adjustments of elements during operation

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CPC
G01N2223/32

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

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G01N2223/32adjustments of elements during operation

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Patents Grantslast 30 patents

Information Patent Grant
Method and mechanical design of a flexure interface for ultra-high-...
- Patent number 12,337,473
- Issue date Jun 24, 2025
- UChicago Argonne, LLC
- Deming Shu
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Systems and methods for analyzing core using x-ray fluorescence
- Patent number 12,325,345
- Issue date Jun 10, 2025
- Veracio Ltd.
- Peter Kanck
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Method for quantitatively characterizing dendrite segregation and d...
- Patent number 12,326,434
- Issue date Jun 10, 2025
- NCS TESTING TECHNOLOGY CO., LTD
- Dongling Li
- G01 - MEASURING TESTING
Information Patent Grant
Customizable axes of rotation for industrial radiography systems
- Patent number 12,298,260
- Issue date May 13, 2025
- Illinois Tool Works Inc.
- Joseph Schlecht
- G01 - MEASURING TESTING
Information Patent Grant
Device for closing the input opening in the sample chamber in an x-...
- Patent number 12,298,262
- Issue date May 13, 2025
- Wolfgang Gehrlein
- G01 - MEASURING TESTING
Information Patent Grant
Correction amount specifying apparatus, method, program, and jig
- Patent number 12,287,301
- Issue date Apr 29, 2025
- Rigaku Corporation
- Takuya Kikuchi
- G01 - MEASURING TESTING
Information Patent Grant
Method and measuring device for measuring objects by means of x-ray...
- Patent number 12,287,302
- Issue date Apr 29, 2025
- Helmut Fischer GmbH Institut für Elektronik und Messtechnik
- Martin Leibfritz
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 12,241,848
- Issue date Mar 4, 2025
- Canon Anelva Corporation
- Takeo Tsukamoto
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Spectrometer
- Patent number 12,235,228
- Issue date Feb 25, 2025
- EasyXAFS, LLC
- William Holden
- G01 - MEASURING TESTING
Information Patent Grant
Imaging environment testing fixture and methods thereof
- Patent number 12,222,302
- Issue date Feb 11, 2025
- SAEC/Kinetic Vision, Inc.
- James Anthony Topich
- G01 - MEASURING TESTING
Information Patent Grant
Monitoring properties of X-ray beam during X-ray analysis
- Patent number 12,078,604
- Issue date Sep 3, 2024
- BRUKER TECHNOLOGIES LTD.
- Alexander Krokhmal
- G01 - MEASURING TESTING
Information Patent Grant
Medical x-ray imaging systems and methods
- Patent number 11,986,327
- Issue date May 21, 2024
- MOBIUS IMAGING, LLC
- Eugene A. Gregerson
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 11,977,038
- Issue date May 7, 2024
- Canon Anelva Corporation
- Takeo Tsukamoto
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 11,971,370
- Issue date Apr 30, 2024
- Canon Anelva Corporation
- Takeo Tsukamoto
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Radiation detection device, recording medium, and positioning method
- Patent number 11,940,397
- Issue date Mar 26, 2024
- Horiba, Ltd.
- Tomoki Aoyama
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 11,940,394
- Issue date Mar 26, 2024
- Canon Anelva Corporation
- Takeo Tsukamoto
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Device for hosting a probe solution of molecules in a plurality of...
- Patent number 11,933,746
- Issue date Mar 19, 2024
- Paul Scherrer Institut
- Soichiro Tsujino
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 11,927,554
- Issue date Mar 12, 2024
- Canon Anelva Corporation
- Takeo Tsukamoto
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 11,921,059
- Issue date Mar 5, 2024
- Canon Anelva Corporation
- Takeo Tsukamoto
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray imaging device
- Patent number 11,921,057
- Issue date Mar 5, 2024
- National University Corporation Shizuoka University
- Toru Aoki
- G01 - MEASURING TESTING
Information Patent Grant
