Patent Application
20180312966
The present disclosure relates generally to methods of depositing thin films. In particular, the disclosure relates to processes for the deposition of films comprising tungsten.
Manufacturing of 3D-NAND devices and devices for applications such as logic and DRAM includes a process that can fill the word lines, vias, gaps, etc. with a metal. The presence of a metal in the word lines allows electrical connections to the control gates of NAND transistors. One challenge of such a metal fill is that, for example, the 3D-NAND structures are microns deep. Another challenge is that the metal also has to fill the lateral spaces between the stacks of insulator (commonly silicon oxide).
The deposition of tungsten-containing thin films in features with ultra-high aspect ratios is challenging. The 3D semiconductor devices require seamless tungsten fill into horizontal and reentrant trenches. Incomplete trench filling may lead to high resistance, contamination, loss of filled materials, and, therefore, degradation of device performance.
Conventionally, the atomic layer deposition (ALD) of tungsten-containing materials are based on the binary reaction WF6+3H2→W+6HF. Briefly, WF6 and H2 are exposed to substrate surface alternatingly (sequentially). It is believed that WF6 partially decomposes on the substrate surface in a self-limiting reaction to form a fluorinated W surface with W-F exposed. An H2 pulse reduces the fluorinated W-F surface to W. However, the reaction of WF6 with the substrate (typically TiN) is very slow and exhibits significant incubation delay. This nucleation issue of WF6 on the substrate surface results in random surface growth and poor deposition conformality.
There is a need in the art for methods of depositing a penetrating and conformal film to fill device components such as 3D-NAND word lines, vias and gaps for logic and DRAM and other applications. Additionally, there is a need in the art for methods of conformally and efficiently depositing tungsten-containing films.
One or more embodiments of the disclosure are directed to processing methods comprising forming a silicon-containing nucleation layer by exposing a substrate surface having at least one feature thereon to a poly-silane precursor. The substrate is sequentially exposed to a metal precursor and a reducing agent to form a metal film on the nucleation layer.
Additional embodiments of the disclosure are directed to processing methods comprising positioning a substrate surface in a processing chamber. The substrate surface has at least one feature thereon. The substrate surface is exposed to a poly-silane precursor to form silicon-containing nucleation layer having a thickness. The substrate surface is sequentially exposed to a metal halide precursor and a reducing agent to form a metal film on the nucleation layer.
Further embodiments of the disclosure are directed to processing methods comprising placing a substrate having a substrate surface with at least one feature thereon into a processing chamber comprising a plurality of sections, each section separated from adjacent sections by a gas curtain. At least a portion of the substrate surface is exposed to a first process condition in a first section of the processing chamber. The first process condition comprises disilane. The substrate is laterally moved through a gas curtain to a second section of the processing chamber. The substrate surface is exposed to a second process condition in the second section of the processing chamber. The second process condition comprises WF6. Exposure to the first process condition and the second process condition including lateral movement is repeated to grow a nucleation layer having a thickness in the range of about 20Å to about 60Å. The substrate surface is laterally moved through a gas curtain to a section of the processing chamber having a third process condition. The third process condition comprises hydrogen. The second process condition and the third process condition including lateral movement between are repeated to form a tungsten-rich tungsten silicide film of a predetermined thickness. The tungsten-rich tungsten silicide film has in the range of about 5 atomic % to about 20 atomic % silicon.
So that the manner in which the above recited features of the present invention can be understood in detail, a more particular description of the invention, briefly summarized above, may be had by reference to embodiments, some of which are illustrated in the appended drawings. It is to be noted, however, that the appended drawings illustrate only typical embodiments of this invention and are therefore not to be considered limiting of its scope, for the invention may admit to other equally effective embodiments.
Before describing several exemplary embodiments of the invention, it is to be understood that the invention is not limited to the details of construction or process steps set forth in the following description. The invention is capable of other embodiments and of being practiced or being carried out in various ways.
