This invention relates generally to processing flexible substrate assemblies, and relates more particularly to a method of decreasing distortion of a flexible substrate and the flexible substrate assemblies therefrom.
In the electronics industry, flexible substrates are quickly becoming popular as a base for electronic circuits. Flexible substrates can include a wide variety of materials including, for example, any of a myriad of plastics. Once a desired electronic component, circuit, or circuits are formed over a surface of the flexible substrate, the flexible substrate can be attached to a final product or incorporated into a further structure. Typical examples of such products or structures are active matrices on flat panel displays, RFID (radio-frequency identification) tags on various commercial products in retail stores, a variety of sensors, etc.
One major problem that arises, however, is stabilizing the flexible substrate during processing. For example, in a process of fabricating a thin film, a thin film transistors (TFTs) or thin film transistor circuits (TFT circuits) on a flexible substrate, a large number of process steps are performed during which the flexible substrate may be moved through several machines, ovens, cleaning steps, etc. To move a flexible substrate through such a process, the flexible substrate is typically temporarily mounted to some type of carrier substrate so that the flexible substrate can be moved between process steps.
However, the relatively high coefficient of thermal expansion (CTE) for flexible substrates compared to typical carrier substrates leads to significant CTE induced strain mismatch during temperature excursions of the TFT or TFT circuit processing. This phenomenon introduces significant distortion of the flexible substrate and can lead to handling errors, photolithographic alignment errors, and line/layer defects.
Therefore, a need exists in the art to develop novel compositions and methodologies for coupling a flexible substrate to a carrier substrate to mediate the preceding limitations.
To facilitate further description of the embodiments, the following drawings are provided in which:
For simplicity and clarity of illustration, the drawing figures illustrate the general manner of construction, and descriptions and details of well-known features and techniques may be omitted to avoid unnecessarily obscuring the invention. Additionally, elements in the drawing figures are not necessarily drawn to scale. For example, the dimensions of some of the elements in the figures may be exaggerated relative to other elements to help improve understanding of embodiments of the present invention. The same reference numerals in different figures denote the same elements.
The terms “first,” “second,” “third,” “fourth,” and the like in the description and in the claims, if any, are used for distinguishing between similar elements and not necessarily for describing a particular sequential or chronological order. It is to be understood that the terms so used are interchangeable under appropriate circumstances such that the embodiments described herein are, for example, capable of operation in sequences other than those illustrated or otherwise described herein. Furthermore, the terms “include,” and “have,” and any variations thereof, are intended to cover a non-exclusive inclusion, such that a process, method, system, article, device, or apparatus that comprises a list of elements is not necessarily limited to those elements, but may include other elements not expressly listed or inherent to such process, method, system, article, device, or apparatus.
The terms “left,” “right,” “front,” “back,” “top,” “bottom,” “over,” “under,” and the like in the description and in the claims, if any, are used for descriptive purposes and not necessarily for describing permanent relative positions. It is to be understood that the terms so used are interchangeable under appropriate circumstances such that the embodiments of the invention described herein are, for example, capable of operation in other orientations than those illustrated or otherwise described herein.
The terms “couple,” “coupled,” “couples,” “coupling,” and the like should be broadly understood and refer to connecting two or more elements or signals, electrically, mechanically, and/or otherwise. Two or more electrical elements may be electrically coupled, but not be mechanically coupled; two or more mechanical elements may be mechanically coupled but not be electrically coupled; two or more electrical elements may be mechanically coupled, but not be electrically coupled. Coupling (whether only mechanical, only electrical, etc.) may be for any length of time, e.g., permanent or semi-permanent or only for an instant.
The absence of the word “removably,” “removable,” and the like near the word “coupled,” and the like does not mean that the coupling, etc. in question is or is not removable.
Some embodiments include a method of preparing a flexible substrate assembly. The method can include: (a) providing a carrier substrate; (b) providing a cross-linking adhesive; (c) providing a plastic substrate; and (d) coupling the carrier substrate to the plastic substrate using the cross-linking adhesive.
