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G01N2223/20

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

Current Industry

G01N2223/20Sources of radiation

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Patents Grantslast 30 patents

Information Patent Grant
System, method, and apparatus for x-ray backscatter inspection of p...
- Patent number 12,163,903
- Issue date Dec 10, 2024
- The Boeing Company
- Morteza Safai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for Schottky TFE inspection
- Patent number 12,165,834
- Issue date Dec 10, 2024
- NUFLARE TECHNOLOGY, INC.
- Victor Katsap
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High throughput 3D x-ray imaging system using a transmission x-ray...
- Patent number 12,153,001
- Issue date Nov 26, 2024
- Sigray, Inc.
- David Vine
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for measuring short-wavelength characteristic X-r...
- Patent number 12,099,025
- Issue date Sep 24, 2024
- THE 59TH INSTITUTE OF CHINA ORDNANCE INDUSTRY
- Lin Zheng
- G01 - MEASURING TESTING
Information Patent Grant
Muon tomography system, apparatus, and method for tunnel detection
- Patent number 12,085,689
- Issue date Sep 10, 2024
- Ideon Technologies Inc.
- Douglas William Schouten
- G01 - MEASURING TESTING
Information Patent Grant
Serial synchrotron crystallography sample holding system
- Patent number 12,007,342
- Issue date Jun 11, 2024
- MITEGEN, LLC
- Robert E. Thorne
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for x-ray fluorescence analysis
- Patent number 12,007,380
- Issue date Jun 11, 2024
- Malvern Panalytical B.V.
- Bruno Vrebos
- G01 - MEASURING TESTING
Information Patent Grant
Patterned x-ray emitting target
- Patent number 11,996,259
- Issue date May 28, 2024
- NOVA MEASURING INSTRUMENTS INC.
- David A. Reed
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 11,977,038
- Issue date May 7, 2024
- Canon Anelva Corporation
- Takeo Tsukamoto
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 11,971,370
- Issue date Apr 30, 2024
- Canon Anelva Corporation
- Takeo Tsukamoto
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Ore component analysis device and method
- Patent number 11,953,455
- Issue date Apr 9, 2024
- SHANDONG UNIVERSITY
- Chen Liu
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 11,940,394
- Issue date Mar 26, 2024
- Canon Anelva Corporation
- Takeo Tsukamoto
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Shielding strategy for mitigation of stray field for permanent magn...
- Patent number 11,927,549
- Issue date Mar 12, 2024
- KLA Corporation
- Qian Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 11,927,554
- Issue date Mar 12, 2024
- Canon Anelva Corporation
- Takeo Tsukamoto
- G01 - MEASURING TESTING
Information Patent Grant
Static CT detection device
- Patent number 11,925,183
- Issue date Mar 12, 2024
- Tsinghua University
- Zhiqiang Chen
- A22 - BUTCHERING MEAT TREATMENT PROCESSING POULTRY OR FISH
Information Patent Grant
Rapid ore analysis to enable bulk sorting using gamma-activation an...
- Patent number 11,927,553
- Issue date Mar 12, 2024
- COMMONWEALTH SCIENTIFIC AND INDUSTRIAL RESEARCH ORGANISATION
- Peter Coghill
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for cosmogenic neutron sensing moisture detecti...
- Patent number 11,927,552
- Issue date Mar 12, 2024
- QUAESTA INSTRUMENTS, LLC
- Peter Shifflett
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 11,921,059
- Issue date Mar 5, 2024
- Canon Anelva Corporation
- Takeo Tsukamoto
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Multi-channel static CT device
- Patent number 11,906,447
- Issue date Feb 20, 2024
- Nuctech Company Limited
- Zhiqiang Chen
- G01 - MEASURING TESTING
Information Patent Grant
Controlling process parameters by means of radiographic online dete...
- Patent number 11,898,971
- Issue date Feb 13, 2024
- SMS group GMBH
- Christian Klinkenberg
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Calibration method and device therefor
- Patent number 11,885,752
- Issue date Jan 30, 2024
