Rowland circle spectrometers

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CPC
G01J3/20

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GPHYSICS G01Measuring instruments G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY G01J3/00Spectrometry Spectrophotometry Monochromators Measuring colour

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G01J3/20Rowland circle spectrometers

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Patents Grantslast 30 patents

Information Patent Grant
Optical system for spectrometers
- Patent number 12,000,734
- Issue date Jun 4, 2024
- HITACHI HIGH-TECH ANALYTICAL SCIENCE GMBH
- Heinz Jürgen Graf
- G01 - MEASURING TESTING
Information Patent Grant
Diffraction grating design
- Patent number 11,506,535
- Issue date Nov 22, 2022
- Apple Inc.
- Yongming Tu
- G01 - MEASURING TESTING
Information Patent Grant
Optical emission spectrometer with cascaded charge storage devices
- Patent number 10,712,201
- Issue date Jul 14, 2020
- Alexej Witzig
- G01 - MEASURING TESTING
Information Patent Grant
Light guiding member, detector, spectral colorimetric apparatus, an...
- Patent number 10,670,984
- Issue date Jun 2, 2020
- Canon Kabushiki Kaisha
- Yu Miyajima
- G01 - MEASURING TESTING
Information Patent Grant
Frame, spectroscope, spectrometry unit, and image forming apparatus
- Patent number 10,444,073
- Issue date Oct 15, 2019
- Ricoh Company, Ltd.
- Hidetaka Noguchi
- G01 - MEASURING TESTING
Information Patent Grant
Spectrometer and optical input portion thereof
- Patent number 10,436,639
- Issue date Oct 8, 2019
- OTO PHOTONICS INC.
- Meng-Hua Wang
- G01 - MEASURING TESTING
Information Patent Grant
Spectrometer and manufacturing method thereof
- Patent number 10,393,586
- Issue date Aug 27, 2019
- OTO PHOTONICS INC.
- Chien-Hsiang Hung
- G01 - MEASURING TESTING
Information Patent Grant
Curved grating spectrometer and wavelength multiplexer or demultipl...
- Patent number 9,939,320
- Issue date Apr 10, 2018
- Electronic Photonic IC Inc. (EPIC Inc.)
- Seng-Tiong Ho
- G02 - OPTICS
Information Patent Grant
Optical module of micro spectrometer with tapered slit and slit str...
- Patent number 9,746,616
- Issue date Aug 29, 2017
- OTO PHOTONICS INC.
- Cheng-Hao Ko
- G02 - OPTICS
Information Patent Grant
Curved grating spectrometer and wavelength multiplexer or demultipl...
- Patent number 9,612,155
- Issue date Apr 4, 2017
- Electronic Photonic IC Inc. (EPIC Inc.)
- Seng-Tiong Ho
- G02 - OPTICS
Information Patent Grant
Spectrometer and image forming apparatus having the same
- Patent number 9,217,667
- Issue date Dec 22, 2015
- Canon Kabushiki Kaisha
- Masayasu Teramura
- G01 - MEASURING TESTING
Information Patent Grant
High efficiency mono-order concave diffraction grating
- Patent number 9,176,282
- Issue date Nov 3, 2015
- VALORBEC S.E.C.
- Pierre Pottier
- G01 - MEASURING TESTING
Information Patent Grant
Optical system and manufacturing method thereof
- Patent number 9,146,155
- Issue date Sep 29, 2015
- OtO Photonics, Inc.
- Cheng-Hao Ko
- G01 - MEASURING TESTING
Information Patent Grant
Spectral colorimetric apparatus and image forming apparatus includi...
- Patent number 8,958,069
- Issue date Feb 17, 2015
- Canon Kabushiki Kaisha
