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CPC
G01N2223/20

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

Current Industry

G01N2223/20Sources of radiation

Industries

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Patents Grantslast 30 patents

Information Patent Grant
X-ray fluorescence system and x-ray source with electrically insula...
- Patent number 12,360,067
- Issue date Jul 15, 2025
- Sigray, Inc.
- Wenbing Yun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Battery module comprising metal particle-dispersed thermal conducti...
- Patent number 12,355,044
- Issue date Jul 8, 2025
- LG ENERGY SOLUTION, LTD.
- Jung Been You
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Serial synchrotron crystallography sample holding system
- Patent number 12,292,395
- Issue date May 6, 2025
- MITEGEN, LLC
- Robert E. Thorne
- G01 - MEASURING TESTING
Information Patent Grant
Re-entrant cones for moderator chamber of a neutron imaging system
- Patent number 12,292,391
- Issue date May 6, 2025
- Phoenix, LLC
- Tye Gribb
- G01 - MEASURING TESTING
Information Patent Grant
Single piece droplet generation and injection device for serial cry...
- Patent number 12,287,299
- Issue date Apr 29, 2025
- Arizona Board of Regents on behalf of Arizona State University
- Alexandra Ros
- G01 - MEASURING TESTING
Information Patent Grant
Thin film damage detection function and charged particle beam device
- Patent number 12,265,041
- Issue date Apr 1, 2025
- HITACHI HIGH-TECH CORPORATION
- Michio Hatano
- G01 - MEASURING TESTING
Information Patent Grant
Handheld inspection device and method of inspecting an infrastructu...
- Patent number 12,259,342
- Issue date Mar 25, 2025
- Inversa Systems LTD.
- Peter Marc Cabot
- G01 - MEASURING TESTING
Information Patent Grant
High-energy x-ray imaging system
- Patent number 12,253,648
- Issue date Mar 18, 2025
- Smiths Detection Inc.
- Joseph Bendahan
- G01 - MEASURING TESTING
Information Patent Grant
Polarized, energy dispersive x-ray fluorescence system and method
- Patent number 12,247,934
- Issue date Mar 11, 2025
- X-Ray Optical Systems, Inc.
- Zewu Chen
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 12,241,848
- Issue date Mar 4, 2025
- Canon Anelva Corporation
- Takeo Tsukamoto
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Imaging systems and methods of operating the same
- Patent number 12,196,693
- Issue date Jan 14, 2025
- SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
- Peiyan Cao
- G01 - MEASURING TESTING
Information Patent Grant
Secondary image removal using high resolution x-ray transmission so...
- Patent number 12,181,423
- Issue date Dec 31, 2024
- Sigray, Inc.
- Sylvia Jia Yun Lewis
- G01 - MEASURING TESTING
Information Patent Grant
System and method for inspecting defects of structure by using X-ray
- Patent number 12,181,426
- Issue date Dec 31, 2024
- NEUF Inc.
- Myoung Chan Na
- G01 - MEASURING TESTING
Information Patent Grant
System, method, and apparatus for x-ray backscatter inspection of p...
- Patent number 12,163,903
- Issue date Dec 10, 2024
- The Boeing Company
- Morteza Safai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for Schottky TFE inspection
- Patent number 12,165,834
- Issue date Dec 10, 2024
- NUFLARE TECHNOLOGY, INC.
- Victor Katsap
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High throughput 3D x-ray imaging system using a transmission x-ray...
- Patent number 12,153,001
- Issue date Nov 26, 2024
- Sigray, Inc.
- David Vine
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for measuring short-wavelength characteristic X-r...
- Patent number 12,099,025
- Issue date Sep 24, 2024
- THE 59TH INSTITUTE OF CHINA ORDNANCE INDUSTRY
- Lin Zheng
- G01 - MEASURING TESTING
Information Patent Grant
Muon tomography system, apparatus, and method for tunnel detection
- Patent number 12,085,689
- Issue date Sep 10, 2024
- Ideon Technologies Inc.
- Douglas William Schouten
- G01 - MEASURING TESTING
Information Patent Grant
Serial synchrotron crystallography sample holding system
- Patent number 12,007,342
- Issue date Jun 11, 2024