- Rapiscan Holdings, Inc.
- Emmanuel St-Aubin
- G01 - MEASURING TESTING
Information Patent Grant
Two-step material decomposition calibration method for a full size...
- Patent number 11,879,856
- Issue date Jan 23, 2024
- Canon Medical Systems Corporation
- Xiaohui Zhan
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Muon tomography for 3D nondestructive examination
- Patent number 11,879,855
- Issue date Jan 23, 2024
- VeriTX Corp.
- James Allen Regenor
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
X-ray collimator and related X-ray inspection apparatus
- Patent number 11,854,712
- Issue date Dec 26, 2023
- DUE2LAB S.R.L.
- Nicola Zambelli
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
System and method for inspecting defects of structure by using X-ray
- Patent number 11,821,854
- Issue date Nov 21, 2023
- NEUF Inc.
- Myoung Chan Na
- G01 - MEASURING TESTING
Information Patent Grant
Non-destructive detection of surface and near surface abnormalities...
- Patent number 11,815,477
- Issue date Nov 14, 2023
- The University of Sheffield
- Matthew Brown
- G01 - MEASURING TESTING
Information Patent Grant
Detection system for X-ray inspection of an object
- Patent number 11,817,231
- Issue date Nov 14, 2023
- Carl Zeiss SMT GmbH
- Johannes Ruoff
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Device and method for measuring total cross-sectional phase fractio...
- Patent number 11,808,719
- Issue date Nov 7, 2023
- SEA PIONEERS TECHNOLOGIES CO., LTD.
- Jige Chen
- G01 - MEASURING TESTING
Information Patent Grant
Device, unit and method for detecting annular flooding with gamma t...
- Patent number 11,796,487
- Issue date Oct 24, 2023
- Petroleo Brasileiro S.A. Petrobras
- Carla Alves Marinho Ferreira
- G01 - MEASURING TESTING
Information Patent Grant
Re-entrant cones for moderator chamber of a neutron imaging system
- Patent number 11,774,375
- Issue date Oct 3, 2023
- Phoenix, LLC
- Tye Gribb
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MUON TOMOGRAPHY SYSTEM, APPARATUS, AND METHOD FOR TUNNEL DETECTION
- Publication number 20240418900
- Publication date Dec 19, 2024
- Ideon Technologies Inc.
- Douglas William SCHOUTEN
- G01 - MEASURING TESTING
Information Patent Application
X-RAY IMAGING APPARATUS
- Publication number 20240402096
- Publication date Dec 5, 2024
- Shimadzu Corporation
- Ryo FUJITA
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
HIGH THROUGHPUT 3D X-RAY IMAGING SYSTEM USING A TRANSMISSION X-RAY...
- Publication number 20240393266
- Publication date Nov 28, 2024
- Sigray, Inc.
- David Vine
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
X-RAY FLUORESCENCE ANALYZER AND X-RAY APERTURE MEMBER
- Publication number 20240385130
- Publication date Nov 21, 2024
- Shimadzu Corporation
- Goshi AKIYAMA
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20240369502
- Publication date Nov 7, 2024
- Canon ANELVA Corporation
- Takeo TSUKAMOTO
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
RAY SCANNING APPARATUS
- Publication number 20240369499
- Publication date Nov 7, 2024
- Nuctech Company Limited
- Zhiqiang CHEN
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SYSTEM AND INSPECTION METHOD
- Publication number 20240361257
- Publication date Oct 31, 2024
- Nuctech Company Limited
- Li ZHANG
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SYSTEM AND METHOD
- Publication number 20240345005
- Publication date Oct 17, 2024
- Nuctech Company Limited
- Li ZHANG
- G01 - MEASURING TESTING
Information Patent Application
SERIAL SYNCHROTRON CRYSTALLOGRAPHY SAMPLE HOLDING SYSTEM
- Publication number 20240328969
- Publication date Oct 3, 2024
- MITEGEN, LLC
- Robert E. Thorne
- G01 - MEASURING TESTING
Information Patent Application
SERIAL SYNCHROTRON CRYSTALLOGRAPHY SAMPLE HOLDING SYSTEM
- Publication number 20240319120
- Publication date Sep 26, 2024
- MITEGEN, LLC
- Robert E. Thorne
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SYSTEM AND METHOD
- Publication number 20240319114
- Publication date Sep 26, 2024
- Nuctech Company Limited
