source created from radiated target

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CPC
G01N2223/204

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

Current Industry

G01N2223/204source created from radiated target

Industries

Patents Grantslast 30 patents

Information Patent Grant
System, method, and apparatus for x-ray backscatter inspection of p...
- Patent number 12,163,903
- Issue date Dec 10, 2024
- The Boeing Company
- Morteza Safai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High throughput 3D x-ray imaging system using a transmission x-ray...
- Patent number 12,153,001
- Issue date Nov 26, 2024
- Sigray, Inc.
- David Vine
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for measuring short-wavelength characteristic X-r...
- Patent number 12,099,025
- Issue date Sep 24, 2024
- THE 59TH INSTITUTE OF CHINA ORDNANCE INDUSTRY
- Lin Zheng
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for x-ray fluorescence analysis
- Patent number 12,007,380
- Issue date Jun 11, 2024
- Malvern Panalytical B.V.
- Bruno Vrebos
- G01 - MEASURING TESTING
Information Patent Grant
Patterned x-ray emitting target
- Patent number 11,996,259
- Issue date May 28, 2024
- NOVA MEASURING INSTRUMENTS INC.
- David A. Reed
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 11,977,038
- Issue date May 7, 2024
- Canon Anelva Corporation
- Takeo Tsukamoto
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 11,971,370
- Issue date Apr 30, 2024
- Canon Anelva Corporation
- Takeo Tsukamoto
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 11,940,394
- Issue date Mar 26, 2024
- Canon Anelva Corporation
- Takeo Tsukamoto
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 11,927,554
- Issue date Mar 12, 2024
- Canon Anelva Corporation
- Takeo Tsukamoto
- G01 - MEASURING TESTING
Information Patent Grant
Static CT detection device
- Patent number 11,925,183
- Issue date Mar 12, 2024
- Tsinghua University
- Zhiqiang Chen
- A22 - BUTCHERING MEAT TREATMENT PROCESSING POULTRY OR FISH
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 11,921,059
- Issue date Mar 5, 2024
- Canon Anelva Corporation
- Takeo Tsukamoto
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Multi-channel static CT device
- Patent number 11,906,447
- Issue date Feb 20, 2024
- Nuctech Company Limited
- Zhiqiang Chen
- G01 - MEASURING TESTING
Information Patent Grant
X-ray collimator and related X-ray inspection apparatus
- Patent number 11,854,712
- Issue date Dec 26, 2023
- DUE2LAB S.R.L.
- Nicola Zambelli
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Non-destructive detection of surface and near surface abnormalities...
- Patent number 11,815,477
- Issue date Nov 14, 2023
- The University of Sheffield
- Matthew Brown
- G01 - MEASURING TESTING
Information Patent Grant
Re-entrant cones for moderator chamber of a neutron imaging system
- Patent number 11,774,375
- Issue date Oct 3, 2023
- Phoenix, LLC
- Tye Gribb
- G01 - MEASURING TESTING
Information Patent Grant
Non-destructive inspection system comprising neutron radiation sour...
- Patent number 11,747,288
- Issue date Sep 5, 2023
- Topcon Corporation
- Shigenori Nagano
- G01 - MEASURING TESTING
Information Patent Grant
Method for imaging a sample
- Patent number 11,742,171
- Issue date Aug 29, 2023
- Excillum AB
- Björn Hansson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor metrology and inspection based on an x-ray source wit...
- Patent number 11,719,652
- Issue date Aug 8, 2023
- KLA Corporation
- Yung-Ho Alex Chuang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High throughput 3D x-ray imaging system using a transmission x-ray...
- Patent number 11,686,692
- Issue date Jun 27, 2023
- Sigray, Inc.
- David Vine
- G01 - MEASURING TESTING
Information Patent Grant
Radiation source for nondestructive inspection, and method and appa...
- Patent number 11,508,491
- Issue date Nov 22, 2022
- Chiyoda Technol Corporation
- Hiroshi Kawamura
