secondary emission

Industry

CPC
G01N2223/07

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

Current Industry

G01N2223/07secondary emission

Industries

Patents Grantslast 30 patents

Information Patent Grant
X-ray detector system with at least two stacked flat Bragg diffractors
- Patent number 12,209,977
- Issue date Jan 28, 2025
- Sigray, Inc.
- Wenbing Yun
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Deposition system and method
- Patent number 12,211,756
- Issue date Jan 28, 2025
- Taiwan Semiconductor Manufacturing Co., Ltd
- Wen-Hao Cheng
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Method for measuring distribution of pores in electrode for seconda...
- Patent number 12,196,651
- Issue date Jan 14, 2025
- LG ENERGY SOLUTION, LTD.
- Jung Hoon Han
- G01 - MEASURING TESTING
Information Patent Grant
Imaging systems and methods of operating the same
- Patent number 12,196,693
- Issue date Jan 14, 2025
- SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
- Peiyan Cao
- G01 - MEASURING TESTING
Information Patent Grant
Methods for growing crystals on QCM sensors
- Patent number 12,195,840
- Issue date Jan 14, 2025
- Saudi Arabian Oil Company
- Ayrat Gizzatov
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Apparatus to operate a quality control in industrial production lin...
- Patent number 12,181,429
- Issue date Dec 31, 2024
- DE.TEC.TOR S.r.l.
- Giuseppe Pitta'
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam apparatus
- Patent number 12,169,182
- Issue date Dec 17, 2024
- HITACHI HIGH-TECH CORPORATION
- Wei Chean Tan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Identification of mycotoxin absorption materials in clay deposits
- Patent number 12,158,461
- Issue date Dec 3, 2024
- Halliburton Energy Services, Inc.
- Marina Carbo
- G01 - MEASURING TESTING
Information Patent Grant
X-ray fluorescence analyzer
- Patent number 12,135,299
- Issue date Nov 5, 2024
- Shimadzu Corporation
- Takuro Izumi
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle detection for spectroscopic techniques
- Patent number 12,117,406
- Issue date Oct 15, 2024
- VG Systems Limited
- Bryan Barnard
- G01 - MEASURING TESTING
Information Patent Grant
Serial arrangement having multiple plies of asymmetric filter media...
- Patent number 12,115,502
- Issue date Oct 15, 2024
- Sartorius Stedim Biotech GmbH
- Volkmar Thom
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Systems and methods for determining the mineralogy of drill solids
- Patent number 12,111,273
- Issue date Oct 8, 2024
- Schlumberger Technology Corporation
- Jonathan Mitchell
- E21 - EARTH DRILLING MINING
Information Patent Grant
X-ray spectrometer and pulse height prediction program
- Patent number 12,105,035
- Issue date Oct 1, 2024
- Rigaku Corporation
- Tsutomu Tada
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for monitoring beam profile and power
- Patent number 12,105,036
- Issue date Oct 1, 2024
- ASML Netherlands B.V.
- Jian Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Measurement of metal or alloy coating
- Patent number 12,092,594
- Issue date Sep 17, 2024
- Schlumberger Technology Corporation
- Jill F. Geddes
- G01 - MEASURING TESTING
Information Patent Grant
Cross-talk cancellation in multiple charged-particle beam inspection
- Patent number 12,080,513
- Issue date Sep 3, 2024
- ASML Netherlands B.V.
- Wei Fang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Monitoring properties of X-ray beam during X-ray analysis
- Patent number 12,078,604
- Issue date Sep 3, 2024
- BRUKER TECHNOLOGIES LTD.
- Alexander Krokhmal
- G01 - MEASURING TESTING
Information Patent Grant
Radiation analysis system, charged particle beam system, and radiat...
- Patent number 12,078,763
- Issue date Sep 3, 2024
- HITACHI HIGH-TECH CORPORATION
- Akira Takano
- G01 - MEASURING TESTING
Information Patent Grant
Method for temperature monitoring in cryo-electron microscopy
- Patent number 12,070,753
- Issue date Aug 27, 2024
- FEI Company
- Jakub Drahotsky
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Method and system for high speed detection of diamonds
- Patent number 12,072,306
- Issue date Aug 27, 2024
- University of Johannesburg
- Simon H. Connell
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Grant