- MITEGEN, LLC
- Robert E. Thorne
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for x-ray fluorescence analysis
- Patent number 12,007,380
- Issue date Jun 11, 2024
- Malvern Panalytical B.V.
- Bruno Vrebos
- G01 - MEASURING TESTING
Information Patent Grant
Patterned x-ray emitting target
- Patent number 11,996,259
- Issue date May 28, 2024
- NOVA MEASURING INSTRUMENTS INC.
- David A. Reed
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 11,977,038
- Issue date May 7, 2024
- Canon Anelva Corporation
- Takeo Tsukamoto
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 11,971,370
- Issue date Apr 30, 2024
- Canon Anelva Corporation
- Takeo Tsukamoto
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Ore component analysis device and method
- Patent number 11,953,455
- Issue date Apr 9, 2024
- SHANDONG UNIVERSITY
- Chen Liu
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 11,940,394
- Issue date Mar 26, 2024
- Canon Anelva Corporation
- Takeo Tsukamoto
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Shielding strategy for mitigation of stray field for permanent magn...
- Patent number 11,927,549
- Issue date Mar 12, 2024
- KLA Corporation
- Qian Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 11,927,554
- Issue date Mar 12, 2024
- Canon Anelva Corporation
- Takeo Tsukamoto
- G01 - MEASURING TESTING
Information Patent Grant
Static CT detection device
- Patent number 11,925,183
- Issue date Mar 12, 2024
- Tsinghua University
- Zhiqiang Chen
- A22 - BUTCHERING MEAT TREATMENT PROCESSING POULTRY OR FISH
Information Patent Grant
Rapid ore analysis to enable bulk sorting using gamma-activation an...
- Patent number 11,927,553
- Issue date Mar 12, 2024
- COMMONWEALTH SCIENTIFIC AND INDUSTRIAL RESEARCH ORGANISATION
- Peter Coghill
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for cosmogenic neutron sensing moisture detecti...
- Patent number 11,927,552
- Issue date Mar 12, 2024
- QUAESTA INSTRUMENTS, LLC
- Peter Shifflett
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
HIGH-DEFINITION EMISSION TOMOGRAPHY IMAGE ACQUISITION DEVICE FOR HI...
- Publication number 20250239377
- Publication date Jul 24, 2025
- UNIVERSITY INDUSTRY FOUNDATION, YONSEI UNIVERSITY WONJU CAMPUS
- Chul Hee MIN
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
DISTANCE AND DIRECTION-SENSITIVE COSMOGENIC NEUTRON SENSORS
- Publication number 20250224346
- Publication date Jul 10, 2025
- QUAESTA INSTRUMENTS, LLC
- MAREK ZREDA
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
X-RAY ANALYSIS SYSTEM WITH FOCUSED X-RAY BEAM AND NON-X-RAY MICROSCOPE
- Publication number 20250224347
- Publication date Jul 10, 2025
- Sigray, Inc.
- Benjamin Donald STRIPE
- G01 - MEASURING TESTING
Information Patent Application
X-RAY INSPECTION DEVICE AND X-RAY INSPECTION METHOD
- Publication number 20250189465
- Publication date Jun 12, 2025
- SK On Co., Ltd.
- Hyung Joon KIM
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
X-Ray Fluorescence Spectrometer and Power Supply Apparatus
- Publication number 20250172515
- Publication date May 29, 2025
- Shimadzu Corporation
- Yohei UKAI
- G01 - MEASURING TESTING
Information Patent Application
Digitally Addressable Sample Irradiator
- Publication number 20250172508
- Publication date May 29, 2025
- Stellarray, Incorporated
- Mark Eaton
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SELF-CENTERING CLAMP ADAPTER FOR X-RAY AND GAMMARAY WELD INSPECTION
- Publication number 20250164419
- Publication date May 22, 2025
- VAREX IMAGING CORPORATION
- Tibby Petrescu
- G01 - MEASURING TESTING
Information Patent Application
X-RAY INSPECTION SYSTEM FOR INSPECTION OF AN OBJECT
- Publication number 20250146958
- Publication date May 8, 2025
- Carl Zeiss SMT GMBH
- Johannes Ruoff
- G01 - MEASURING TESTING
Information Patent Application
X-RAY INSPECTION APPARATUS
- Publication number 20250123222
- Publication date Apr 17, 2025
- ISHIDA CO., LTD.
- Futoshi YURUGI
- G01 - MEASURING TESTING
Information Patent Application
X-RAY INSPECTION DEVICE AND CALIBRATION METHOD THEREOF
- Publication number 20250093283