- Weizhen WANG
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SYSTEM AND METHOD
- Publication number 20240319112
- Publication date Sep 26, 2024
- Nuctech Company Limited
- Bicheng LIU
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SYSTEM AND METHOD
- Publication number 20240310305
- Publication date Sep 19, 2024
- Nuctech Company Limited
- Zhiqiang CHEN
- G01 - MEASURING TESTING
Information Patent Application
RADIATION INSPECTION SYSTEM AND METHOD
- Publication number 20240312753
- Publication date Sep 19, 2024
- Nuctech Company Limited
- Weizhen WANG
- G01 - MEASURING TESTING
Information Patent Application
X-RAY LINE SCAN FOR FOREIGN OBJECT DEBRIS DETECTION
- Publication number 20240310306
- Publication date Sep 19, 2024
- The Boeing Company
- Morteza Safai
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SYSTEM AND METHOD
- Publication number 20240302299
- Publication date Sep 12, 2024
- Nuctech Company Limited
- Weizhen WANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
RAY SCANNING APPARATUS AND RAY SCANNING SYSTEM
- Publication number 20240288385
- Publication date Aug 29, 2024
- Nuctech Company Limited
- Li ZHANG
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR PROVIDING A DIGITALLY SWITCHABLE X-RAY SOURCES
- Publication number 20240272093
- Publication date Aug 15, 2024
- NANO-X IMAGING LTD.
- Ukyo JEONG
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND PROCESS FOR DETERMINING THE WATER EQUIVALENT CONTENT OF...
- Publication number 20240272092
- Publication date Aug 15, 2024
- FINAPP S.r.l.
- Luca STEVANATO
- G01 - MEASURING TESTING
Information Patent Application
CONVEYOR SYSTEM AND MEASURING DEVICE FOR DETERMINING WATER CONTENT...
- Publication number 20240210332
- Publication date Jun 27, 2024
- TROXLER ELECTRONIC LABORATORIES, INC.
- Wewage Hiran Linus Dep
- G01 - MEASURING TESTING
Information Patent Application
NONDESTRUCTIVE INSPECTING DEVICE
- Publication number 20240183801
- Publication date Jun 6, 2024
- TOPCON CORPORATION
- Shigenori NAGANO
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR CORRECTING THE NONLINEARITY ASSOCIATED WITH PHOTON COUNT...
- Publication number 20240142393
- Publication date May 2, 2024
- NeuroLogica Corporation, a subsidiary of Samsung Electronics Co., Ltd.
- Duhgoon Lee
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Calibration Method and Device Therefor
- Publication number 20240134083
- Publication date Apr 25, 2024
- Rapiscan Holdings, Inc.
- Emmanuel St-Aubin
- G01 - MEASURING TESTING
Information Patent Application
DEVICE FOR ANALYZING A FLUID IN A SAMPLE AND RELATED METHOD
- Publication number 20240125715
- Publication date Apr 18, 2024
- TOTALENERGIES ONETECH
- Michel N'GUYEN
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR INSPECTING DEFECTS OF STRUCTURE BY USING X-RAY
- Publication number 20240102949
- Publication date Mar 28, 2024
- NEUF Inc.
- Myoung Chan NA
- G01 - MEASURING TESTING
Information Patent Application
Systems and Methods for Generating High-Energy Three-Dimensional Co...
- Publication number 20240094147
- Publication date Mar 21, 2024
- Rapiscan Holdings, Inc.
- Mark Procter
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Thin Film Damage Detection Function and Charged Particle Beam Device
- Publication number 20240085352
- Publication date Mar 14, 2024
- Hitachi High-Tech Corporation
- Michio HATANO
- G01 - MEASURING TESTING
Information Patent Application
POLARIZED, ENERGY DISPERSIVE X-RAY FLUORESCENCE SYSTEM AND METHOD
- Publication number 20240035990
- Publication date Feb 1, 2024
- X-Ray Optical Systems, Inc.
- Zewu CHEN
- G01 - MEASURING TESTING
Information Patent Application
X-RAY FLUORESCENCE WITH HEAVY ELEMENT TARGET AND METHODS OF USE THE...
- Publication number 20240019386
- Publication date Jan 18, 2024
- Bruce Kaiser
- G01 - MEASURING TESTING
Information Patent Application
X-RAY GENERATION DEVICE AND X-RAY IMAGING SYSTEM
- Publication number 20240006145
- Publication date Jan 4, 2024
- Hamamatsu Photonics K.K.
- Hiroki KAWAKAMI
- H01 - BASIC ELECTRIC ELEMENTS