X-ray sequential array wavelength dispersive spectrometer
- Patent number 11,885,755
- Issue date Jan 30, 2024
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for acquiring three-dimensional electron diffra...
- Patent number 11,815,476
- Issue date Nov 14, 2023
- FEI Company
- Bart Buijsse
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
X-ray spectrometer and methods for use
- Patent number 11,796,490
- Issue date Oct 24, 2023
- University of Washington
- Gerald Todd Seidler
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Apparatuses and methods for combined simultaneous analyses of mater...
- Patent number 11,796,492
- Issue date Oct 24, 2023
- INEL S.A.S.
- Henry Pilliere
- G01 - MEASURING TESTING
Information Patent Grant
Diffraction analysis device and method for full-field x-ray fluores...
- Patent number 11,774,380
- Issue date Oct 3, 2023
- Sichuan University
- Yuanjun Xu
- G01 - MEASURING TESTING
Information Patent Grant
Imaging environment testing fixture and methods thereof
- Patent number 11,733,181
- Issue date Aug 22, 2023
- SAEC/Kinetic Vision, Inc.
- James Anthony Topich
- G01 - MEASURING TESTING
Information Patent Grant
Inline x-ray measurement apparatus and method
- Patent number 11,714,054
- Issue date Aug 1, 2023
- Illinois Tool Works Inc.
- Mark B. Kirschenman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection device, inspection method, and method for producing obje...
- Patent number 11,639,904
- Issue date May 2, 2023
- Nikon Corporation
- Takeshi Ohbayashi
- G01 - MEASURING TESTING
Information Patent Grant
Method acquiring projection image, control apparatus, control progr...
- Patent number 11,543,367
- Issue date Jan 3, 2023
- Rigaku Corporation
- Yoshihiro Takeda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Analytical method and apparatus
- Patent number 11,536,675
- Issue date Dec 27, 2022
- Jeol Ltd.
- Takanori Murano
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CONVEYING SYSTEM FOR INSPECTION DEVICE
- Publication number 20250237617
- Publication date Jul 24, 2025
- Nuctech Company Limited
- Qingping HUANG
- G01 - MEASURING TESTING
Information Patent Application
MULTI-ROTATIONAL FIXTURES FOR RADIOGRAPHY SYSTEMS AND RADIOGRAPHY S...
- Publication number 20250198950
- Publication date Jun 19, 2025
- Illinois Tool Works Inc.
- Nicole Wilson
- G01 - MEASURING TESTING
Information Patent Application
Systems And Methods For Analyzing Core Using X-Ray Fluorescence
- Publication number 20250162487
- Publication date May 22, 2025
- Veracio Ltd
- Peter Kanck
- B60 - VEHICLES IN GENERAL
Information Patent Application
IMAGING ENVIRONMENT TESTING FIXTURE AND METHODS THEREOF
- Publication number 20250164418
- Publication date May 22, 2025
- SAEC/Kinetic Vision, Inc.
- James Anthony Topich
- G01 - MEASURING TESTING
Information Patent Application
SPECTROMETER
- Publication number 20250164421
- Publication date May 22, 2025
- EasyXAFS, LLC
- William Holden
- G01 - MEASURING TESTING
Information Patent Application
X-RAY IMAGING APPARATUS
- Publication number 20250164415
- Publication date May 22, 2025
- Rayence Co., Ltd.
- Seungman YUN
- G01 - MEASURING TESTING
Information Patent Application
Object Manipulator for an X-ray Inspection System
- Publication number 20250155385
- Publication date May 15, 2025
- Comet Yxlon GmbH
- Laurenz Rosemann
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR X-RAY ABSORPTION SPECTROSCOPY USING SPECTRAL...
- Publication number 20250146960
- Publication date May 8, 2025
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Application
DISTANCE MEASUREMENT DEVICE, RADIOGRAPHY SYSTEM, OPERATION METHOD O...
- Publication number 20250110063
- Publication date Apr 3, 2025
- FUJIFILM CORPORATION
- Hisatsugu HORIUCHI
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR ORIENTATING A SAMPLE FOR INSPECTION WITH CHAR...
- Publication number 20250110069
- Publication date Apr 3, 2025
- FEI Company
- Radovan VAŠINA
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION DEVICE USED FOR SCANNING AND INSPECTING OBJECT TO BE INS...
- Publication number 20240410838
