secondary emission

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CPC
G01N2223/07

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

Current Industry

G01N2223/07secondary emission

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Nondestructive inspection system
- Patent number 12,366,542
- Issue date Jul 22, 2025
- Topcon Corporation
- Shigenori Nagano
- G01 - MEASURING TESTING
Information Patent Grant
System and method for soil characterization
- Patent number 12,360,099
- Issue date Jul 15, 2025
- X-Centric Sciences Inc.
- Roozbeh Ravansari
- G01 - MEASURING TESTING
Information Patent Grant
X-ray fluorescence system and x-ray source with electrically insula...
- Patent number 12,360,067
- Issue date Jul 15, 2025
- Sigray, Inc.
- Wenbing Yun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
X-ray fluorescence spectroscopy analysis
- Patent number 12,345,667
- Issue date Jul 1, 2025
- Schlumberger Technology Corporation
- Sergey Mikhailovich Makarychev-Mikhailov
- G01 - MEASURING TESTING
Information Patent Grant
Measurement system and measurement method
- Patent number 12,345,159
- Issue date Jul 1, 2025
- Komatsu Ltd.
- Yuichi Kodama
- E21 - EARTH DRILLING MINING
Information Patent Grant
Multiple secondary electron beam alignment method, multiple seconda...
- Patent number 12,339,241
- Issue date Jun 24, 2025
- NuFlare Technology, Inc.
- Koichi Ishii
- G01 - MEASURING TESTING
Information Patent Grant
Method for detection of soil heavy metal pollution using unmanned a...
- Patent number 12,339,240
- Issue date Jun 24, 2025
- University of Electronic Science and Technology of China
- Fang Huang
- B64 - AIRCRAFT AVIATION COSMONAUTICS
Information Patent Grant
Pulsed neutron apparatus and method for using same to analyze core...
- Patent number 12,332,193
- Issue date Jun 17, 2025
- Core Laboratories LP
- Derek Raymond Beckett
- G01 - MEASURING TESTING
Information Patent Grant
Method for calibrating parameter error of electron probe microanaly...
- Patent number 12,332,195
- Issue date Jun 17, 2025
- Shanghai Institute of Measurement and Testing Technology
- Lihua Lei
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam device
- Patent number 12,334,299
- Issue date Jun 17, 2025
- HITACHI HIGH-TECH CORPORATION
- U Oh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Electron spectroscopy based techniques for determining various chem...
- Patent number 12,326,410
- Issue date Jun 10, 2025
- COZAI LTD
- Hagai Cohen
- G01 - MEASURING TESTING
Information Patent Grant
Automatic particle beam focusing
- Patent number 12,327,342
- Issue date Jun 10, 2025
- FEI Company
- Yuchen Deng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Sample component determination method, sample component determinati...
- Patent number 12,326,409
- Issue date Jun 10, 2025
- Shimadzu Corporation
- Akira Ogoshi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for quantitatively characterizing dendrite segregation and d...
- Patent number 12,326,434
- Issue date Jun 10, 2025
- NCS TESTING TECHNOLOGY CO., LTD
- Dongling Li
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for analyzing core using x-ray fluorescence
- Patent number 12,325,345
- Issue date Jun 10, 2025
- Veracio Ltd.
- Peter Kanck
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Quality control evaluation method of cyanate ester matrix resin mat...
- Patent number 12,320,765
- Issue date Jun 3, 2025
- THE AEROSPACE CORPORATION
- Rafael J. Zaldivar
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for analyzing prostate biopsy
- Patent number 12,306,172
- Issue date May 20, 2025
- ProSight Ltd.
- Meir Weksler
- G01 - MEASURING TESTING
Information Patent Grant
Device for closing the input opening in the sample chamber in an x-...
- Patent number 12,298,262
- Issue date May 13, 2025
- Wolfgang Gehrlein
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for stress testing of materials using laser accel...
- Patent number 12,298,263
- Issue date May 13, 2025
- Institut National de la Recherche Scientifique
- Patrizio Antici
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray analysis system and method with multi-source design
- Patent number 12,292,396
