Specimen supports; Sample conveying means

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CPC
G01N23/2204

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N23/00Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00

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G01N23/2204Specimen supports; Sample conveying means

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Sample fixation mechanism for test with nano-probe, apparatus for t...
- Patent number 12,099,076
- Issue date Sep 24, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Jiabao Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Battery cell and in situ battery electrode analysis method
- Patent number 12,080,860
- Issue date Sep 3, 2024
- Battelle Memorial Institute
- Zihua Zhu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for positioning and transferring a sample
- Patent number 12,000,789
- Issue date Jun 4, 2024
- FEI Company
- Libor Novak
- G01 - MEASURING TESTING
Information Patent Grant
Manufacturing method of sample collection component
- Patent number 11,959,834
- Issue date Apr 16, 2024
- Materials Analysis Technology Inc.
- Pin Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample mounting system for an X-ray analysis apparatus
- Patent number 11,927,550
- Issue date Mar 12, 2024
- Malvern Panalytical B.V.
- Jaap Boksem
- G01 - MEASURING TESTING
Information Patent Grant
System for ultra-high temperature in-situ fretting fatigue experiment
- Patent number 11,921,066
- Issue date Mar 5, 2024
- Nanjing University of Aeronautics and Astronautics
- Qinan Han
- G01 - MEASURING TESTING
Information Patent Grant
System and method for detection and identification of foreign eleme...
- Patent number 11,867,645
- Issue date Jan 9, 2024
- Security Matters LTD.
- Yair Grof
- G01 - MEASURING TESTING
Information Patent Grant
Two-axis rotator
- Patent number 11,835,112
- Issue date Dec 5, 2023
- Helmholtz-Zentrum Dresden-Rossendorf e.V.
- Stefan Findeisen
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Method of examining a sample using a charged particle beam apparatus
- Patent number 11,815,479
- Issue date Nov 14, 2023
- FEI Company
- Oleksii Kaplenko
- G01 - MEASURING TESTING
Information Patent Grant
Apparatuses and methods for combined simultaneous analyses of mater...
- Patent number 11,796,492
- Issue date Oct 24, 2023
- INEL S.A.S.
- Henry Pilliere
- G01 - MEASURING TESTING
Information Patent Grant
X-ray fluorescence analyzer comprising a measurement device, sample...
- Patent number 11,788,977
- Issue date Oct 17, 2023
- S himadzu Corporation
- Yuji Morihisa
- G01 - MEASURING TESTING
Information Patent Grant
Systems, devices, and methods for x-ray fluorescence analysis of ge...
- Patent number 11,592,407
- Issue date Feb 28, 2023
- Enersoft Inc.
- Yannai Z. R. Segal
- G01 - MEASURING TESTING
Information Patent Grant
X-ray fluorescence measurement apparatus
- Patent number 11,549,896
- Issue date Jan 10, 2023
- Jeol Ltd.
- Genki Kinugasa
- G01 - MEASURING TESTING
Information Patent Grant
Analytical method and apparatus
- Patent number 11,536,675
- Issue date Dec 27, 2022
- Jeol Ltd.
- Takanori Murano
- G01 - MEASURING TESTING
Information Patent Grant
Sample holding device for X-ray analysis
- Patent number 11,525,790
- Issue date Dec 13, 2022
- Rigaku Corporation
- Koichiro Ito
- G01 - MEASURING TESTING
Information Patent Grant
Shielded X-ray radiation apparatus
- Patent number 11,456,147
- Issue date Sep 27, 2022
- Chrysos Corporation Limited
- James Tickner
- G01 - MEASURING TESTING
Information Patent Grant
Acquisition and processing of data in a tomographic imaging apparatus
- Patent number 11,428,828
- Issue date Aug 30, 2022
- FEI Company
- Andrew Kingston
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Freezable fluid cell for cryo-electron microscopy
- Patent number 11,402,308
- Issue date Aug 2, 2022
- Brandeis University
- Joel Meyerson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Imaging device
- Patent number 11,385,193
- Issue date Jul 12, 2022
- HITACHI HIGH-TECH CORPORATION
- Hiroyuki Chiba
- G01 - MEASURING TESTING
Information Patent Grant
Sample holder
- Patent number 11,293,882
- Issue date Apr 5, 2022
- Orexplore AB
- Alexander Hansson
- G01 - MEASURING TESTING
Information Patent Grant
