1. Field of the Invention
The present invention relates to chip packages and, more particularly, to a chip package assembly and its use for mounting at least one semiconductor chip, comprising a flange and a substrate, where the at least one semiconductor chip and the substrate are arranged on one side of the flange.
The present invention describes a chip package assembly which can be used for mounting and encapsulation of semiconductor chips containing for example vertical junction field effect transistors (VJFET).
2. Description of the Related Art
Inter alia high power RF semiconductor devices can be composed of VJFET structures. Chip packages are known, for example, from U.S. Pat. No. 6,318,622B1, U.S. Pat. No. 6,967,400B2, U.S. Pat. No. 6,465,883B2 and U.S. Pat. No. 7,256,494B2.
In U.S. Pat. No. 6,318,622B1 describes an assembly of high power chips that mounts to an additional substrate. Semiconductor chips are electrically connected to the main substrate by bonding wires. Ribbon connectors are used for external electrical connection. To protect the internal structure of the assembly an extra cap is used.
U.S. Pat. No. 6,967,400B2 describes an IC chip package including a substrate, a chip, adhesive means, a cover and a spacer. Vias at the end faces of the substrate are used for external electrical connection, where bonding wires pass through the vias. This provides a good possibility to connect the semiconductor chip electrically from outside the package.
Two main problems arise from the described conventional assemblies, i.e., the problem of connecting several substrates together and the problem of heat transfer. In practice, high power devices produce huge amounts of heat during use. This heat must be transferred to the environment, must not to exceed a critical temperature of the device and in worst case must not destroy the devices by a temperature exceeding the critical temperature. There is no possibility given to improve heat transfer, for example, by use of external cooling blocks.
U.S. Pat. No. 6,465,883B2 describes a high power transistor chip for high frequencies that is coupled to an electrically and thermally conductive flange at its backside.
U.S. Pat. No. 7,256,494B2 describes a chip package including a heat spreader at the backside of a chip. Here, electrical connectors are provided for the gate and drain of a transistor to be electrically connected with the substrate mount on top of the flange or heat spreader. The described conventional assemblies exhibit good thermal properties, but are restricted to use for applications where the electrical insulation of the flange or heat spreader from the ground is required. This electrical insulation is required, for example, with the use of VJFET chips with the drain connector located at the bottom of the chip.
It is therefore an object of the present invention to provide a chip package assembly with high efficiency of heat removal from a semiconductor chip, particularly for semiconductor chips with a transistor drain contact connection on the bottom side of the semiconductor chip. The bottom side of the semiconductor chip is the side opposite to the side with other electrical contacts such as source contacts and electrical connections of the semiconductor chip to external devices. The bottom side is the side with which the semiconductor chip is arranged on a mounting structure. A further object of the present invention is to provide a chip package assembly and method of use with the ability to mount and demount the semiconductor chip from the assembly. If the semiconductor chip shows a failure, it is advantageous to be able to easily remove and/or exchange the semiconductor chip with a properly functioning chip.
The foregoing objects and advantages are achieved in accordance with the invention by providing a chip package assembly and method for its use, where the chip package assembly for mounting at least one semiconductor chip in accordance with the present invention comprises a flange and a substrate, where the at least one semiconductor chip and the substrate are arranged on one side of the flange. In this case, the flange is the previously described mounting structure. The flange is composed of an electrical and thermally conducting material. This means that the material has a low electrical and thermal resistance compared to other materials like isolators.
The advantage of the chip package assembly in accordance with the present invention is a high efficiency of heat removal from the at least one semiconductor chip due to the flange. The semiconductor chip can have a transistor drain contact connection on the bottom side of the chip and still the flange can be thermally coupled to this side. The assembly is easy to use and easy to assemble, with a low number of parts, is cost effective and can be used in high frequency applications.
The conducting material of the flange can comprise or can be made of a metal, particularly a metal with high thermal conductivity, particularly copper. A flange made of copper shows a high thermal conductivity and is able to transfer heat away from the semiconductor chip well, which is produced, for example, in high power applications of the semiconductor chip. Cooling and keeping the semiconductor chip below a critical temperature in use also prevents damage and failure of the semiconductor chip.
The substrate can comprise a material with low losses at high frequencies. The substrate can, for example, be made of printed circuit board (PCB) material. This material does not adsorb much signal in high frequency applications; radiation with high frequency can pass it with little or no loss. PCB material is cheap, can be easy handled, is mechanically stable and other electronic or electric components such as electrical contacts can easy be arranged on such boards.
The at least one chip can comprise a transistor drain contact connection at the bottom side. The bottom side is the side facing the flange and is particularly opposite to the side with the other electrical contacts of the at least one semiconductor chip. The chip package assembly in accordance with the present invention allows also for a semiconductor chip with a transistor drain contact connection at the bottom side to fix it at the same side to a flange, respectively a cooling device.
The at least one semiconductor chip and/or substrate can be mounted on the one side of the flange using solder, eutectic alloy, electrical conductive adhesive and/or sinter paste. This allows easy and cost effective arrangement of the at least one semiconductor chip and/or substrate to the flange.