- Issue date May 6, 2025
- SHENZHEN ANGSTROM EXCELLENCE TECHNOLOGY CO. LTD
- Xuena Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Downhole lithium detection systems and methods
- Patent number 12,282,136
- Issue date Apr 22, 2025
- Schlumberger Technology Corporation
- Christian Stoller
- G01 - MEASURING TESTING
Information Patent Grant
X-ray fluorescence analyzer
- Patent number 12,265,042
- Issue date Apr 1, 2025
- Shimadzu Corporation
- Yasuyuki Okamoto
- G01 - MEASURING TESTING
Information Patent Grant
X-ray fluorescence spectrometer
- Patent number 12,247,935
- Issue date Mar 11, 2025
- Rigaku Corporation
- Yasuhiko Nagoshi
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 12,241,848
- Issue date Mar 4, 2025
- Canon Anelva Corporation
- Takeo Tsukamoto
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Spectrometer
- Patent number 12,235,228
- Issue date Feb 25, 2025
- EasyXAFS, LLC
- William Holden
- G01 - MEASURING TESTING
Information Patent Grant
X-ray fluorescence spectrometer
- Patent number 12,235,229
- Issue date Feb 25, 2025
- Rigaku Corporation
- Yoshiyuki Kataoka
- G01 - MEASURING TESTING
Information Patent Grant
Method for moisture measurement
- Patent number 12,228,530
- Issue date Feb 18, 2025
- Chrysos Corporation Limited
- James Tickner
- G01 - MEASURING TESTING
Information Patent Grant
X-ray detector system with at least two stacked flat Bragg diffractors
- Patent number 12,209,977
- Issue date Jan 28, 2025
- Sigray, Inc.
- Wenbing Yun
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Deposition system and method
- Patent number 12,211,756
- Issue date Jan 28, 2025
- Taiwan Semiconductor Manufacturing Co., Ltd
- Wen-Hao Cheng
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Method for measuring distribution of pores in electrode for seconda...
- Patent number 12,196,651
- Issue date Jan 14, 2025
- LG ENERGY SOLUTION, LTD.
- Jung Hoon Han
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
THIN FILM THICKNESS MEASURING DEVICE AND THIN FILM THICKNESS MEASUR...
- Publication number 20250237621
- Publication date Jul 24, 2025
- SAMSUNG DISPLAY CO., LTD.
- Won Hyuk JANG
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR OPERATING AN X-RAY DEVICE, X-RAY DEVICE, COMPUTER PROGRA...
- Publication number 20250231123
- Publication date Jul 17, 2025
- Siemens Healthineers AG
- Markus Kowarschik
- G01 - MEASURING TESTING
Information Patent Application
IMAGING SYSTEMS WITH SMALL X-RAY SOURCES
- Publication number 20250231131
- Publication date Jul 17, 2025
- SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
- Yurun LIU
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION DEVICE, INSPECTION ELEMENT, AND INSPECTION METHOD
- Publication number 20250231124
- Publication date Jul 17, 2025
- Hitachi High-Tech Corporation
- Yoshihiro ANAN
- G01 - MEASURING TESTING
Information Patent Application
Analysis System, Analysis Method, and Analysis Program
- Publication number 20250208076
- Publication date Jun 26, 2025
- Hitachi High-Tech Corporation
- Keiichi TANAKA
- G01 - MEASURING TESTING
Information Patent Application
CHANGING THE ORIENTATION OF THE X-RAY EMITTER IN ORDER TO VARY THE...
- Publication number 20250203744
- Publication date Jun 19, 2025
- Siemens Healthineers AG
- Joerg FREUDENBERGER
- G01 - MEASURING TESTING
Information Patent Application
ADJUSTING UNIT FOR AN X-RAY OPTICAL ELEMENT IN AN X-RAY FLUORESCENC...
- Publication number 20250198955
- Publication date Jun 19, 2025
- Helmut Fischer GmbH Institut fuer Elektronik und Messtechnik
- Bruno Schroth
- G01 - MEASURING TESTING
Information Patent Application
SPECTROMETER
- Publication number 20250164421
- Publication date May 22, 2025
- EasyXAFS, LLC
- William Holden
- G01 - MEASURING TESTING
Information Patent Application
Systems And Methods For Analyzing Core Using X-Ray Fluorescence
- Publication number 20250162487
- Publication date May 22, 2025
- Veracio Ltd
- Peter Kanck
- B60 - VEHICLES IN GENERAL
Information Patent Application
MONITORING NANOPARTICLE ADDITIVES IN WELLBORE TREATMENT FLUID USING...
- Publication number 20250146918
- Publication date May 8, 2025
- Halliburton Energy Services, Inc.
- Preston Andrew May
- B82 - NANO-TECHNOLOGY
