The present invention relates to a sealing material for a compound having a non-stoichiometric composition and a method for manufacturing the same.
Semiconductor devices are expected to be basic elements of electronic devices in the Internet of Things (IoT) society. In particular, an amorphous metal oxide semiconductor (AOS) is a promising candidate for printed electronics.
The AOS has characteristics such as high mobility, low voltage driving, high affinity with a gate insulating film, transparency, and high thermal stability, and is expected to be applied to next-generation devices such as transparent flexible TFTs and electronic paper.
The use of printed electronics is a promising solution because of its high throughput. In particular, a thin film transistor (TFT) using a printable semiconductor has attracted attention as a key device for developing trillions of sensors and radio frequency identification tags and realizing information exchange between different objects. Among printable materials, the amorphous metal oxide semiconductor (AOS) having high carrier mobility and excellent uniformity is regarded as a promising printing material for the TFT.
However, since the AOS has high sensitivity to the environment such as molecules present in ambient including oxygen and water, and is unstable in mobility, a threshold voltage, bias stress, and the like, there are problems in that the AOS is deteriorated due to a manufacturing process and has a difficulty in performing a practical long-term stable operation. Therefore, a sealing material (passivation) that suppresses the influence of ambient molecules including oxygen and water on the AOS is used, and thus the AOS is protected.
Insulating inorganic oxide sealing materials such as SiOx, SiOx/SiNx, AlOx, YOx, and the like exhibit low gas permeability and water permeability. However, when a film forming process such as an atomic layer deposition method (ALD) method or a sputtering method is used to form such an inorganic oxide sealing material, the AOS may be damaged and the performance of the TFT may be deteriorated.
Alternatively, an insulating polymer formed into a film by chemical vapor deposition (CVD), such as CYTOP (trade name) or parylene, is also used as the sealing material (Patent Document 1). Since these films are formed by a film forming process by CVD, which is relatively mild, damage to the AOS is relatively small. However, such a polymer has a higher permeability of gas and water than that of the inorganic oxide, and thus does not have sufficient protection performance.
Therefore, a sealing material having a two layer structure obtained by combining the materials of the above-mentioned sealing materials has been proposed. Non-Patent Literature 1 proposes a technique of forming a parylene layer, which is an organic substance, and then laminating AlOx, which is an inorganic oxide insulator layer, by using the ALD method to perform sealing.
Non-Patent Literature 1: S. Zhan et al., Phys. Status Solidus, 2020, 217, 1900832.
It has been found that these known sealing materials can be used for the amorphous metal oxide semiconductor (AOS) formed by a vacuum process, but when used for an AOS formed by printable solution process, the AOS is damaged. As a cause of this, it has been found that the AOS formed by the solution process has a non-stoichiometric composition in which oxygen or the like is deficient and thus has very high environmental sensitivity and is easily damaged by a known forming process of the sealing material.
Therefore, a sealing technique suitable for a compound having a non-stoichiometric composition is required.
The gist of an embodiment of the present invention is as follows.
(1) A sealing material for a compound having a non-stoichiometric composition, the sealing material including a polymer layer, and an inorganic oxide insulator layer, wherein
(2) The sealing material according to above (1), wherein the polymer layer further includes a second polymer layer located between the first polymer layer and the inorganic oxide insulator layer, and
(3) The sealing material according to above (2), wherein a total thickness of the first polymer layer, the second polymer layer, and the inorganic oxide insulator layer is 100 nm or less.
(4) The sealing material according to any one of above (1) to (3), wherein the organic solvent soluble polymer is an acrylic polymer, a styrenic polymer, a fluorine-based polymer, a thermally crosslinkable polymer, or a combination thereof.
(5) The sealing material according to any one of above (1) to (4), wherein an inorganic oxide insulator of the inorganic oxide insulator layer is AlOx, HfOx, ZrOx, SiOx, TiOx, or a combination thereof.
(6) The sealing material according to any one of above (2) to (5), wherein the chemical vapor deposition film is parylene.
