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G01B2210/00
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PHYSICS
G01
Measuring instruments
G01B
MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
Current Industry
G01B2210/00
Aspects not specifically covered by any group under G01B
Sub Industries
G01B2210/10
Wheel alignment
G01B2210/12
Method or fixture for calibrating the wheel aligner
G01B2210/14
One or more cameras or other optical devices capable of acquiring a two-dimensional image
G01B2210/143
One or more cameras on each side of a vehicle in the main embodiment
G01B2210/146
Two or more cameras imaging the same area
G01B2210/16
Active or passive device attached to the chassis of a vehicle
G01B2210/18
Specially developed for using with motorbikes or other two-wheeled vehicles
G01B2210/20
Vehicle in a state of translatory motion
G01B2210/22
Wheels in a state of motion supported on rollers, rotating platform or other structure substantially capable of only one degree of rotational freedom
G01B2210/24
Specially developed for using with trucks or other heavy-duty vehicles
G01B2210/26
Algorithms, instructions, databases, computerized methods and graphical user interfaces employed by a user in conjunction with the wheel aligner
G01B2210/28
Beam projector and related sensors, camera, inclinometer or other active sensing or projecting device
G01B2210/283
Beam projectors and related sensors
G01B2210/286
Projecting a light pattern on the wheel or vehicle body
G01B2210/30
Reference markings, reflector, scale or other passive device
G01B2210/303
fixed to the ground or to the measuring station
G01B2210/306
Mirror, prism or other reflector
G01B2210/40
Caliper-like sensors
G01B2210/42
with one or more detectors on a single side of the object to be measured and with a backing surface of support or reference on the other side
G01B2210/44
with detectors on both sides of the object to be measured
G01B2210/46
with one or more detectors on a single side of the object to be measured and with a transmitter on the other side
G01B2210/48
for measurement of a wafer
G01B2210/50
Using chromatic effects to achieve wavelength-dependent depth resolution
G01B2210/52
Combining or merging partially overlapping images to an overall image
G01B2210/54
Revolving an optical measuring instrument around a body
G01B2210/56
Measuring geometric parameters of semiconductor structures
G01B2210/58
Wireless transmission of information between a sensor or probe and a control or evaluation unit
G01B2210/60
Unique sensor identification
G01B2210/62
Support for workpiece air film or bearing with positive or negative pressure
G01B2210/64
Interconnection or interfacing through or under capping or via rear of substrate in microsensors
G01B2210/66
Rock or ground anchors having deformation measuring means
Industries
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Patents Grants
last 30 patents
Information
Patent Grant
Target installation apparatus and target installation method using...
Patent number
11,976,919
Issue date
May 7, 2024
Honda Motor Co., Ltd.
Eiji Ohmori
G01 - MEASURING TESTING
Information
Patent Grant
System and method for operator guided identification of vehicle ref...
Patent number
11,971,250
Issue date
Apr 30, 2024
Hunter Engineering Company
Brian M Cejka
G01 - MEASURING TESTING
Information
Patent Grant
Reducing device overlay errors
Patent number
11,971,664
Issue date
Apr 30, 2024
KLA-Tencor Corporation
Liran Yerushalmi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Confocal sensor
Patent number
11,965,729
Issue date
Apr 23, 2024
Omron Corporation
Hisayasu Morino
G01 - MEASURING TESTING
Information
Patent Grant
Lithographic apparatus, metrology systems, phased array illuminatio...
Patent number
11,966,169
Issue date
Apr 23, 2024
ASML Holding N.V.
Mohamed Swillam
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and system for quantitatively evaluating surface roughness o...
Patent number
11,965,734
Issue date
Apr 23, 2024
NORTHEAST PETROLEUM UNIVERSITY
Shansi Tian
E21 - EARTH DRILLING MINING
Information
Patent Grant
Intraoral scanner with improved ray footprint
Patent number
11,950,880
Issue date
Apr 9, 2024
Align Technology, Inc.
Yossef Atiya
G01 - MEASURING TESTING
Information
Patent Grant
Vehicle wheel assembly position measurement method and apparatus th...
