The present invention relates to a substrate, an electronic substrate, and a method for producing an electronic substrate.
Electronic components have been mounted on substrates with solder. To downsize electronic apparatuses, an electronic component is mounted on a substrate by flip-chip bonding or the like, and to reinforce a connecting portion between the electronic component and the substrate, a resin material is packed between the electronic component and the substrate, or a resin material is applied to corner areas of the electronic component (for example, see Japanese Unexamined Patent Application Publication No. 2016-143357).
The technique disclosed in Japanese Unexamined Patent Application Publication No. 2016-143357 needs additional steps for packing a resin material after mounting of an electronic component and for curing the resin material. Packing of a resin material can reinforce the connecting portion, but the resin material and the substrate have a large difference in thermal expansion coefficient, and thus the connecting portion may be broken by thermal stress when a thermal load is applied.
In view of the above circumstances, the present invention is intended to provide a substrate capable of effectively reinforcing a connecting portion between an electronic component and the substrate, an electronic substrate, and a method for producing an electronic substrate.
A substrate according to the first aspect of the present invention is a substrate on which a first electronic component having a plurality of bumps is to be mounted, and the substrate includes: a base portion including an insulator and having, on an upper face thereof, at least one groove portion configured to store a tip portion of at least one of the bumps of the first electronic component; and an electrode provided on at least a bottom face of the groove portion.
An electronic substrate according to the second aspect of the present invention includes: a first electronic component having a plurality of bumps; and a substrate that includes a base portion including an insulator and having, on an upper face thereof, at least one groove portion configured to store a tip portion of at least one of the bumps of the first electronic component and includes an electrode provided on at least a bottom face of the groove portion, and the tip portion of the bump is stored in the groove portion and is electrically connected to the electrode through a first solder alloy.
A method for producing an electronic substrate according to the third aspect of the present invention includes: preparing a substrate that includes a base portion including an insulator and having, on an upper face thereof, at least one groove portion configured to store a tip portion of a bump of the first electronic component and includes an electrode provided on at least a bottom face of the groove portion; packing a first solder alloy in the groove portion of the substrate; placing the first electronic component on an upper face of the substrate such that the tip portion of the bump is stored in the groove portion of the substrate; and heating the first solder alloy at a temperature at which the first solder alloy melts.
The above-described aspects of the present invention can suppress or avoid breakage of a connecting portion between an electronic component and a substrate even when a thermal stress is applied.
Preferred embodiments of a substrate, an electronic substrate, and a method for producing an electronic substrate according to the present invention will now be described in detail with reference to the accompanying drawings.
The main body 21 is made from a previously cured resin. The main body 21 is selected from under fill materials such as an epoxy resin, a silicone resin, and an acrylic resin. A previously cured main body 21 enables formation of through-holes 22 with a predetermined shape. The main body 21 may contain a filler such as glass. The resin sheet 20 may have a cover film covering the main body 21.
A first electronic component 30 includes a main body 31 and bumps 32 to be electrically connected to electrodes 12 of a substrate 10 (see
Next, with reference to figures, a method for producing an electronic substrate 100 will be described.
In the packing step, a first solder alloy 14 is packed in the groove portions 13 of the substrate 10 as shown in
The first solder alloy 14 is preferably a solder alloy having a melting point lower than that of the bumps 32. The first solder alloy 14 preferably has a melting point of, for example, 150° C. or less. By using a low-melting solder alloy as the first solder alloy 14, the first electronic component 30 can be mounted at a lower heating temperature, and this can reduce the thermal load applied to the first electronic component 30. Examples of the solder alloy having a melting point of 150° C. or less include Sn—Bi solder alloys. Specific examples of the Sn—Bi solder alloy include Sn—Bi solder alloy, Sn—Bi—Cu solder alloy, Sn—Bi—Ni solder alloy, Sn—Bi—Cu—Ni solder alloy, Sn—Bi—Ag solder alloy, and Sn—Bi—Sb solder alloy.
