adjustments of elements during operation

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CPC
G01N2223/32

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

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G01N2223/32adjustments of elements during operation

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Imaging environment testing fixture and methods thereof
- Patent number 12,222,302
- Issue date Feb 11, 2025
- SAEC/Kinetic Vision, Inc.
- James Anthony Topich
- G01 - MEASURING TESTING
Information Patent Grant
Monitoring properties of X-ray beam during X-ray analysis
- Patent number 12,078,604
- Issue date Sep 3, 2024
- BRUKER TECHNOLOGIES LTD.
- Alexander Krokhmal
- G01 - MEASURING TESTING
Information Patent Grant
Medical x-ray imaging systems and methods
- Patent number 11,986,327
- Issue date May 21, 2024
- MOBIUS IMAGING, LLC
- Eugene A. Gregerson
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 11,977,038
- Issue date May 7, 2024
- Canon Anelva Corporation
- Takeo Tsukamoto
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 11,971,370
- Issue date Apr 30, 2024
- Canon Anelva Corporation
- Takeo Tsukamoto
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Radiation detection device, recording medium, and positioning method
- Patent number 11,940,397
- Issue date Mar 26, 2024
- Horiba, Ltd.
- Tomoki Aoyama
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 11,940,394
- Issue date Mar 26, 2024
- Canon Anelva Corporation
- Takeo Tsukamoto
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Device for hosting a probe solution of molecules in a plurality of...
- Patent number 11,933,746
- Issue date Mar 19, 2024
- Paul Scherrer Institut
- Soichiro Tsujino
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 11,927,554
- Issue date Mar 12, 2024
- Canon Anelva Corporation
- Takeo Tsukamoto
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 11,921,059
- Issue date Mar 5, 2024
- Canon Anelva Corporation
- Takeo Tsukamoto
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray imaging device
- Patent number 11,921,057
- Issue date Mar 5, 2024
- National University Corporation Shizuoka University
- Toru Aoki
- G01 - MEASURING TESTING
Information Patent Grant
X-ray sequential array wavelength dispersive spectrometer
- Patent number 11,885,755
- Issue date Jan 30, 2024
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for acquiring three-dimensional electron diffra...
- Patent number 11,815,476
- Issue date Nov 14, 2023
- FEI Company
- Bart Buijsse
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
X-ray spectrometer and methods for use
- Patent number 11,796,490
- Issue date Oct 24, 2023
- University of Washington
- Gerald Todd Seidler
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Apparatuses and methods for combined simultaneous analyses of mater...
- Patent number 11,796,492
- Issue date Oct 24, 2023
- INEL S.A.S.
- Henry Pilliere
- G01 - MEASURING TESTING
Information Patent Grant
Diffraction analysis device and method for full-field x-ray fluores...
- Patent number 11,774,380
- Issue date Oct 3, 2023
- Sichuan University
- Yuanjun Xu
- G01 - MEASURING TESTING
Information Patent Grant
Imaging environment testing fixture and methods thereof
- Patent number 11,733,181
- Issue date Aug 22, 2023
- SAEC/Kinetic Vision, Inc.
- James Anthony Topich
- G01 - MEASURING TESTING
Information Patent Grant
Inline x-ray measurement apparatus and method
- Patent number 11,714,054
- Issue date Aug 1, 2023
- Illinois Tool Works Inc.
- Mark B. Kirschenman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection device, inspection method, and method for producing obje...
- Patent number 11,639,904
- Issue date May 2, 2023
- Nikon Corporation
- Takeshi Ohbayashi
- G01 - MEASURING TESTING
Information Patent Grant
Method acquiring projection image, control apparatus, control progr...
- Patent number 11,543,367
- Issue date Jan 3, 2023
- Rigaku Corporation
- Yoshihiro Takeda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Analytical method and apparatus
- Patent number 11,536,675
- Issue date Dec 27, 2022
- Jeol Ltd.