(7) The sealing material according to any one of above (1) to (6), wherein the compound having a non-stoichiometric composition is an amorphous metal oxide inorganic semiconductor film.
(8) The sealing material according to above (7), wherein the amorphous metal oxide inorganic semiconductor film has different distribution of oxygen deficiency state in a direction perpendicular to a main surface of the film, and includes a surface and an inside, the surface including more oxygen deficiency than the inside.
(9) An electronic element including the sealing material described in any one of above (1) to (8).
(10) A method for manufacturing a sealing material for a compound having a non-stoichiometric composition, the method including
(11) The method for manufacturing a sealing material according to above (10), wherein
According to the present invention, a sealing material suitable for a compound having a non-stoichiometric composition can be provided.
The present disclosure is directed to a sealing material for a compound having a non-stoichiometric composition, the sealing material including a polymer layer and an inorganic oxide insulator layer, in which the polymer layer includes a first polymer layer containing an organic solvent soluble polymer.
According to a sealing material of the present disclosure, damage to a compound having a non-stoichiometric composition can be suppressed even under air atmosphere in which moisture or oxygen is present. Therefore, according to the sealing material of the present disclosure, an electronic device containing the compound having a non-stoichiometric composition can be stably operated under air atmosphere for a long time.
According to the sealing material of the present disclosure, a damage to the compound having a non-stoichiometric composition due to a step of disposing the sealing material and a subsequent step of fabricating an electronic element or an electronic device can also be suppressed. For example, even when another electronic element or electronic device is laminated and integrated on the sealing material by a lithography process using water or an organic solvent after the sealing material is formed, deterioration of the compound having a non-stoichiometric composition can be suppressed. Therefore, according to the sealing material of the present disclosure, a complicated integrated device including the compound having a non-stoichiometric composition, for example, a complementary metal oxide semiconductor or an inorganic/organic hybrid semiconductor can be fabricated. The sealing material of the present disclosure can provide convenient and effective sealing, particularly in the printed electronics.
The first polymer layer containing the organic solvent soluble polymer can be 35 formed by a mild method such as solution process. Since the solution process does not use vacuum or radical reaction, further formation of oxygen defects due to desorption of oxygen can be avoided, and there is an advantage of very low or no reactivity with the compound having a non-stoichiometric composition. In the solution process, there is also no reaction in which acid is generated. Therefore, the first polymer layer can be formed directly on the compound having a non-stoichiometric composition without substantially damaging the compound.
As described above, when the polymer layer 10 is present between the compound layer 30 having a non-stoichiometric composition and the inorganic oxide insulator layer 20, damage to the compound having a non-stoichiometric composition when the inorganic oxide insulator layer 20 is formed can be suppressed.
Typically, an inorganic oxide insulator layer such as an AlOx layer is directly formed on a material to be sealed and used as the sealing material. However, when the inorganic oxide insulator layer is tried to be directly formed by using an atomic layer deposition (ALD) method on the compound having a non-stoichiometric composition such as an IZOx layer fabricated by the solution process, the compound having a non-stoichiometric composition is deteriorated because the ALD method is process in which the substrate is heated under vacuum and is mediated by water. When the inorganic oxide insulator layer is tried to be directly formed by using the sputtering method on the compound having a non-stoichiometric composition such as the IZOx layer fabricated by the solution process, the compound having a non-stoichiometric composition is deteriorated because the sputtering method is vacuum process.
Since a chemical vapor deposition film (deposited film) such as parylene can be formed by a chemical vapor deposition method (CVD) which is relatively milder than the ALD method and does not require substrate heating, the chemical vapor deposition film such as parylene is also formed as a base for forming the inorganic oxide insulator layer. However, since the compound having a non-stoichiometric composition has very high environmental sensitivity, the compound having a non-stoichiometric composition is also easily damaged by a vacuum environment and generated radicals during formation of the chemical vapor deposition film.