Patent number
11,953,315
Issue date
Apr 9, 2024
Mazda Motor Corporation
Taiga Inoue
G01 - MEASURING TESTING
Information
Patent Grant
Stalk sensor apparatus, systems, and methods
Patent number
11,950,529
Issue date
Apr 9, 2024
CLIMATE LLC
Timothy A. Sauder
G01 - MEASURING TESTING
Information
Patent Grant
Optical phase measurement system and method
Patent number
11,946,875
Issue date
Apr 2, 2024
Nova Ltd.
Gilad Barak
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Wheel aligner with advanced diagnostics and no-stop positioning
Patent number
11,933,606
Issue date
Mar 19, 2024
Snap-on Incorporated
Steven W. Rogers
B60 - VEHICLES IN GENERAL
Information
Patent Grant
Layer detection for high aspect ratio etch control
Patent number
11,929,291
Issue date
Mar 12, 2024
Nova Ltd.
Gil Loewenthal
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and system for measuring a surface of an object comprising d...
Patent number
11,906,302
Issue date
Feb 20, 2024
UNITY SEMICONDUCTOR
Jean-François Boulanger
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods improving optical coherence tomography (OCT) im...
Patent number
11,892,291
Issue date
Feb 6, 2024
LightLab Imaging, Inc.
Chih-Hao Liu
G01 - MEASURING TESTING
Information
Patent Grant
Ellipsometer and inspection device for inspecting semiconductor dev...
Patent number
11,885,608
Issue date
Jan 30, 2024
Samsung Electronics Co., Ltd.
Yasuhiro Hidaka
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus, methods, and computer programs for obtaining an image of...
Patent number
11,885,616
Issue date
Jan 30, 2024
Nokia Technologies
Noriaki Kaneda
G01 - MEASURING TESTING
Information
Patent Grant
Optical measuring method and optical measuring device
Patent number
11,879,725
Issue date
Jan 23, 2024
Dentsply Sirona Inc.
Konrad Klein
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Thickness measuring system and method
Patent number
11,879,723
Issue date
Jan 23, 2024
Jenbit LLC
Michael Jenkins
G01 - MEASURING TESTING
Information
Patent Grant
Camera calibration tool
Patent number
11,870,973
Issue date
Jan 9, 2024
Deere & Company
Nicholas C. Baltz
B60 - VEHICLES IN GENERAL
Information
Patent Grant
System for predicting properties of structures, imager system, and...
Patent number
11,869,178
Issue date
Jan 9, 2024
Micron Technology, Inc.
Amitava Majumdar
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Depth profiling of semiconductor structures using picosecond ultras...
Patent number
11,859,963
Issue date
Jan 2, 2024
Applied Materials Israel Ltd.
Ori Golani
G01 - MEASURING TESTING
Information
Patent Grant
Measuring tape with preset length
Patent number
11,859,968
Issue date
Jan 2, 2024
Kirk Steven Tecu
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for metrology with layer-specific illumination...
Patent number
11,852,590
Issue date
Dec 26, 2023
KLA Corporation
Amnon Manassen
G01 - MEASURING TESTING
Information
Patent Grant
Broad spectrum radiation by supercontinuum generation using a taper...
Patent number
11,835,752
Issue date
Dec 5, 2023
ASML Holding N.V.
King Pui Leung
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Intraoral scanning apparatus
Patent number
11,831,815
Issue date
Nov 28, 2023
3Shape A/S
Rune Fisker
G01 - MEASURING TESTING
Information
Patent Grant
Methods and systems for inspecting integrated circuits based on X-rays
Patent number
11,815,349
Issue date
Nov 14, 2023
Bruker Nano, Inc.
Brennan Lovelace Peterson
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Device for the chromatic confocal measurement of a local height and...
Patent number
11,815,346
Issue date
Nov 14, 2023
SCIENCES ET TECHNIQUES INDUSTRIELLES DE LA LUMIERE
Jérôme Gaillard-Groleas
G01 - MEASURING TESTING
Information
Patent Grant
Optical near-field metrology
Patent number
11,815,347
Issue date
Nov 14, 2023
KLA-Tencor Corporation
Yuri Paskover
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Pattern measurement device and computer program
Patent number
11,802,763
Issue date
Oct 31, 2023
HITACHI HIGH-TECH CORPORATION
Hiroshi Fukuda
G01 - MEASURING TESTING
Information
Patent Grant
Light emitting device, optical detection system, optical detection...