- Hisanori Kobayashi
- G01 - MEASURING TESTING
Information Patent Grant
Temperature-compensated spectrometer
- Patent number 8,891,082
- Issue date Nov 18, 2014
- Bruker Elemental GmbH
- Rainer Simons
- G01 - MEASURING TESTING
Information Patent Grant
Curved grating spectrometer and wavelength multiplexer or demultipl...
- Patent number 8,854,620
- Issue date Oct 7, 2014
- Optonet Inc.
- Seng-Tiong Ho
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Diffraction element, manufacturing method for diffraction element,...
- Patent number 8,767,300
- Issue date Jul 1, 2014
- Canon Kabushiki Kaisha
- Yoshihiro Ishibe
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Spectral colorimetric apparatus and image forming apparatus using t...
- Patent number 8,705,154
- Issue date Apr 22, 2014
- Canon Kabushiki Kaisha
- Tokuji Takizawa
- G01 - MEASURING TESTING
Information Patent Grant
Calibration apparatus and calibration method
- Patent number 8,564,771
- Issue date Oct 22, 2013
- Canon Kabushiki Kaisha
- Hisato Sekine
- G01 - MEASURING TESTING
Information Patent Grant
Spectrometer capable of eliminating side-tail effects
- Patent number 8,508,731
- Issue date Aug 13, 2013
- OTO Photonics, Inc.
- Cheng-Hao Ko
- G01 - MEASURING TESTING
Information Patent Grant
Spectral colorimetric apparatus and image forming apparatus includi...
- Patent number 8,462,342
- Issue date Jun 11, 2013
- Canon Kabushiki Kaisha
- Hisanori Kobayashi
- G01 - MEASURING TESTING
Information Patent Grant
Spectral colorimetric apparatus and image forming apparatus using t...
- Patent number 8,462,406
- Issue date Jun 11, 2013
- Canon Kabushiki Kaisha
- Tokuji Takizawa
- G01 - MEASURING TESTING
Information Patent Grant
Curved grating spectrometer and wavelength multiplexer or demultipl...
- Patent number 8,462,338
- Issue date Jun 11, 2013
- Seng-Tiong Ho
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Diffraction optical element, spectral colorimetric apparatus, and i...
- Patent number 8,451,443
- Issue date May 28, 2013
- Canon Kabushiki Kaisha
- Tokuji Takizawa
- G01 - MEASURING TESTING
Information Patent Grant
Spectrometer and image forming apparatus having the same
- Patent number 8,422,012
- Issue date Apr 16, 2013
- Canon Kabushiki Kaisha
- Masayasu Teramura
- G01 - MEASURING TESTING
Information Patent Grant
Non-astigmatic imaging with matched pairs of spherically bent refle...
- Patent number 8,217,353
- Issue date Jul 10, 2012
- U.S. Department of Energy
- Manfred Ludwig Bitter
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Chemical impedance detectors for fluid analyzers
- Patent number 7,965,089
- Issue date Jun 21, 2011
- Honeywell International Inc.
- Ulrich Bonne
- G01 - MEASURING TESTING
Information Patent Grant
Method for operating an optical emission spectrometer
- Patent number 7,911,606
- Issue date Mar 22, 2011
- Spectro Analytical Instruments GmbH
- Heinz-Gerd Joosten
- G01 - MEASURING TESTING
Information Patent Grant
Spectrometer optics comprising positionable slots and method for th...
- Patent number 7,876,433
- Issue date Jan 25, 2011
- Spectro Analytical Instruments GmbH
- Heinz-Gerd Joosten
- G01 - MEASURING TESTING
Information Patent Grant