Information Patent Application
SYSTEM AND METHOD FOR X-RAY ABSORPTION SPECTROSCOPY USING SPECTRAL...
- Publication number 20250146960
- Publication date May 8, 2025
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Application
DOWNHOLE LITHIUM DETECTION SYSTEMS AND METHODS
- Publication number 20250102699
- Publication date Mar 27, 2025
- SCHLUMBERGER TECHNOLOGY CORPORATION
- Christian Stoller
- G01 - MEASURING TESTING
Information Patent Application
ANALYSIS SYSTEM, ANALYSIS DEVICE, AND CONTROL METHOD
- Publication number 20250067690
- Publication date Feb 27, 2025
- Shimadzu Corporation
- Keijiro SUZUKI
- G01 - MEASURING TESTING
Information Patent Application
X-RAY FLUORESCENCE ANALYZER AND POWER SUPPLY DEVICE
- Publication number 20250031293
- Publication date Jan 23, 2025
- Shimadzu Corporation
- Yohei UKAI
- G01 - MEASURING TESTING
Information Patent Application
CROSS-TALK CANCELLATION IN MULTIPLE CHARGED-PARTICLE BEAM INSPECTION
- Publication number 20250006456
- Publication date Jan 2, 2025
- ASML NETHERLANDS B.V.
- Wei FANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PATTERNED X-RAY EMITTING TARGET
- Publication number 20250006451
- Publication date Jan 2, 2025
- NOVA MEASURING INSTRUMENTS INC.
- David A. REED
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
X-RAY FLUORESCENCE SPECTROMETER
- Publication number 20240418661
- Publication date Dec 19, 2024
- Rigaku Corporation
- Yoshiyuki KATAOKA
- G01 - MEASURING TESTING
Information Patent Application
X-RAY ANALYZER
- Publication number 20240402101
- Publication date Dec 5, 2024
- Shimadzu Corporation
- Tetsuya YONEDA
- G01 - MEASURING TESTING
Information Patent Application
AN X-RAY FLUORESCENCE SYSTEM
- Publication number 20240385129
- Publication date Nov 21, 2024
- Commonwealth Scientific and Industrial Research Organisation
- Brianna Ganly
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20240369502
- Publication date Nov 7, 2024
- Canon ANELVA Corporation
- Takeo TSUKAMOTO
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
X-RAY ANALYZER
- Publication number 20240361261
- Publication date Oct 31, 2024
- Shimadzu Corporation
- Keijiro SUZUKI
- G01 - MEASURING TESTING
Information Patent Application
X-RAY FLUORESCENCE SPECTROMETER
- Publication number 20240361263
- Publication date Oct 31, 2024
- Rigaku Corporation
- Yasuhiko Nagoshi
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR IN-SITU U-Pb DATING OF HETEROGENEOUS MINERALS
- Publication number 20240319137
- Publication date Sep 26, 2024
- Zijin Mining Group Co., Ltd.
- Youye ZHENG
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT OBJECT AND METHOD FOR VERIFYING A CALIBRATION OF AN X-R...
- Publication number 20240310308
- Publication date Sep 19, 2024
- Helmut Fischer GmbH Institut fuer Elektronik und Messtechnik
- Martin Leibfritz
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF USING A DISSOLVABLE DEPLOYMENT DEVICE FOR THE TRANSFER OF...
- Publication number 20240309759
- Publication date Sep 19, 2024
- Talgat Shokanov
- C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Information Patent Application
METHOD OF DETERMINING HAFNIUM CONTENT IN METALLIC ZIRCONIUM AND ALL...
- Publication number 20240295512
- Publication date Sep 5, 2024
- AKTSIONERNOE OBSHCHESTVO "CHEPETSKIJ MEKHANICHESKIJ ZAVOD
- Olga Alekseevna KARAVAEVA
- G01 - MEASURING TESTING
Information Patent Application
Non-Destructive Inspection Device
- Publication number 20240295511
- Publication date Sep 5, 2024
- Riken
- Yasuo WAKABAYASHI
- G01 - MEASURING TESTING
Information Patent Application
Systems And Methods For Analyzing Core Using X-Ray Fluorescence
- Publication number 20240286541
- Publication date Aug 29, 2024
- Veracio Ltd
- Peter Kanck
- B60 - VEHICLES IN GENERAL
Information Patent Application
X-RAY DETECTOR SYSTEM WITH AT LEAST TWO STACKED FLAT BRAGG DIFFRACTORS
- Publication number 20240280515
- Publication date Aug 22, 2024
- Sigray, Inc.
- Wenbing Yun
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
NON-DESTRUCTIVE INSPECTION DEVICE AND NON-DESTRUCTIVE INSPECTION SY...
- Publication number 20240272102
- Publication date Aug 15, 2024
- TOPCON CORPORATION
- Shigenori NAGANO
- G01 - MEASURING TESTING