Analyzing apparatus, analyzing method, and program
- Patent number 11,293,885
- Issue date Apr 5, 2022
- Horiba, Ltd.
- Yusuke Mizuno
- G01 - MEASURING TESTING
Information Patent Grant
Monitor for measuring mercury emissions
- Patent number 11,262,320
- Issue date Mar 1, 2022
- UHV Technologies, Inc.
- Nalin Kumar
- G01 - MEASURING TESTING
Information Patent Grant
Graphene-based electro-microfluidic devices and methods for protein...
- Patent number 11,175,244
- Issue date Nov 16, 2021
- University of Massachusetts
- Sarah L. Perry
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
System and method for computed laminography x-ray fluorescence imaging
- Patent number 11,143,605
- Issue date Oct 12, 2021
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Grant
Radiation detection device and computer program
- Patent number 11,125,703
- Issue date Sep 21, 2021
- Horiba, Ltd.
- Azusa Taroura
- G01 - MEASURING TESTING
Information Patent Grant
Dual-arm clamping type holder for transmission electron microscopy...
- Patent number 11,041,784
- Issue date Jun 22, 2021
- Institute of Microbiology, Chinese Academy of Sciences
- Jingnan Liang
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic holder for immunoelectron microscopy grids
- Patent number 11,041,820
- Issue date Jun 22, 2021
- Institute of Microbiology, Chinese Academy of Sciences
- Jingnan Liang
- G01 - MEASURING TESTING
Information Patent Grant
Substrate contamination analysis system
- Patent number 11,022,572
- Issue date Jun 1, 2021
- Rigaku Corporation
- Motoyuki Yamagami
- G01 - MEASURING TESTING
Information Patent Grant
Methods and devices for preparing sample for cryogenic electron mic...
- Patent number 10,921,268
- Issue date Feb 16, 2021
- FEI Company
- Bas Hendriksen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Advanced drug development and manufacturing
- Patent number 10,877,035
- Issue date Dec 29, 2020
- Icagen, LLC
- Eva R. Birnbaum
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INTEGRATED FESEM AND LDI-TOF-MS ANALYSIS SYSTEM
- Publication number 20240369504
- Publication date Nov 7, 2024
- LG ENERGY SOLUTION, LTD.
- Soeun KIM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Radiation Effects Testing System with a Beam Accelerator
- Publication number 20240353358
- Publication date Oct 24, 2024
- SHINE Technologies, LLC
- Craig Jacobson
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR X-RAY FLUORESCENCE IMAGING
- Publication number 20240280519
- Publication date Aug 22, 2024
- SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
- Yurun LIU
- G01 - MEASURING TESTING
Information Patent Application
CHARGED PARTICLE BEAM DEVICE, AND SAMPLE OBSERVATION METHOD EMPLOYI...
- Publication number 20240242925
- Publication date Jul 18, 2024
- Hitachi, Ltd
- Shunya TANAKA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
XPS SAMPLE HOLDER, APPARATUS FOR X-RAY PHOTOELECTRON SPECTROSCOPY I...
- Publication number 20240125716
- Publication date Apr 18, 2024
- Korea Institute of Science and Technology
- Soohyung PARK
- G01 - MEASURING TESTING
Information Patent Application
Thin Film Damage Detection Function and Charged Particle Beam Device
- Publication number 20240085352
- Publication date Mar 14, 2024
- Hitachi High-Tech Corporation
- Michio HATANO
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF EXAMINING A SAMPLE USING A CHARGED PARTICLE MICROSCOPE
- Publication number 20240027377
- Publication date Jan 25, 2024
- FEI Company
- Jan Klusácek
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED ANALYZER
- Publication number 20240027375
- Publication date Jan 25, 2024
- Shimadzu Corporation
- Kohji OKADA
- G01 - MEASURING TESTING
Information Patent Application
X-RAY FLUORESCENCE WITH HEAVY ELEMENT TARGET AND METHODS OF USE THE...
- Publication number 20240019386
- Publication date Jan 18, 2024
- Bruce Kaiser
- G01 - MEASURING TESTING
Information Patent Application
Sample Holder Assembly for Optical Microscopy
- Publication number 20240003835
- Publication date Jan 4, 2024
- CHARITE-UNIVERSITATSMEDIZIN BERLIN
- Foo Wei TEN
- G02 - OPTICS
Information Patent Application
Sample Container and Measuring Method
- Publication number 20230408427
- Publication date Dec 21, 2023
- JEOL Ltd.
- Genki Kinugasa