On the other hand, when the first polymer layer containing the organic solvent soluble polymer is formed by the solution process on the compound having a non-stoichiometric composition, the polymer layer can be disposed without substantially damaging the compound having a non-stoichiometric composition.
The first polymer layer can protect the compound having a non-stoichiometric composition from moisture associated with the ALD method or the vacuum environment of the sputtering process. Therefore, the inorganic oxide insulator layer can be formed on the polymer layer without substantially damaging the compound having a non-stoichiometric composition. Since the first polymer layer has a low density and has low gas barrier performance, oxygen passes through the first polymer layer to some extent. The density of the first polymer layer is preferably from 0.4 g/cm3 to 1.3 g/cm3, more preferably from 0.5 g/cm3 to 1.2 g/cm3, still more preferably 0.6 g/cm3 to 1.1 g/cm3, and even still more preferably from 0.7 g/cm3 to 1.0 g/cm3. On the other hand, since the inorganic oxide insulator layer having a dense structure is located on the first polymer layer, moisture and oxygen cannot substantially pass through the sealing material. The density of the first polymer layer is calculated from X-ray reflectivity measurement. By fitting the X-ray reflectivity data, the film thickness and the film density can be simultaneously estimated as fitting parameters.
Examples of the compound having a non-stoichiometric composition include an amorphous metal oxide inorganic semiconductor (AOS), metal chalcogenide, and halide perovskite. Examples of the AOS include ZnO, In2O3, In—Zn—O (IZO), and In—Ga—Zn—O (IGZO), and particularly, the AOS formed by the solution process. Examples of the metal chalcogenide include layered substances such as molybdenum sulfide, tungsten sulfide, and molybdenum selenide, and quantum dots such as lead sulfide and cadmium sulfide. Examples of the halide perovskite include organic/inorganic hybrid substances represented by ABX3 and A2BX4 (A is an organic ammonium substance or an alkali metal, B is a metal such as lead or tin, and X is a halogen element) and inorganic metal substances. Whether the AOS layer is amorphous can be confirmed by thin film X-ray diffraction.
Examples of the electronic device including the compound having a non-stoichiometric composition include a transistor, a complementary metal oxide semiconductor device, an organic electroluminescence (organic EL), a battery, an organic solar cell, and an oxide sensor. The transistor includes a thin film transistor and a field effect transistor. The oxide sensor includes a chemical sensor and an optical sensor. The same applies hereinafter.
The sealing material of the present disclosure may have any shape, and may be a sealing film, a sealing sheet, or the like.
The first polymer layer preferably has a thickness of 50 nm or greater, more preferably 75 nm or greater, and still more preferably 100 nm or greater. When the first polymer layer has the above-described preferable thickness, damage to the compound having a non-stoichiometric composition during formation of the inorganic oxide insulator layer can be further suppressed. The upper limit of the thickness of the first polymer layer is not particularly limited. However, the thickness of the first polymer layer may be preferably 1000 nm or less, more preferably 500 nm or less, and may be 100 nm or less, 50 nm or less, or 30 nm or less, and thus the thickness of the electronic device including the sealing material does not increase.
Preferably, the polymer layer further includes a second polymer layer located between the first polymer layer and the inorganic oxide insulator layer, and the second polymer layer includes a chemical vapor deposition film.
When the second polymer layer including the chemical vapor deposition film is located between the first polymer layer and the inorganic oxide insulator layer, damage to the compound having a non-stoichiometric composition during formation of the inorganic oxide insulator layer can be further suppressed. The compound having a non-stoichiometric composition can be protected from attack of radical due to the CVD process for forming the second polymer layer. When the polymer layer includes the second polymer layer, a preferable thickness of the first polymer layer may be thin, or may be 10 nm or greater.
In the sealing material 100 of a hybrid structure including the first polymer layer 12, the second polymer layer 14, and the inorganic oxide insulator layer 20, the first polymer layer 12 including the organic solvent soluble polymer and the second polymer layer 14 including the chemical vapor deposition film function as a buffer layer against damage due to the ALD process or the sputtering process during the formation of the inorganic oxide insulator layer 20, and the inorganic oxide insulator layer 20 has a strong barrier effect.
