Measuring arrangements characterised by the use of wave or particle radiation

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Patents Grantslast 30 patents

Information Patent Grant
System and method to adjust a kinetics model of surface reactions d...
- Patent number 11,966,203
- Issue date Apr 23, 2024
- KLA Corporation
- Ankur Agarwal
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Assisted corrosion and erosion recognition
- Patent number 11,959,739
- Issue date Apr 16, 2024
- Baker Hughes Oilfield Operations LLC
- George Sheri
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Grant
Method and installation for the in-line dimensional control of manu...
- Patent number 11,954,848
- Issue date Apr 9, 2024
- TIAMA
- Olivier Colle
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Geometry based three dimensional reconstruction of a semiconductor...
- Patent number 11,953,316
- Issue date Apr 9, 2024
- Applied Materials Israel Ltd.
- Rafael Bistritzer
- G01 - MEASURING TESTING
Information Patent Grant
Measurement machine and method for detecting a defect in solder joints
- Patent number 11,927,436
- Issue date Mar 12, 2024
- Hewlett Packard Enterprise Development LP
- Jaime E. Llinas
- G01 - MEASURING TESTING
Information Patent Grant
Line for inspecting empty glass containers
- Patent number 11,927,542
- Issue date Mar 12, 2024
- TIAMA
- Olivier Colle
- G01 - MEASURING TESTING
Information Patent Grant
Optical metrology in machine learning to characterize features
- Patent number 11,921,433
- Issue date Mar 5, 2024
- Lam Research Corporation
- Ye Feng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system utilizing imaging analysis for golf balls
- Patent number 11,911,667
- Issue date Feb 27, 2024
- Topgolf Callaway Brands Corp.
- Megan Ilnicky
- G01 - MEASURING TESTING
Information Patent Grant
Recording medium, shape calculation method, and shape calculation d...
- Patent number 11,913,778
- Issue date Feb 27, 2024
- Kioxia Corporation
- Kazuki Hagihara
- G01 - MEASURING TESTING
Information Patent Grant
Non-contact angle measuring apparatus
- Patent number 11,903,755
- Issue date Feb 20, 2024
- Weng-Dah Ken
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for cooperative usage of multiple distance meters
- Patent number 11,906,290
- Issue date Feb 20, 2024
- May Patents Ltd.
- Yehuda Binder
- G01 - MEASURING TESTING
Information Patent Grant
Method and computer program for time-resolved calculation of a defo...
- Patent number 11,906,292
- Issue date Feb 20, 2024
- Fraunhofer-Gesellschaft zur Forderung der Angewandten Forschung E.V.
- Stefan Hiermaier
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for non-destructive metrology of thin layers
- Patent number 11,906,451
- Issue date Feb 20, 2024
- Nova Ltd.
- Wei Ti Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of calculating thickness of graphene layer and method of mea...
- Patent number 11,906,291
- Issue date Feb 20, 2024
- Samsung Electronics Co., Ltd.
- Eunkyu Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sensors incorporated into semi-rigid structural members to detect p...
- Patent number 11,892,372
- Issue date Feb 6, 2024
- LytEn, Inc.
- Michael Stowell
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Antenna ice loading sensor and method
- Patent number 11,892,561
- Issue date Feb 6, 2024
- Nanowave Technologies Inc.
- Justin Dinsdale Miller
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Surface profile detection apparatus of burden in blast furnace and...
- Patent number 11,891,672
- Issue date Feb 6, 2024
- WADECO CO., LTD.
- Hayae Kayano
- C21 - METALLURGY OF IRON
Information Patent Grant
Edge extraction method and edge extraction device
- Patent number 11,879,718
- Issue date Jan 23, 2024
- Nippon Telegraph and Telephone Corporation
- Teruo Jo
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for estimating convergence of changes in dimensio...
- Patent number 11,879,722
- Issue date Jan 23, 2024
- IIDA CO., LTD.
- Shigeo Miyake
- G01 - MEASURING TESTING
Information Patent Grant
Multi-energy x-ray system and method for golf ball inspection
- Patent number 11,874,106
- Issue date Jan 16, 2024
- Acushnet Company
- Paul Furze
- A63 - SPORTS GAMES AMUSEMENTS
Information Patent Grant
Measurement system and method for measuring a measurement object, i...
- Patent number 11,874,105
- Issue date Jan 16, 2024
- INOEX GMBH INNOVATIONEN UND AUSRÜSTUNGEN FÜR DIE EXTRUSIONSTECHNIK
- Ralph Klose
- G01 - MEASURING TESTING
Information Patent Grant
System and method for determining soil clod size or residue coverag...
- Patent number 11,864,484
- Issue date Jan 9, 2024
- CNH Industrial Canada, Ltd.
- Trevor Stanhope
- A01 - AGRICULTURE FORESTRY ANIMAL HUSBANDRY HUNTING TRAPPING FISHING
Information Patent Grant
System and methods for three dimensional modeling of an object usin...
- Patent number 11,860,262
- Issue date Jan 2, 2024
- VAYYAR IMAGING LTD.
- Raviv Melamed
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Material analysis method
- Patent number 11,859,965
- Issue date Jan 2, 2024
- GlobalWafers Co., Ltd.
- Shang-Chi Wang
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for monitoring deposition process
- Patent number 11,852,467
- Issue date Dec 26, 2023
- NOVA MEASURING INSTRUMENTS, INC.
- Heath A. Pois
- G01 - MEASURING TESTING
Information Patent Grant
Seed trench depth detection systems
- Patent number 11,839,171
- Issue date Dec 12, 2023
- Precision Planting LLC
- Michael Strnad
- A01 - AGRICULTURE FORESTRY ANIMAL HUSBANDRY HUNTING TRAPPING FISHING
Information Patent Grant
System and method for sub-wavelength detection for jetting-based ad...
- Patent number 11,841,220
- Issue date Dec 12, 2023
- Lawrence Livermore National Security, LLC
- Saptarshi Mukherjee
- B33 - ADDITIVE MANUFACTURING TECHNOLOGY
Information Patent Grant
Seed trench closing sensors
- Patent number 11,839,172
- Issue date Dec 12, 2023
- Precision Planting LLC
- Dale Koch
- A01 - AGRICULTURE FORESTRY ANIMAL HUSBANDRY HUNTING TRAPPING FISHING
Information Patent Grant
Shape measuring method, shape measuring device, and program
- Patent number 11,835,334
- Issue date Dec 5, 2023
- Kioxia Corporation
- Kazuki Hagihara
- G01 - MEASURING TESTING
Information Patent Grant
Through-tubing, cased-hole sealed material density evaluation using...
- Patent number 11,815,478
- Issue date Nov 14, 2023
- Halliburton Energy Services, Inc.
- Pablo Vieira Rego
- E21 - EARTH DRILLING MINING