- Publication date Dec 12, 2024
- Nuctech Company Limited
- Zhiqiang CHEN
- G01 - MEASURING TESTING
Information Patent Application
ATTITUDE ADJUSTMENT STRUCTURE, CONVEYING DEVICE, RADIATION IMAGING...
- Publication number 20240410837
- Publication date Dec 12, 2024
- Nuctech Company Limited
- Qingping HUANG
- G01 - MEASURING TESTING
Information Patent Application
X-RAY ANALYZER
- Publication number 20240402101
- Publication date Dec 5, 2024
- Shimadzu Corporation
- Tetsuya YONEDA
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20240369502
- Publication date Nov 7, 2024
- Canon ANELVA Corporation
- Takeo TSUKAMOTO
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
METHOD AND APPARATUS FOR USING RADIATION IMAGING DATA TO ANALYZE CO...
- Publication number 20240369500
- Publication date Nov 7, 2024
- Robert Koch
- G01 - MEASURING TESTING
Information Patent Application
X-RAY MEASURING METHOD AND X-RAY MEASURING DEVICE FOR MEASURING A S...
- Publication number 20240353355
- Publication date Oct 24, 2024
- CiTEX Holding GmbH
- Arno NEUMEISTER
- G01 - MEASURING TESTING
Information Patent Application
Systems And Methods For Analyzing Core Using X-Ray Fluorescence
- Publication number 20240286541
- Publication date Aug 29, 2024
- Veracio Ltd
- Peter Kanck
- B60 - VEHICLES IN GENERAL
Information Patent Application
RAY SCANNING APPARATUS AND RAY SCANNING SYSTEM
- Publication number 20240288385
- Publication date Aug 29, 2024
- Nuctech Company Limited
- Li ZHANG
- G01 - MEASURING TESTING
Information Patent Application
X-Ray Imaging Apparatus and Subject Holding Mechanism
- Publication number 20240230559
- Publication date Jul 11, 2024
- Shimadzu Corporation
- Masashi HAYAKAWA
- G01 - MEASURING TESTING
Information Patent Application
X-RAY DETECTOR HAVING INCREASED RESOLUTION, ARRANGEMENT, AND CORRES...
- Publication number 20240219323
- Publication date Jul 4, 2024
- SMITHS DETECTION GERMANY GMBH
- Philipp FISCHER
- G01 - MEASURING TESTING
Information Patent Application
RADIOGRAPHIC INSPECTION DEVICE AND METHOD OF INSPECTING OBJECT
- Publication number 20240210333
- Publication date Jun 27, 2024
- Nuctech Company Limited
- Li ZHANG
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR IMAGE ACQUISITION, ANALYSIS, AND CHARACTERIZATION OF TIS...
- Publication number 20240151660
- Publication date May 9, 2024
- Diagnostic Instruments, Inc.
- Philip T. Merlo
- G01 - MEASURING TESTING
Information Patent Application
RADIOGRAPHIC INSPECTION APPARATUS AND VEHICLE-MOUNTED SECURITY INSP...
- Publication number 20240151661
- Publication date May 9, 2024
- Nuctech Company Limited
- Li ZHANG
- G01 - MEASURING TESTING
Information Patent Application
Analyzing Method and Analyzer
- Publication number 20240142395
- Publication date May 2, 2024
- JEOL Ltd.
- Koki Kato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
X-RAY PHASE IMAGING APPARATUS AND DISPLAY METHOD OF PREVIEW IMAGE I...
- Publication number 20240102945
- Publication date Mar 28, 2024
- Shimadzu Corporation
- Kana KOJIMA
- G01 - MEASURING TESTING
Information Patent Application
Systems and Methods for Generating High-Energy Three-Dimensional Co...
- Publication number 20240094147
- Publication date Mar 21, 2024
- Rapiscan Holdings, Inc.
- Mark Procter
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR AUTOMATICALLY SETTING UP COMPUTED TOMOGRAPHY SCAN PARAME...
- Publication number 20240077434
- Publication date Mar 7, 2024
- Lumafield, Inc.
- Adam P. Damiano
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20230349841
- Publication date Nov 2, 2023
- Canon ANELVA Corporation
- Takeo TSUKAMOTO
- G01 - MEASURING TESTING
Information Patent Application
IMAGING ENVIRONMENT TESTING FIXTURE AND METHODS THEREOF
- Publication number 20230333030
- Publication date Oct 19, 2023
- SAEC/Kinetic Vision, Inc.
- James Anthony Topich
- G01 - MEASURING TESTING
Information Patent Application
Multi-fraction sample holder for 3D particle analysis
- Publication number 20230146198
- Publication date May 11, 2023
- Carl Zeiss X-ray Microscopy, Inc.
- Matthew Andrew
- G01 - MEASURING TESTING