- Publication date Mar 20, 2025
- Anritsu Corporation
- Akira OHASHI
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM, METHOD, AND APPARATUS FOR X-RAY BACKSCATTER INSPECTION OF P...
- Publication number 20250067689
- Publication date Feb 27, 2025
- The Boeing Company
- Morteza Safai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
X-RAY GENERATOR AND X-RAY INSPECTION APPARATUS INCLUDING THE SAME
- Publication number 20250040021
- Publication date Jan 30, 2025
- Anritsu Corporation
- Jyunichi MORIYA
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
INSPECTION APPARATUS AND METHOD FOR GENERATING INSPECTION IMAGE
- Publication number 20250037269
- Publication date Jan 30, 2025
- NuFlare Technology, Inc.
- Shinji SUGIHARA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SECURITY INSPECTION DEVICE, SECURITY INSPECTION SYSTEM, AND SECURIT...
- Publication number 20250035569
- Publication date Jan 30, 2025
- NUCTECH (BEIJING) COMPANY LIMITED
- Yuanjing LI
- G01 - MEASURING TESTING
Information Patent Application
HIGH THROUGHPUT 3D X-RAY IMAGING SYSTEM USING A TRANSMISSION X-RAY...
- Publication number 20250027889
- Publication date Jan 23, 2025
- Sigray, Inc.
- David Vine
- G01 - MEASURING TESTING
Information Patent Application
PATTERNED X-RAY EMITTING TARGET
- Publication number 20250006451
- Publication date Jan 2, 2025
- NOVA MEASURING INSTRUMENTS INC.
- David A. REED
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MUON TOMOGRAPHY SYSTEM, APPARATUS, AND METHOD FOR TUNNEL DETECTION
- Publication number 20240418900
- Publication date Dec 19, 2024
- Ideon Technologies Inc.
- Douglas William SCHOUTEN
- G01 - MEASURING TESTING
Information Patent Application
X-RAY IMAGING APPARATUS
- Publication number 20240402096
- Publication date Dec 5, 2024
- Shimadzu Corporation
- Ryo FUJITA
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
HIGH THROUGHPUT 3D X-RAY IMAGING SYSTEM USING A TRANSMISSION X-RAY...
- Publication number 20240393266
- Publication date Nov 28, 2024
- Sigray, Inc.
- David Vine
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
X-RAY FLUORESCENCE ANALYZER AND X-RAY APERTURE MEMBER
- Publication number 20240385130
- Publication date Nov 21, 2024
- Shimadzu Corporation
- Goshi AKIYAMA
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20240369502
- Publication date Nov 7, 2024
- Canon ANELVA Corporation
- Takeo TSUKAMOTO
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
RAY SCANNING APPARATUS
- Publication number 20240369499
- Publication date Nov 7, 2024
- Nuctech Company Limited
- Zhiqiang CHEN
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SYSTEM AND INSPECTION METHOD
- Publication number 20240361257
- Publication date Oct 31, 2024
- Nuctech Company Limited
- Li ZHANG
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SYSTEM AND METHOD
- Publication number 20240345005
- Publication date Oct 17, 2024
- Nuctech Company Limited
- Li ZHANG
- G01 - MEASURING TESTING
Information Patent Application
SERIAL SYNCHROTRON CRYSTALLOGRAPHY SAMPLE HOLDING SYSTEM
- Publication number 20240328969
- Publication date Oct 3, 2024
- MITEGEN, LLC
- Robert E. Thorne
- G01 - MEASURING TESTING
Information Patent Application
SERIAL SYNCHROTRON CRYSTALLOGRAPHY SAMPLE HOLDING SYSTEM
- Publication number 20240319120
- Publication date Sep 26, 2024
- MITEGEN, LLC
- Robert E. Thorne
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SYSTEM AND METHOD
- Publication number 20240319114
- Publication date Sep 26, 2024
- Nuctech Company Limited
- Weizhen WANG
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SYSTEM AND METHOD
- Publication number 20240319112
- Publication date Sep 26, 2024
- Nuctech Company Limited
- Bicheng LIU
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SYSTEM AND METHOD
- Publication number 20240310305
- Publication date Sep 19, 2024
- Nuctech Company Limited
- Zhiqiang CHEN
- G01 - MEASURING TESTING
Information Patent Application
RADIATION INSPECTION SYSTEM AND METHOD
- Publication number 20240312753
- Publication date Sep 19, 2024
- Nuctech Company Limited
- Weizhen WANG
- G01 - MEASURING TESTING