- Takanori Murano
- G01 - MEASURING TESTING
Information Patent Grant
Mini C-arm imaging system with stepless collimation
- Patent number 11,530,995
- Issue date Dec 20, 2022
- OrthoScan, Inc.
- Andy Webster Green
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Active gratings position tracking in gratings-based phase-contrast...
- Patent number 11,506,617
- Issue date Nov 22, 2022
- Koninklijke Philips N.V.
- Sven Peter Prevrhal
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Device for adjusting and exchanging beamstops
- Patent number 11,307,155
- Issue date Apr 19, 2022
- Wolfgang Gehrlein
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Collimator assembly and ray detection apparatus
- Patent number 11,295,871
- Issue date Apr 5, 2022
- Nuctech Company Limited
- Hanping Li
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Medical x-ray imaging systems and methods
- Patent number 11,197,643
- Issue date Dec 14, 2021
- MOBIUS IMAGING, LLC
- Eugene A. Gregerson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Nanoscale X-ray tomosynthesis for rapid analysis of integrated circ...
- Patent number 11,152,130
- Issue date Oct 19, 2021
- Massachusetts Institute of Technology
- Akintunde I. Akinwande
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray imaging system
- Patent number 11,150,202
- Issue date Oct 19, 2021
- Konica Minolta, Inc.
- Yasunori Tsuboi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
X-ray spectrometer and chemical state analysis method using the same
- Patent number 11,137,360
- Issue date Oct 5, 2021
- Shimadzu Corporation
- Kenji Sato
- G01 - MEASURING TESTING
Information Patent Grant
Radiation detection device and computer program
- Patent number 11,125,703
- Issue date Sep 21, 2021
- Horiba, Ltd.
- Azusa Taroura
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INSPECTION DEVICE USED FOR SCANNING AND INSPECTING OBJECT TO BE INS...
- Publication number 20240410838
- Publication date Dec 12, 2024
- Nuctech Company Limited
- Zhiqiang CHEN
- G01 - MEASURING TESTING
Information Patent Application
ATTITUDE ADJUSTMENT STRUCTURE, CONVEYING DEVICE, RADIATION IMAGING...
- Publication number 20240410837
- Publication date Dec 12, 2024
- Nuctech Company Limited
- Qingping HUANG
- G01 - MEASURING TESTING
Information Patent Application
X-RAY ANALYZER
- Publication number 20240402101
- Publication date Dec 5, 2024
- Shimadzu Corporation
- Tetsuya YONEDA
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20240369502
- Publication date Nov 7, 2024
- Canon ANELVA Corporation
- Takeo TSUKAMOTO
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
METHOD AND APPARATUS FOR USING RADIATION IMAGING DATA TO ANALYZE CO...
- Publication number 20240369500
- Publication date Nov 7, 2024
- Robert Koch
- G01 - MEASURING TESTING
Information Patent Application
X-RAY MEASURING METHOD AND X-RAY MEASURING DEVICE FOR MEASURING A S...
- Publication number 20240353355
- Publication date Oct 24, 2024
- CiTEX Holding GmbH
- Arno NEUMEISTER
- G01 - MEASURING TESTING
Information Patent Application
Systems And Methods For Analyzing Core Using X-Ray Fluorescence
- Publication number 20240286541
- Publication date Aug 29, 2024
- Veracio Ltd
- Peter Kanck
- B60 - VEHICLES IN GENERAL
Information Patent Application
RAY SCANNING APPARATUS AND RAY SCANNING SYSTEM
- Publication number 20240288385
- Publication date Aug 29, 2024
- Nuctech Company Limited
- Li ZHANG
- G01 - MEASURING TESTING
Information Patent Application
X-Ray Imaging Apparatus and Subject Holding Mechanism
- Publication number 20240230559
- Publication date Jul 11, 2024
- Shimadzu Corporation
- Masashi HAYAKAWA
- G01 - MEASURING TESTING
Information Patent Application
X-RAY DETECTOR HAVING INCREASED RESOLUTION, ARRANGEMENT, AND CORRES...
- Publication number 20240219323
- Publication date Jul 4, 2024
- SMITHS DETECTION GERMANY GMBH
- Philipp FISCHER
- G01 - MEASURING TESTING
Information Patent Application
RADIOGRAPHIC INSPECTION DEVICE AND METHOD OF INSPECTING OBJECT
- Publication number 20240210333
- Publication date Jun 27, 2024
- Nuctech Company Limited
- Li ZHANG