Other embodiments include a flexible substrate assembly can include: (a) a carrier substrate with a first surface; (b) a cross-linking adhesive; and (c) a plastic substrate having a first surface and a second surface opposite the first surface. The first surface of the carrier substrate is removably bonded to the first surface of the plastic substrate with the cross-linking adhesive.
Further embodiments include a method of fabricating a semiconductor device over a flexible plastic substrate. This method can include: (a) providing a flexible plastic substrate having a first surface and a second surface opposite the first surface; (b) attaching a protective material to the first surface of the flexible plastic substrate; (c) providing a support substrate with a first surface and a polished second surface opposite the first surface; (d) providing a cross-linking acrylic adhesive; (e) spin-coating the cross-linking acrylic adhesive onto the first surface of the support substrate; (f) removably coupling the first surface of the support substrate to the second surface of the flexible plastic substrate using the cross-linking acrylic adhesive; and (g) laminating the support substrate and the flexible plastic substrate with the cross-linking acrylic adhesive between the support substrate and the flexible plastic substrate.
Many embodiments include a method. The method comprises: providing a carrier substrate; providing a cross-linking adhesive, the cross-linking adhesive being configured to outgas at a rate of less than approximately 2×10−4 Torr-liters per second; providing a plastic substrate; and coupling the carrier substrate to the plastic substrate using the cross-linking adhesive.
Other embodiments include a flexible substrate assembly. The flexible substrate assembly comprises a carrier substrate with a first surface, a cross-linking adhesive, the cross-linking adhesive being configured to outgas at a rate of less than approximately 2×10−4 Torr-liters per second, and a plastic substrate having a first surface and a second surface opposite the first surface. Meanwhile, the first surface of the carrier substrate can be coupled to the first surface of the plastic substrate with the cross-linking adhesive.
Further embodiments include a method. The method comprises: providing a carrier substrate; providing a cross-linking adhesive, the cross-linking adhesive being configured to outgas at a rate of less than approximately 2×10−4 Torr-liters per second; providing a plastic substrate; and coupling the carrier substrate to the plastic substrate using the cross-linking adhesive. Further, coupling the carrier substrate to the plastic substrate using the cross-linking adhesive can comprise: spin-coating the cross-linking acrylic adhesive across a first surface of the carrier substrate such that a thickness of the cross-linking adhesive is in the range of approximately five micrometers to approximately fifteen micrometers; using the cross-linking acrylic adhesive to couple the first surface of the carrier substrate to a first surface of the plastic substrate; and laminating the carrier substrate and the plastic substrate with the cross-linking acrylic adhesive located between the support substrate and the plastic substrate.
The term “bowing” as used herein means the curvature of a substrate about a median plane, which is parallel to the top and bottom sides, or major surfaces of the substrate. The term “warping” as used herein means the linear displacement of the surface of a substrate with respect to a z-axis, which is perpendicular to the top and bottom sides, or major surfaces of the substrate. The term “distortion” as used herein means the curvature or stress of a substrate in-plane (i.e., the x-y plane, which is parallel to the top and bottom sides, or major surfaces of the substrate). For example, distortion could include shrinkage in the x-y plane of a substrate and/or expansion in the x-y plane of the substrate.
The term “CTE matched material” as used herein means a material that has a coefficient of thermal expansion (CTE) which differs from the CTE of a reference material by less than about 20%. Preferably, the CTEs differ by less than about 10%, 5%, 3%, or 1%. As used herein, “polish” can mean to lap and polish a surface or to only lap the surface.
Turning to the drawings,
Method 100 includes a procedure 111 of providing a flexible substrate. The term “flexible substrate” as used herein means a free-standing substrate comprising a flexible material which readily adapts its shape. In some embodiments, procedure 111 can include providing a flexible substrate with a low elastic modulus. For example, a low elastic modulus can be considered an elastic modulus of less than approximately five GigaPascals (GPa).
In many examples, the flexible substrate is a plastic substrate. For example, flexible substrates can include polyethylene naphthalate (PEN), polyethylene terephthalate (PET), polyethersulfone (PES), polyimide, polycarbonate, cyclic olefin copolymer, or liquid crystal polymer.