Unlike the first polymer layer formed by the solution process, the chemical vapor deposition film is formed by a dry process. Therefore, since the second polymer layer includes the chemical vapor deposition film, the second polymer layer is dense and has a high barrier effect. The density of the second polymer layer including the chemical vapor deposition film is higher than the density of the first polymer layer containing the organic solvent soluble polymer. The density of the second polymer layer is preferably from 1.0 g/cm3 to 1.5 g/cm3, and more preferably from 1.0 g/cm3 to 1.45 g/cm3. The density of the second polymer layer is measured by ASTM D1505 or ASTM E1461.
The thickness of the second polymer layer including the chemical vapor deposition film is preferably from 10 nm to 40 nm, and more preferably from 15 nm to 35 nm. Since the second polymer layer has a higher density, the barrier effect can be obtained even in the above-described preferable thickness range, and thus the total thickness of the sealing material can be reduced.
The thickness of the inorganic oxide insulator layer is preferably from 5 nm to 100 nm, more preferably from 15 nm to 75 nm, and still more preferably from 25 nm to 55 nm. Since the inorganic oxide insulator layer has a higher barrier effect than the polymer layer, which is the organic film, the total thickness of the sealing material can be reduced while exhibiting a good barrier effect in the above-described preferable thickness range. Since the inorganic oxide insulator layer has the dense structure and is relatively hard, the thickness of the inorganic oxide insulator layer is preferably 100 nm or less from the viewpoint of ensuring flexibility of the electronic element or electronic device including sealing material.
When the sealing material includes the first polymer layer containing the organic solvent soluble polymer, the second polymer layer including the chemical vapor deposition film, and the inorganic oxide insulator layer, the total thickness of the sealing material is preferably 100 nm or less, more preferably 90 nm or less, and still more preferably 80 nm or less. When the second polymer layer including the chemical vapor deposition film is provided, the total thickness of the sealing material can be reduced. The lower limit of the thickness of the sealing material is preferably 25 nm or greater, and more preferably 40 nm or greater. When the thickness of the sealing material is in the above-described preferable range, the thickness of the electronic element or electronic device provided with the sealing material can be reduced while obtaining the good barrier function.
The organic solvent soluble polymer is preferably an acrylic polymer, a styrenic polymer, a fluorine-based polymer, a thermally crosslinkable polymer, or a combination thereof.
The acrylic polymer is preferably polymethyl methacrylate (PMMA), polyadamantyl methacrylate (PADMA), or polycyclohexyl methacrylate (PCMA).
The styrenic polymer is preferably polystyrene, poly-α-methylstyrene (PaMS), poly-4-methylstyrene (PMS), or polyvinylphenol (PVP).
The fluorine-based polymer is preferably CYTOP (trade name) or Teflon (trade name) AF.
The thermally crosslinkable polymer is preferably an epoxy resin or a thermally curable cycloolefin polymer.
An inorganic oxide insulator of the inorganic oxide insulator layer is preferably AlOx, HfOx, ZrOx, SiOx, TiOx, or a combination thereof. x may be a value satisfying the stoichiometric composition or may be a value not satisfying the stoichiometric composition. The inorganic oxide insulator layer has a high density, and large molecules such as water molecules and oxygen in the air cannot pass through the inorganic oxide insulator layer, and thus the inorganic oxide insulator layer has a high barrier effect against moisture and gases.
The chemical vapor deposition film is preferably parylene. Parylene is sequentially formed at around room temperature, and thus is preferable in terms of high denseness and uniformity. Parylene also includes derivatives thereof.
The sealing material preferably has a three layer hybrid structure of a PMMA layer as the first polymer layer, a parylene layer as the second polymer layer, and an AlOx layer as the inorganic oxide insulator layer. The hybrid three layer sealing film of PMMA/parylene/AlOx can obtain strong protection without deteriorating the performance of the compound having a non-stoichiometric composition.
