Claims
- 1. A tunnel diode comprising: first and second layers of different semiconductor materials; the top of the valance band for the material of said first layer being at an energy between the energy of the bottom of the conduction band and the top of the valance band for the material of said second layer; the bottom of the conduction band for the material of said first layer being at an energy greater than the energy of the bottom of the conduction band for the material of said second layer; said first layer being degenerately doped with an excess of acceptors to the extent that the Fermi level lies in the valance band; said second layer being degenerately doped with an excess of donors to the extent that the Fermi level lies in the conduction band; and said first and second layers being interfaced to form a semiconductor heterojunction.
- 2. A tunnel diode according to claim 1, wherein the top of the valance band of said first layer is closer to the bottom of the conduction band of said second layer than it is to the top of the valance band of said second layer.
- 3. A tunnel diode as defined in claim 1, in which said layers are formed from different Group III-V alloys.
- 4. A tunnel diode as defined in claim 2, in which the first layer is an alloy of In.sub.1-x Ga.sub.x As and the second layer is an alloy of GaSb.sub.1-y As.sub.y,
- 5. A tunnel diode as defined in claim 4, in which y=0.918x+0.082.
Government Interests
The invention described herein may be manufactured and used by or for the Government for governmental purposes without the payment of any royalties thereon or therefor.
US Referenced Citations (6)