The present invention relates to a method for manufacturing a micromechanical component including a cap structure and a micromechanical component manufactured using this method.
Micromechanical sensors such as pressure sensors, for example, require for sensor detection a media access from the surroundings to the sensor element. This necessary media access is generally achieved by a perforation in the cap which is situated above the sensor for the protection of the sensor element.
When very large perforations are used, with the use of the sensor, there is a risk that dust and water may penetrate the cap, so that under some conditions the accurate detection of sensor variables is threatened. One remedy to this problem might be the creation of very small openings for the passage of media. However, since such small openings are generally created with the aid of micromechanical etching processes, there is a risk when these openings are created after the capping that the sensor element may be damaged by the required etching process.
However, it is not easy to create small openings before capping since the handling during the application and the subsequent molding process during packaging may damage the fine structures generated in the cap and therefore render them useless.
The present invention provides an approach to create a cap including a plurality of small openings without adversely affecting the covered sensor element and/or the media access during processing.
The present invention relates to a method for manufacturing a micromechanical component and the micromechanical component manufactured using this method. In an example embodiment, the micromechanical component thereby includes a sensor substrate and a cap applied thereon. To create the cap, a plurality of openings is introduced into a cap substrate in a delimited area on the surface of the front side, e.g., in the form of microperforations (diameter a few μm). During the creation of these openings, however, care must be taken that the openings end in the cap substrate, i.e., they do not go all the way through the cap substrate and are therefore shallow. The cap substrate processed in this manner is subsequently applied to the sensor substrate, whereby the front side of the cap substrate including the plurality of openings is directed toward the sensor substrate. Finally, a portion of the cap substrate is removed from its back side, e.g., by back-thinning, a grinding process or another semiconductor process suitable for this. The removal of the cap substrate material from the back side creates access to the openings.
With this manufacturing method, therefore a cap of a sensor substrate may be created that has openings for a media access without damaging or clogging up these openings during the application process. The sensor structures situated on the sensor substrate and covered with the cap may also be protected during the manufacturing process by the initially closed openings.
This process makes possible, in particular in a molding process in which the cap and the sensor substrate are initially molded, a greater reliability of the manufacturing process since the covered sensor element cannot be damaged nor can the openings be closed.
Moreover, the subsequent back-thinning or grinding of the back side of the cap substrate also makes it possible to create very thin caps.
In one further embodiment of the present invention it may be provided that, in the delimited area in which the plurality of openings is created, a recess is initially created by removing some of the cap substrate material. This has the advantage that the openings are somewhat recessed from an enclosing frame. A configuration of this type has advantages during processing, in that the delimited area, which is weakened by the openings, is protected against direct mechanical contact with the sensor substrate. Moreover, a cavity may be created between the cap and sensor substrate by the projecting frame. This cavity or the distance between the openings and the sensor substrate may also be utilized by attaching a component directly to the sensor substrate inside the cavity.
However, a cavity of this type may also be achieved by a recess in the sensor substrate, e.g. during the creation of a sensor structure.
The placement of the delimited area in the cap substrate above a sensor structure created in the sensor substrate is particularly advantageous. For example, a diaphragm or an oscillating structure may be formed in the sensor substrate.
To place the cap substrate on the sensor substrate, as mentioned above, a frame is provided that encloses the delimited area. Even without a recess, i.e., a depression of the delimited area, this frame may be used to establish the connection to the sensor substrate. This may take place, for example, with the aid of a bonding process or an adhesive process.
To create the openings, a semiconductor process such as an etching process, e.g., a trench etching process, is used. With the aid of a process of this type, openings with very small diameters may be created with reasonable effort. Since these openings are intended to provide media access to the sensor element situated below them, the choice of a suitable diameter must take the intended use into consideration. However, these openings should primarily keep dust, dirt and fluids such as water away from the sensor element, although gaseous media may pass through unhindered.
On account of the use of a plurality of openings, the clogging of individual openings is not critical in terms of the function of the media passage.
Additional advantages arise from the following description of exemplary embodiments.
The method according to the present invention is described with reference to the accompanying
For the manufacture of the component according to the present invention, in a method step 120 (see
Cap substrate 210 provided with openings 220 is subsequently placed on sensor substrate 240 in method step 160 (see
In final method step 180, cap substrate 210 is ground or back-thinned from its back side 310. As a result of this removal of material, the openings are opened toward the back side, so that media access from the surroundings into cavity 260 and/or to a sensor element situated in the sensor substrate 240 becomes possible (see
As noted above, in step 160 a sensor element or a sensor structure may be provided in sensor substrate 240. For this purpose, diaphragms are particularly well-suited for a diaphragm sensor, e.g. a pressure sensor or a gas sensor, or even movable structures such as acceleration and/or rotation rate sensors, for example. In a further configuration, the sensor element may be situated in sensor substrate 240 recessed from its surface. This has the advantage that cap 270 forms a cavity 260 with frame 230 and openings 220 together with the sensor substrate without the need for further measures.
Number | Date | Country | Kind |
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102015211778.2 | Jun 2015 | DE | national |
The present application claims the benefit under 35 U.S.C. §119 of German Patent Application No. DE 102015211778.2 filed on Jun. 25, 2015, which is expressly incorporated herein by reference in its entirety.