Sources of radiation

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

System, method, and apparatus for x-ray backscatter inspection of p...

Method and apparatus for Schottky TFE inspection

High throughput 3D x-ray imaging system using a transmission x-ray...

Device and method for measuring short-wavelength characteristic X-r...

Muon tomography system, apparatus, and method for tunnel detection

Serial synchrotron crystallography sample holding system

Apparatus and method for x-ray fluorescence analysis

Patterned x-ray emitting target

Inspection apparatus and inspection method

Inspection apparatus and inspection method

Ore component analysis device and method

Inspection apparatus and inspection method

Shielding strategy for mitigation of stray field for permanent magn...

Inspection apparatus and inspection method

Static CT detection device

Rapid ore analysis to enable bulk sorting using gamma-activation an...

Systems and methods for cosmogenic neutron sensing moisture detecti...

Inspection apparatus and inspection method

Multi-channel static CT device

Controlling process parameters by means of radiographic online dete...

Calibration method and device therefor

Two-step material decomposition calibration method for a full size...

Muon tomography for 3D nondestructive examination

X-ray collimator and related X-ray inspection apparatus

System and method for inspecting defects of structure by using X-ray

Non-destructive detection of surface and near surface abnormalities...

Detection system for X-ray inspection of an object

Device and method for measuring total cross-sectional phase fractio...

Device, unit and method for detecting annular flooding with gamma t...

Re-entrant cones for moderator chamber of a neutron imaging system

Patents Applicationslast 30 patents

MUON TOMOGRAPHY SYSTEM, APPARATUS, AND METHOD FOR TUNNEL DETECTION

X-RAY IMAGING APPARATUS

HIGH THROUGHPUT 3D X-RAY IMAGING SYSTEM USING A TRANSMISSION X-RAY...

X-RAY FLUORESCENCE ANALYZER AND X-RAY APERTURE MEMBER

INSPECTION APPARATUS AND INSPECTION METHOD

RAY SCANNING APPARATUS

INSPECTION SYSTEM AND INSPECTION METHOD

INSPECTION SYSTEM AND METHOD

SERIAL SYNCHROTRON CRYSTALLOGRAPHY SAMPLE HOLDING SYSTEM

SERIAL SYNCHROTRON CRYSTALLOGRAPHY SAMPLE HOLDING SYSTEM

INSPECTION SYSTEM AND METHOD

INSPECTION SYSTEM AND METHOD

INSPECTION SYSTEM AND METHOD

RADIATION INSPECTION SYSTEM AND METHOD

X-RAY LINE SCAN FOR FOREIGN OBJECT DEBRIS DETECTION

INSPECTION SYSTEM AND METHOD

RAY SCANNING APPARATUS AND RAY SCANNING SYSTEM

SYSTEM AND METHOD FOR PROVIDING A DIGITALLY SWITCHABLE X-RAY SOURCES

SYSTEM AND PROCESS FOR DETERMINING THE WATER EQUIVALENT CONTENT OF...

CONVEYOR SYSTEM AND MEASURING DEVICE FOR DETERMINING WATER CONTENT...

NONDESTRUCTIVE INSPECTING DEVICE

METHOD FOR CORRECTING THE NONLINEARITY ASSOCIATED WITH PHOTON COUNT...

Calibration Method and Device Therefor

DEVICE FOR ANALYZING A FLUID IN A SAMPLE AND RELATED METHOD

SYSTEM AND METHOD FOR INSPECTING DEFECTS OF STRUCTURE BY USING X-RAY

Systems and Methods for Generating High-Energy Three-Dimensional Co...

Thin Film Damage Detection Function and Charged Particle Beam Device

POLARIZED, ENERGY DISPERSIVE X-RAY FLUORESCENCE SYSTEM AND METHOD

X-RAY FLUORESCENCE WITH HEAVY ELEMENT TARGET AND METHODS OF USE THE...

X-RAY GENERATION DEVICE AND X-RAY IMAGING SYSTEM