Masato Hara

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Projection aligner
- Patent number 6,853,441
- Issue date Feb 8, 2005
- PENTAX Corporation
- Yoshinori Kobayashi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Projection aligner
- Patent number 6,839,124
- Issue date Jan 4, 2005
- PENTAX Corporation
- Yoshinori Kobayashi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Projection aligner
- Patent number 6,807,013
- Issue date Oct 19, 2004
- PENTAX Corporation
- Yoshinori Kobayashi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Optical member inspecting apparatus and method of inspection thereof
- Patent number 6,804,386
- Issue date Oct 12, 2004
- Asahi Kogaku Kogyo Kabushiki Kaisha
- Toshihiro Nakayama
- G01 - MEASURING TESTING
Information Patent Grant
Optical member inspecting apparatus and method of inspection thereof
- Patent number 6,788,804
- Issue date Sep 7, 2004
- Asahi Kogaku Kogyo Kabushiki Kaisha
- Toshihiro Nakayama
- G01 - MEASURING TESTING
Information Patent Grant
Projection aligner
- Patent number 6,727,979
- Issue date Apr 27, 2004
- PENTAX Corporation
- Yoshinori Kobayashi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Target for photogrammetric analytical measurement system
- Patent number 6,717,683
- Issue date Apr 6, 2004
- PENTAX Corporation
- Shigeru Wakashiro
- G01 - MEASURING TESTING
Information Patent Grant
Optical member inspecting apparatus and method of inspection thereof
- Patent number 6,697,513
- Issue date Feb 24, 2004
- Asahi Kogaku Kogyo Kabushiki Kaisha
- Toshihiro Nakayama
- G01 - MEASURING TESTING
Information Patent Grant
Optical member inspecting apparatus and method of inspection thereof
- Patent number 6,636,625
- Issue date Oct 21, 2003
- Asahi Kogaku Kogyo Kabushiki Kaisha
- Toshihiro Nakayama
- G01 - MEASURING TESTING
Information Patent Grant
Device for calculating positional data of standard points of photog...
- Patent number 6,628,803
- Issue date Sep 30, 2003
- PENTAX Corporation
- Shigeru Wakashiro
- G01 - MEASURING TESTING
Information Patent Grant
Optical member inspecting apparatus and method of inspection thereof
- Patent number 6,535,627
- Issue date Mar 18, 2003
- Asahi Kogaku Kogyo Kabushiki Kaisha
- Toshihiro Nakayama
- G01 - MEASURING TESTING
Information Patent Grant
Optical member inspecting apparatus and method of inspection thereof
- Patent number 6,476,909
- Issue date Nov 5, 2002
- Asahi Kogaku Kogyo Kabushiki Kaisha
- Toshihiro Nakayama
- G01 - MEASURING TESTING
Information Patent Grant
Optical member inspecting apparatus and method of inspection thereof
- Patent number 6,477,264
- Issue date Nov 5, 2002
- Asahi Kogaku Kogyo Kabushiki Kaisha
- Toshihiro Nakayama
- G01 - MEASURING TESTING
Information Patent Grant
Optical member inspecting apparatus and method of inspection thereof
- Patent number 6,434,263
- Issue date Aug 13, 2002
- Asahi Kogaku Kogyo Kabushiki Kaisha
- Toshihiro Nakayama
- G01 - MEASURING TESTING
Information Patent Grant
Optical member inspecting apparatus and method of inspection thereof
- Patent number 6,430,310
- Issue date Aug 6, 2002
- Asahi Kogaku Kogyo Kabushiki Kaisha
- Toshihiro Nakayama
- G01 - MEASURING TESTING
Information Patent Grant
Optical member inspecting apparatus and method of inspection thereof
- Patent number 6,427,023
- Issue date Jul 30, 2002
- Asahi Kogaku Kogyo Kabushiki Kaisha
- Toshihiro Nakayama
- G01 - MEASURING TESTING
Information Patent Grant
Optical member inspecting apparatus and method of inspection thereof
- Patent number 6,363,165
- Issue date Mar 26, 2002
- Asahi Kogaku Kogyo Kabushiki Kaisha
- Toshihiro Nakayama
- G01 - MEASURING TESTING
Information Patent Grant
Optical member inspecting apparatus and method of inspection thereof
- Patent number 6,351,554
- Issue date Feb 26, 2002
- Asahi Kugaku Kogyo Kabushiki Kaisha
- Toshihiro Nakayama
- G01 - MEASURING TESTING
Information Patent Grant
Optical member inspecting apparatus and method of inspection thereof
- Patent number 6,349,145
- Issue date Feb 19, 2002
- Asahi Kogaku Kogyo Kabushiki Kaisha
- Toshihiro Nakayama
- G01 - MEASURING TESTING
Information Patent Grant
Optical member inspecting apparatus and method of inspection thereof
- Patent number 6,314,200
- Issue date Nov 6, 2001
- Asahi Kogaku Kogyo Kabushiki Kaisha
- Toshihiro Nakayama
- G01 - MEASURING TESTING
Information Patent Grant
Photogrammetric analytical measurement system
- Patent number 6,304,669
- Issue date Oct 16, 2001
- Asahi Kogaku Kogyo Kabushiki Kaisha
- Atsumi Kaneko
- G01 - MEASURING TESTING
Information Patent Grant
Optical-member inspection apparatus and holder for inspection targe...
- Patent number 6,208,475
- Issue date Mar 27, 2001
- Asahi Kogaku Kogyo Kabushiki Kaisha
- Kiyoshi Yamamoto
- G02 - OPTICS
Information Patent Grant
Optical member inspecting apparatus and method of inspection thereof
- Patent number 6,148,097
- Issue date Nov 14, 2000
- Asahi Kogaku Kogyo Kabushiki Kaisha
- Toshihiro Nakayama
- G01 - MEASURING TESTING
Information Patent Grant
Beam protecting device
- Patent number 5,991,102
- Issue date Nov 23, 1999
- Asahi Kogaku Kogyo Kabushiki Kaisha
- Masahiro Oono
- G02 - OPTICS
Information Patent Grant
Beam projecting device
- Patent number 5,978,148
- Issue date Nov 2, 1999
- Asahi Kogaku Kogyo Kabushiki Kaisha
- Masahiro Oono
- G02 - OPTICS
Information Patent Grant
Optical element inspecting apparatus
- Patent number 5,847,822
- Issue date Dec 8, 1998
- Asahi Kogaku Kogyo Kabushiki Kaisha
- Masayuki Sugiura
- G01 - MEASURING TESTING
Information Patent Grant
Laser marking device
- Patent number 5,838,431
- Issue date Nov 17, 1998
- Asahi Kogaku Kogyo Kabushiki Kaisha
- Masato Hara
- G01 - MEASURING TESTING
Information Patent Grant
Optical member inspecting apparatus
- Patent number 5,835,207
- Issue date Nov 10, 1998
- Asahi Kogaku Kogyo Kabushiki Kaisha
- Masayuki Sugiura
- G01 - MEASURING TESTING
Information Patent Grant
Optical element inspecting apparatus
- Patent number 5,828,500
- Issue date Oct 27, 1998
- Asahi Kogaku Kogyo Kabushiki Kaisha
- Atsushi Kida
- G01 - MEASURING TESTING
Information Patent Grant
Optical encoder with converging means
- Patent number 4,883,955
- Issue date Nov 28, 1989
- Asahi Kogaku Kogyo K.K.
- Harumi Kawasaki
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Projection Aligner
- Publication number 20030133089
- Publication date Jul 17, 2003
- PENTAX CORPORATION
- Yoshinori Kobayashi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Projection aligner
- Publication number 20030117602
- Publication date Jun 26, 2003
- PENTAX CORPORATION
- Yoshinori Kobayashi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Projection aligner
- Publication number 20030117607
- Publication date Jun 26, 2003
- PENTAX CORPORATION
- Yoshinori Kobayashi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Projection aligner
- Publication number 20030117604
- Publication date Jun 26, 2003
- PENTAX CORPORATION
- Yoshinori Kobayashi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Projection aligner
- Publication number 20030117603
- Publication date Jun 26, 2003
- PENTAX CORPORATION
- Yoshinori Kobayashi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Projection aligner
- Publication number 20030095339
- Publication date May 22, 2003
- PENTAX CORPORATION
- Yoshinori Kobayashi
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
Schematic illustration drawing apparatus and method
- Publication number 20020060650
- Publication date May 23, 2002
- ASAHI KOGAKU KOGYO KABUSHIKI KAISHA
- Shigeru Wakashiro
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPTICAL MEMBER INSPECTING APPARATUS AND METHOD OF INSPECTION THEREOF
- Publication number 20020057428
- Publication date May 16, 2002
- Toshihiro Nakayama
- G01 - MEASURING TESTING

