3162767

Information

• Patent Grant
• 3162767

• References
• Source

• Patent Number

  3,162,767

• Date Filed

  Not available

• Date Issued

  Tuesday, December 22, 1964
  60 years ago

• CPC

  • H01J37/3056 - for microworking
  • B23K15/00 - Electron-beam welding or cutting
  • G01N23/225 - using electron or ion microprobe or incident electron or ion beam
  • H01C17/2404 - by charged particle impact
  • H01J37/3005 - Observing the objects or the point of impact on the object
  • H01J37/302 - Controlling tubes by external information
  • H01L49/02 - Thin-film or thick-film devices

• US Classifications

  • 850 - Scanning-probe techniques or apparatus
  • 073 - Measuring and testing
  • 219 - Electric heating
  • 250 - Radiant energy