Connectors of the at least one semiconductor chip, particularly the connectors on the side of the at least one semiconductor chip opposite the side facing the flange, can be connected to the substrate by bonding, particularly by bonding with wires and/or ribbon lines. This gives an easy and good electrical connection between the at least one semiconductor chip and the substrate.
The chip package assembly can comprise electrical outlets for high frequency requirements connectable to external devices, particularly to an amplifier Printed Circuit Board. This makes it easy to use the chip package assembly in high frequency applications.
The substrate can comprise end side metalized places for electrical contact, particularly in electrical contact to the at least one semiconductor chip, for electrical contact to at least one external device. The end side metalized places can be arranged at the side face of substrate and/or soldered for contact to the at least one external device. The arrangement of the end side of metalized parts of substrate for electrical contact at side faces and soldering makes it easy to electrically contact external devices to the contacts. This arrangement makes it easy to contact electrically the semiconductor chip with external devices. The end side metalized places are easy to reach for electrical connection.
The chip package assembly can comprise an electrical isolation between the connectors of the at least one semiconductor chip and the flange. This prevents short circuits over the flange of the semiconductor chip contacts, especially for good electrically conducting flanges like the one made of copper.
The chip package assembly can comprise at least one cooling device, particularly a cooling block. Also other active or passive cooling devices can be thermally connected to the flange of the chip package assembly. For example, devices with a water cooling circuit or with an air fan can be used. This enables a good cooling of the at least one semiconductor chip even in high power applications with high amounts of waste heat. The chip package assembly can also comprise means for mounting the flange with the at least one semiconductor chip and the substrate to the cooling device. This means can be, for example, screws.
An electrical isolation can be arranged between the connectors of the at least one semiconductor chip and the cooling device. This prevents short circuits between connectors and/or via the cooling device. This prevents short circuits between connectors and/or via the cooling device.
The chip package assembly can comprise a dielectric substrate between the flange and the cooling device, particularly in plate form. It can be arranged on the opposite side of the flange, to the one side of the flange where the at least one semiconductor chip and the substrate are arranged, for electrical isolation.
The chip package assembly can further comprise an encapsulation to protect the at least one semiconductor chip and connectors. The encapsulation can be removable. This enables an easy exchange of semiconductor chips from the assembly such as if the semiconductor chip in use has a fail function.
The chip package assembly can comprise screws through dielectric sleeves to fasten the at least one semiconductor chip, substrate and flange to the cooling device. This enables an easy, fast and reliable assembly of the chip package assembly without electrical short circuits due to the screws.
A method to use the chip package assembly in accordance with the present invention comprises demounting of the chip package, particularly to demount the at least one chip from the substrate. This is also enabled by the arrangement of parts as described before for the chip package assembly itself. It allows the exchange of the at least one chip, especially if it shows a failure, with another, properly working chip.
The advantages in connection with the described method to use the chip package assembly in accordance with the present invention are similar to the previously, in connection with the chip package assembly described advantages.
Other objects and features of the present invention will become apparent from the following detailed description considered in conjunction with the accompanying drawings. It is to be understood, however, that the drawings are designed solely for purposes of illustration and not as a definition of the limits of the invention, for which reference should be made to the appended claims. It should be further understood that the drawings are not necessarily drawn to scale and that, unless otherwise indicated, they are merely intended to conceptually illustrate the structures and procedures described herein.
The present invention is further described hereinafter with reference to illustrated embodiments shown in the accompanying drawings, in which:
Shown in
During usage, the semiconductor chip 2 produces waste heat. In high power applications the waste heat can increase the temperature of the semiconductor chip 2 and damage it. This is why heat must be removed and transferred to the environment, to cool down the semiconductor chip 2 and/or to keep the temperature of the semiconductor chip 2 below a critical temperature. Above the critical temperature the electronic device of the semiconductor chip 2 can show failure and/or can be damaged. The flange 3, which is in good thermal contact to the chip 2, absorbs the waste heat of the semiconductor chip 2 and transfers it directly to the environment or to an additional cooling device, which is not shown in the figures for simplicity. An appropriate material for the flange 3 to consist of or to comprise is a metal with high thermal conductivity, such as copper.
For good mechanical and thermal connection between the semiconductor chip 2 and the flange 3, materials 5 for attachment of the semiconductor chip 2 are solders, eutectic alloys, electrical conductive adhesives and/or sinter paste. The semiconductor chip 2 and/or substrate 4 can be mounted on one and the same side of the flange using these materials. In between the semiconductor chip 2 and the flange 3 an electrical isolation 9 can be arranged. The electrical isolation can be made of a plate like isolating material, which prevents short circuits between the electrical connectors of the at least one semiconductor chip 2 and electrical contacts between the semiconductor chip 2 and the flange 3.