In many examples, the flexible substrate can include a coating at one or more sides of the flexible substrate. The coating can improve the scratch resistance of the flexible substrate and/or help prevent outgassing, oligomer crystallization on the surface of the flexible substrate, and/or other leakage of chemicals from the flexible substrate. Moreover, the coating can planarize the side of the flexible substrate over which it is located. The coating also can help decrease distortion. In some examples, the coating is located only at the side of the flexible substrate where the electrical device will be fabricated. In other examples, the coating is at both sides of the flexible substrate. In various embodiments the flexible substrate can be provided pre-planarized. For example, the flexible substrate can be a PEN substrate from DuPont Teij in Films of Tokyo, Japan, sold under the tradename “planarized Teonex® Q65.” In other embodiments, a flexible substrate can be planarized after being provided.
The thickness of the plastic substrate can be in the range of approximately 25 micrometers to approximately 300 micrometers. In the same or different embodiments, the thickness of the plastic substrate can be in the range of approximately 100 micrometers to approximately 200 micrometers.
In some examples, the flexible substrate can be provided by cutting a sheet of a plastic substrate from a roll of the plastic material using a paper cutter or a pair of ceramic scissors. In various examples, after cutting the plastic substrate, the cut sheet is blown clean with a nitrogen gun. In some embodiments of method 100, either or both of the cutting and blowing processes can be part of a procedure 112, described below, instead of being part of procedure 111.
Method 100 of
Procedure 112 of
In some examples, the flexible substrate can be baked using a vacuum bake process. For example, the temperature in an oven containing the flexible substrate can be ramped up over approximately two to three hours to approximately 160 degrees Celsius (° C.) to approximately 200° C. The flexible substrate can be baked for one hour at approximately 160° C. to approximately 200° C. and at a pressure of approximately one to approximately ten milliTorr. Then, the temperature in the oven can be lowered to between approximately 90° C. to approximately 115° C., and the flexible substrate can be baked for approximately eight more hours. Other baking processes can be also be used. After the baking process is complete, the plastic substrate can be wiped clean of any residues or chemicals that were baked off.
Subsequently, procedure 112 of
The protective template can be 5 mm (millimeters) to 15 mm thick and cut to a length of approximately 0.5 m (meters) to approximately 1.5 m. In other embodiments, the protective template can be 50 micrometers to 15 mm thick and cut to a length of approximately 0.5 m (meters) to approximately 1.5 m. In various embodiments, as part of process 231, the protective template is folded in half and run through rollers (e.g., a hot roll laminator) to help lock in the fold. A line trace of a carrier substrate can also be made on the back side of the protective sheet as part of process 231. Additionally, the protective template can be baked at approximately 90° C. to approximately 110° C. for approximately five minutes to approximately ten minutes to help flatten the protective template.
Procedure 112 of
The protective material prevents scratches and adhesive from covering the planarized surface of the flexible substrate and, thus, reduces defects. In some examples, blue low tack tape (e.g., from Semiconductor Equipment Corporation, part number 18133-7.50) or Mylar could be used as the protective material. The protective material can be approximately 25 micrometers to approximately 100 micrometers thick. For example, the protective material can be approximately 70 micrometers thick. In some examples, the protective material is applied by rolling the protective material onto the planarized surface of the flexible substrate using a roller to remove air bubbles between the protective material and the flexible substrate.
Subsequently, procedure 112 of
If the pressing of the punch cut template cuts completely through the flexible substrate, the flexible substrate is scrapped because the press cut can create cracks in a coating on the flexible substrate that propagate throughout the flexible substrate. After the wafer shape is outlined into the flexible substrate and/or the protective material using the press, the flexible substrate and the protective material are cut simultaneously with each other. In some examples, the flexible substrate and protective material are cut using ceramic scissors approximately one millimeter outside the impression made by the punch cut template.
In some examples, the flexible substrate includes a tab extending from the wafer shape in the flexible substrate and the protective material. The tab can be used to help align the flexible substrate to a carrier substrate when traveling through a laminator in procedure 117 of
Referring back to
Next, procedure 112 of
Subsequently, procedure 112 of
After coupling the flexible substrate to the protective coating, the protective template is then folded over the flexible substrate.
