publication number 20200359982
- Publication date Nov 19, 2020
- Scarlet Imaging Radiology, LLC
- Michael Scott Echols
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
X-RAY PHOTOEMISSION APPARATUS FOR INSPECTION OF INTEGRATED DEVICES
- Publication number 20200090826
- Publication date Mar 19, 2020
- David L. Adler
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
Semiconductor X-ray Detector
- Publication number 20200072986
- Publication date Mar 5, 2020
- SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
- Peiyan CAO
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor X-ray Detector
- Publication number 20200064499
- Publication date Feb 27, 2020
- SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
- Peiyan CAO
- G01 - MEASURING TESTING
Information Patent Application
3-DIMENSIONAL X-RAY IMAGER
- Publication number 20190148029
- Publication date May 16, 2019
- LAWRENCE LIVERMORE NATIONAL SECURITY, LLC
- Bernard J. Kozioziemski
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
METHOD FOR THREE-DIMENSIONALLY MEASURING A 3D AERIAL IMAGE OF A LIT...
- Publication number 20180357758
- Publication date Dec 13, 2018
- Carl Zeiss SMT GMBH
- Ulrich Matejka
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
X-RAY MICROSCOPE
- Publication number 20180261352
- Publication date Sep 13, 2018
- OSAKA UNIVERSITY
- Satoshi MATSUYAMA
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
TALBOT X-RAY MICROSCOPE
- Publication number 20180261350
- Publication date Sep 13, 2018
- Sigray, Inc.
- Wenbing Yun
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
Semiconductor X-ray Detector
- Publication number 20180224563
- Publication date Aug 9, 2018
- SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
- Peiyan CAO
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
STATISTICAL ANALYSIS IN X-RAY IMAGING
- Publication number 20180204647
- Publication date Jul 19, 2018
- FEI Company
- Wilfred Kelsham Fullagar
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
HIGH ASPECT RATIO X-RAY TARGETS AND USES OF SAME
- Publication number 20180190467
- Publication date Jul 5, 2018
- FEI Company
- N. William Parker
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
Semiconductor X-ray Detector
- Publication number 20180156927
- Publication date Jun 7, 2018
- SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
- Peiyan CAO
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
ARRANGEMENT FOR X-RAY TOMOGRAPHY
- Publication number 20180100815
- Publication date Apr 12, 2018
- FEI Company
- Pavel Stejskal
- G01 - MEASURING TESTING
Information Patent Application
EMBEDDED PUPIL FUNCTION RECOVERY FOR FOURIER PTYCHOGRAPHIC IMAGING...
- Publication number 20180088309
- Publication date Mar 29, 2018
- California Institute of Technology
- Xiaoze Ou
- G02 - OPTICS
Information Patent Application
X-RAY LASER MICROSCOPY SYSTEM AND METHOD
- Publication number 20180020996
- Publication date Jan 25, 2018
- Rising Star Pathway, a California Corporation
- Yiming Wang
- G01 - MEASURING TESTING

Gamma- or X-ray microscopes

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method for scanning a sample by means of X-ray optics and an appara...

Method for imaging a region of interest of a sample using a tomogra...

Imaging optical arrangement to image an object illuminated by X-rays

Inspection apparatus and inspection method

Inspection apparatus and inspection method

Inspection apparatus and inspection method

Inspection apparatus and inspection method

Inspection apparatus and inspection method

Light field X-ray optics

Optical three-dimensional scanning for collision avoidance in micro...

Table-top ultra supercontinuum and higher harmonic generation sourc...

Detection system for X-ray inspection of an object

Specimen radiography system comprising cabinet and a specimen drawe...

X-ray photoemission system for 3-D laminography

Microscopic system for testing structures and defects on EUV lithog...

Sensing for automated biological cell injection

System and method for high-resolution high contrast x-ray ghost dif...

Devices processed using x-rays

X-ray photoemission apparatus for inspection of integrated devices

Radiograph density detection device

X-ray imaging with a detector capable of resolving photon energy

X-ray microscope

Nanoscale X-ray tomosynthesis for rapid analysis of integrated circ...

System and method for nanoscale X-ray imaging of biological specimen

Specimen radiography system comprising cabinet and a specimen drawe...

Semiconductor X-ray detector

Semiconductor X-ray detector

Semiconductor x-ray detector

Lamella-shaped targets for x-ray generation

3-dimensional x-ray imager

Patents Applicationslast 30 patents

INSPECTION APPARATUS AND INSPECTION METHOD

FREESTANDING HIGH-ASPECT-RATIO GOLD MASKS FOR LOW-ENERGY, PHASE-BAS...

IMAGING DEVICE AND IMAGE GENERATION METHOD

SPECIMEN RADIOGRAPHY SYSTEM COMPRISING CABINET AND A SPECIMEN DRAWE...

IMAGING OPTICAL ARRANGEMENT TO IMAGE AN OBJECT ILLUMINATED BY X-RAYS

MICROSCOPIC SYSTEM FOR TESTING STRUCTURES AND DEFECTS ON EUV LITHOG...

FOURIER PTYCHOGRAPHIC IMAGING SYSTEMS, DEVICES, AND METHODS

X-RAY PHOTOEMISSION SYSTEM FOR 3-D LAMINOGRAPHY

LIGHT FIELD X-RAY OPTICS

TABLE-TOP UTRA SUPERCONTINUUM AND HIGHER HARMONIC GENERATION SOURCE...

SPECIMEN RADIOGRAPHY SYSTEM COMPRISING CABINET AND A SPECIMEN DRAWE...

METHOD FOR IMAGING A REGION OF INTEREST OF A SAMPLE USING A TOMOGRA...

Optical three-dimensional scanning for collision avoidance in micro...

FOURIER PTYCHOGRAPHIC IMAGING SYSTEMS, DEVICES, AND METHODS

CODED X-RAY TARGET

RADIOGRAPH DENSITY DETECTION DEVICE

X-RAY PHOTOEMISSION APPARATUS FOR INSPECTION OF INTEGRATED DEVICES

Semiconductor X-ray Detector

Semiconductor X-ray Detector

3-DIMENSIONAL X-RAY IMAGER

METHOD FOR THREE-DIMENSIONALLY MEASURING A 3D AERIAL IMAGE OF A LIT...

X-RAY MICROSCOPE

TALBOT X-RAY MICROSCOPE

Semiconductor X-ray Detector

STATISTICAL ANALYSIS IN X-RAY IMAGING

HIGH ASPECT RATIO X-RAY TARGETS AND USES OF SAME

Semiconductor X-ray Detector

ARRANGEMENT FOR X-RAY TOMOGRAPHY

EMBEDDED PUPIL FUNCTION RECOVERY FOR FOURIER PTYCHOGRAPHIC IMAGING...

X-RAY LASER MICROSCOPY SYSTEM AND METHOD