The compound having a non-stoichiometric composition is preferably the amorphous metal oxide inorganic semiconductor (AOS) film. As schematically illustrated in
The distribution of the oxygen defect amount of the AOS layer in the thickness direction can be evaluated by measuring an angle dependence of a ratio (ηM-O-M) of M-O-M (in a metal oxide state) to the entire O1s by angle-resolved X-ray photoelectron spectroscopy (XPS). In the AOS layer having the distribution of the oxygen defect amount in the thickness direction, the closer to the outermost surface of the AOS layer, the less M-O-M (M: In or Zn) bonds.
As illustrated in
where I0 is an incident electron intensity, I(d) is effective intensity at a depth d from a surface, λ, is an inelastic mean free path of electrons in a solid (estimated to be about 2.8 nm under the present measurement condition), and 3λ, is an escape depth (I(d) to I0×5%), and
where d is a depth from the surface, dinf is a detection depth (information depth), and θsub is a tilt angle of the substrate, by changing an angle (inclination angle θ) with respect to an XPS detector (analyzer) with reference (0°) to a direction perpendicular to a surface of a measurement sample. The inclination angle θ can be set in a range from 0° to less than 90°, and preferably from 0° to 70°.
In the AOS layer, a ratio of ηM-O-M of the outermost surface to ηM-O-M of the inside is preferably smaller by 10% or more, more preferably smaller by 15% or more, and still more preferably smaller by 20% or more.
The sealing material of the present disclosure can be used in the electronic element. The sealing film of the present disclosure can be used as a sealing material for covering an electronic element containing the compound having a non-stoichiometric composition preferably disposed on a flexible substrate. Examples of the electronic device including the electronic element include a transistor, a complementary metal oxide semiconductor device, an organic EL, a battery, a solar cell, and an oxide sensor.
The present disclosure is also directed to a method for manufacturing a sealing material for a compound having a non-stoichiometric composition, the method including providing a substrate, preparing an organic solvent containing a first polymer dissolved, forming a polymer layer including a first polymer layer on the substrate by applying an organic solvent containing the first polymer dissolved, and forming an inorganic oxide insulator layer on the polymer layer by using an atomic layer deposition method or a sputtering method to obtain a sealing material.
In the present method, an organic solvent containing the first polymer dissolved is prepared. By mixing the organic solvent and the first polymer, the organic solvent containing the first polymer dissolved can be prepared. The concentration of the first polymer may be changed depending on the desired thickness of the first polymer layer, and is, for example, from 1 mg/mL to 80 mg/mL, from 2 mg/mL to 70 mg/mL or from 3 mg/mL to 60 mg/mL.
In the present method, the organic solvent containing the first polymer dissolved is applied onto the substrate to form the polymer layer including the first polymer layer. an application method is preferably a spin coating method, a bar coating method, a spray coating method, a dip coating method, an ink-jet method, a flexographic printing method, or a gravure printing method, more preferably the spin coating method, the bar coating method, the spray coating method, the dip coating method, or the ink-jet method, and still more preferably the spin coating method.
The inorganic oxide insulator layer is formed using the atomic layer deposition (ALD) method or the sputtering method, and preferably the atomic layer deposition (ALD) method. The ALD method is preferable in that a film having a large area can be formed and cost can be reduced.
The film formation temperature of the inorganic oxide insulator layer is preferably 200° C. or less, more preferably 150° C. or less, and still more preferably 125° C. or less. By forming the film in the preferable temperature range, a layer below the inorganic oxide insulator layer is less likely to be damaged. In particular, since the flexible substrate contains an organic material such as polyethylene terephthalate (PET) or polyimide, by forming the film in the preferable temperature range, the damage to the substrate can be suppressed.
Preferably, the forming the polymer layer includes forming a second polymer layer which is a chemical vapor deposition film on the first polymer layer by using a chemical vapor deposition method (CVD), and the forming the inorganic oxide insulator layer includes forming the inorganic oxide insulator layer on the second polymer layer.