In some examples, only one side of the flexible substrate is attached to the protective template. In other examples, both sides of the flexible substrate are attached to the protective template.
Next, procedure 112 of
After laminating the flexible substrate and protective template, procedure 112 is complete. Referring back to
The carrier substrate can include a first surface and a second surface opposite the first surface. In some examples, at least one of the first surface and the second surface has been polished. Polishing the surface that is not subsequently coupled to the flexible substrate improves the ability of a vacuum or air chuck to handle the carrier substrate. Also, polishing the surface that is subsequently coupled to the flexible substrate removes topological features of the surface of the carrier substrate that could cause roughness of the flexible substrate assembly in the z-axis after the coupling with the flexible substrate.
In various embodiments, the carrier substrate comprises at least one of the following: alumina (Al2O3), silicon, low CTE glass, steel, sapphire, barium borosilicate, soda lime silicate, an alkali silicate, or another material that is CTE matched to the flexible substrate. The CTE of the carrier substrate should be matched to the CTE of the flexible substrate. Non-matched CTEs can create stress between the carrier substrate and the flexible substrate.
For example, the carrier substrate could comprise sapphire with a thickness between approximately 0.7 mm and approximately 1.1 mm. The carrier substrate could also comprise 96% alumina with a thickness between approximately 0.7 mm and approximately 1.1 mm. In a different embodiment, the thickness of the 96% alumina is approximately 2.0 mm. In another example, the carrier substrate could be a single crystal silicon wafer with a thickness of at least approximately 0.65 mm. In still a further embodiment, the carrier substrate could comprise stainless steel with a thickness of at least approximately 0.5 mm. In some examples, the carrier substrate is slightly larger than the flexible substrate.
Next, method 100 of
In various embodiments, the cross-linking adhesive is a cross-linking acrylic adhesive. In the same or different embodiment, the cross-linking adhesive is a cross-linking pressure sensitive acrylic adhesive or a cross-linking viscoelastic polymer. In some examples, the CTE of the adhesive is very large compared to the CTE of the flexible substrate and the carrier substrate. However, the CTE of the adhesive is not important because the adhesive does not create any stress (i.e., viscoelasticity) between the flexible substrate and carrier substrate because the layer of adhesive is so thin compared to the thickness of the flexible substrate and carrier substrate.
Subsequently, method 100 of
For example, the carrier substrate can be coated with the cross-linking adhesive. The carrier substrate and the cross-linking adhesive can be spun to distribute the cross-linking adhesive over a first surface of the carrier substrate. In some embodiments, the cross-linking adhesive is spin coated on the carrier substrate by spinning the carrier substrate with the cross-linking adhesive at approximately 900 rpm (revolutions per minute) to 1100 rpm for approximately 20 seconds to approximately 30 seconds and then spinning the carrier substrate with the cross-linking adhesive at approximately 3400 rpm to approximately 3600 rpm for approximately 10 seconds to 30 seconds. In a different embodiment, the carrier substrate with the cross-linking adhesive is spun at approximately 600 rpm to approximately 700 rpm to coat the surface of the carrier substrate and then spun at approximately 3400 rpm to approximately 3600 rpm to control the thickness of the cross-linking adhesive.
Prior to spin coating, the cross-linking adhesive can be dispensed onto or over a geometric center of the carrier substrate. In a different embodiment, the cross-linking adhesive can be dispensed onto or over the carrier substrate while the carrier substrate is spinning.
The thickness of the cross-linking adhesive over the carrier substrate after the depositing procedure can be between approximately five micrometers and approximately fifteen micrometers. In another embodiment, the thickness of the cross-linking adhesive over the carrier substrate after the depositing procedure can be between approximately three micrometers and approximately fifteen micrometers. In the same or different embodiment, the thickness of the cross-linking adhesive over the carrier substrate after the depositing procedure can be between approximately ten micrometers and approximately twelve micrometers.
Method 100 of
In other examples, the cross-linking adhesive is not baked. For example, if the cross-linking adhesive does not include any solvents, a bake is not necessary. Moreover, if the cross-linking adhesive is very viscous, solvents may even be added to the cross-linking adhesive to decrease the viscosity before the adhesive is deposited in procedure 115.