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray analysis apparatus and x-ray generation unit
- Patent number 11,467,107
- Issue date Oct 11, 2022
- Horiba, Ltd.
- Tomoki Aoyama
- G01 - MEASURING TESTING
Information Patent Grant
Shielded X-ray radiation apparatus
- Patent number 11,456,147
- Issue date Sep 27, 2022
- Chrysos Corporation Limited
- James Tickner
- G01 - MEASURING TESTING
Information Patent Grant
System and method for x-ray absorption spectroscopy using a crystal...
- Patent number 11,428,651
- Issue date Aug 30, 2022
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Grant
Portable neutron imaging based non-destructive evaluation
- Patent number 11,385,364
- Issue date Jul 12, 2022
- Kelly A. Jordan
- G01 - MEASURING TESTING
Information Patent Grant
X-ray generation device and X-ray image capture system
- Patent number 11,244,801
- Issue date Feb 8, 2022
- Canon Anelva Corporation
- Kazuya Tsujino
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for x-ray absorption spectroscopy using a crystal...
- Patent number 11,215,572
- Issue date Jan 4, 2022
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Grant
System with a spatially expansive X-ray source for X-ray imaging
- Patent number 11,202,360
- Issue date Dec 14, 2021
- SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
- Peiyan Cao
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
X-ray dark-field in-line inspection for semiconductor samples
- Patent number 11,175,243
- Issue date Nov 16, 2021
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Grant
Devices having an electron emitting structure
- Patent number 11,101,095
- Issue date Aug 24, 2021
- NANO-X IMAGING LTD
- Koichi Iida
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron gun, X-ray generation apparatus, and X-ray imaging apparatus
- Patent number 10,971,322
- Issue date Apr 6, 2021
- Canon Anelva Corporation
- Kazuya Tsujino
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PATTERNED X-RAY EMITTING TARGET
- Publication number 20250006451
- Publication date Jan 2, 2025
- NOVA MEASURING INSTRUMENTS INC.
- David A. REED
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
X-RAY IMAGING APPARATUS
- Publication number 20240402096
- Publication date Dec 5, 2024
- Shimadzu Corporation
- Ryo FUJITA
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
HIGH THROUGHPUT 3D X-RAY IMAGING SYSTEM USING A TRANSMISSION X-RAY...
- Publication number 20240393266
- Publication date Nov 28, 2024
- Sigray, Inc.
- David Vine
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
X-RAY FLUORESCENCE ANALYZER AND X-RAY APERTURE MEMBER
- Publication number 20240385130
- Publication date Nov 21, 2024
- Shimadzu Corporation
- Goshi AKIYAMA
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20240369502
- Publication date Nov 7, 2024
- Canon ANELVA Corporation
- Takeo TSUKAMOTO
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
INSPECTION SYSTEM AND INSPECTION METHOD
- Publication number 20240361257
- Publication date Oct 31, 2024
- Nuctech Company Limited
- Li ZHANG
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SYSTEM AND METHOD
- Publication number 20240345005
- Publication date Oct 17, 2024
- Nuctech Company Limited
- Li ZHANG
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SYSTEM AND METHOD
- Publication number 20240319114
- Publication date Sep 26, 2024
- Nuctech Company Limited
- Weizhen WANG
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SYSTEM AND METHOD
- Publication number 20240310305
- Publication date Sep 19, 2024
- Nuctech Company Limited
- Zhiqiang CHEN
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR PROVIDING A DIGITALLY SWITCHABLE X-RAY SOURCES
- Publication number 20240272093
- Publication date Aug 15, 2024
- NANO-X IMAGING LTD.
- Ukyo JEONG
- G01 - MEASURING TESTING
Information Patent Application
NONDESTRUCTIVE INSPECTING DEVICE
- Publication number 20240183801
- Publication date Jun 6, 2024
- TOPCON CORPORATION
- Shigenori NAGANO
- G01 - MEASURING TESTING
