Claims
- 1. A process for coating a replica of a diffraction grating defining a grating surface having grooves defining reflective faces, said process comprising:
A. placing said replica in a vacuum chamber and reducing the chamber pressure to below 10−6 torr; and B. while maintaining chamber pressure below 10−6 torr, depositing on said grating surface an overcoat layer of aluminum; C. while maintaining chamber pressure below 10−6 torr, depositing on said overcoat layer of aluminum a protective layer comprising one or more layers of dielectric material; D. installing said replica in a gas discharge laser producing laser radiation at wavelengths of about 193 nm or less than 193 mm; wherein said one or more layers are deposited at thicknesses chosen to increase normal reflectivity of said reflective faces.
- 2. The process of claim 1 wherein said overcoat layer of aluminum on said reflective face is between 200 nm and 50 nm thick.
- 3. The process of claim 1 wherein each of said reflective faces define a width and said protective layer on said reflective face has a thickness of less than 10% of said width.
- 4. The process of claim 1 wherein each of said reflective faces define a width and said protective layer on said reflective face has a thickness of less than 5% of said width.
- 5. The process of claim 3 wherein said protective layer on at least one set of surfaces is about 150 nm thick and said aluminum layer is about 100 nm thick.
- 6. The process as in claim 1 wherein said chamber pressure is below 5×10−7 torr.
- 7. The process as in claim 1 wherein the chamber pressure is continuously maintained below 10−6 torr during steps A, B and C.
- 8. The process as in claim 7 wherein both of said depositing steps are accomplished using an electron beam sputtering technique.
- 9. The process as in claim 6 wherein both of said depositing steps are accomplished using a vapor deposition technique.
- 10. A process as in claim 1 wherein said dielectric material is chosen from a group consisting of MgF2, Al2O3, SiO2, CaF2, AlF3 and GdF3.
- 11. A process as in claim 1 wherein said protective layer comprises a single layer of MgF2 about 54 nm thick.
- 12. A process as in claim 1 wherein said protective layer comprises a layer of MgF2 about 24 nm thick and an Al2O3 layer about 26 nm thick.
- 13. A process as in claim 1 wherein said protective layer comprises a first layer of MgF2 about 22 nm thick, a second layer of Al2O3 about 26 nm thick, a third layer of MgF2 about 34 nm thick and a fourth layer of Al2O3 about 26 nm thick.
- 14. An overcoat protected diffraction grating having a large number of parallel grooves, each groove having a reflective face, said grating comprising:
A. a rigid substrate; B. an aluminum grating layer comprising a very large number of parallel grooves; C. an adhesive layer affixing said aluminum grating layer to said rigid substrate; D. a thin aluminum overcoat layer overcoating said aluminum grating layer, said aluminum overcoat layer having a thickness of less than 200 nm on said reflective faces; E. a protective layer comprised of one or more layers of dielectric material, overcoating said aluminum overcoat layer; wherein said protective layer or layers have a thickness or thicknesses chosen to increase normal reflectivity of said reflecting face of each groove.
- 15. A grating as in claim 14 wherein said large number of parallel grooves define a cross section approximately triangular in shape.
- 16. A grating as in claim 15 wherein said grooves are spaced apart by about 11.7966 microns.
- 17. A grating as in claim 14 wherein said protective layer is comprised of a layer of MgF2 about 24 nm thick overcoated with a layer of Al2O3 about 24 nm thick.
- 18. A grating as in claim 14 wherein said protective layer is comprised of a first layer of MgF2 about 22 nm thick, a second layer of Al2O3 about 26 nm thick, a third layer of MgF2 about 35 nm thick and a fourth layer of Al2O3 about 26 nm thick.
- 19. A grating as in claim 14 wherein said dielectric material is chosen from a group consisting of MgF2, Al2O3, SiO2, CaF2, AlF3 and GdF3.
- 20. A grating as in claim 14 wherein said protective layer comprises a single layer of MgF2 about 54 nm thick.
- 21. A grating as in claim 14 wherein said protective layer comprises a layer of MgF2 about 24 nm thick and an Al2O3 layer about 26 nm thick.
- 22. A grating as in claim 14 wherein said protective layer comprises a first layer of MgF2 about 22 nm thick, a second layer of Al2O3 about 26 nm thick, a third layer of MgF2 about 34 nm thick and a fourth layer of Al2O3 about 26 nm thick.
- 23. A line narrowing module for an ArF laser comprising:
A. a prism beam expander for expanding a laser beam produced by said ArF laser; B. an overcoat protected diffraction grating having a large number of parallel grooves, each groove having a reflective face, said grating comprising:
1. a rigid substrate; 2. an aluminum grating layer comprising a very large number of parallel grooves; 3. an adhesive layer affixing said aluminum grating layer to said rigid substrate; 4. a thin aluminum overcoat layer overcoating said aluminum grating layer, said aluminum overcoat layer having a thickness of less than 200 nm on said reflective faces; 5. a thin protective layer overcoating said aluminum overcoat layer, said protective layer being comprised of one or more layers of a material or materials chosen from a group consisting of MgF2, CaF2, AlF3, SiO2 and Al2O3; C. a beam angle adjustment means for adjusting directions of said laser beam relative to said grating in order to select a narrow wavelength for amplification by said laser; wherein said protective layer or layers have a thickness or thicknesses chosen to increase normal reflectivity of said reflecting face of each groove.
- 24. A process as in claim 23 wherein said first protective layer is MgF2 or CaF2 and further comprising a second protective layer deposited on top of said first protective layer, said second protective layer being comprised of a material chosen from a group consisting of SiO2, Al2O3 and AlF3.
FIELD OF THE INVENTION
[0001] This application is a continuation-in-part application of U.S. Ser. No. 08/939,611, filed Sep. 29, 1997. This invention relates to diffraction gratings and, in particular, to techniques used for improving performance extending the life of diffraction gratings.
Continuation in Parts (1)
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Number |
Date |
Country |
Parent |
08939611 |
Sep 1997 |
US |
Child |
09731938 |
Dec 2000 |
US |