Sources of radiation

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

X-ray fluorescence system and x-ray source with electrically insula...

Battery module comprising metal particle-dispersed thermal conducti...

Serial synchrotron crystallography sample holding system

Re-entrant cones for moderator chamber of a neutron imaging system

Single piece droplet generation and injection device for serial cry...

Thin film damage detection function and charged particle beam device

Handheld inspection device and method of inspecting an infrastructu...

High-energy x-ray imaging system

Polarized, energy dispersive x-ray fluorescence system and method

Inspection apparatus and inspection method

Imaging systems and methods of operating the same

Secondary image removal using high resolution x-ray transmission so...

System and method for inspecting defects of structure by using X-ray

System, method, and apparatus for x-ray backscatter inspection of p...

Method and apparatus for Schottky TFE inspection

High throughput 3D x-ray imaging system using a transmission x-ray...

Device and method for measuring short-wavelength characteristic X-r...

Muon tomography system, apparatus, and method for tunnel detection

Serial synchrotron crystallography sample holding system

Apparatus and method for x-ray fluorescence analysis

Patterned x-ray emitting target

Inspection apparatus and inspection method

Inspection apparatus and inspection method

Ore component analysis device and method

Inspection apparatus and inspection method

Shielding strategy for mitigation of stray field for permanent magn...

Inspection apparatus and inspection method

Static CT detection device

Rapid ore analysis to enable bulk sorting using gamma-activation an...

Systems and methods for cosmogenic neutron sensing moisture detecti...

Patents Applicationslast 30 patents

HIGH-DEFINITION EMISSION TOMOGRAPHY IMAGE ACQUISITION DEVICE FOR HI...

DISTANCE AND DIRECTION-SENSITIVE COSMOGENIC NEUTRON SENSORS

X-RAY ANALYSIS SYSTEM WITH FOCUSED X-RAY BEAM AND NON-X-RAY MICROSCOPE

X-RAY INSPECTION DEVICE AND X-RAY INSPECTION METHOD

X-Ray Fluorescence Spectrometer and Power Supply Apparatus

Digitally Addressable Sample Irradiator

SELF-CENTERING CLAMP ADAPTER FOR X-RAY AND GAMMARAY WELD INSPECTION

X-RAY INSPECTION SYSTEM FOR INSPECTION OF AN OBJECT

X-RAY INSPECTION APPARATUS

X-RAY INSPECTION DEVICE AND CALIBRATION METHOD THEREOF

SYSTEM, METHOD, AND APPARATUS FOR X-RAY BACKSCATTER INSPECTION OF P...

X-RAY GENERATOR AND X-RAY INSPECTION APPARATUS INCLUDING THE SAME

INSPECTION APPARATUS AND METHOD FOR GENERATING INSPECTION IMAGE

SECURITY INSPECTION DEVICE, SECURITY INSPECTION SYSTEM, AND SECURIT...

HIGH THROUGHPUT 3D X-RAY IMAGING SYSTEM USING A TRANSMISSION X-RAY...

PATTERNED X-RAY EMITTING TARGET

MUON TOMOGRAPHY SYSTEM, APPARATUS, AND METHOD FOR TUNNEL DETECTION

X-RAY IMAGING APPARATUS

HIGH THROUGHPUT 3D X-RAY IMAGING SYSTEM USING A TRANSMISSION X-RAY...

X-RAY FLUORESCENCE ANALYZER AND X-RAY APERTURE MEMBER

INSPECTION APPARATUS AND INSPECTION METHOD

RAY SCANNING APPARATUS

INSPECTION SYSTEM AND INSPECTION METHOD

INSPECTION SYSTEM AND METHOD

SERIAL SYNCHROTRON CRYSTALLOGRAPHY SAMPLE HOLDING SYSTEM

SERIAL SYNCHROTRON CRYSTALLOGRAPHY SAMPLE HOLDING SYSTEM

INSPECTION SYSTEM AND METHOD

INSPECTION SYSTEM AND METHOD

INSPECTION SYSTEM AND METHOD

RADIATION INSPECTION SYSTEM AND METHOD