Patents Applicationslast 30 patents

Information Patent Application
OVERLAY MEASURING METHOD AND SYSTEM, AND METHOD OF MANUFACTURING A...
- Publication number 20240133683
- Publication date Apr 25, 2024
- Samsung Electronics Co., Ltd.
- Inho KWAK
- G01 - MEASURING TESTING
Information Patent Application
GAP INSPECTION APPARATUS AND GAP INSPECTION METHOD
- Publication number 20240133682
- Publication date Apr 25, 2024
- CONTEMPORARY AMPEREX TECHNOLOGY CO., LIMITED
- Fenglin ZHANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ULTRA-PRECISION TIMING CLOCK METHOD AND APPARATUS
- Publication number 20240115222
- Publication date Apr 11, 2024
- Weng-Dah Ken
- G04 - HOROLOGY
Information Patent Application
SYSTEM AND METHODS FOR THREE DIMENSIONAL MODELING OF AN OBJECT USIN...
- Publication number 20240103149
- Publication date Mar 28, 2024
- Vayyar Imaging Ltd.
- Raviv MELAMED
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR DETERMINING PARAMETERS OF THREE DIMENSIONAL NANOSTRUCTUR...
- Publication number 20240102950
- Publication date Mar 28, 2024
- Industrial Technology Research Institute
- Chun-Ting LIU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR DETERMINING THE THICKNESS OF A MATERIAL IN MA...
- Publication number 20240093983
- Publication date Mar 21, 2024
- PaneraTech, Inc.
- Yakup Bayram
- G01 - MEASURING TESTING
Information Patent Application
X-RAY REFLECTOMETRY APPARATUS AND METHOD THEREOF FOR MEASURING THRE...
- Publication number 20240094148
- Publication date Mar 21, 2024
- Industrial Technology Research Institute
- Bo-Ching HE
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR ACQUIRING ALIGNMENT MEASUREMENTS OF STRUCTURE...
- Publication number 20240093985
- Publication date Mar 21, 2024
- KLA Corporation
- Nimrod Shuall
- G01 - MEASURING TESTING
Information Patent Application
FEED-FORWARD OF MULTI-LAYER AND MULTI-PROCESS INFORMATION USING XPS...
- Publication number 20240085174
- Publication date Mar 14, 2024
- NOVA MEASURING INSTRUMENTS INC.
- Heath POIS
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT SYSTEM, INSPECTION SYSTEM, MEASUREMENT DEVICE, MEASUREM...
- Publication number 20240062401
- Publication date Feb 22, 2024
- Omron Corporation
- Takako ONISHI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SUBSTRATE INSPECTION METHOD
- Publication number 20240019380
- Publication date Jan 18, 2024
- Samsung Electronics Co., Ltd.
- Kihong Chung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR PRODUCING TRANSPARENT GAS BARRIER FILM
- Publication number 20240002620
- Publication date Jan 4, 2024
- Toyobo Co., Ltd.
- Kiyoshi ISEKI
- C08 - ORGANIC MACROMOLECULAR COMPOUNDS THEIR PREPARATION OR CHEMICAL WORKING-...
Information Patent Application
METHOD AND SYSTEM FOR NON-DESTRUCTIVE METROLOGY OF THIN LAYERS
- Publication number 20230408430
- Publication date Dec 21, 2023
- NOVA MEASURING INSTRUMENTS, INC.
- Wei Ti Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Pattern Measurement Device
- Publication number 20230375338
- Publication date Nov 23, 2023
- Hitachi High-Tech Corporation
- Long ZHANG
- G01 - MEASURING TESTING
Information Patent Application
Method And System For Utilizing Radio-Opaque Fillers In Multiple La...
- Publication number 20230372781
- Publication date Nov 23, 2023
- Topgolf Callaway Brands Corp.
- David M. Melanson
- A63 - SPORTS GAMES AMUSEMENTS
Information Patent Application
AIRFOIL TIP CLEANING AND ASSESSMENT SYSTEMS AND METHODS
- Publication number 20230366835