Afterwards, the carrier substrate can be placed on the protective template. The flexible substrate is already coupled to one portion (or half) of the protective template as shown in
Next, method 100 of
In some examples, the carrier substrate is coupled to the flexible substrate using the cross-linking adhesive by laminating the flexible substrate assembly between the protective template halves to remove air bubbles between the carrier substrate and the flexible substrate. Laminating the flexible substrate involves first aligning the carrier substrate with the flexible substrate so that, when laminated, the carrier substrate and the flexible substrate are aligned. Then, the aligned structure can be fed through a hot roll laminator, which can be the same laminator of process 237 of
Also, in various embodiments, the protective material may stick to the protective template when laminated. To avoid this problem, a shield material can be located between the protective template and the protective material before the lamination of process 237 and/or process 232. The shield material can be, for example, wax paper. In one embodiment, the shield material is originally coupled to the protective material when acquired from the manufacturer.
In the same or different embodiments, some of the cross-linking adhesive can be squeezed out from between the carrier and flexible substrates during lamination and adhere to the first side or the top of the flexible substrate, particularly because the carrier substrate and the overlying cross-linking adhesive layer is slightly larger than the flexible substrate. The presence of the protective material, however, prevents this problem from occurring. The cross-linking adhesive that squeezes out and adheres to the top of the protective material (instead of the flexible substrate) is inconsequential because the protective material is eventually removed and discarded.
Referring again back to
Procedure 118 of
Referring again to
Subsequently, procedure 118 of
Next, procedure 118 of
Procedure 118 of
In various examples, the cross-linking adhesive is thermally cured during the baking in process 636. In some examples, the edges of the cross-linking adhesive are UV cured, and the rest of the cross-linking adhesive is thermally cured during the baking of process 636.
Subsequently, procedure 118 of
Next, procedure 118 of
In some examples, the flexible substrate assembly can be baked using a vacuum bake process. For example, the temperature in an oven containing the flexible substrate assembly can be ramped up over two to three hours to approximately 160° C. to approximately 190° C. The flexible substrate assembly can be baked for approximately 50 minutes to 70 minutes at 180° C. and with a pressure of approximately 1 millitorr to approximately 10 millitorr. The temperature in the oven can then be lowered to between approximately 90° C. to 115° C., and the flexible substrate assembly can be baked for approximately seven more hours to approximately nine more hours. Other baking processes can be also be used. After the baking process is complete, the flexible substrate assemblies are cleaned and placed in an oven at approximately 90° C. to 110° C. for a minimum of approximately two hours.
After baking the flexible substrate assembly, procedure 118 is complete. Referring again back to
Referring again to
Method 100, as described herein, and similar methods can allow fabrication of one or more electrical components on a flexible substrate with zero or at least minimal distortion (e.g. less than or approximately the limits of the sensitivity of an Azores 5200, manufactured by Azores Corporation of Wilmington, Mass.). Prior art methods of fabricating electrical components on the flexible substrate suffer from significant distortion problems that can lead to handling errors, photolithographic alignment errors, and line/layer defects.
Although the invention has been described with reference to specific embodiments, it will be understood by those skilled in the art that various changes may be made without departing from the spirit or scope of the invention. For example, it will be readily apparent that additional baking and/or cleaning procedures can be added to method 100. Also, the manual procedures described herein can be performed by a machine and automated. Additional examples of such changes have been given in the foregoing description. Accordingly, the disclosure of embodiments is intended to be illustrative of the scope of the invention and is not intended to be limiting. It is intended that the scope of the invention shall be limited only to the extent required by the appended claims. To one of ordinary skill in the art, it will be readily apparent that the flexible substrate assembly and methods discussed herein may be implemented in a variety of embodiments, and that the foregoing discussion of certain of these embodiments does not necessarily represent a complete description of all possible embodiments. Rather, the detailed description of the drawings, and the drawings themselves, disclose at least one preferred embodiment, and may disclose alternative embodiments.