Petro-steering methodologies during under balanced coiled tubing (U...
- Patent number 12,065,929
- Issue date Aug 20, 2024
- Saudi Arabian Oil Company
- Ferney Geovany Moreno Sierra
- G01 - MEASURING TESTING
Information Patent Grant
Defect characterization method and apparatus
- Patent number 12,067,704
- Issue date Aug 20, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Ning Huang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Estimating heights of defects in a wafer by scaling a 3D model usin...
- Patent number 12,057,336
- Issue date Aug 6, 2024
- Samsung Electronics Co., Ltd.
- Shashank Shrikant Agashe
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Correlative multimodal chemical imaging via machine learning
- Patent number 12,057,304
- Issue date Aug 6, 2024
- UT-Battelle, LLC
- Olga S. Ovchinnikova
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Defect inspection method and defect inspection device
- Patent number 12,039,716
- Issue date Jul 16, 2024
- HITACHI HIGH-TECH CORPORATION
- Takashi Hiroi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Scanning mode application of neutron-induced gamma analysis for soi...
- Patent number 12,031,928
- Issue date Jul 9, 2024
- Auburn University
- Bryan A. Chin
- A01 - AGRICULTURE FORESTRY ANIMAL HUSBANDRY HUNTING TRAPPING FISHING
Information Patent Grant
Method of using a dissolvable deployment device for the transfer of...
- Patent number 12,025,001
- Issue date Jul 2, 2024
- Talgat Shokanov
- E21 - EARTH DRILLING MINING
Information Patent Grant
Apparatus and method for x-ray fluorescence analysis
- Patent number 12,007,380
- Issue date Jun 11, 2024
- Malvern Panalytical B.V.
- Bruno Vrebos
- G01 - MEASURING TESTING
Information Patent Grant
Patterned x-ray emitting target
- Patent number 11,996,259
- Issue date May 28, 2024
- NOVA MEASURING INSTRUMENTS INC.
- David A. Reed
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Microfluidic device and method for the nanostructure sequencing of...
- Patent number 11,986,823
- Issue date May 21, 2024
- Robert Bosch GmbH
- Franz Laermer
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
X-RAY FLUORESCENCE ANALYZER AND POWER SUPPLY DEVICE
- Publication number 20250031293
- Publication date Jan 23, 2025
- Shimadzu Corporation
- Yohei UKAI
- G01 - MEASURING TESTING
Information Patent Application
CROSS-TALK CANCELLATION IN MULTIPLE CHARGED-PARTICLE BEAM INSPECTION
- Publication number 20250006456
- Publication date Jan 2, 2025
- ASML NETHERLANDS B.V.
- Wei FANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PATTERNED X-RAY EMITTING TARGET
- Publication number 20250006451
- Publication date Jan 2, 2025
- NOVA MEASURING INSTRUMENTS INC.
- David A. REED
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
X-RAY FLUORESCENCE SPECTROMETER
- Publication number 20240418661
- Publication date Dec 19, 2024
- Rigaku Corporation
- Yoshiyuki KATAOKA
- G01 - MEASURING TESTING
Information Patent Application
X-RAY ANALYZER
- Publication number 20240402101
- Publication date Dec 5, 2024
- Shimadzu Corporation
- Tetsuya YONEDA
- G01 - MEASURING TESTING
Information Patent Application
AN X-RAY FLUORESCENCE SYSTEM
- Publication number 20240385129
- Publication date Nov 21, 2024
- Commonwealth Scientific and Industrial Research Organisation
- Brianna Ganly
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20240369502
- Publication date Nov 7, 2024
- Canon ANELVA Corporation
- Takeo TSUKAMOTO
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
X-RAY ANALYZER
- Publication number 20240361261
- Publication date Oct 31, 2024
- Shimadzu Corporation
- Keijiro SUZUKI
- G01 - MEASURING TESTING
Information Patent Application
X-RAY FLUORESCENCE SPECTROMETER
- Publication number 20240361263
- Publication date Oct 31, 2024
- Rigaku Corporation
- Yasuhiko Nagoshi
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR IN-SITU U-Pb DATING OF HETEROGENEOUS MINERALS
- Publication number 20240319137
- Publication date Sep 26, 2024
- Zijin Mining Group Co., Ltd.
- Youye ZHENG
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT OBJECT AND METHOD FOR VERIFYING A CALIBRATION OF AN X-R...
- Publication number 20240310308
- Publication date Sep 19, 2024
- Helmut Fischer GmbH Institut fuer Elektronik und Messtechnik
- Martin Leibfritz