The Sn—Bi solder alloy preferably has a Bi content of 30 to 80% by mass. When having a Bi content within the range, for example, a solder alloy can have a melting point of 138° C. In order to reduce the melting point, the Bi content is more preferably 35 to 70% by mass and particularly preferably 53 to 61% by mass. When Cu or Ni is added to the Sn—Bi solder alloy, such a component is preferably added at a Cu content of 0.1 to 1.0% by mass or a Ni content of 0.01 to 0.1% by mass.
As the material of the bumps 32, for example, Sn—Cu solder alloy, Sn—Ag solder alloy, Sn—Ag—Cu solder alloy, Sn—Ag—Cu—Ni solder alloy, Sn—Ag—Cu—Sb solder alloy, Sn—Ag—Cu—Ni—Sb solder alloy, or the like can be used. The material of the bumps 32 is preferably a solder alloy having such a melting point that the bumps do not melt when the first electronic component 30 is mounted, such as a solder alloy having a high melting point of 200° C. or more, but a low-melting solder that melts at the time of mounting of the first electronic component 30 may be used.
In the resin sheet placing step, the lower face of the resin sheet 20 is allowed to face the upper face of the substrate 10 and is placed on the substrate 10, as shown in
The electronic component placing step is a step of placing the first electronic component 30 on the resin sheet 20, as shown in
In the mounting step, the bumps 32 of the first electronic component 30 are electrically connected to the electrodes 12 of the substrate 10 through the first solder alloy 14, as shown in
As described above, in the electronic substrate 100 according to the first embodiment, the bumps 32 of the first electronic component 30 are electrically connected to the electrodes 12 of the substrate 10 through the first solder alloy 14, and the first electronic component 30 is physically connected to the substrate 10 through the resin sheet 20. In the electronic substrate 100 according to the first embodiment, the electrodes 12 are formed in the groove portions 13 provided on the upper face of the base portion 11, and connection is made through the first solder alloy 14 while the tip portions of the bumps 32 are stored in the groove portions 13. Hence, even when the substrate 10 is deformed by a thermal stress, breakage of the connecting portion can be effectively prevented. In addition, in the first embodiment, each electrode 12 is formed on the bottom face and the side face of the corresponding groove portion 13, and this structure increases the area of the electrode 12 in contact with the bump 32. Hence, while the electronic substrate 100 is not increased, the connection strength between the bumps 32 and the electrodes 12 can be increased.
In the first embodiment, the electrodes 12 are formed on the bottom face and the side face of the groove portions 13 but may be formed only on the bottom face.
In the first embodiment, the resin sheet 20 is inserted between the substrate 10 and the first electronic component 30 to protect the connecting portions between the bumps 32 and the electrodes 12, but the resin sheet 20 is not necessarily used. When the connecting portion of the electronic substrate 100 needs higher strength, resin sealing for reinforcement may be performed in an additional step.
A substrate 10B includes a base portion 11B having groove portions 13 and groove portions 13B formed on the upper face and includes electrodes 12 and electrodes 12B made from an electric conductor and formed on the bottom face and the side face of the groove portions 13 and the groove portions 13B. The groove portions 13B are first groove portions located in four corner areas on the base portion 11, and the groove portions 13 are second groove portions having a smaller diameter than that of the groove portions 13B and are located in the area other than the four corner areas. As shown in
The electronic substrate 100B according to the second embodiment is, in the same manner as in the first embodiment, produced through a packing step, a resin sheet placing step, an electronic component placing step, and a mounting step. In the packing step, a first solder alloy 14 and a first solder alloy 14B are packed (inserted) in the groove portions 13 and the groove portions 13B, respectively. The first solder alloy 14 and the first solder alloy 14B are the same kind of solder alloy and differ only in the packing amount. In the resin sheet placing step, the placing is performed in such a way that the positions of the through-holes 22 and the through-holes 22B of the resin sheet 20B are fitted onto the groove portions 13 and the groove portions 13B, respectively, of the substrate 10B. In the electronic component placing step, the placing is performed in such a way that the positions of the bumps 32 and the bumps 32B of the first electronic component 30B are fitted onto the through-holes 22 and the through-holes 22B, respectively, of the resin sheet 20B. In the electronic component placing step, accordingly, the bumps 32 are stored in the through-holes 22 and the groove portions 13, and the bumps 32B are stored in the through-holes 22B and the groove portions 13B.