- G01 - MEASURING TESTING
Information Patent Application
MANUFACTURING METHOD OF SAMPLE COLLECTION COMPONENT
- Publication number 20230332985
- Publication date Oct 19, 2023
- Materials Analysis Technology Inc.
- Pin Chang
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE HOLDER FOR DETECTION OF HYDROGEN PERMEATION AND HYDROGEN PER...
- Publication number 20230333032
- Publication date Oct 19, 2023
- National Institute for Materials Science
- Akiko Nakamura
- G01 - MEASURING TESTING
Information Patent Application
ELECTRON MICROSCOPY GRIDS AND HIGH-RESOLUTION STRUCTURAL DETERMINAT...
- Publication number 20230288299
- Publication date Sep 14, 2023
- Universiteit Gent
- Wouter VAN PUTTE
- G01 - MEASURING TESTING
Information Patent Application
X-RAY FLUORESCENCE SYSTEM AND X-RAY SOURCE WITH ELECTRICALLY INSULA...
- Publication number 20230280291
- Publication date Sep 7, 2023
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Application
X-RAY ANALYZER
- Publication number 20230236142
- Publication date Jul 27, 2023
- Shimadzu Corporation
- Yuji MORIHISA
- G01 - MEASURING TESTING
Information Patent Application
OBSERVATION DEVICE FOR OBSERVATION TARGET GAS, METHOD OF OBSERVING...
- Publication number 20230221268
- Publication date Jul 13, 2023
- National Institute for Materials Science
- Akiko Nakamura
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR POSITIONING AND TRANSFERRING A SAMPLE
- Publication number 20230204525
- Publication date Jun 29, 2023
- FEI Company
- Libor NOVAK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GEOLOGICAL ANALYSIS SYSTEM, DEVICES AND METHODS USING X-RAY FLUORES...
- Publication number 20230175992
- Publication date Jun 8, 2023
- Enersoft Inc.
- Yannai Z. R. Segal
- G01 - MEASURING TESTING
Information Patent Application
DEVICE FOR CLOSING THE INPUT OPENING IN THE SAMPLE CHAMBER IN AN X-...
- Publication number 20230143497
- Publication date May 11, 2023
- Bruker AXS GmbH
- Wolfgang GEHRLEIN
- G01 - MEASURING TESTING
Information Patent Application
TRANSMISSION ELECTRON MICROSCOPE IN-SITU CHIP AND PREPARATION METHO...
- Publication number 20230103943
- Publication date Apr 6, 2023
- Xiamen Chip-Nova Technology Co., Ltd.
- Honggang Liao
- G01 - MEASURING TESTING
Information Patent Application
FREEZABLE FLUID CELL FOR CRYO-ELECTRON MICROSCOPY
- Publication number 20230034150
- Publication date Feb 2, 2023
- Brandeis University
- Joel Meyerson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM FOR DETERMINING THE SURFACE AND MECHANICAL CHARACTERISTICS O...
- Publication number 20220317114
- Publication date Oct 6, 2022
- Universita Degli Studi Di Pavia
- Paola PERUGINI
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
APPARATUSES AND METHODS FOR COMBINED SIMULTANEOUS ANALYSES OF MATER...
- Publication number 20220205935
- Publication date Jun 30, 2022
- INEL S.A.S.
- Henry PILLIERE
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE MOUNTING SYSTEM FOR AN X-RAY ANALYSIS APPARATUS
- Publication number 20220187224
- Publication date Jun 16, 2022
- MALVERN PANALYTICAL B.V.
- Jaap BOKSEM
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF EXAMINING A SAMPLE USING A CHARGED PARTICLE BEAM APPARATUS
- Publication number 20220065804
- Publication date Mar 3, 2022
- FEI Company
- Oleksii Kaplenko
- G01 - MEASURING TESTING
Information Patent Application
Method and System for Stack Monitoring of Radioactive Nuclides
- Publication number 20220034827
- Publication date Feb 3, 2022
- Rotem Ind. Ltd.
- Alon Osovizky
- G01 - MEASURING TESTING
Information Patent Application
Graphene Oxide Affinity Sample Grids for Cyro-EM
- Publication number 20210310910
- Publication date Oct 7, 2021
- The Regents of the University of California
- Feng Wang
- C01 - INORGANIC CHEMISTRY
Information Patent Application
SYSTEM FOR ULTRA-HIGH TEMPERATURE IN-SITU FRETTING FATIGUE EXPERIMENT
- Publication number 20210285901
- Publication date Sep 16, 2021
- NANJING UNIVERSITY OF AERONAUTICS AND ASTRONAUTICS
- Qinan HAN
- G01 - MEASURING TESTING
Information Patent Application
Imaging Device
- Publication number 20210247335
- Publication date Aug 12, 2021
- Hitachi High-Tech Corporation
- Hiroyuki CHIBA
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Specimen supports; Sample conveying means