A “substrate” as used herein, refers to any substrate or material surface formed on a substrate upon which film processing is performed during a fabrication process. For example, a substrate surface on which processing can be performed include materials such as silicon, silicon oxide, strained silicon, silicon on insulator (SOI), carbon doped silicon oxides, amorphous silicon, doped silicon, germanium, gallium arsenide, glass, sapphire, and any other materials such as metals, metal nitrides, metal alloys, and other conductive materials, depending on the application. Substrates include, without limitation, semiconductor wafers. Substrates may be exposed to a pretreatment process to polish, etch, reduce, oxidize, hydroxylate, anneal and/or bake the substrate surface. In addition to film processing directly on the surface of the substrate itself, in the present invention, any of the film processing steps disclosed may also be performed on an underlayer formed on the substrate as disclosed in more detail below, and the term “substrate surface” is intended to include such underlayer as the context indicates. Thus for example, where a film/layer or partial film/layer has been deposited onto a substrate surface, the exposed surface of the newly deposited film/layer becomes the substrate surface.
According to one or more embodiments, the method uses an atomic layer deposition (ALD) process. In such embodiments, the substrate surface is exposed to the precursors (or reactive gases) sequentially or substantially sequentially. As used herein throughout the specification, “substantially sequentially” means that a majority of the duration of a precursor exposure does not overlap with the exposure to a co-reagent, although there may be some overlap. As used in this specification and the appended claims, the terms “precursor”, “reactant”, “reactive gas” and the like are used interchangeably to refer to any gaseous species that can react with the substrate surface.
Atomic Layer Deposition (ALD) is a process in which a substrate is sequentially exposed to a precursor and a reactant to deposit a film. ALD is a self-limiting process that allows for monolayer control of the deposition process. The immense amount of surface area of 3DNAND structures uses a high dose of precursor in each ALD cycle. An insufficient dose might lead to non-conformal deposition. A dose is typically expressed as partial pressure of precursor multiplied by exposure time (1 Langmuir or 1 L=1E-6 Torr-second). To obtain a certain dose, the substrate can be exposed for a long time at a low partial pressure or a short time at a high partial pressure. The product of time and pressure in both cases are equal. A high dose of precursor might be used for surface saturation on deep, entrenched structures that have a large surface area. While embodiments of the disclosure are presented with reference to 3DNAND structures, those skilled in the art will understand that the disclosure is not limited to 3DNAND devices. Embodiments of the disclosure can be used with other applications, for example, logic and DRAM.
High doses present a challenge to time-based ALD (also referred to as temporal ALD or time-domain ALD). For temporal ALD, process time and partial pressure are not independent of each other. Exposure time might be minimized to achieve high wafer throughput. To achieve a high dose in a short exposure, a high precursor partial pressure might be used. The interdependence between process time and partial pressure of temporal ALD is a result of the fact that there is a purge step between the two precursor exposures (or precursor and reactant) to ensure or minimize any gas phase mixing of the precursors.
Ramping of the partial pressure up from zero (zero during purge) to a certain high value during the exposure step takes time. Ramping of the partial pressure down from some high value to zero during the purge step also takes time. As a result, the total process time when a high dose of precursor is needed is generally not short. Using low pressures means faster ramp up/down of partial pressure, but use a longer exposure time for a high dose. Using high pressure means slower ramp up/down of partial pressure although a short exposure suffices to achieve a high dose.
Spatial ALD does not have the fundamental interdependence between process time and partial pressure. For spatial ALD, precursor cycles are spatially separated. Each spatially-separated zone (process region) can maintain pressure without any ramp up/down. A short exposure at high pressure for spatial ALD may be possible. The length of precursor exposure depends on how fast the substrate can be moved into and out of each spatially separated zone. Therefore, it is believed that spatial ALD can achieve much higher wafer throughput than temporal ALD when high dose precursor processes are used.
One or more embodiments of the disclosure reduce the incubation delay by depositing an interlayer before WF6-H2 ALD cycles. Some embodiments increase conformality of the deposited film by use of the interlayer as a nucleation promoter. Some embodiments allow for the filling of vertical trenches, such as tungsten via in MOL/BEOL, and horizon and reentrant trenches, such as the wordline of 3D NAND devices. Some embodiments of the disclosure are used with MOL/BEOL contact fill, DRAM buried wordline fill, 3D NAND memory wordline fill and/or TSV fill for 3D IC.