In the second embodiment, the large bumps 32B are located in four corner areas on the first electronic component 30B, and the corresponding large groove portions 13B and through-holes 22B are also located in four corner areas of the substrate 10B and resin sheet 20B. The placement of the large bumps 32B and groove portions 13B in the corner areas enables a further improvement in bonding strength of the connecting portions between the bumps 32B and the electrodes 12B located in the corner areas.
In the second embodiment, the electrodes 12 and the electrodes 12B are formed on the bottom face and the side face of the groove portions 13 and the groove portions 13B but may be formed only on the bottom face. In the second embodiment, the resin sheet 20B is inserted between the substrate 10B and the first electronic component 30B to protect the connecting portions between the bumps 32 and bumps 32B and the electrodes 12 and electrodes 12B, but the resin sheet 20B is not necessarily used.
The substrate 10D includes a rectangular base portion 11D having groove portions 13 located in four corner areas on the upper face, electrodes 12 are provided on the bottom face and the side face of the groove portions 13, a recessed portion 17 located on the upper face other than the four corner areas with the groove portions 13 of the base portion 11D and recessed from the upper face of the four corner areas, and electrodes 12D are provided on the recessed portion 17.
The electronic substrate 100D is, in the same manner as the electronic substrate 100 in the first embodiment, produced through a packing step, a resin sheet placing step, an electronic component placing step, and a mounting step. After the packing step of packing and applying a first solder alloy 14 in the groove portions 13 and onto the electrodes 12D of the substrate 10D, resin sheets 20D each having a smaller area than that of the main body 31 of the first electronic component 30 are placed on the substrate 10D at positions corresponding to four corner areas of the first electronic component 30, as shown in
In the electronic substrate 100D, even when the substrate 10D is deformed due to a thermal load, some of the bumps 32 in the four corner areas on the first electronic component 30, to which the largest stress load is applied, are stored in the groove portions 13, and the peripheries of the bumps 32 are sealed by the resin sheet 20D. Hence, the connecting portions between the bumps 32 and the electrodes 12 can be effectively protected.
In the third embodiment, four resin sheets 20D each having nine through-holes 22 are used, but the sheet is not limited to this. For example, resin sheets having a smaller area (for example, each having four through-holes) may be located in the four corner areas on the first electronic component 30 and in the areas located midway of the sides between the corners.
In the third embodiment, the electrodes 12 are formed on the bottom face and the side face of the groove portions 13 but may be formed only on the bottom face. In the third embodiment, the resin sheets 20D are inserted between the substrate 10B and the first electronic component 30D to protect the connecting portions between the bumps 32 and the electrodes 12 and the electrodes 12D, but the resin sheets 20D are not necessarily used.
The substrate 10F includes a base portion 11F having groove portions 13 located in an outer peripheral area on the upper face, electrodes 12 provided on the bottom face and the side face of the groove portions 13, a recessed portion 17F located on the upper face in the inner area from the outer peripheral area with the groove portions 13 of the base portion 11F and recessed from the upper face of the outer peripheral area, and electrodes 12F provided on the recessed portion 17F.
