BRIEF DESCRIPTION OF THE DRAWINGS
FIG. 1 is a schematic structural view of a light source according to a first exemplary embodiment of the present invention.
FIG. 2 is an explanatory view showing trajectories of debris particles in the first exemplary embodiment.
FIG. 3 is an explanatory view showing a modification of the first exemplary embodiment.
FIGS. 4A and 4B are schematic structural views showing a second exemplary embodiment of the present invention.
FIG. 5 is an explanatory view showing calculation of the magnetic flux density for capturing debris particles.
FIG. 6 is an explanatory view showing calculation of the magnetic flux density for capturing debris particles.
FIG. 7 is an explanatory view showing the arrangement of magnets in the first exemplary embodiment.
FIG. 8 is an explanatory view showing the arrangement of the magnets in the first exemplary embodiment.
FIGS. 9A and 9B are explanatory views showing the direction of a magnetic line of force in the first exemplary embodiment.
FIG. 10 is an explanatory view of a related art.
FIG. 11 is an explanatory view of another related art.
FIG. 12 is a schematic structural view of an exposure apparatus.
FIG. 13 is a flowchart of a semiconductor-device manufacturing process.
FIG. 14 is a detailed flowchart of a wafer process in the process shown in FIG. 13.