adjustments of elements during operation

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method and mechanical design of a flexure interface for ultra-high-...

Systems and methods for analyzing core using x-ray fluorescence

Method for quantitatively characterizing dendrite segregation and d...

Customizable axes of rotation for industrial radiography systems

Device for closing the input opening in the sample chamber in an x-...

Correction amount specifying apparatus, method, program, and jig

Method and measuring device for measuring objects by means of x-ray...

Inspection apparatus and inspection method

Spectrometer

Imaging environment testing fixture and methods thereof

Monitoring properties of X-ray beam during X-ray analysis

Medical x-ray imaging systems and methods

Inspection apparatus and inspection method

Inspection apparatus and inspection method

Radiation detection device, recording medium, and positioning method

Inspection apparatus and inspection method

Device for hosting a probe solution of molecules in a plurality of...

Inspection apparatus and inspection method

Inspection apparatus and inspection method

X-ray imaging device

X-ray sequential array wavelength dispersive spectrometer

Methods and systems for acquiring three-dimensional electron diffra...

X-ray spectrometer and methods for use

Apparatuses and methods for combined simultaneous analyses of mater...

Diffraction analysis device and method for full-field x-ray fluores...

Imaging environment testing fixture and methods thereof

Inline x-ray measurement apparatus and method

Inspection device, inspection method, and method for producing obje...

Method acquiring projection image, control apparatus, control progr...

Analytical method and apparatus

Patents Applicationslast 30 patents

CONVEYING SYSTEM FOR INSPECTION DEVICE

MULTI-ROTATIONAL FIXTURES FOR RADIOGRAPHY SYSTEMS AND RADIOGRAPHY S...

Systems And Methods For Analyzing Core Using X-Ray Fluorescence

IMAGING ENVIRONMENT TESTING FIXTURE AND METHODS THEREOF

SPECTROMETER

X-RAY IMAGING APPARATUS

Object Manipulator for an X-ray Inspection System

SYSTEM AND METHOD FOR X-RAY ABSORPTION SPECTROSCOPY USING SPECTRAL...

DISTANCE MEASUREMENT DEVICE, RADIOGRAPHY SYSTEM, OPERATION METHOD O...

METHOD AND SYSTEM FOR ORIENTATING A SAMPLE FOR INSPECTION WITH CHAR...

INSPECTION DEVICE USED FOR SCANNING AND INSPECTING OBJECT TO BE INS...

ATTITUDE ADJUSTMENT STRUCTURE, CONVEYING DEVICE, RADIATION IMAGING...

X-RAY ANALYZER

INSPECTION APPARATUS AND INSPECTION METHOD

METHOD AND APPARATUS FOR USING RADIATION IMAGING DATA TO ANALYZE CO...

X-RAY MEASURING METHOD AND X-RAY MEASURING DEVICE FOR MEASURING A S...

Systems And Methods For Analyzing Core Using X-Ray Fluorescence

RAY SCANNING APPARATUS AND RAY SCANNING SYSTEM

X-Ray Imaging Apparatus and Subject Holding Mechanism

X-RAY DETECTOR HAVING INCREASED RESOLUTION, ARRANGEMENT, AND CORRES...

RADIOGRAPHIC INSPECTION DEVICE AND METHOD OF INSPECTING OBJECT

SYSTEM FOR IMAGE ACQUISITION, ANALYSIS, AND CHARACTERIZATION OF TIS...

RADIOGRAPHIC INSPECTION APPARATUS AND VEHICLE-MOUNTED SECURITY INSP...

Analyzing Method and Analyzer

X-RAY PHASE IMAGING APPARATUS AND DISPLAY METHOD OF PREVIEW IMAGE I...

Systems and Methods for Generating High-Energy Three-Dimensional Co...

METHOD FOR AUTOMATICALLY SETTING UP COMPUTED TOMOGRAPHY SCAN PARAME...

INSPECTION APPARATUS AND INSPECTION METHOD

IMAGING ENVIRONMENT TESTING FIXTURE AND METHODS THEREOF

Multi-fraction sample holder for 3D particle analysis