Yusuke Kohyama

Person

Yokohama-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Solid-state imaging device with vertical gate electrode and method...
- Patent number 8,310,003
- Issue date Nov 13, 2012
- Kabushiki Kaisha Toshiba
- Yusuke Kohyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device with an electrode as an alignment mark, and me...
- Patent number 8,138,533
- Issue date Mar 20, 2012
- Kabushiki Kaisha Toshiba
- Hidetoshi Koike
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Solid-state image pickup device and method for manufacturing same
- Patent number 8,133,753
- Issue date Mar 13, 2012
- Kabushiki Kaisha Toshiba
- Yusuke Kohyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Solid-state image pickup device and method for manufacturing same
- Patent number 8,039,883
- Issue date Oct 18, 2011
- Kabushiki Kaisha Toshiba
- Yusuke Kohyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Back-illuminated type solid-state image pickup device and camera mo...
- Patent number 7,859,073
- Issue date Dec 28, 2010
- Kabushiki Kaisha Toshiba
- Mie Matsuo
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Semiconductor device using fuse/anti-fuse system
- Patent number 7,615,813
- Issue date Nov 10, 2009
- Kabushiki Kaisha Toshiba
- Yoshiaki Fukuzumi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device having a wiring layer of damascene structure a...
- Patent number 7,235,882
- Issue date Jun 26, 2007
- Kabushiki Kaisha Toshiba
- Hiroyuki Nitta
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Stacked capacitor-type semiconductor storage device and manufacturi...
- Patent number 7,187,027
- Issue date Mar 6, 2007
- Kabushiki Kaisha Toshiba
- Yusuke Kohyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device having a wiring layer of damascene structure a...
- Patent number 7,163,894
- Issue date Jan 16, 2007
- Kabushiki Kaisha Toshiba
- Hiroyuki Nitta
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Stacked capacitor-type semiconductor storage device and manufacturi...
- Patent number 7,023,044
- Issue date Apr 4, 2006
- Kabushiki Kaisha Toshiba
- Yusuke Kohyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device using damascene technique and manufacturing me...
- Patent number 6,977,228
- Issue date Dec 20, 2005
- Kabushiki Kaisha Toshiba
- Yusuke Kohyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device having a wiring layer of damascene structure a...
- Patent number 6,906,419
- Issue date Jun 14, 2005
- Kabushiki Kaisha Toshiba
- Hiroyuki Nitta
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Stacked capacitor-type semiconductor storage device and manufacturi...
- Patent number 6,846,733
- Issue date Jan 25, 2005
- Kabushiki Kaisha Toshiba
- Yusuke Kohyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electric fuse whose dielectric breakdown resistance is controlled b...
- Patent number 6,812,542
- Issue date Nov 2, 2004
- Kabushiki Kaisha Toshiba
- Yusuke Kohyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device using fuse/anti-fuse system
- Patent number 6,774,439
- Issue date Aug 10, 2004
- Kabushiki Kaisha Toshiba
- Yoshiaki Fukuzumi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dynamic semiconductor memory device having a trench capacitor
- Patent number 6,720,606
- Issue date Apr 13, 2004
- Kabushiki Kaisha Toshiba
- Akihiro Nitayama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Structure of a capacitor section of a dynamic random-access memory
- Patent number 6,635,933
- Issue date Oct 21, 2003
- Kabushiki Kaisha Toshiba
- Yutaka Ishibashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device using damascene technique and manufacturing me...
- Patent number 6,608,356
- Issue date Aug 19, 2003
- Kabushiki Kaisha Toshiba
- Yusuke Kohyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor memory device and fabrication method thereof
- Patent number 6,593,202
- Issue date Jul 15, 2003
- Kabushiki Kaisha Toshiba
- Keiji Hosotani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Stacked capacitor-type semiconductor storage device and manufacturi...
- Patent number 6,551,894
- Issue date Apr 22, 2003
- Kabushiki Kaisha Toshiba
- Yusuke Kohyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Capacitor having a structure capable of restraining deterioration o...
- Patent number 6,548,844
- Issue date Apr 15, 2003
- Kabushiki Kaisha Toshiba
- Yoshiaki Fukuzumi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing a semiconductor memory device having a tren...
- Patent number 6,534,814
- Issue date Mar 18, 2003
- Kabushiki Kaisha Toshiba
- Junichiro Iba
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor memory device and method for producing same
- Patent number 6,506,634
- Issue date Jan 14, 2003
- Kabushiki Kaisha Toshiba
- Yusuke Kohyama
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device and method for manufacturing the same
- Patent number 6,448,618
- Issue date Sep 10, 2002
- Kabushiki Kaisha Toshiba
- Satoshi Inaba
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for forming storage capacitor having undulated lower electro...
- Patent number 6,403,444
- Issue date Jun 11, 2002
- Kabushiki Kaisha Toshiba
- Yoshiaki Fukuzumi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
DRAM having a cup-shaped storage node electrode recessed within an...
- Patent number 6,362,042
- Issue date Mar 26, 2002
- Kabushiki Kaisha Toshiba
- Keiji Hosotani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
COB DRAM having contact extending over element-isolating film
- Patent number 6,333,538
- Issue date Dec 25, 2001
- Kabushiki Kaisha Toshiba
- Keiji Hosotani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor memory device and manufacturing method thereof which...
- Patent number 6,329,683
- Issue date Dec 11, 2001
- Kabushiki Kaisha Toshiba
- Yusuke Kohyama
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device and method for manufacturing the same
- Patent number 6,326,691
- Issue date Dec 4, 2001
- Kabushiki Kaisha Toshiba