Information Patent Application
Re-Entrant Cones for Moderator Chamber of a Neutron Imaging System
- Publication number 20230408425
- Publication date Dec 21, 2023
- Phoenix, LLC
- Tye Gribb
- G01 - MEASURING TESTING
Information Patent Application
HIGH THROUGHPUT 3D X-RAY IMAGING SYSTEM USING A TRANSMISSION X-RAY...
- Publication number 20230384245
- Publication date Nov 30, 2023
- Sigray, Inc.
- David Vine
- G01 - MEASURING TESTING
Information Patent Application
Re-Entrant Cones for Moderator Chamber of a Neutron Imaging System
- Publication number 20230333029
- Publication date Oct 19, 2023
- Phoenix, LLC
- Tye Gribb
- G01 - MEASURING TESTING
Information Patent Application
X-RAY FLUORESCENCE SYSTEM AND X-RAY SOURCE WITH ELECTRICALLY INSULA...
- Publication number 20230280291
- Publication date Sep 7, 2023
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Application
A Detection System and Method for Investigating a Content of an Item
- Publication number 20230266257
- Publication date Aug 24, 2023
- Dynaxion B.V.
- Emma Wooldridge
- G01 - MEASURING TESTING
Information Patent Application
X-RAY IMAGING SYSTEM
- Publication number 20230238204
- Publication date Jul 27, 2023
- Excillum AB
- Björn HANSSON
- G01 - MEASURING TESTING
Information Patent Application
PATTERNED X-RAY EMITTING TARGET
- Publication number 20220390395
- Publication date Dec 8, 2022
- NOVA MEASURING INSTRUMENTS INC.
- David A. REED
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR IMAGING A SAMPLE
- Publication number 20220262591
- Publication date Aug 18, 2022
- Excillum AB
- Björn HANSSON
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH-ENERGY X-RAY IMAGING SYSTEM
- Publication number 20220260745
- Publication date Aug 18, 2022
- SMITHS DETECTION INC.
- Joseph BENDAHAN
- G01 - MEASURING TESTING
Information Patent Application
RADIATION SOURCE FOR NONDESTRUCTIVE INSPECTION, AND METHOD AND APPA...
- Publication number 20220189650
- Publication date Jun 16, 2022
- Chiyoda Technol Corporation
- Hiroshi KAWAMURA
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
HIGH THROUGHPUT 3D X-RAY IMAGING SYSTEM USING A TRANSMISSION X-RAY...
- Publication number 20220178851
- Publication date Jun 9, 2022
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR X-RAY ABSORPTION SPECTROSCOPY USING A CRYSTAL...
- Publication number 20220082516
- Publication date Mar 17, 2022
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Application
X-RAY ANALYSIS APPARATUS AND X-RAY GENERATION UNIT
- Publication number 20210389262
- Publication date Dec 16, 2021
- HORIBA, LTD.
- Tomoki AOYAMA
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR X-RAY ABSORPTION SPECTROSCOPY USING A CRYSTAL...
- Publication number 20210356412
- Publication date Nov 18, 2021
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Application
X-RAY GENERATION DEVICE AND X-RAY IMAGE CAPTURE SYSTEM
- Publication number 20210233734
- Publication date Jul 29, 2021
- CANON ANELVA CORPORATION
- KAZUYA TSUJINO
- G01 - MEASURING TESTING
Information Patent Application
ELECTRON GUN, X-RAY GENERATION APPARATUS, AND X-RAY IMAGING APPARATUS
- Publication number 20200258710
- Publication date Aug 13, 2020
- Canon ANELVA Corporation
- Kazuya TSUJINO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM WITH A SPATIALLY EXPANSIVE X-RAY SOURCE FOR X-RAY IMAGING
- Publication number 20200163194
- Publication date May 21, 2020
- SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
- Peiyan CAO
- G01 - MEASURING TESTING
Information Patent Application
TALBOT-LAU X-RAY SOURCE AND INTERFEROMETRIC SYSTEM
- Publication number 20200041428
- Publication date Feb 6, 2020
- Sigray, Inc.
- Wenbing Yun
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
X-RAY INSPECTION DEVICE AND METHOD FOR DETERMINING DEGREE OF CONSUM...
- Publication number 20190380193
- Publication date Dec 12, 2019
- Shimadzu Corporation
- Bunta MATSUHANA
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR

source created from radiated target

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

System, method, and apparatus for x-ray backscatter inspection of p...

High throughput 3D x-ray imaging system using a transmission x-ray...

Device and method for measuring short-wavelength characteristic X-r...

Apparatus and method for x-ray fluorescence analysis

Patterned x-ray emitting target

Inspection apparatus and inspection method

Inspection apparatus and inspection method

Inspection apparatus and inspection method

Inspection apparatus and inspection method

Static CT detection device

Inspection apparatus and inspection method

Multi-channel static CT device

X-ray collimator and related X-ray inspection apparatus

Non-destructive detection of surface and near surface abnormalities...

Re-entrant cones for moderator chamber of a neutron imaging system

Non-destructive inspection system comprising neutron radiation sour...

Method for imaging a sample

Semiconductor metrology and inspection based on an x-ray source wit...

High throughput 3D x-ray imaging system using a transmission x-ray...

Radiation source for nondestructive inspection, and method and appa...

X-ray analysis apparatus and x-ray generation unit

Shielded X-ray radiation apparatus

System and method for x-ray absorption spectroscopy using a crystal...

Portable neutron imaging based non-destructive evaluation

X-ray generation device and X-ray image capture system

System and method for x-ray absorption spectroscopy using a crystal...

System with a spatially expansive X-ray source for X-ray imaging

X-ray dark-field in-line inspection for semiconductor samples

Devices having an electron emitting structure

Electron gun, X-ray generation apparatus, and X-ray imaging apparatus

Patents Applicationslast 30 patents

PATTERNED X-RAY EMITTING TARGET

X-RAY IMAGING APPARATUS

HIGH THROUGHPUT 3D X-RAY IMAGING SYSTEM USING A TRANSMISSION X-RAY...

X-RAY FLUORESCENCE ANALYZER AND X-RAY APERTURE MEMBER

INSPECTION APPARATUS AND INSPECTION METHOD

INSPECTION SYSTEM AND INSPECTION METHOD

INSPECTION SYSTEM AND METHOD

INSPECTION SYSTEM AND METHOD

INSPECTION SYSTEM AND METHOD

SYSTEM AND METHOD FOR PROVIDING A DIGITALLY SWITCHABLE X-RAY SOURCES

NONDESTRUCTIVE INSPECTING DEVICE

Re-Entrant Cones for Moderator Chamber of a Neutron Imaging System

HIGH THROUGHPUT 3D X-RAY IMAGING SYSTEM USING A TRANSMISSION X-RAY...

Re-Entrant Cones for Moderator Chamber of a Neutron Imaging System

X-RAY FLUORESCENCE SYSTEM AND X-RAY SOURCE WITH ELECTRICALLY INSULA...

A Detection System and Method for Investigating a Content of an Item

X-RAY IMAGING SYSTEM

PATTERNED X-RAY EMITTING TARGET

METHOD FOR IMAGING A SAMPLE

HIGH-ENERGY X-RAY IMAGING SYSTEM

RADIATION SOURCE FOR NONDESTRUCTIVE INSPECTION, AND METHOD AND APPA...

HIGH THROUGHPUT 3D X-RAY IMAGING SYSTEM USING A TRANSMISSION X-RAY...

SYSTEM AND METHOD FOR X-RAY ABSORPTION SPECTROSCOPY USING A CRYSTAL...

X-RAY ANALYSIS APPARATUS AND X-RAY GENERATION UNIT

SYSTEM AND METHOD FOR X-RAY ABSORPTION SPECTROSCOPY USING A CRYSTAL...

X-RAY GENERATION DEVICE AND X-RAY IMAGE CAPTURE SYSTEM

ELECTRON GUN, X-RAY GENERATION APPARATUS, AND X-RAY IMAGING APPARATUS

SYSTEM WITH A SPATIALLY EXPANSIVE X-RAY SOURCE FOR X-RAY IMAGING

TALBOT-LAU X-RAY SOURCE AND INTERFEROMETRIC SYSTEM

X-RAY INSPECTION DEVICE AND METHOD FOR DETERMINING DEGREE OF CONSUM...