Number | Date | Country | Kind |
---|---|---|---|
61-179741 | Jul 1986 | JPX |
Number | Name | Date | Kind |
---|---|---|---|
4464750 | Tatematsu | Aug 1984 | |
4672582 | Nishimuru et al. | Jun 1987 | |
4742486 | Takemae | May 1988 | |
4744061 | Takemae et al. | May 1988 |
Entry |
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"A Reliable 1-M bit DRAM with a Multi-Bit-Test Mode", Kumanoya, et al., IEEE Journal of Solid-State Circuits, vol. SC-20, No. 5, Oct., 1985, pp. 909-913. |