The substrate 4 is arranged on the same side of the flange 3 as the semiconductor chip 2, and it can comprise a recess within, where the semiconductor chip 2 can be arranged. Electrical outlets 7 on the substrate 4 are used to electrically contact the semiconductor chip 2. One way of electrically connect the semiconductor chip 2 and substrate 4 is bonding, for example, bonding with wires and/or ribbon lines 6. The electrical outlets 7 can extend to end-side metalized places of substrate 8. They can be arranged at side faces of the substrate 4 and can be soldered. The end-side metalized places of substrate 8 are suitable for electrical connection with external devices, for example, by wires soldered to the places 8. Via the end side metalized places and the electrical outlets 7 of substrate 8, bonded, for example, with wires and/or ribbon lines 6 to contact connections of the semiconductor chip 2, semiconductor the chip 2 can be electrically connected with external devices (not shown in figures for simplicity).
On top of the semiconductor chip 2, with its contact connections and bonded wires and/or ribbon lines 6, an encapsulation 13 can be arranged to protect the semiconductor chip 2 and connections mechanically and electrically. The encapsulation 13 or cover can be made of a polymer, which is not electrically conducting. It can be arranged and connected removable from the assembly to be able to exchange the semiconductor chip 2 if necessary.
As shown in
Dielectric sleeves 11 can be used to electrically isolate the screws 10 from the flange 3. The sleeves 11 can have a cupped form with washer head. The chip package assembly 1 can be clamped together in a sandwich like form by the means 11 and 12, and can be mechanically stably fixed or mounted to the cooling device.
Isolation of electrical conductive parts, such as flange 3, external cooling device and screws, from each other can improve the performance of the assembly 1, and makes its use possible in high frequency applications.
Features of the above described embodiments of the invention with itself and features from embodiments known from the state of the art can be combined. Different materials and forms of parts of the described assembly 1 are possible. For example, the flange 3 can be made, instead of copper, out of steel or other materials, particularly metals. The H like shape of the substrate 4 and the flange 3, with recesses for means 10, 11 to fix the assembly 1 together can, for example, also have a shape of an 8. Instead of an external cooling device, nuts can be used in connection with screws 10 to clamp the assembly 1 together.
A method to use the chip package assembly 1 comprises mounting the semiconductor chip 2 on the flange 3, for example, by using solder, eutectic alloy, electrical conductive adhesive and/or sinter paste 5. In between an electrical isolation 9 can be arranged. Around the semiconductor chip 2, on the same side of the flange 3 a substrate 4 is arranged, such as by also using solder, eutectic alloy, electrical conductive adhesive and/or sinter paste 5. The semiconductor chip 2 and electrical outlets 7 of the substrate 4 are electrically connected together, for example, by bonding with bond wires or ribbon lines 6. The electrical outlets 7 can extend to side faces of the substrate 4, which can be soldered for good electrical contact to external electrical devices like amplifiers. Arranging the semiconductor chip 2 on the flange 3 and not direct on the substrate 4, can permit a better heat transfer between the semiconductor chip 2 and flange 3.
An encapsulation 13 can be arranged on top of the semiconductor chip 2 and on top of electrical connections 6 to the outlets 7 of substrate 4. The encapsulation 13 can be in the form of a cap, which is removable. Alternatively, the semiconductor chip 2 can be enclosed in a casting compound. This can be a usual polymer used in the semiconductor industry to encapsulate semiconductor chips.
The use of removable encapsulation 13, which can be clamped by the means 10, 11 or glued to the substrate 4, enables an easy exchange of the semiconductor chip 2. The chip package assembly 1 can be demounted, particularly the at least one semiconductor chip (2) can be demounted from the substrate 4. For example, if the mounted semiconductor chip 2 shows a failed function in use, the semiconductor chip 2 can be exchanged with another, properly working chip. After removal of the encapsulation 13 bonding material 6 is removed, the semiconductor chip 2 is peeled of the flange 3, a new chip 2 is arranged on the flange 3 and, for example, is fixed using solder, eutectic alloy, electrical conductive adhesive and/or sinter paste 5. The semiconductor chip 2 connections and electrical outlets 7 on the substrate 4 are bonded together electrically. And the encapsulation is affixed to the assembly 1, for example, on top of the semiconductor chip 2, as shown in
Other additional steps are possible. For example a cleaning step of parts can be used to remove glue or solder, eutectic alloy, electrical conductive adhesive and/or sinter paste. The steps of the method according to the present invention can also be performed in another timely order. Also steps known from the state of the art can be performed alternatively or additionally to the described steps of the method according to the present invention.
Thus, while there have shown, described and pointed out fundamental novel features of the invention as applied to a preferred embodiment thereof, it will be understood that various omissions and substitutions and changes in the form and details of the devices illustrated, and in their operation, may be made by those skilled in the art without departing from the spirit of the invention. For example, it is expressly intended that all combinations of those elements which perform substantially the same function in substantially the same way to achieve the same results are within the scope of the invention. Moreover, it should be recognized that structures and/or elements shown and/or described in connection with any disclosed form or embodiment of the invention may be incorporated in any other disclosed or described or suggested form or embodiment as a general matter of design choice. It is the intention, therefore, to be limited only as indicated by the scope of the claims appended hereto.
This is a U.S. national stage of application No. PCT/RU2013/000031 filed 16 Jan. 2013.
Filing Document | Filing Date | Country | Kind |
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PCT/RU2013/000031 | 1/16/2013 | WO | 00 |