- Publication date Nov 16, 2023
- Raytheon Technologies Corporation
- Ron I. PRIHAR
- G08 - SIGNALLING
Information Patent Application
INSPECTION DEVICE AND INSPECTION METHOD
- Publication number 20230324317
- Publication date Oct 12, 2023
- KIOXIA Corporation
- Takahiro IKEDA
- G01 - MEASURING TESTING
Information Patent Application
SENSORS INCORPORATED INTO SEMI-RIGID STRUCTURAL MEMBERS TO DETECT P...
- Publication number 20230296479
- Publication date Sep 21, 2023
- Lyten, Inc.
- Michael STOWELL
- B60 - VEHICLES IN GENERAL
Information Patent Application
SMALL SPOT
- Publication number 20230288196
- Publication date Sep 14, 2023
- NOVA MEASURING INSTRUMENTS INC.
- Heath POIS
- G01 - MEASURING TESTING
Information Patent Application
THZ MEASUREMENT METHOD AND THZ MEASUREMENT DEVICE FOR SURVEYING A M...
- Publication number 20230251083
- Publication date Aug 10, 2023
- CiTEX Holding GmbH
- Roland BÖHM
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Application
SCALE-AWARE SELF-SUPERVISED MONOCULAR DEPTH WITH SPARSE RADAR SUPER...
- Publication number 20230230264
- Publication date Jul 20, 2023
- Toyota Research Institute, Inc.
- VITOR GUIZILINI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CATHODOLUMINESCENCE FOCAL SCANS TO CHARACTERIZE 3D NAND CH PROFILE
- Publication number 20230221112
- Publication date Jul 13, 2023
- APPLIED MATERIALS ISRAEL LTD.
- David Goldovsky
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Methods And Systems For Tomographic Microscopy Imaging
- Publication number 20230215687
- Publication date Jul 6, 2023
- FEI Company
- Andreas Voigt
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS, APPARATUSES, AND METHODS FOR MEASURING SUBMERGED SURFACES
- Publication number 20230204524
- Publication date Jun 29, 2023
- DELTA SUBSEA, LLC
- Scott P. DINGMAN
- G05 - CONTROLLING REGULATING
Information Patent Application
Pattern Inspection/Measurement Device, and Pattern Inspection/Measu...
- Publication number 20230194253
- Publication date Jun 22, 2023
- Hitachi High-Tech Corporation
- Ryugo KAGETANI
- G01 - MEASURING TESTING
Information Patent Application
RADIO FREQUENCY IDENTIFICATION BASED THREE-DIMENSIONAL METROLOGY
- Publication number 20230175842
- Publication date Jun 8, 2023
- International Business Machines Corporation
- Olawunmi Akinlemibola
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR EVALUATION OF A STATUS OF A MATERIAL IN ME...
- Publication number 20230152243
- Publication date May 18, 2023
- PaneraTech, Inc.
- YAKUP BAYRAM
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR SUB-WAVELENGTH DETECTION FOR JETTING-BASED AD...
- Publication number 20230152090
- Publication date May 18, 2023
- LAWRENCE LIVERMORE NATIONAL SECURITY, LLC
- Saptarshi MUKHERJEE
- B33 - ADDITIVE MANUFACTURING TECHNOLOGY
Information Patent Application
METHOD AND DEVICE FOR DETERMINING AN ALIGNMENT OF A PHOTOMASK ON A...
- Publication number 20230152089
- Publication date May 18, 2023
- Carl Zeiss SMT GMBH
- Christof Baur
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
CURING OVEN AND METHOD OF CONTROLLING CURING OVEN
- Publication number 20230123109
- Publication date Apr 20, 2023
- ROCKWOOL A/S
- Ole Andreasen
- C03 - GLASS MINERAL OR SLAG WOOL

Measuring arrangements characterised by the use of wave or particle radiation

Industry

Parent Industries

Current Industry

Sub Industries

Patents Grantslast 30 patents

System and method to adjust a kinetics model of surface reactions d...