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Sample fixation mechanism for test with nano-probe, apparatus for t...

Battery cell and in situ battery electrode analysis method

Method and system for positioning and transferring a sample

Manufacturing method of sample collection component

Sample mounting system for an X-ray analysis apparatus

System for ultra-high temperature in-situ fretting fatigue experiment

System and method for detection and identification of foreign eleme...

Two-axis rotator

Method of examining a sample using a charged particle beam apparatus

Apparatuses and methods for combined simultaneous analyses of mater...

X-ray fluorescence analyzer comprising a measurement device, sample...

Systems, devices, and methods for x-ray fluorescence analysis of ge...

X-ray fluorescence measurement apparatus

Analytical method and apparatus

Sample holding device for X-ray analysis

Shielded X-ray radiation apparatus

Acquisition and processing of data in a tomographic imaging apparatus

Freezable fluid cell for cryo-electron microscopy

Imaging device

Sample holder

Analyzing apparatus, analyzing method, and program

Monitor for measuring mercury emissions

Graphene-based electro-microfluidic devices and methods for protein...

System and method for computed laminography x-ray fluorescence imaging

Radiation detection device and computer program

Dual-arm clamping type holder for transmission electron microscopy...

Magnetic holder for immunoelectron microscopy grids

Substrate contamination analysis system

Methods and devices for preparing sample for cryogenic electron mic...

Advanced drug development and manufacturing

Patents Applicationslast 30 patents

INTEGRATED FESEM AND LDI-TOF-MS ANALYSIS SYSTEM

Radiation Effects Testing System with a Beam Accelerator

APPARATUS AND METHOD FOR X-RAY FLUORESCENCE IMAGING

CHARGED PARTICLE BEAM DEVICE, AND SAMPLE OBSERVATION METHOD EMPLOYI...

XPS SAMPLE HOLDER, APPARATUS FOR X-RAY PHOTOELECTRON SPECTROSCOPY I...

Thin Film Damage Detection Function and Charged Particle Beam Device

METHOD OF EXAMINING A SAMPLE USING A CHARGED PARTICLE MICROSCOPE

AUTOMATED ANALYZER

X-RAY FLUORESCENCE WITH HEAVY ELEMENT TARGET AND METHODS OF USE THE...

Sample Holder Assembly for Optical Microscopy

Sample Container and Measuring Method

MANUFACTURING METHOD OF SAMPLE COLLECTION COMPONENT

SAMPLE HOLDER FOR DETECTION OF HYDROGEN PERMEATION AND HYDROGEN PER...

ELECTRON MICROSCOPY GRIDS AND HIGH-RESOLUTION STRUCTURAL DETERMINAT...

X-RAY FLUORESCENCE SYSTEM AND X-RAY SOURCE WITH ELECTRICALLY INSULA...

X-RAY ANALYZER

OBSERVATION DEVICE FOR OBSERVATION TARGET GAS, METHOD OF OBSERVING...

METHOD AND SYSTEM FOR POSITIONING AND TRANSFERRING A SAMPLE

GEOLOGICAL ANALYSIS SYSTEM, DEVICES AND METHODS USING X-RAY FLUORES...

DEVICE FOR CLOSING THE INPUT OPENING IN THE SAMPLE CHAMBER IN AN X-...

TRANSMISSION ELECTRON MICROSCOPE IN-SITU CHIP AND PREPARATION METHO...

FREEZABLE FLUID CELL FOR CRYO-ELECTRON MICROSCOPY

SYSTEM FOR DETERMINING THE SURFACE AND MECHANICAL CHARACTERISTICS O...

APPARATUSES AND METHODS FOR COMBINED SIMULTANEOUS ANALYSES OF MATER...

SAMPLE MOUNTING SYSTEM FOR AN X-RAY ANALYSIS APPARATUS

METHOD OF EXAMINING A SAMPLE USING A CHARGED PARTICLE BEAM APPARATUS

Method and System for Stack Monitoring of Radioactive Nuclides

Graphene Oxide Affinity Sample Grids for Cyro-EM

SYSTEM FOR ULTRA-HIGH TEMPERATURE IN-SITU FRETTING FATIGUE EXPERIMENT

Imaging Device