The second polymer layer, which is the chemical vapor deposition film, is formed by CVD. CVD is gentle vacuum process and is preferable in terms of deposition rate, processing area, denseness, and uniformity.
The contents regarding the above-described the sealing material are applied to the polymer layer, the first polymer layer, the second polymer layer, the inorganic oxide insulator layer, the organic solvent soluble polymer, the organic solvent, and other configurations.
Fabrication of TFT including Two Layer Sealing Material and IZO
A precursor solution of indium zinc oxide (IZO) was prepared by the sol-gel method schematically illustrated in
A P-doped Si wafer substrate including thermally oxidized SiO2 (having a thickness of 100 nm) as a gate insulating film was ultrasonically cleaned in acetone and then in 2-propanol for 10 minutes each, and then dried at 100° C. for 10 minutes under air atmosphere by using a hotplate.
The cleaned and dried substrate was subjected to a treatment with a UV ozone cleaner (UV253H available from Filgen, Inc.) for 10 minutes to remove the organic residue and improve wettability.
As schematically illustrated in
The source/drain (S/D) electrodes (Al, 40 nm) were formed and patterned on the IZO film by thermal evaporation using a metal mask. Further, the IZO film was patterned by an yttrium aluminum garnet (YAG) laser, subjected to a heat treatment at 90° C. for 3 hours under air atmosphere, and gradually cooled to a room temperature to obtain the IZO active layer.
Butyl acetate solution (50 mg/mL) in which PMMA (Mw: 120000) was dissolved was spin coated at 500 rpm for 5 seconds and at 4000 rpm for 30 seconds on the gate insulating layer on which the IZO active layer and the S/D electrodes were formed, and then subjected to heat treatment at 150° C. for 2 hours to form the PMMA layer having a thickness of 100 nm. AlOx having a thickness of 40 nm was deposited on the PMMA layer by the ALD method while the substrate temperature was maintained at 110° C. to form a sealing film of two layers of PMMA layer/AlOx layer. Thus, the bottom-gate-top-contact TFT including the sealing material and the IZO film was fabricated.
Fabrication of TFT including Three layer sealing material and IZO
An IZO precursor solution was prepared under the same conditions as in Example 1. By a lift-off method in which Cr/Au/Cr was vapor-deposited on a pattern formed of photoresist (TLOR, Tokyo Ohka Kogyo Co., Ltd.) and then the photoresist was removed, a gate electrode of Cr/Au/Cr having thicknesses of 5 nm/25 nm/5 nm, respectively, was formed on a glass substrate. An AlOx gate insulating film having a thickness of 75 nm was formed by the ALD method.
The substrate on which the AlOx gate insulating film was formed was treated with a UV ozone cleaner for 10 minutes, and then the IZO film was formed under the same conditions as in Example 1. The formed IZO film was subjected to photolithography using a photosensitive dielectric (PDM, TAIYO INK MFG. CO., LTD.) and wet etching using a 1.75 mass % oxalic acid aqueous solution to form an IZO active layer which was a patterned n-type semiconductor.
Thereafter, photolithography was performed using a photosensitive dielectric (PDM, TAIYO INK MFG. CO., LTD.), and Al thermal evaporation and lift-off was performed using the resulting PDM as a shadow mask to form source/drain S/D electrodes having a thickness of 60 nm. Next, a laminate body on which the S/D electrodes were formed was subjected to the heat treatment at 90° C. for 3 hours under air atmosphere, and gradually cooled to a room temperature.
Butyl acetate solution (5 mg/mL) in which PMMA (Mw: 120000) was dissolved was spin coated at 500 rpm for 5 seconds and at 4000 rpm for 30 seconds on the gate insulating layer on which the IZO active layer and the S/D electrodes were formed, and then subjected to heat treatment at 150° C. for 1 hour to form the PMMA layer having a thickness of 13 nm.