All elements claimed in any particular claim are essential to the embodiment claimed in that particular claim. Consequently, replacement of one or more claimed elements constitutes reconstruction and not repair. Additionally, benefits, other advantages, and solutions to problems have been described with regard to specific embodiments. The benefits, advantages, solutions to problems, and any element or elements that may cause any benefit, advantage, or solution to occur or become more pronounced, however, are not to be construed as critical, required, or essential features or elements of any or all of the claims.
Moreover, embodiments and limitations disclosed herein are not dedicated to the public under the doctrine of dedication if the embodiments and/or limitations: (1) are not expressly claimed in the claims; and (2) are or are potentially equivalents of express elements and/or limitations in the claims under the doctrine of equivalents.
This application is a continuation of U.S. patent application Ser. No. 13/118,225, filed May 27, 2011. Meanwhile, U.S. patent application Ser. No. 13/118,225 is a continuation of PCT Application No. PCT/US2009/066259, filed Dec. 1, 2009, which claims the benefit of (a) U.S. Provisional Application No. 61/119,217, filed Dec. 2, 2008, (b) U.S. Provisional Application No. 61/182,464, filed May 29, 2009, and (c) U.S. Provisional Application No. 61/230,051, filed Jul. 30, 2009. U.S. patent application Ser. No. 13/118,225, PCT Application No. PCT/US2009/066259 and U.S. Provisional Application Nos. 61/119,217, 61/182,464, and 61/230,051 are incorporated herein by reference in their entirety.
The U.S. Government has a paid-up license in this invention and the right in limited circumstances to require the patent owner to license to others on reasonable terms as provided by the terms of Grant/Contract No. W911NF-04-2-0005 by the Army Research Lab (ARL).
Number | Name | Date | Kind |
---|---|---|---|
3089801 | Tierney et al. | May 1963 | A |
3684637 | Andersen et al. | Aug 1972 | A |
4221083 | Carroll | Sep 1980 | A |
4337107 | Eshleman | Jun 1982 | A |
4349593 | Blechstein | Sep 1982 | A |
4831799 | Glover et al. | May 1989 | A |
4858073 | Gregory | Aug 1989 | A |
5007217 | Glover et al. | Apr 1991 | A |
5042655 | Beldyk et al. | Aug 1991 | A |
5098772 | af Strom | Mar 1992 | A |
5220488 | Denes | Jun 1993 | A |
5229882 | Rowland | Jul 1993 | A |
5264063 | Martin | Nov 1993 | A |
5417743 | Dauber | May 1995 | A |
5417974 | Sekiyama et al. | May 1995 | A |
5714305 | Teng et al. | Feb 1998 | A |
5769807 | Haddock et al. | Jun 1998 | A |
5853511 | Fairbanks | Dec 1998 | A |
5869150 | Iwamoto | Feb 1999 | A |
5890429 | Alam et al. | Apr 1999 | A |
5916652 | Miner et al. | Jun 1999 | A |
5962806 | Coakley et al. | Oct 1999 | A |
6051289 | Tsujimoto et al. | Apr 2000 | A |
6083580 | Finestone et al. | Jul 2000 | A |
6177156 | Glover et al. | Jan 2001 | B1 |
6177163 | Blok et al. | Jan 2001 | B1 |
6287869 | Hug et al. | Sep 2001 | B1 |
6482288 | Kreckel et al. | Nov 2002 | B1 |
6550092 | Brown et al. | Apr 2003 | B1 |
6558975 | Sugino et al. | May 2003 | B2 |
6627037 | Kurokawa et al. | Sep 2003 | B1 |
6630289 | Kwok et al. | Oct 2003 | B1 |
6693944 | Hug et al. | Feb 2004 | B1 |