secondary emission

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Nondestructive inspection system

System and method for soil characterization

X-ray fluorescence system and x-ray source with electrically insula...

X-ray fluorescence spectroscopy analysis

Measurement system and measurement method

Multiple secondary electron beam alignment method, multiple seconda...

Method for detection of soil heavy metal pollution using unmanned a...

Pulsed neutron apparatus and method for using same to analyze core...

Method for calibrating parameter error of electron probe microanaly...

Charged particle beam device

Electron spectroscopy based techniques for determining various chem...

Automatic particle beam focusing

Sample component determination method, sample component determinati...

Method for quantitatively characterizing dendrite segregation and d...

Systems and methods for analyzing core using x-ray fluorescence

Quality control evaluation method of cyanate ester matrix resin mat...

Method and system for analyzing prostate biopsy

Device for closing the input opening in the sample chamber in an x-...

Method and system for stress testing of materials using laser accel...

X-ray analysis system and method with multi-source design

Downhole lithium detection systems and methods

X-ray fluorescence analyzer

X-ray fluorescence spectrometer

Inspection apparatus and inspection method

Spectrometer

X-ray fluorescence spectrometer

Method for moisture measurement

X-ray detector system with at least two stacked flat Bragg diffractors

Deposition system and method

Method for measuring distribution of pores in electrode for seconda...

Patents Applicationslast 30 patents

THIN FILM THICKNESS MEASURING DEVICE AND THIN FILM THICKNESS MEASUR...

METHOD FOR OPERATING AN X-RAY DEVICE, X-RAY DEVICE, COMPUTER PROGRA...

IMAGING SYSTEMS WITH SMALL X-RAY SOURCES

INSPECTION DEVICE, INSPECTION ELEMENT, AND INSPECTION METHOD

Analysis System, Analysis Method, and Analysis Program

CHANGING THE ORIENTATION OF THE X-RAY EMITTER IN ORDER TO VARY THE...

ADJUSTING UNIT FOR AN X-RAY OPTICAL ELEMENT IN AN X-RAY FLUORESCENC...

SPECTROMETER

Systems And Methods For Analyzing Core Using X-Ray Fluorescence

MONITORING NANOPARTICLE ADDITIVES IN WELLBORE TREATMENT FLUID USING...

SYSTEM AND METHOD FOR X-RAY ABSORPTION SPECTROSCOPY USING SPECTRAL...

DOWNHOLE LITHIUM DETECTION SYSTEMS AND METHODS

ANALYSIS SYSTEM, ANALYSIS DEVICE, AND CONTROL METHOD

X-RAY FLUORESCENCE ANALYZER AND POWER SUPPLY DEVICE

CROSS-TALK CANCELLATION IN MULTIPLE CHARGED-PARTICLE BEAM INSPECTION

PATTERNED X-RAY EMITTING TARGET

X-RAY FLUORESCENCE SPECTROMETER

X-RAY ANALYZER

AN X-RAY FLUORESCENCE SYSTEM

INSPECTION APPARATUS AND INSPECTION METHOD

X-RAY ANALYZER

X-RAY FLUORESCENCE SPECTROMETER

METHOD FOR IN-SITU U-Pb DATING OF HETEROGENEOUS MINERALS

MEASUREMENT OBJECT AND METHOD FOR VERIFYING A CALIBRATION OF AN X-R...

METHOD OF USING A DISSOLVABLE DEPLOYMENT DEVICE FOR THE TRANSFER OF...

METHOD OF DETERMINING HAFNIUM CONTENT IN METALLIC ZIRCONIUM AND ALL...

Non-Destructive Inspection Device

Systems And Methods For Analyzing Core Using X-Ray Fluorescence

X-RAY DETECTOR SYSTEM WITH AT LEAST TWO STACKED FLAT BRAGG DIFFRACTORS

NON-DESTRUCTIVE INSPECTION DEVICE AND NON-DESTRUCTIVE INSPECTION SY...