A parylene layer having a thickness of 25 nm was deposited on the PMMA layer by using the CVD method. AlOx having a thickness of 40 nm was deposited on the parylene layer by the ALD method while the substrate temperature was maintained at 110° C. to form a sealing film of three layers of PMMA layer/parylene layer/AlOx layer. Thus, the bottom-gate-top-contact TFT including the sealing material and the IZO film was fabricated.
A TFT was fabricated in the same manner as in Example 2 except that the sealing film was a PMMA single layer having a thickness of 13 nm.
A TFT was fabricated in the same manner as in Example 2 except that the sealing film was a parylene single layer having a thickness of 25 nm.
A TFT was fabricated in the same manner as in Example 2 except that the sealing film was an AlOx single layer having a thickness of 40 nm.
A TFT was fabricated in the same manner as in Example 2 except that the sealing film was not formed.
A TFT was fabricated in the same manner as in Example 2, except that the sealing film was the PMMA layer having a thickness of 13 nm and a parylene layer having a thickness of 25 nm disposed on the PMMA layer.
Using a semiconductor parameter analyzer (Keithley 4200-SCS), electrical measurements of the TFTs fabricated in the example and comparative examples were performed at a room temperature and dark place condition. The thicknesses of the IZO film and PMMA layer were measured by X-ray reflectivity measurement (XRR, Rigaku SmartLab, CuKα radiation, λ=1.5416 Å). The surface roughness was measured using an atomic force microscope (AFM, SPM-9700HT manufactured by Shimadzu Corporation). During measurement of the characteristics, a through hole was formed in the sealing material by a YAG laser, and conduction was secured by using a silver paste.
Evaluation of Influence by TFT fabrication Process on Performance of Active Layer
The transfer characteristics of the TFTs fabricated in Comparative Examples 1 to 4 were measured to evaluate the influence by the TFT fabrication process on the performance of the active layer.
The TFT of Comparative Example 4 (without sealing material) had a saturation mobility (μsat) of 2.3 cm2V−1s−1, an on/off current ratio (Ion/Ioff) of about 108, and a threshold voltage (Vth) of 2.0 V. This value is the reference value for comparison.
The TFT of Comparative Example 1 (PMMA single layer) exhibited desirable characteristics such as μsat of 2.0 cm2V−1s−1, Ion/Ioff≈108, Vth of 1.7 V, and negligible hysteresis.
In the TFT of Comparative Example 2 (parylene single layer), Vth was greatly shifted to the negative side. This is considered to be because the IZO active layer having a non-stoichiometric composition was affected by a long-time vacuum state during parylene vapor deposition and reactive radical species derived from a parylene source that may react with weakly bonded oxygen atoms.
In the TFT of Comparative Example 3 (AlOx single layer), Vth was greatly shifted to the negative side. The performance was further deteriorated as compared with the TFT of Comparative Example 2 (parylene single layer). This is considered to be due to the harsh conditions of the ALD method, such as high vacuum, high temperature (110° C.), and the use of water as the reactive species. Thus, the parylene coating process and the ALD method changed the characteristics of the IZO active layer having a non-stoichiometric composition.
As compared with the TFT of Comparative Example 4, the TFT of Example 2 showed substantially the same characteristics. That is, it was confirmed that the two layers of PMMA layer/parylene layer functioned as a protective layer during formation of the AlOx film by the ALD method.
The TFT of Comparative Example 1 (PMMA single layer), the TFT of Comparative Example 4 (without sealing material), and the TFT of Comparative Example 5 (PMMA/parylene bilayer) were immersed in deionized water for 15 minutes and air-dried (hereinafter referred to as water treatment). The transfer characteristics of each TFT subjected to the water treatment were measured to evaluate the waterproof characteristics. Evaluation was performed based on the characteristics of the TFT of Comparative Example 4 (without sealing material) before the water treatment as a reference.
In the TFT of Comparative Example 4 (without sealing material), since a large amount of water was incorporated and remained in a back channel layer by the water treatment, the water acted as charge donors and charge traps, the Vth shift became significantly negative, and a large hysteresis was observed.