Analysis apparatus for analyzing a specimen by obtaining electromag...
- Patent number 7,869,036
- Issue date Jan 11, 2011
- Canon Kabushiki Kaisha
- Kousuke Kajiki
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
OPTICAL SYSTEM FOR SPECTROMETERS
- Publication number 20220397455
- Publication date Dec 15, 2022
- Hitachi High-Tech Analytical Science GmbH
- Heinz Jürgen Graf
- G01 - MEASURING TESTING
Information Patent Application
SPECTROMETER AND MANUFACTURING METHOD THEREOF
- Publication number 20190339129
- Publication date Nov 7, 2019
- OtO Photonics Inc.
- CHIEN-HSIANG HUNG
- G01 - MEASURING TESTING
Information Patent Application
Curved Grating Spectrometer and Wavelength Multiplexer or Demultipl...
- Publication number 20170102270
- Publication date Apr 13, 2017
- Electronic Photonic IC Inc. (EPIC Inc.)
- Seng-Tiong Ho
- G02 - OPTICS
Information Patent Application
HIGH EFFICIENCY MONO-ORDER CONCAVE DIFFRACTION GRATING
- Publication number 20140233891
- Publication date Aug 21, 2014
- Pierre Pottier
- G02 - OPTICS
Information Patent Application
OPTICAL MODULE OF MICRO SPECTROMETER WITH TAPERED SLIT AND SLIT STR...
- Publication number 20140002820
- Publication date Jan 2, 2014
- OtO Photonics, Inc.
- Cheng-Hao Ko
- G02 - OPTICS
Information Patent Application
Curved Grating Spectrometer and Wavelength Multiplexer or Demultipl...
- Publication number 20130272695
- Publication date Oct 17, 2013
- Seng-Tiong Ho
- G02 - OPTICS
Information Patent Application
SPECTRAL COLORIMETRIC APPARATUS AND IMAGE FORMING APPARATUS USING T...
- Publication number 20130250295
- Publication date Sep 26, 2013
- Canon Kabushiki Kaisha
- Tokuji Takizawa
- G01 - MEASURING TESTING
Information Patent Application
SPECTRAL COLORIMETRIC APPARATUS AND IMAGE FORMING APPARATUS INCLUDI...
- Publication number 20130242299
- Publication date Sep 19, 2013
- Canon Kabushiki Kaisha
- Hisanori Kobayashi
- G01 - MEASURING TESTING
Information Patent Application
SPECTROMETER AND IMAGE FORMING APPARATUS HAVING THE SAME
- Publication number 20130201478
- Publication date Aug 8, 2013
- Canon Kabushiki Kaisha
- Masayasu Teramura
- G01 - MEASURING TESTING
Information Patent Application
TEMPERATURE-COMPENSATED SPECTROMETER
- Publication number 20120327416
- Publication date Dec 27, 2012
- BRUKER ELEMENTAL GMBH
- Rainer Simons
- G01 - MEASURING TESTING
Information Patent Application
SPECTRAL COLORIMETRIC APPARATUS AND IMAGE FORMING APPARATUS INCLUDI...
- Publication number 20120105851
- Publication date May 3, 2012
- Canon Kabushiki Kaisha
- Hisanori Kobayashi
- G01 - MEASURING TESTING
Information Patent Application
RING GRATING SPECTROMETER
- Publication number 20110273707
- Publication date Nov 10, 2011
- UNIVERSITY OF MAINE SYSTEM BOARD OF TRUSTEES
- David Roger LABRECQUE
- G01 - MEASURING TESTING
Information Patent Application
SPECTROMETER CAPABLE OF ELIMINATING SIDE-TAIL EFFECTS
- Publication number 20110170099
- Publication date Jul 14, 2011
- Cheng-Hao KO
- G01 - MEASURING TESTING
Information Patent Application
CALIBRATION APPARATUS AND CALIBRATION METHOD
- Publication number 20110128542
- Publication date Jun 2, 2011
- Canon Kabushiki Kaisha
- Hisato Sekine
- G01 - MEASURING TESTING
Information Patent Application
Optical System