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF USING A DISSOLVABLE DEPLOYMENT DEVICE FOR THE TRANSFER OF...
- Publication number 20240309759
- Publication date Sep 19, 2024
- Talgat Shokanov
- C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Information Patent Application
METHOD OF DETERMINING HAFNIUM CONTENT IN METALLIC ZIRCONIUM AND ALL...
- Publication number 20240295512
- Publication date Sep 5, 2024
- AKTSIONERNOE OBSHCHESTVO "CHEPETSKIJ MEKHANICHESKIJ ZAVOD
- Olga Alekseevna KARAVAEVA
- G01 - MEASURING TESTING
Information Patent Application
Non-Destructive Inspection Device
- Publication number 20240295511
- Publication date Sep 5, 2024
- Riken
- Yasuo WAKABAYASHI
- G01 - MEASURING TESTING
Information Patent Application
Systems And Methods For Analyzing Core Using X-Ray Fluorescence
- Publication number 20240286541
- Publication date Aug 29, 2024
- Veracio Ltd
- Peter Kanck
- B60 - VEHICLES IN GENERAL
Information Patent Application
X-RAY DETECTOR SYSTEM WITH AT LEAST TWO STACKED FLAT BRAGG DIFFRACTORS
- Publication number 20240280515
- Publication date Aug 22, 2024
- Sigray, Inc.
- Wenbing Yun
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
NON-DESTRUCTIVE INSPECTION DEVICE AND NON-DESTRUCTIVE INSPECTION SY...
- Publication number 20240272102
- Publication date Aug 15, 2024
- TOPCON CORPORATION
- Shigenori NAGANO
- G01 - MEASURING TESTING
Information Patent Application
Direct Sampling from Phase-Separated Sample for Hydrophobicity Asse...
- Publication number 20240272101
- Publication date Aug 15, 2024
- DH Technologies Development Pte. Ltd.
- Thomas COVEY
- G01 - MEASURING TESTING
Information Patent Application
X-RAY SPECTROMETER AND PULSE HEIGHT PREDICTION PROGRAM
- Publication number 20240264098
- Publication date Aug 8, 2024
- Rigaku Corporation
- Tsutomu TADA
- G01 - MEASURING TESTING
Information Patent Application
NON-DESTRUCTIVE CLASSIFICATION OF SPECIMENS BASED ON ENERGY SIGNATU...
- Publication number 20240255449
- Publication date Aug 1, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Doron Girmonsky
- G01 - MEASURING TESTING
Information Patent Application
DETECTING DEFECTS IN ARRAY REGIONS ON SPECIMENS
- Publication number 20240255448
- Publication date Aug 1, 2024
- KLA Corporation
- Siqing Nie
- G01 - MEASURING TESTING
Information Patent Application
NONDESTRUCTIVE INSPECTION SYSTEM
- Publication number 20240192153
- Publication date Jun 13, 2024
- TOPCON CORPORATION
- Shigenori NAGANO
- G01 - MEASURING TESTING
Information Patent Application
QUALITY CONTROL EVALUATION METHOD OF CYANATE ESTER MATRIX RESIN MAT...
- Publication number 20240183805
- Publication date Jun 6, 2024
- The Aerospace Corporation
- Rafael J. ZALDIVAR
- G01 - MEASURING TESTING
Information Patent Application
CHARGED PARTICLE BEAM SYSTEM, CORRECTOR FOR ABERRATION CORRECTION O...
- Publication number 20240170249
- Publication date May 23, 2024
- ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
- Pieter Kruit
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR CALIBRATING PARAMETER ERROR OF ELECTRON PROBE MICROANALY...
- Publication number 20240151666
- Publication date May 9, 2024
- Shanghai Institute of Measurement and Testing Technology
- Lihua LEI
- G01 - MEASURING TESTING
Information Patent Application
Analyzing Method and Analyzer
- Publication number 20240142395
- Publication date May 2, 2024
- JEOL Ltd.
- Koki Kato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LUBRICATING OIL ANALYSIS
- Publication number 20240133859
- Publication date Apr 25, 2024
- ExxonMobil Technology and Engineering Company
- Andrew SATTERFIELD
- G01 - MEASURING TESTING
Information Patent Application
Dynamic Data Driven Detector Tuning for Improved Investigation of S...
- Publication number 20240110880
- Publication date Apr 4, 2024
- FEI Company
- Maurice PEEMEN
- G01 - MEASURING TESTING
Information Patent Application
Systems And Methods For Detecting Beam Displacement
- Publication number 20240110881
- Publication date Apr 4, 2024
- FEI Company
- James B. McGinn
- G01 - MEASURING TESTING
Information Patent Application
ELECTROSTATIC IMAGE DEVELOPER, PROCESS CARTRIDGE, IMAGE FORMING APP...
- Publication number 20240103391
- Publication date Mar 28, 2024
- FUJIFILM Business Innovation Corp.
- Yosuke TSURUMI
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