Assisted corrosion and erosion recognition

Method and installation for the in-line dimensional control of manu...

Geometry based three dimensional reconstruction of a semiconductor...

Measurement machine and method for detecting a defect in solder joints

Line for inspecting empty glass containers

Optical metrology in machine learning to characterize features

Method and system utilizing imaging analysis for golf balls

Recording medium, shape calculation method, and shape calculation d...

Non-contact angle measuring apparatus

Method and apparatus for cooperative usage of multiple distance meters

Method and computer program for time-resolved calculation of a defo...

Method and system for non-destructive metrology of thin layers

Method of calculating thickness of graphene layer and method of mea...

Sensors incorporated into semi-rigid structural members to detect p...

Antenna ice loading sensor and method

Surface profile detection apparatus of burden in blast furnace and...

Edge extraction method and edge extraction device

Method and system for estimating convergence of changes in dimensio...

Multi-energy x-ray system and method for golf ball inspection

Measurement system and method for measuring a measurement object, i...

System and method for determining soil clod size or residue coverag...

System and methods for three dimensional modeling of an object usin...

Material analysis method

Method and system for monitoring deposition process

Seed trench depth detection systems

System and method for sub-wavelength detection for jetting-based ad...

Seed trench closing sensors

Shape measuring method, shape measuring device, and program

Through-tubing, cased-hole sealed material density evaluation using...

Patents Applicationslast 30 patents

OVERLAY MEASURING METHOD AND SYSTEM, AND METHOD OF MANUFACTURING A...

GAP INSPECTION APPARATUS AND GAP INSPECTION METHOD

ULTRA-PRECISION TIMING CLOCK METHOD AND APPARATUS

SYSTEM AND METHODS FOR THREE DIMENSIONAL MODELING OF AN OBJECT USIN...

METHOD FOR DETERMINING PARAMETERS OF THREE DIMENSIONAL NANOSTRUCTUR...

SYSTEM AND METHOD FOR DETERMINING THE THICKNESS OF A MATERIAL IN MA...

X-RAY REFLECTOMETRY APPARATUS AND METHOD THEREOF FOR MEASURING THRE...

SYSTEM AND METHOD FOR ACQUIRING ALIGNMENT MEASUREMENTS OF STRUCTURE...

FEED-FORWARD OF MULTI-LAYER AND MULTI-PROCESS INFORMATION USING XPS...

MEASUREMENT SYSTEM, INSPECTION SYSTEM, MEASUREMENT DEVICE, MEASUREM...

SUBSTRATE INSPECTION METHOD

METHOD AND APPARATUS FOR PRODUCING TRANSPARENT GAS BARRIER FILM

METHOD AND SYSTEM FOR NON-DESTRUCTIVE METROLOGY OF THIN LAYERS

Pattern Measurement Device

Method And System For Utilizing Radio-Opaque Fillers In Multiple La...

AIRFOIL TIP CLEANING AND ASSESSMENT SYSTEMS AND METHODS

INSPECTION DEVICE AND INSPECTION METHOD

SENSORS INCORPORATED INTO SEMI-RIGID STRUCTURAL MEMBERS TO DETECT P...

SMALL SPOT

THZ MEASUREMENT METHOD AND THZ MEASUREMENT DEVICE FOR SURVEYING A M...

SCALE-AWARE SELF-SUPERVISED MONOCULAR DEPTH WITH SPARSE RADAR SUPER...

CATHODOLUMINESCENCE FOCAL SCANS TO CHARACTERIZE 3D NAND CH PROFILE

Methods And Systems For Tomographic Microscopy Imaging

SYSTEMS, APPARATUSES, AND METHODS FOR MEASURING SUBMERGED SURFACES

Pattern Inspection/Measurement Device, and Pattern Inspection/Measu...

RADIO FREQUENCY IDENTIFICATION BASED THREE-DIMENSIONAL METROLOGY

METHOD AND APPARATUS FOR EVALUATION OF A STATUS OF A MATERIAL IN ME...

SYSTEM AND METHOD FOR SUB-WAVELENGTH DETECTION FOR JETTING-BASED AD...

METHOD AND DEVICE FOR DETERMINING AN ALIGNMENT OF A PHOTOMASK ON A...

CURING OVEN AND METHOD OF CONTROLLING CURING OVEN