A process sequence for a time-domain ALD process might follow: SixHy pulse→inert purge→pump→WF6 pulse→inert purge→pump. A process sequence for a spatial ALD process might follow: inert purge zone→SixHy zone→inert purge zone→pump zone→inert purge zone→WF6 zone→inert purge zone→pump zone.
According to one or more embodiment of the disclosure, a nucleation layer is formed on a substrate surface. The nucleation layer of some embodiments contains silicon and may be referred to as a silicon-containing nucleation layer. After the nucleation layer has been deposited to a predetermined thickness, a metal layer is deposited on the nucleation layer.
The nucleation layer can be deposited by an ALD process using a silicon precursor. Suitable silicon precursors include, but are not limited to, poly-silanes (SiHy). For example, poly-silanes include disilane (Si2H6), trisilane (Si3H8), tetrasilane (Si4H10), neopentasilane (Si5H12), hexasilane (C6H14), cyclohexasilane (Si6H12) and combinations thereof. For example, disilane, which has a moderate processing temperature and high vapor pressure, may be used as the silicon precursor alone or in combination with other species.
In some embodiments, the silicon precursor comprises substantially only disilane. As used in this specification and the appended claims, the phrase “substantially only disilane” means that at least 95% of the active species is disilane. Other gases, such as carrier gases and inert gases, can be included in any amount.
The silicon precursor can be alternately exposed to the substrate surface with a reducing agent or allowed to react with the surface through a thermal degradation process. In some embodiments, formation of the nucleation layer comprises sequentially exposing the substrate surface to a silicon precursor and a metal precursor that will be used to form the metal layer on the nucleation layer.
Suitable chemistries for the formation of the nucleation layer include, but are not limited to, WF6 or WClX or MoF6 or MoClx with one or more of H2, SiH4, Si2H6, B2H6, Si3H8 and/or Si4H10. There may or may not be dilution of chemistries with Ar/He/N2. A SixHy pulse can be a pure SixHy (greater than about 98%) or a mixture of SixHy and an inert gas dilution. Inert gases can include Ar, He or N2. In some embodiments, the silicon-containing nucleation layer is formed from a mixture of SixHy/H2 or SixHy/H2/inert gas.
The nucleation layer can be formed to any suitable thickness. In some embodiments, the nucleation layer has a thickness in the range of about 20Å to about 60Å, or in the range of about 30Å to about 50Å, or greater than 30Å, 35Å, 40Å, 45Å or 50Å.
The silicon-containing nucleation layer can be formed at any suitable temperature or pressure depending on, for example, the precursors being used. In some embodiments, the silicon-containing nucleation layer is deposited at a pressure in the range of about 500 mTorr to about 100 Torr, or in the range of about 1 Torr to about 50 Torr. In some embodiments, forming the silicon-containing nucleation layer occurs at a temperature in the range of about 300° C. to about 550° C. In one or more embodiments, the silicon precursor is flowed into the processing chamber, or a region of the processing chamber, at a flow rate in the range of about 150 sccm to about 1000 sccm. The total flow of the gas can be tuned by coflowing an inert gas (e.g., Ar) to bring the total flow rate in the range of about 500 sccm to about 5000 sccm.
In some embodiments, the substrate surface has at least one feature thereon. The feature can be, for example, a trench or pillar. As used in this regard, the term “feature” means any intention surface irregularity. Suitable examples of features include, but are not limited to trenches which have a top, two sidewalls and a bottom, peaks which have a top and two sidewalls. The feature of some embodiments has a depth of greater than about 900 nm, 950 nm or 1 μm.
The uniformity of the film coverage is referred to as the conformality. Conformality is measured as the thickness of the film at the bottom of the feature relative to the top of the feature. In one or more embodiments, the nucleation layer forms conformally on the substrate surface. A conformality of 100% means that the thickness at the top of the feature and the bottom of the feature are the same. In some embodiments, the substrate surface comprises at least one feature having a top and sidewall and the nucleation layer has a conformality of greater than or equal to about 75%, or greater than or equal to about 80%, or greater than or equal to about 85%, or greater than or equal to about 90%, or greater than or equal to about 95%.