- Yusuke Kohyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method for manufacturing the same
- Patent number 6,320,260
- Issue date Nov 20, 2001
- Kabushiki Kaisha Toshiba
- Yusuke Kohyama
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SOLID-STATE IMAGE PICKUP DEVICE AND CAMERA MODULE
- Publication number 20160028983
- Publication date Jan 28, 2016
- KABUSHIKI KAISHA TOSHIBA
- Shinji UYA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CAMERA MODULE, SOLID-STATE IMAGING DEVICE, AND METHOD OF MANUFACTUR...
- Publication number 20140218578
- Publication date Aug 7, 2014
- KABUSHIKI KAISHA TOSHIBA
- Yusuke Kohyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SOLID-STATE IMAGE PICKUP DEVICE AND METHOD FOR MANUFACTURING SAME
- Publication number 20110250716
- Publication date Oct 13, 2011
- Kabushiki Kaisha Toshiba
- Yusuke KOHYAMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SOLID-STATE IMAGING DEVICE AND METHOD OF MANUFACTURING THE SAME
- Publication number 20110042552
- Publication date Feb 24, 2011
- Shogo FURUYA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
- Publication number 20100155796
- Publication date Jun 24, 2010
- Hidetoshi KOIKE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SOLID-STATE IMAGING DEVICE WITH VERTICAL GATE ELECTRODE AND METHOD...
- Publication number 20100025738
- Publication date Feb 4, 2010
- Yusuke KOHYAMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STI Structure At SOI/Bulk Transition For HOT Device
- Publication number 20100006973
- Publication date Jan 14, 2010
- Kabushiki Kaisha Toshiba
- Yusuke KOHYAMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SOLID-STATE IMAGE PICKUP DEVICE AND METHOD FOR MANUFACTURING SAME
- Publication number 20090315132
- Publication date Dec 24, 2009
- Kabushiki Kaisha Toshiba
- Yusuke KOHYAMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BACK-ILLUMINATED TYPE SOLID-STATE IMAGE PICKUP DEVICE AND CAMERA MO...
- Publication number 20090014762
- Publication date Jan 15, 2009
- Mie MATSUO
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Semiconductor Device Using Fuse/Anti-Fuse System and Method of Manu...
- Publication number 20080012057
- Publication date Jan 17, 2008
- Kabushiki Kaisha Toshiba
- Yoshiaki Fukuzumi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Stacked capacitor-type semiconductor storage device and manufacturi...
- Publication number 20060124980
- Publication date Jun 15, 2006
- KABUSHIKI KAISHA TOSHIBA
- Yusuke Kohyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device using damascene technique and manufacturing me...
- Publication number 20060084273
- Publication date Apr 20, 2006
- KABUSHIKI KAISHA TOSHIBA
- Yusuke Kohyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device having a wiring layer of damascene structure a...
- Publication number 20050206002
- Publication date Sep 22, 2005
- KABUSHIKI KAISHA TOSHIBA
- Hiroyuki Nitta
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device having a wiring layer of damascene structure a...
- Publication number 20050023696
- Publication date Feb 3, 2005
- KABUSHIKI KAISHA TOSHIBA
- Hiroyuki Nitta
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Stacked capacitor-type semiconductor storage device and manufacturi...
- Publication number 20040262771
- Publication date Dec 30, 2004
- KABUSHIKI KAISHA TOSHIBA
- Yusuke Kohyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device using fuse/anti-fuse system and method of manu...
- Publication number 20040227260
- Publication date Nov 18, 2004
- KABUSHIKI KAISHA TOSHIBA
- Yoshiaki Fukuzumi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Stacked capacitor-type semiconductor storage device and manufacturi...
- Publication number 20030178686
- Publication date Sep 25, 2003
- KABUSHIKI KAISHA TOSHIBA
- Yusuke Kohyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device using damascene technique and manufacturing me...
- Publication number 20030162396
- Publication date Aug 28, 2003
- KABUSHIKI KAISHA TOSHIBA
- Yusuke Kohyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Capacitor having a structure capable of restraining deterioration o...
- Publication number 20030094645
- Publication date May 22, 2003
- Yoshiaki Fukuzumi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
A SEMICONDUCTOR MEMORY DEVICE HAVING A TRENCH CAPACITOR
- Publication number 20020072183
- Publication date Jun 13, 2002
- Junichiro Iba
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Structure of a capacitor section of a dynamic random-access memory
- Publication number 20020011618
- Publication date Jan 31, 2002
- KABUSHIKI KAISHA TOSHIBA
- Yutaka Ishibashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electric fuse whose dielectric breakdown resistance is controlled b...
- Publication number 20020003280
- Publication date Jan 10, 2002
- Yusuke Kohyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device having a wiring layer of damascene structure a...
- Publication number 20010054764
- Publication date Dec 27, 2001
- Hiroyuki Nitta
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor memory device and fabrication method thereof
- Publication number 20010049185
- Publication date Dec 6, 2001
- Keiji Hosotani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor memory device and fabrication method thereof
- Publication number 20010045587
- Publication date Nov 29, 2001
- Keiji Hosotani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Storage capacitor having undulated lower electrode for a semiconduc...
- Publication number 20010023110
- Publication date Sep 20, 2001
- Yoshiaki Fukuzumi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device using fuse/anti-fuse system and method of manu...
- Publication number 20010015472
- Publication date Aug 23, 2001
- Yoshiaki Fukuzumi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor memory device and manufacturing method thereof which...
- Publication number 20010012223
- Publication date Aug 9, 2001
- Yusuke Kohyama
- H01 - BASIC ELECTRIC ELEMENTS