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR IMAGE ACQUISITION, ANALYSIS, AND CHARACTERIZATION OF TIS...
- Publication number 20240151660
- Publication date May 9, 2024
- Diagnostic Instruments, Inc.
- Philip T. Merlo
- G01 - MEASURING TESTING
Information Patent Application
RADIOGRAPHIC INSPECTION APPARATUS AND VEHICLE-MOUNTED SECURITY INSP...
- Publication number 20240151661
- Publication date May 9, 2024
- Nuctech Company Limited
- Li ZHANG
- G01 - MEASURING TESTING
Information Patent Application
Analyzing Method and Analyzer
- Publication number 20240142395
- Publication date May 2, 2024
- JEOL Ltd.
- Koki Kato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
X-RAY PHASE IMAGING APPARATUS AND DISPLAY METHOD OF PREVIEW IMAGE I...
- Publication number 20240102945
- Publication date Mar 28, 2024
- Shimadzu Corporation
- Kana KOJIMA
- G01 - MEASURING TESTING
Information Patent Application
Systems and Methods for Generating High-Energy Three-Dimensional Co...
- Publication number 20240094147
- Publication date Mar 21, 2024
- Rapiscan Holdings, Inc.
- Mark Procter
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR AUTOMATICALLY SETTING UP COMPUTED TOMOGRAPHY SCAN PARAME...
- Publication number 20240077434
- Publication date Mar 7, 2024
- Lumafield, Inc.
- Adam P. Damiano
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20230349841
- Publication date Nov 2, 2023
- Canon ANELVA Corporation
- Takeo TSUKAMOTO
- G01 - MEASURING TESTING
Information Patent Application
IMAGING ENVIRONMENT TESTING FIXTURE AND METHODS THEREOF
- Publication number 20230333030
- Publication date Oct 19, 2023
- SAEC/Kinetic Vision, Inc.
- James Anthony Topich
- G01 - MEASURING TESTING
Information Patent Application
Multi-fraction sample holder for 3D particle analysis
- Publication number 20230146198
- Publication date May 11, 2023
- Carl Zeiss X-ray Microscopy, Inc.
- Matthew Andrew
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND MEASURING DEVICE FOR MEASURING OBJECTS BY MEANS OF X-RAY...
- Publication number 20230127587
- Publication date Apr 27, 2023
- Helmut Fischer GmbH Institut fur Elektronik und Messtechnik
- Martin Leibfritz
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR ACQUIRING THREE-DIMENSIONAL ELECTRON DIFFRA...
- Publication number 20220317066
- Publication date Oct 6, 2022
- FEI Company
- Bart BUIJSSE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ACTIVE GRATINGS POSITION TRACKING IN GRATINGS-BASED PHASE-CONTRAST...
- Publication number 20220268573
- Publication date Aug 25, 2022
- Koninklijke Philips N.V.
- SVEN PETER PREVRHAL
- G01 - MEASURING TESTING
Information Patent Application
X-RAY IMAGING DEVICE
- Publication number 20220196575
- Publication date Jun 23, 2022
- NATIONALUNIVERSITYCORPORATIONSHIZUOKAUNIVERSITY
- Toru AOKI
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
Medical X-Ray Imaging Systems And Methods
- Publication number 20220061780
- Publication date Mar 3, 2022
- Mobius Imaging, LLC
- Eugene A. Gregerson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Systems And Methods For Analyzing Core Using X-Ray Fluorescence
- Publication number 20210354616
- Publication date Nov 18, 2021
- BLY IP INC.
- PETER KANCH
- B60 - VEHICLES IN GENERAL
Information Patent Application
MINI C-ARM IMAGING SYSTEM WITH STEPLESS COLLIMATION
- Publication number 20210096088
- Publication date Apr 1, 2021
- ORTHOSCAN, INC.
- Andy Webster Green
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
INLINE X-RAY MEASUREMENT APPARATUS AND METHOD
- Publication number 20200408705
- Publication date Dec 31, 2020
- Illinois Tool Works Inc.
- Mark B. Kirschenman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEVICE AND METHOD FOR PHASE STEPPING IN PHASE CONTRAST IMAGE ACQUIS...
- Publication number 20200383651
- Publication date Dec 10, 2020
- KONINKLIJKE PHILIPS N.V.
- EWALD ROESSL
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
INSPECTION DEVICE, INSPECTION METHOD, AND METHOD FOR PRODUCING OBJE...
- Publication number 20200300784
- Publication date Sep 24, 2020
- Nikon Corporation
- Takeshi OHBAYASHI
- G01 - MEASURING TESTING