After forming the nucleation layer, a metal layer can be deposited on the nucleation layer. The metal layer can be deposited by sequentially exposing the substrate surface to a metal precursor and a reducing agent to form a metal film on the nucleation layer. The metal can be any suitable metal including, but not limited to tungsten and molybdenum. While the process of various embodiments is described with respect to the deposition of tungsten or molybdenum, those skilled in the art will understand that the scope of the disclosure is no so limited. Embodiments of the disclosure can be used in the formation of other materials such as, but not limited to, Ge, Al, Co, Ti, Ta, Cu and/or metal silicide depositions.
Suitable metal precursors include, but are not limited to, one or more of WF6, WClx, MoF6, MoClx, where x is 5 or 6. In some embodiments, the metal precursor consists essentially of WF6.
The metal precursor can be exposed to the substrate surface at a pressure in the range of about 500 mTorr to about 100 Torr, or in the range of about 1 Torr to about 50 Torr. In some embodiments, metal precursor is exposed to the substrate at a temperature in the range of about 300° C. to about 550° C. In one or more embodiments, the metal precursor is flowed into the processing chamber, or a region of the processing chamber, at a flow rate in the range of about 150 sccm to about 1000 sccm. The total flow of the gas can be tuned by coflowing an inert gas (e.g., Ar) to bring the total flow rate in the range of about 500 sccm to about 5000 sccm.
Suitable reducing agents include, but are not limited to, H2 or a silane. The reducing can be exposed to the substrate surface at a pressure in the range of about 500 mTorr to about 100 Torr, or in the range of about 1 Torr to about 50 Torr. In some embodiments, the reducing agent is exposed to the substrate at a temperature in the range of about 300° C. to about 550° C. In one or more embodiments, the reducing agent is flowed into the processing chamber, or a region of the processing chamber, at a flow rate in the range of about 150 sccm to about 1000 sccm. The total flow of the gas can be tuned by coflowing an inert gas (e.g., Ar) to bring the total flow rate in the range of about 500 sccm to about 5000 sccm.
Suitable inert gases include, but are not limited to, one or more of argon, helium and nitrogen.
In some embodiments, the metal film formed is a metal-rich metal silicide film. A metal-rich metal silicide of various embodiments has a silicon content in the range of about 0.1 atomic % to less than 50 atomic %, or in the range of about 1 atomic % to about 40 atomic %, or in the range of about 5 atomic % to about 30 atomic %, or in the range of about 10 atomic % to about 20 atomic %.
In an exemplary embodiment, the nucleation layer is formed by sequentially exposing the substrate surface to disilane and WF6 to deposit a nucleation layer with a thickness up to about 50Å. After formation of the nucleation layer, tungsten is deposited by sequentially exposing the substrate to WF6 and H2 as a reducing agent. The film formed is a tungsten-rich tungsten silicide having in the range of about 10 atomic % to about 20 atomic % silicon.
Some embodiments of the disclosure are directed to film deposition using a batch processing chamber, also referred to as a spatial processing chamber.
The specific type of gas distribution assembly 120 used can vary depending on the particular process being used. Embodiments of the invention can be used with any type of processing system where the gap between the susceptor and the gas distribution assembly is controlled. While various types of gas distribution assemblies can be employed (e.g., showerheads), embodiments of the invention may be particularly useful with spatial gas distribution assemblies which have a plurality of substantially parallel gas channels. As used in this specification and the appended claims, the term “substantially parallel” means that the elongate axis of the gas channels extend in the same general direction. There can be slight imperfections in the parallelism of the gas channels. In a binary reaction, the plurality of substantially parallel gas channels can include at least one first reactive gas A channel, at least one second reactive gas B channel, at least one purge gas P channel and/or at least one vacuum V channel. The gases flowing from the first reactive gas A channel(s), the second reactive gas B channel(s) and the purge gas P channel(s) are directed toward the top surface of the wafer. Some of the gas flow moves horizontally across the surface of the wafer and out of the processing region through the purge gas P channel(s). A substrate moving from one end of the gas distribution assembly to the other end will be exposed to each of the process gases in turn, forming a layer on the substrate surface.