Yusuke Kohyama

Person

Patents Grantslast 30 patents

Solid-state imaging device with vertical gate electrode and method...

Semiconductor device with an electrode as an alignment mark, and me...

Solid-state image pickup device and method for manufacturing same

Solid-state image pickup device and method for manufacturing same

Back-illuminated type solid-state image pickup device and camera mo...

Semiconductor device using fuse/anti-fuse system

Semiconductor device having a wiring layer of damascene structure a...

Stacked capacitor-type semiconductor storage device and manufacturi...

Semiconductor device having a wiring layer of damascene structure a...

Stacked capacitor-type semiconductor storage device and manufacturi...

Semiconductor device using damascene technique and manufacturing me...

Semiconductor device having a wiring layer of damascene structure a...

Stacked capacitor-type semiconductor storage device and manufacturi...

Electric fuse whose dielectric breakdown resistance is controlled b...

Semiconductor device using fuse/anti-fuse system

Dynamic semiconductor memory device having a trench capacitor

Structure of a capacitor section of a dynamic random-access memory

Semiconductor device using damascene technique and manufacturing me...

Semiconductor memory device and fabrication method thereof

Stacked capacitor-type semiconductor storage device and manufacturi...

Capacitor having a structure capable of restraining deterioration o...

Method of manufacturing a semiconductor memory device having a tren...

Semiconductor memory device and method for producing same

Semiconductor device and method for manufacturing the same

Method for forming storage capacitor having undulated lower electro...

DRAM having a cup-shaped storage node electrode recessed within an...

COB DRAM having contact extending over element-isolating film

Semiconductor memory device and manufacturing method thereof which...

Semiconductor device and method for manufacturing the same

Semiconductor device and method for manufacturing the same

Patents Applicationslast 30 patents

SOLID-STATE IMAGE PICKUP DEVICE AND CAMERA MODULE

CAMERA MODULE, SOLID-STATE IMAGING DEVICE, AND METHOD OF MANUFACTUR...

SOLID-STATE IMAGE PICKUP DEVICE AND METHOD FOR MANUFACTURING SAME

SOLID-STATE IMAGING DEVICE AND METHOD OF MANUFACTURING THE SAME

SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME

SOLID-STATE IMAGING DEVICE WITH VERTICAL GATE ELECTRODE AND METHOD...

STI Structure At SOI/Bulk Transition For HOT Device

SOLID-STATE IMAGE PICKUP DEVICE AND METHOD FOR MANUFACTURING SAME

BACK-ILLUMINATED TYPE SOLID-STATE IMAGE PICKUP DEVICE AND CAMERA MO...

Semiconductor Device Using Fuse/Anti-Fuse System and Method of Manu...

Stacked capacitor-type semiconductor storage device and manufacturi...

Semiconductor device using damascene technique and manufacturing me...

Semiconductor device having a wiring layer of damascene structure a...

Semiconductor device having a wiring layer of damascene structure a...

Stacked capacitor-type semiconductor storage device and manufacturi...

Semiconductor device using fuse/anti-fuse system and method of manu...

Stacked capacitor-type semiconductor storage device and manufacturi...

Semiconductor device using damascene technique and manufacturing me...

Capacitor having a structure capable of restraining deterioration o...

A SEMICONDUCTOR MEMORY DEVICE HAVING A TRENCH CAPACITOR

Structure of a capacitor section of a dynamic random-access memory

Electric fuse whose dielectric breakdown resistance is controlled b...

Semiconductor device having a wiring layer of damascene structure a...

Semiconductor memory device and fabrication method thereof

Semiconductor memory device and fabrication method thereof

Storage capacitor having undulated lower electrode for a semiconduc...

Semiconductor device using fuse/anti-fuse system and method of manu...

Semiconductor memory device and manufacturing method thereof which...