adjustments of elements during operation

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Imaging environment testing fixture and methods thereof

Monitoring properties of X-ray beam during X-ray analysis

Medical x-ray imaging systems and methods

Inspection apparatus and inspection method

Inspection apparatus and inspection method

Radiation detection device, recording medium, and positioning method

Inspection apparatus and inspection method

Device for hosting a probe solution of molecules in a plurality of...

Inspection apparatus and inspection method

Inspection apparatus and inspection method

X-ray imaging device

X-ray sequential array wavelength dispersive spectrometer

Methods and systems for acquiring three-dimensional electron diffra...

X-ray spectrometer and methods for use

Apparatuses and methods for combined simultaneous analyses of mater...

Diffraction analysis device and method for full-field x-ray fluores...

Imaging environment testing fixture and methods thereof

Inline x-ray measurement apparatus and method

Inspection device, inspection method, and method for producing obje...

Method acquiring projection image, control apparatus, control progr...

Analytical method and apparatus

Mini C-arm imaging system with stepless collimation

Active gratings position tracking in gratings-based phase-contrast...

Device for adjusting and exchanging beamstops

Collimator assembly and ray detection apparatus

Medical x-ray imaging systems and methods

Nanoscale X-ray tomosynthesis for rapid analysis of integrated circ...

X-ray imaging system

X-ray spectrometer and chemical state analysis method using the same

Radiation detection device and computer program

Patents Applicationslast 30 patents

INSPECTION DEVICE USED FOR SCANNING AND INSPECTING OBJECT TO BE INS...

ATTITUDE ADJUSTMENT STRUCTURE, CONVEYING DEVICE, RADIATION IMAGING...

X-RAY ANALYZER

INSPECTION APPARATUS AND INSPECTION METHOD

METHOD AND APPARATUS FOR USING RADIATION IMAGING DATA TO ANALYZE CO...

X-RAY MEASURING METHOD AND X-RAY MEASURING DEVICE FOR MEASURING A S...

Systems And Methods For Analyzing Core Using X-Ray Fluorescence

RAY SCANNING APPARATUS AND RAY SCANNING SYSTEM

X-Ray Imaging Apparatus and Subject Holding Mechanism

X-RAY DETECTOR HAVING INCREASED RESOLUTION, ARRANGEMENT, AND CORRES...

RADIOGRAPHIC INSPECTION DEVICE AND METHOD OF INSPECTING OBJECT

SYSTEM FOR IMAGE ACQUISITION, ANALYSIS, AND CHARACTERIZATION OF TIS...

RADIOGRAPHIC INSPECTION APPARATUS AND VEHICLE-MOUNTED SECURITY INSP...

Analyzing Method and Analyzer

X-RAY PHASE IMAGING APPARATUS AND DISPLAY METHOD OF PREVIEW IMAGE I...

Systems and Methods for Generating High-Energy Three-Dimensional Co...

METHOD FOR AUTOMATICALLY SETTING UP COMPUTED TOMOGRAPHY SCAN PARAME...

INSPECTION APPARATUS AND INSPECTION METHOD

IMAGING ENVIRONMENT TESTING FIXTURE AND METHODS THEREOF

Multi-fraction sample holder for 3D particle analysis

METHOD AND MEASURING DEVICE FOR MEASURING OBJECTS BY MEANS OF X-RAY...

METHODS AND SYSTEMS FOR ACQUIRING THREE-DIMENSIONAL ELECTRON DIFFRA...

ACTIVE GRATINGS POSITION TRACKING IN GRATINGS-BASED PHASE-CONTRAST...

X-RAY IMAGING DEVICE

Medical X-Ray Imaging Systems And Methods

Systems And Methods For Analyzing Core Using X-Ray Fluorescence

MINI C-ARM IMAGING SYSTEM WITH STEPLESS COLLIMATION

INLINE X-RAY MEASUREMENT APPARATUS AND METHOD

DEVICE AND METHOD FOR PHASE STEPPING IN PHASE CONTRAST IMAGE ACQUIS...

INSPECTION DEVICE, INSPECTION METHOD, AND METHOD FOR PRODUCING OBJE...