In some embodiments, the gas distribution assembly 120 is a rigid stationary body made of a single injector unit. In one or more embodiments, the gas distribution assembly 120 is made up of a plurality of individual sectors (e.g., injector units 122), as shown in
A susceptor assembly 140 is positioned beneath the gas distribution assembly 120. The susceptor assembly 140 includes a top surface 141 and at least one recess 142 in the top surface 141. The susceptor assembly 140 also has a bottom surface 143 and an edge 144. The recess 142 can be any suitable shape and size depending on the shape and size of the substrates 60 being processed. In the embodiment shown in
In some embodiments, as shown in
The susceptor assembly 140 of
In some embodiments, the gap 170 distance is in the range of about 0.1 mm to about 5.0 mm, or in the range of about 0.1 mm to about 3.0 mm, or in the range of about 0.1 mm to about 2.0 mm, or in the range of about 0.2 mm to about 1.8 mm, or in the range of about 0.3 mm to about 1.7 mm, or in the range of about 0.4 mm to about 1.6 mm, or in the range of about 0.5 mm to about 1.5 mm, or in the range of about 0.6 mm to about 1.4 mm, or in the range of about 0.7 mm to about 1.3 mm, or in the range of about 0.8 mm to about 1.2 mm, or in the range of about 0.9 mm to about 1.1 mm, or about 1 mm.
The processing chamber 100 shown in the Figures is a carousel-type chamber in which the susceptor assembly 140 can hold a plurality of substrates 60. As shown in
Processing chambers having multiple gas injectors can be used to process multiple wafers simultaneously so that the wafers experience the same process flow.
For example, as shown in
The processing chamber 100 shown in
The embodiment shown in
Rotation of the carousel (e.g., the susceptor assembly 140) can be continuous or intermittent (discontinuous). In continuous processing, the wafers are constantly rotating so that they are exposed to each of the injectors in turn. In discontinuous processing, the wafers can be moved to the injector region and stopped, and then to the region 84 between the injectors and stopped. For example, the carousel can rotate so that the wafers move from an inter-injector region across the injector (or stop adjacent the injector) and on to the next inter-injector region where the carousel can pause again. Pausing between the injectors may provide time for additional processing steps between each layer deposition (e.g., exposure to plasma).
Referring to both
With reference to the embodiments shown in
Referring to
The injector unit 122 of
Referring to
During processing a substrate may be exposed to more than one processing region 250 at any given time. However, the portions that are exposed to the different processing regions will have a gas curtain separating the two. For example, if the leading edge of a substrate enters a processing region including the second gas port 135, a middle portion of the substrate will be under a gas curtain 150 and the trailing edge of the substrate will be in a processing region including the first reactive gas port 125.
A factory interface 280, which can be, for example, a load lock chamber, is shown connected to the processing chamber 100. A substrate 60 is shown superimposed over the gas distribution assembly 220 to provide a frame of reference. The substrate 60 may often sit on a susceptor assembly to be held near the front surface 121 of the gas distribution plate 120. The substrate 60 is loaded via the factory interface 280 into the processing chamber 100 onto a substrate support or susceptor assembly (see
Embodiments of the invention are directed to processing methods comprising a processing chamber 100 with a plurality of processing regions 250a-250h with each processing region separated from an adjacent region by a gas curtain 150. For example, the processing chamber shown in
A plurality of substrates 60 are positioned on a substrate support, for example, the susceptor assembly 140 shown
A first reactive gas A is flowed into one or more of the processing regions 250 while an inert gas is flowed into any processing region 250 which does not have a first reactive gas A flowing into it. For example if the first reactive gas is flowing into processing regions 250b through processing region 250h, an inert gas would be flowing into processing region 250a. The inert gas can be flowed through the first reactive gas port 125 or the second gas port 135.