6808773 | Shimamura et al. | Oct 2004 | B2 |
6825068 | Denis et al. | Nov 2004 | B2 |
6989407 | Lapin | Jan 2006 | B2 |
7070859 | Imanaka et al. | Jul 2006 | B2 |
7212088 | Norregaard et al. | May 2007 | B1 |
7316942 | Sarma et al. | Jan 2008 | B2 |
7838328 | Isa | Nov 2010 | B2 |
7906193 | Yukawa et al. | Mar 2011 | B2 |
8048251 | Yamashita et al. | Nov 2011 | B2 |
20020008839 | Miyai et al. | Jan 2002 | A1 |
20020018173 | Furukawa et al. | Feb 2002 | A1 |
20030072889 | Abrams | Apr 2003 | A1 |
20030077442 | Inokuchi et al. | Apr 2003 | A1 |
20040008298 | Kwok et al. | Jan 2004 | A1 |
20040042379 | Schoeppel | Mar 2004 | A1 |
20040110326 | Forbes et al. | Jun 2004 | A1 |
20040168182 | Kakuta et al. | Aug 2004 | A1 |
20050242341 | Knudson et al. | Nov 2005 | A1 |
20050249943 | Nishikawa et al. | Nov 2005 | A1 |
20060017154 | Eguchi et al. | Jan 2006 | A1 |
20060063851 | Lapin | Mar 2006 | A1 |
20060169485 | Kawaguchi et al. | Aug 2006 | A1 |
20060180815 | Sarma et al. | Aug 2006 | A1 |
20060202171 | Yoshida et al. | Sep 2006 | A1 |
20060223282 | Amundson et al. | Oct 2006 | A1 |
20070003775 | Ushino et al. | Jan 2007 | A1 |
20070054085 | Nagate | Mar 2007 | A1 |
20070059478 | Nagate et al. | Mar 2007 | A1 |
20070178297 | Takada et al. | Aug 2007 | A1 |
20070223348 | Sasaki | Sep 2007 | A1 |
20070241436 | Ookubo et al. | Oct 2007 | A1 |
20070243489 | Watanabe | Oct 2007 | A1 |
20070263152 | Mazaki et al. | Nov 2007 | A1 |
20080050548 | Abrams | Feb 2008 | A1 |
20080179594 | Oh | Jul 2008 | A1 |
20080316896 | Usami | Dec 2008 | A1 |
20090004419 | Cok et al. | Jan 2009 | A1 |
20090008132 | Takasawa et al. | Jan 2009 | A1 |
20090022031 | Usami | Jan 2009 | A1 |
20090022967 | Inenaga | Jan 2009 | A1 |
20090029151 | Noguchi et al. | Jan 2009 | A1 |
20090067798 | Hikita et al. | Mar 2009 | A1 |
20090101903 | Chen et al. | Apr 2009 | A1 |
20090208673 | Seki et al. | Aug 2009 | A1 |
20100003512 | Ookubo et al. | Jan 2010 | A1 |
20100003513 | Ookubo et al. | Jan 2010 | A1 |
20100026936 | Uesaka et al. | Feb 2010 | A1 |
20100038023 | Kho et al. | Feb 2010 | A1 |
20100059171 | Chun | Mar 2010 | A1 |
20100124627 | Nonaka et al. | May 2010 | A1 |
20110064953 | O'Rourke et al. | Mar 2011 | A1 |
Number | Date | Country |
---|---|---|
1118075 | Mar 1996 | CN |
101231972 | Jul 2007 | CN |
101288348 | Oct 2008 | CN |
01-198094 | Sep 1989 | JP |
07-22795 | Jan 1995 | JP |
07-022795 | Jan 1995 | JP |
08-148814 | Jul 1996 | JP |
11-340462 | Oct 1999 | JP |
2005-123576 | Dec 2005 | JP |
2007146121 | Jun 2007 | JP |
20070103050 | Oct 2007 | KR |
2006088564 | Aug 2006 | WO |
2007083906 | Jul 2007 | WO |
2008005979 | Jan 2008 | WO |
Entry |
---|
International Search Report and Written Opinion for PCT/US2012/066833 dated Jan. 17, 2013, 11 pages. |
International Search Report from PCT/US09/66259, 3 pages, May 5, 2010. |
Number | Date | Country | |
---|---|---|---|
20130271930 A1 | Oct 2013 | US |
Number | Date | Country | |
---|---|---|---|
61119217 | Dec 2008 | US | |
61182464 | May 2009 | US | |
61230051 | Jul 2009 | US |
Number | Date | Country | |
---|---|---|---|
Parent | 13118225 | May 2011 | US |
Child | 13913141 | US | |
Parent | PCT/US2009/066259 | Dec 2009 | US |
Child | 13118225 | US |