secondary emission

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

X-ray detector system with at least two stacked flat Bragg diffractors

Deposition system and method

Method for measuring distribution of pores in electrode for seconda...

Imaging systems and methods of operating the same

Methods for growing crystals on QCM sensors

Apparatus to operate a quality control in industrial production lin...

Charged particle beam apparatus

Identification of mycotoxin absorption materials in clay deposits

X-ray fluorescence analyzer

Charged particle detection for spectroscopic techniques

Serial arrangement having multiple plies of asymmetric filter media...

Systems and methods for determining the mineralogy of drill solids

X-ray spectrometer and pulse height prediction program

Method and apparatus for monitoring beam profile and power

Measurement of metal or alloy coating

Cross-talk cancellation in multiple charged-particle beam inspection

Monitoring properties of X-ray beam during X-ray analysis

Radiation analysis system, charged particle beam system, and radiat...

Method for temperature monitoring in cryo-electron microscopy

Method and system for high speed detection of diamonds

Petro-steering methodologies during under balanced coiled tubing (U...

Defect characterization method and apparatus

Estimating heights of defects in a wafer by scaling a 3D model usin...

Correlative multimodal chemical imaging via machine learning

Defect inspection method and defect inspection device

Scanning mode application of neutron-induced gamma analysis for soi...

Method of using a dissolvable deployment device for the transfer of...

Apparatus and method for x-ray fluorescence analysis

Patterned x-ray emitting target

Microfluidic device and method for the nanostructure sequencing of...

Patents Applicationslast 30 patents

X-RAY FLUORESCENCE ANALYZER AND POWER SUPPLY DEVICE

CROSS-TALK CANCELLATION IN MULTIPLE CHARGED-PARTICLE BEAM INSPECTION

PATTERNED X-RAY EMITTING TARGET

X-RAY FLUORESCENCE SPECTROMETER

X-RAY ANALYZER

AN X-RAY FLUORESCENCE SYSTEM

INSPECTION APPARATUS AND INSPECTION METHOD

X-RAY ANALYZER

X-RAY FLUORESCENCE SPECTROMETER

METHOD FOR IN-SITU U-Pb DATING OF HETEROGENEOUS MINERALS

MEASUREMENT OBJECT AND METHOD FOR VERIFYING A CALIBRATION OF AN X-R...

METHOD OF USING A DISSOLVABLE DEPLOYMENT DEVICE FOR THE TRANSFER OF...

METHOD OF DETERMINING HAFNIUM CONTENT IN METALLIC ZIRCONIUM AND ALL...

Non-Destructive Inspection Device

Systems And Methods For Analyzing Core Using X-Ray Fluorescence

X-RAY DETECTOR SYSTEM WITH AT LEAST TWO STACKED FLAT BRAGG DIFFRACTORS

NON-DESTRUCTIVE INSPECTION DEVICE AND NON-DESTRUCTIVE INSPECTION SY...

Direct Sampling from Phase-Separated Sample for Hydrophobicity Asse...

X-RAY SPECTROMETER AND PULSE HEIGHT PREDICTION PROGRAM

NON-DESTRUCTIVE CLASSIFICATION OF SPECIMENS BASED ON ENERGY SIGNATU...

DETECTING DEFECTS IN ARRAY REGIONS ON SPECIMENS

NONDESTRUCTIVE INSPECTION SYSTEM

QUALITY CONTROL EVALUATION METHOD OF CYANATE ESTER MATRIX RESIN MAT...

CHARGED PARTICLE BEAM SYSTEM, CORRECTOR FOR ABERRATION CORRECTION O...

METHOD FOR CALIBRATING PARAMETER ERROR OF ELECTRON PROBE MICROANALY...

Analyzing Method and Analyzer

LUBRICATING OIL ANALYSIS

Dynamic Data Driven Detector Tuning for Improved Investigation of S...

Systems And Methods For Detecting Beam Displacement

ELECTROSTATIC IMAGE DEVELOPER, PROCESS CARTRIDGE, IMAGE FORMING APP...