The inert gas flow within the processing regions can be constant or varied. In some embodiments, the reactive gas is co-flowed with an inert gas. The inert gas will act as a carrier and diluent. Since the amount of reactive gas, relative to the carrier gas, is small, co-flowing may make balancing the gas pressures between the processing regions easier by decreasing the differences in pressure between adjacent regions.
Accordingly, one or more embodiments of the disclosure are directed to processing methods utilizing a batch processing chamber like that shown in
The substrate surface is laterally moved through a gas curtain 150 to a second section 250b. The substrate can be exposed to a second process condition in the second section 250b. The second process condition of some embodiments comprises a metal precursor that can react with the substrate surface or the silicon precursor that has already reacted with the substrate surface to form a silicon-containing nucleation layer.
The substrate surface is laterally moved with the silicon-containing nucleation layer through a gas curtain 150 to a third section 250c of the processing chamber. The substrate surface can then be repeatedly exposed to additional first process conditions and second process conditions to form a film with a predetermined film thickness. For example, a nucleation layer with a thickness up to about 50Å can be formed.
In some embodiments, the substrate surface is repeatedly exposed to the silicon precursor in one section of the processing chamber and a metal precursor in the next section of the processing chamber. In an embodiment of this sort, the first process region 250a, third process region 250c, fifth process region 250e and seventh process region 250g may have a silicon precursor gas flowing while the second process region 250b, fourth process region 250d, sixth process region 250f and eighth process region 250h have a metal precursor flowing. Those skilled in the art will understand that the use of ordinals such as “first” and “second” to describe processing regions do not imply a specific location within the processing chamber, or order of exposure within the processing chamber. For example, the substrate may be exposed to the metal precursor first followed by the silicon precursor in a second section.
Once the nucleation layer has been formed to a predetermined thickness, the silicon precursor flowing into any of the process regions can be discontinued and/or replaced with a reducing agent. The metal precursor can continue to flow into the same process regions so that continuing the rotation of the susceptor assembly sequentially exposes the substrate to a process region with a metal precursor and a process region with a reducing agent to form a metal film on the nucleation layer.
According to one or more embodiments, the substrate is subjected to processing prior to and/or after forming the layer. This processing can be performed in the same chamber or in one or more separate processing chambers. In some embodiments, the substrate is moved from the first chamber to a separate, second chamber for further processing. The substrate can be moved directly from the first chamber to the separate processing chamber, or it can be moved from the first chamber to one or more transfer chambers, and then moved to the separate processing chamber. Accordingly, the processing apparatus may comprise multiple chambers in communication with a transfer station. An apparatus of this sort may be referred to as a “cluster tool” or “clustered system,” and the like.
Generally, a cluster tool is a modular system comprising multiple chambers which perform various functions including substrate center-finding and orientation, degassing, annealing, deposition and/or etching. According to one or more embodiments, a cluster tool includes at least a first chamber and a central transfer chamber. The central transfer chamber may house a robot that can shuttle substrates between and among processing chambers and load lock chambers. The transfer chamber is typically maintained at a vacuum condition and provides an intermediate stage for shuttling substrates from one chamber to another and/or to a load lock chamber positioned at a front end of the cluster tool. Two well-known cluster tools which may be adapted for the present invention are the Centura® and the Endura®, both available from Applied Materials, Inc., of Santa Clara, Calif. However, the exact arrangement and combination of chambers may be altered for purposes of performing specific steps of a process as described herein. Other processing chambers which may be used include, but are not limited to, cyclical layer deposition (CLD), atomic layer deposition (ALD), chemical vapor deposition (CVD), physical vapor deposition (PVD), etch, pre-clean, chemical clean, thermal treatment such as RTP, plasma nitridation, degas, orientation, hydroxylation and other substrate processes. By carrying out processes in a chamber on a cluster tool, surface contamination of the substrate with atmospheric impurities can be avoided without oxidation prior to depositing a subsequent film.
According to one or more embodiments, the substrate is continuously under vacuum or “load lock” conditions, and is not exposed to ambient air when being moved from one chamber to the next. The transfer chambers are thus under vacuum and are “pumped down” under vacuum pressure. Inert gases may be present in the processing chambers or the transfer chambers. In some embodiments, an inert gas is used as a purge gas to remove some or all of the reactants. According to one or more embodiments, a purge gas is injected at the exit of the deposition chamber to prevent reactants from moving from the deposition chamber to the transfer chamber and/or additional processing chamber. Thus, the flow of inert gas forms a curtain at the exit of the chamber.