- Publication number 20110080584
- Publication date Apr 7, 2011
- OtO Photonics, Inc.
- Cheng-Hao Ko
- G02 - OPTICS
Information Patent Application
SPECTRAL OPTICAL ELEMENT, SPECTRAL COLORIMETRIC APPARATUS, AND IMAG...
- Publication number 20110026022
- Publication date Feb 3, 2011
- Canon Kabushiki Kaisha
- Tokuji Takizawa
- G02 - OPTICS
Information Patent Application
DIFFRACTION ELEMENT, MANUFACTURING METHOD FOR DIFFRACTION ELEMENT,...
- Publication number 20100284084
- Publication date Nov 11, 2010
- Canon Kabushiki Kaisha
- Yoshihiro Ishibe
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
SPECTRAL COLORIMETRIC APPARATUS AND IMAGE FORMING APPARATUS USING T...
- Publication number 20100278543
- Publication date Nov 4, 2010
- Canon Kabushiki Kaisha
- Tokuji Takizawa
- G01 - MEASURING TESTING
Information Patent Application
SPECTROMETER AND IMAGE FORMING APPARATUS HAVING THE SAME
- Publication number 20100277731
- Publication date Nov 4, 2010
- Canon Kabushiki Kaisha
- Masayasu Teramura
- G01 - MEASURING TESTING
Information Patent Application
A THERMAL PUMP
- Publication number 20100239436
- Publication date Sep 23, 2010
- Honeywell International Inc.
- Ulrich Bonne
- G01 - MEASURING TESTING
Information Patent Application
Spectrometer Optics Comprising Positionable Slots and Method for th...
- Publication number 20090284740
- Publication date Nov 19, 2009
- SPECTRO ANALYTICAL INSTRUMENTS GMBH & CO. KG
- Heinz-Gerd Joosten
- G01 - MEASURING TESTING
Information Patent Application
CHEMICAL IMPEDANCE DETECTORS FOR FLUID ANALYZERS
- Publication number 20090184724
- Publication date Jul 23, 2009
- Honeywell International Inc.
- Ulrich Bonne
- G01 - MEASURING TESTING
Information Patent Application
ELECTROMAGNETIC ANALYSIS APPARATUS
- Publication number 20090059226
- Publication date Mar 5, 2009
- Canon Kabushiki Kaisha
- Kousuke Kajiki
- G01 - MEASURING TESTING
Information Patent Application
CURVED GRATING SPECTROMETER WITH VERY HIGH WAVELENGTH RESOLUTION
- Publication number 20080285919
- Publication date Nov 20, 2008
- Seng-Tiong Ho
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL SYSTEM
- Publication number 20080225392
- Publication date Sep 18, 2008
- Cheng-Hao KO
- G02 - OPTICS
Information Patent Application
Method for Operating an Optical Emission Spectrometer
- Publication number 20080198377
- Publication date Aug 21, 2008
- Heinz-Gerd Joosten
- G01 - MEASURING TESTING
Information Patent Application
SPECTROSCOPE AND SPECTROSCOPIC METHOD
- Publication number 20070291266
- Publication date Dec 20, 2007
- Canon Kabushiki Kaisha
- YOICHIRO HANDA
- G01 - MEASURING TESTING
Information Patent Application
Array detector coupled spectroanalytical system and graded blaze an...
- Publication number 20070182961
- Publication date Aug 9, 2007
- Suneet Chadha
- G01 - MEASURING TESTING
Information Patent Application
CHEMICAL IMPEDANCE DETECTORS FOR FLUID ANALYZERS
- Publication number 20070113642
- Publication date May 24, 2007
- Honeywell International Inc.
- Ulrich Bonne
- G01 - MEASURING TESTING
Information Patent Application
AN OPTICAL MICRO-SPECTROMETER
- Publication number 20060262303
- Publication date Nov 23, 2006
- Honeywell International Inc.
- Ulrich Bonne
- G01 - MEASURING TESTING