Masato Hara

Person

Patents Grantslast 30 patents

Projection aligner

Projection aligner

Projection aligner

Optical member inspecting apparatus and method of inspection thereof

Optical member inspecting apparatus and method of inspection thereof

Projection aligner

Target for photogrammetric analytical measurement system

Optical member inspecting apparatus and method of inspection thereof

Optical member inspecting apparatus and method of inspection thereof

Device for calculating positional data of standard points of photog...

Optical member inspecting apparatus and method of inspection thereof

Optical member inspecting apparatus and method of inspection thereof

Optical member inspecting apparatus and method of inspection thereof

Optical member inspecting apparatus and method of inspection thereof

Optical member inspecting apparatus and method of inspection thereof

Optical member inspecting apparatus and method of inspection thereof

Optical member inspecting apparatus and method of inspection thereof

Optical member inspecting apparatus and method of inspection thereof

Optical member inspecting apparatus and method of inspection thereof

Optical member inspecting apparatus and method of inspection thereof

Photogrammetric analytical measurement system

Optical-member inspection apparatus and holder for inspection targe...

Optical member inspecting apparatus and method of inspection thereof

Beam protecting device

Beam projecting device

Optical element inspecting apparatus

Laser marking device

Optical member inspecting apparatus

Optical element inspecting apparatus

Optical encoder with converging means

Patents Applicationslast 30 patents

Projection Aligner

Projection aligner

Projection aligner

Projection aligner

Projection aligner

Projection aligner

Schematic illustration drawing apparatus and method

OPTICAL MEMBER INSPECTING APPARATUS AND METHOD OF INSPECTION THEREOF