In the TFT of Comparative Example 1 (PMMA single layer), a slight Vth shift was observed, but the hysteresis was negligible. The TFT of Comparative Example 5 (PMMA/parylene bilayer) exhibited substantially the same characteristics as the TFT of Comparative Example 4 (without sealing material) before the water treatment. That is, it was found that the PMMA/parylene bilayer has a strong protective ability against moisture, and it can be seen that the PMMA/parylene bilayer also has a protective ability against the film forming process by the ALD method. Due to the low moisture permeability of parylene, the PMMA/parylene bilayer has a better buffer function than the PMMA single layer during AlOx deposition.
With respect to the TFT of Example 2 (three layers of PMMA layer/parylene layer/AlOx layer), the TFT of Comparative Example 1 (PMMA single layer), the TFT of Comparative Example 4 (without sealing material), and the TFT of Comparative Example 5 (PMMA/parylene bilayer), bias stress stability at room temperature (25° C.) was evaluated.
The bias stress stability was evaluated by measuring a drain current (ID) throughout the entire process and calculating an ID decrease rate after 3700 seconds, the decrease rate being defined by the following equation 3.
Here, ID(0) is an initial drain current and ID(t) is the ID after applying bias stress at a respective time (t).
When the gate bias was constant, the ID tended to gradually decrease in all the TFTs. This is considered to be because the absorbed oxygen could take electrons away from the conductive bond as indicated by the following formula:
I2(g)+e−(s)=2O−(s).
In the TFT of Comparative Example 4 (without sealing material), the ID decrease rate was 67%, and the stability of the bias stress was the worst. The ID decrease rate of the TFT of Comparative Example 1 (PMMA single layer) was suppressed to 21%, and the ID decrease rate of the TFT of Comparative Example 5 (PMMA/parylene bilayer) was suppressed to 17%. In particular, in the TFT of Example 2 (three layers of PMMA layer/parylene layer/AlOx layer), the ID decrease rate was significantly suppressed, and the ID decrease rate was 2%.
With respect to the TFT of Example 2 (three layers of PMMA layer/parylene layer/AlOx layer), the TFT of Comparative Example 1 (PMMA single layer), the TFT of Comparative Example 4 (without sealing material), and the TFT of Comparative Example 5 (PMMA/parylene bilayer), the transfer characteristics were measured before and after the bias stress to estimate the Vth shift values (ΔVth).
As shown in
As compared with the TFT of Comparative Example 4 (without sealing material), there was less change in the TFT of Comparative Example 5 (PMMA/parylene bilayer).
M refers to In or Zn. M-O-M means oxygen bridging between metal centers and means an oxide of a stoichiometric composition having no oxygen defect. M-O (H) means oxygen or a hydroxyl group having an unpaired electron that does not bridge between metal centers M-O-R means oxygen in an organic material such as H2O, CO2, or alcohol bonded to a metal center, and means compositions each having oxygen defects.
The larger the inclination angle θ, the more the surface selective, and thus the composition closer to the surface of the AOS layer is represented. The ratio of the M-O-M bond was constant at about 50% in the inside of the AOS film, but the closer to the surface of the AOS film, the smaller the ratio of the M-O-M bond, and the ratio was decreased to about 40%, that is, the ratio of the M-O-M bond was decreased by about 20%. As described above, it was found that the AOS layer had more oxygen defects near the surface than in the inside and had a non-uniform chemical composition in the film thickness direction. In
Characteristic Evaluation after Long-Term Standing
100 Sealing material
10 Polymer layer
12 First polymer layer
14 Second polymer layer
20 Inorganic oxide insulator layer
30 Compound layer having a non-stoichiometric composition
Number | Date | Country | Kind |
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2021-029328 | Feb 2021 | JP | national |
Filing Document | Filing Date | Country | Kind |
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PCT/JP2022/007657 | 2/24/2022 | WO |