Rowland circle spectrometers

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Optical system for spectrometers

Diffraction grating design

Optical emission spectrometer with cascaded charge storage devices

Light guiding member, detector, spectral colorimetric apparatus, an...

Frame, spectroscope, spectrometry unit, and image forming apparatus

Spectrometer and optical input portion thereof

Spectrometer and manufacturing method thereof

Curved grating spectrometer and wavelength multiplexer or demultipl...

Optical module of micro spectrometer with tapered slit and slit str...

Curved grating spectrometer and wavelength multiplexer or demultipl...

Spectrometer and image forming apparatus having the same

High efficiency mono-order concave diffraction grating

Optical system and manufacturing method thereof

Spectral colorimetric apparatus and image forming apparatus includi...

Temperature-compensated spectrometer

Curved grating spectrometer and wavelength multiplexer or demultipl...

Diffraction element, manufacturing method for diffraction element,...

Spectral colorimetric apparatus and image forming apparatus using t...

Calibration apparatus and calibration method

Spectrometer capable of eliminating side-tail effects

Spectral colorimetric apparatus and image forming apparatus includi...

Spectral colorimetric apparatus and image forming apparatus using t...

Curved grating spectrometer and wavelength multiplexer or demultipl...

Diffraction optical element, spectral colorimetric apparatus, and i...

Spectrometer and image forming apparatus having the same

Non-astigmatic imaging with matched pairs of spherically bent refle...

Chemical impedance detectors for fluid analyzers

Method for operating an optical emission spectrometer

Spectrometer optics comprising positionable slots and method for th...

Analysis apparatus for analyzing a specimen by obtaining electromag...

Patents Applicationslast 30 patents

OPTICAL SYSTEM FOR SPECTROMETERS

SPECTROMETER AND MANUFACTURING METHOD THEREOF

Curved Grating Spectrometer and Wavelength Multiplexer or Demultipl...

HIGH EFFICIENCY MONO-ORDER CONCAVE DIFFRACTION GRATING

OPTICAL MODULE OF MICRO SPECTROMETER WITH TAPERED SLIT AND SLIT STR...

Curved Grating Spectrometer and Wavelength Multiplexer or Demultipl...

SPECTRAL COLORIMETRIC APPARATUS AND IMAGE FORMING APPARATUS USING T...

SPECTRAL COLORIMETRIC APPARATUS AND IMAGE FORMING APPARATUS INCLUDI...

SPECTROMETER AND IMAGE FORMING APPARATUS HAVING THE SAME

TEMPERATURE-COMPENSATED SPECTROMETER

SPECTRAL COLORIMETRIC APPARATUS AND IMAGE FORMING APPARATUS INCLUDI...

RING GRATING SPECTROMETER

SPECTROMETER CAPABLE OF ELIMINATING SIDE-TAIL EFFECTS

CALIBRATION APPARATUS AND CALIBRATION METHOD

Optical System

SPECTRAL OPTICAL ELEMENT, SPECTRAL COLORIMETRIC APPARATUS, AND IMAG...

DIFFRACTION ELEMENT, MANUFACTURING METHOD FOR DIFFRACTION ELEMENT,...

SPECTRAL COLORIMETRIC APPARATUS AND IMAGE FORMING APPARATUS USING T...

SPECTROMETER AND IMAGE FORMING APPARATUS HAVING THE SAME

A THERMAL PUMP

Spectrometer Optics Comprising Positionable Slots and Method for th...

CHEMICAL IMPEDANCE DETECTORS FOR FLUID ANALYZERS

ELECTROMAGNETIC ANALYSIS APPARATUS

CURVED GRATING SPECTROMETER WITH VERY HIGH WAVELENGTH RESOLUTION

OPTICAL SYSTEM

Method for Operating an Optical Emission Spectrometer

SPECTROSCOPE AND SPECTROSCOPIC METHOD

Array detector coupled spectroanalytical system and graded blaze an...

CHEMICAL IMPEDANCE DETECTORS FOR FLUID ANALYZERS

AN OPTICAL MICRO-SPECTROMETER