The substrate 10F stores, in the groove portions 13, tip portions of bumps 32 located in the peripheral area of a first electronic component 30 and makes the connection with the electrodes 12 formed in the groove portions 13, and thus the connecting portions between the bumps 32 of the first electronic component 30 in the peripheral area, to which a large stress load is applied, and the electrodes 12 can be protected. In addition, use of a resin sheet that seals the periphery of the bumps 32 located in the peripheral area on the first electronic component 30 improves the bonding strength of the connecting portions between the bumps and the electrodes 12, and the environmental effect including humidity on the connecting portion can be blocked.
In the fourth embodiment, a line of groove portions 13 is located in the outer peripheral area of the substrate 10F, and additional groove portions 13 are located near the four corner areas, but the arrangement of groove portions 13 is not limited to this. Only a line of groove portions 13 may be arranged, or two lines may be arranged.
As the first electronic component 30 and the second electronic component 40, integrated circuit (IC) chips such as a large scale integration (LSI) and a small scale integration (SSI) can be used. A component relatively expensive and susceptible to heat, such as a central processing unit (CPU), a graphic processing unit (GPU), a memory, and a solid state drive (SSD), is preferably used as the first electronic component 30, and another component is preferably used as the second electronic component 40.
In the fifth embodiment, a preliminary mounting step is performed before a packing step. In the preliminary mounting step, a second electronic component 40 is mounted on a substrate 10A as shown in
After the preliminary mounting step, by performing a packing step, a resin sheet placing step, an electronic component placing step, and a mounting step as shown in
The second solder alloy 16 used in the fifth embodiment preferably has a higher melting point than that of the first solder alloy 14. In the fifth embodiment, the second electronic component 40 is connected to the electrodes 15 with the second solder alloy 16, and then the first electronic component 30 is connected to electrodes 12 with the first solder alloy 14. This is because the re-melting of the second solder alloy 16 is prevented at the time of mounting of the first electronic component 30. When a low-melting solder having a melting point of 150° C. or less is used as the first solder alloy 14, the second solder alloy 16 preferably has a melting point of about 180° C.
When a second electronic component 40 that has bumps and is to be flip-chip mounted on the substrate 10A is mounted, a substrate 10A may have groove portions configured to store the bumps of the second electronic component 40, and the bumps of the second electronic component 40 may be mounted with electrodes formed in the groove portions with the second solder alloy.
In addition to the effects of the first embodiment, the electronic substrate 100A according to the fifth embodiment can include different types of electronic components that are mounted in consideration of heat resistance or the like of the electronic components, and the electronic substrate 100A obtains higher reliability.
This application claims the benefit of and priority to U.S. provisional application No. 62/851,352 filed May 22, 2019 which is incorporated herein.
Number | Name | Date | Kind |
---|---|---|---|
10373893 | Vaidya | Aug 2019 | B2 |
10660216 | Kosuga | May 2020 | B1 |
20090053459 | Hirose | Feb 2009 | A1 |
20090154128 | Tamadate | Jun 2009 | A1 |
20090229861 | Hando | Sep 2009 | A1 |
20090283900 | Yamada | Nov 2009 | A1 |
20100193949 | Belanger | Aug 2010 | A1 |
20100314757 | Sugiyama | Dec 2010 | A1 |
20120126416 | Lee | May 2012 | A1 |
20120126429 | Do | May 2012 | A1 |
20120299183 | Fujisawa | Nov 2012 | A1 |
20170117243 | Katkar | Apr 2017 | A1 |
Number | Date | Country |
---|---|---|
39162527 | Jun 1997 | JP |
2001267717 | Sep 2001 | JP |
2001320145 | Nov 2001 | JP |
2008171975 | Jul 2008 | JP |
2009099637 | May 2009 | JP |
2016-143357 | Aug 2016 | JP |
2018082084 | May 2018 | JP |
2008111345 | Sep 2008 | WO |
2018042846 | Mar 2018 | WO |
Number | Date | Country | |
---|---|---|---|
20200373268 A1 | Nov 2020 | US |
Number | Date | Country | |
---|---|---|---|
62851352 | May 2019 | US |