The substrate can be processed in single substrate deposition chambers, where a single substrate is loaded, processed and unloaded before another substrate is processed. The substrate can also be processed in a continuous manner, similar to a conveyer system, in which multiple substrate are individually loaded into a first part of the chamber, move through the chamber and are unloaded from a second part of the chamber. The shape of the chamber and associated conveyer system can form a straight path or curved path. Additionally, the processing chamber may be a carousel in which multiple substrates are moved about a central axis and are exposed to deposition, etch, annealing, cleaning, etc. processes throughout the carousel path.
During processing, the substrate can be heated or cooled. Such heating or cooling can be accomplished by any suitable means including, but not limited to, changing the temperature of the substrate support and flowing heated or cooled gases to the substrate surface. In some embodiments, the substrate support includes a heater/cooler which can be controlled to change the substrate temperature conductively. In one or more embodiments, the gases (either reactive gases or inert gases) being employed are heated or cooled to locally change the substrate temperature. In some embodiments, a heater/cooler is positioned within the chamber adjacent the substrate surface to convectively change the substrate temperature.
The substrate can also be stationary or rotated during processing. A rotating substrate can be rotated continuously or in discreet steps. For example, a substrate may be rotated throughout the entire process, or the substrate can be rotated by a small amount between exposures to different reactive or purge gases. Rotating the substrate during processing (either continuously or in steps) may help produce a more uniform deposition or etch by minimizing the effect of, for example, local variability in gas flow geometries.
In atomic layer deposition type chambers, the substrate can be exposed to the first and second precursors either spatially or temporally separated processes. Temporal ALD is a traditional process in which the first precursor flows into the chamber to react with the surface. The first precursor is purged from the chamber before flowing the second precursor. In spatial ALD, both the first and second precursors are simultaneously flowed to the chamber but are separated spatially so that there is a region between the flows that prevents mixing of the precursors. In spatial ALD, the substrate is moved relative to the gas distribution plate, or vice-versa.
In embodiments, where one or more of the parts of the methods takes place in one chamber, the process may be a spatial ALD process. Although one or more of the chemistries described above may not be compatible (i.e., result in reaction other than on the substrate surface and/or deposit on the chamber), spatial separation ensures that the reagents are not exposed to each in the gas phase. For example, temporal ALD involves the purging the deposition chamber. However, in practice it is sometimes not possible to purge all of the excess reagent out of the chamber before flowing in additional regent. Therefore, any leftover reagent in the chamber may react. With spatial separation, excess reagent does not need to be purged, and cross-contamination is limited. Furthermore, a lot of time can be used to purge a chamber, and therefore throughput can be increased by eliminating the purge step.
Reference throughout this specification to “one embodiment,” “certain embodiments,” “one or more embodiments” or “an embodiment” means that a particular feature, structure, material, or characteristic described in connection with the embodiment is included in at least one embodiment of the invention. Thus, the appearances of the phrases such as “in one or more embodiments,” “in certain embodiments,” “in one embodiment” or “in an embodiment” in various places throughout this specification are not necessarily referring to the same embodiment of the invention. Furthermore, the particular features, structures, materials, or characteristics may be combined in any suitable manner in one or more embodiments.
Although the invention herein has been described with reference to particular embodiments, it is to be understood that these embodiments are merely illustrative of the principles and applications of the present invention. It will be apparent to those skilled in the art that various modifications and variations can be made to the method and apparatus of the present invention without departing from the spirit and scope of the invention. Thus, it is intended that the present invention include modifications and variations that are within the scope of the appended claims and their equivalents.
| Filing Document | Filing Date | Country | Kind |
|---|---|---|---|
| PCT/US2016/058346 | 10/22/2016 | WO | 00 |
| Number | Date | Country | |
|---|---|---|---|
| 62245875 | Oct 2015 | US |