Patent number
11,796,311
Issue date
Oct 24, 2023
SKYVERSE TECHNOLOGY CO., LTD.
Lu Chen
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
MEASUREMENT PROBE
Publication number
20240142229
Publication date
May 2, 2024
RENISHAW PLC
Jamie John BUCKINGHAM
G01 - MEASURING TESTING
Information
Patent Application
SEMICONDUCTOR MEASUREMENT APPARATUS
Publication number
20240133673
Publication date
Apr 25, 2024
Samsung Electronics Co., Ltd.
Garam CHOI
G01 - MEASURING TESTING
Information
Patent Application
FILM THICKNESS MEASURING DEVICE AND FILM THICKNESS MEASURING METHOD
Publication number
20240125589
Publication date
Apr 18, 2024
Hamamatsu Photonics K.K.
Kenichi OHTSUKA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD AND SYSTEM FOR CAPTURING AND PROVIDING DATA FOR A PURCHASE O...
Publication number
20240125593
Publication date
Apr 18, 2024
Sikora AG
Harald Sikora
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METROLOGY AND PROCESS CONTROL FOR SEMICONDUCTOR MANUFACTURING
Publication number
20240078450
Publication date
Mar 7, 2024
NOVA LTD
EITAN ROTHSTEIN
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
DIMENSIONAL METROLOGY USING NON-LINEAR OPTICS
Publication number
20240077302
Publication date
Mar 7, 2024
FemtoMetrix, Inc.
David L. Adler
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
DETECTION SYSTEM FOR MUSICAL INSTRUMENT AND MUSICAL INSTRUMENT
Publication number
20240078984
Publication date
Mar 7, 2024
Yamaha Corporation
Jun Ishii
G10 - MUSICAL INSTRUMENTS ACOUSTICS
Information
Patent Application
METHOD OF MEASURING THICKNESS OF DISPLAY DEVICE
Publication number
20240068800
Publication date
Feb 29, 2024
SAMSUNG DISPLAY CO., LTD.
Sang Heon YE
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SYSTEM FOR SIMULATING A SECOND AXLE ON A THREE-WHEEL VEHICLE AND RE...
Publication number
20240044643
Publication date
Feb 8, 2024
PANTIN ENTERPRISES INC.
Sean R. Pantin
G01 - MEASURING TESTING
Information
Patent Application
ROLLING MASTER WITH KINGPIN AXIS AND STEERING TO CALIBRATE WHEEL AL...
Publication number
20240035813
Publication date
Feb 1, 2024
Volvo Car Corporation
Carola Aronsson
B62 - LAND VEHICLES FOR TRAVELLING OTHERWISE THAN ON RAILS
Information
Patent Application
TIRE INSPECTION APPARATUS, TIRE INSPECTION SYSTEM, AND RECORDING ME...
Publication number
20240035817
Publication date
Feb 1, 2024
TOYO TIRE CORPORATION
Yoichi Kawashima
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS TO CHARACTERIZE SUBSTRATES AND FILMS
Publication number
20240027186
Publication date
Jan 25, 2024
ONTO INNOVATION INC.
Jian Ding
G01 - MEASURING TESTING
Information
Patent Application
SUBSTRATE INSPECTION METHOD
Publication number
20240019380
Publication date
Jan 18, 2024
Samsung Electronics Co., Ltd.
Kihong Chung
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD AND SYSTEM FOR PROVIDING INDIVIDUAL INFORMATION ABOUT A COOR...
Publication number
20240003673
Publication date
Jan 4, 2024
Leica Geosystems AG
Markus STEINER
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
METHOD AND SYSTEM FOR OPTIMIZING USE OF COORDINATE MEASURING DEVICES
Publication number
20230417545
Publication date
Dec 28, 2023
Leica Geosystems AG
Markus STEINER
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND SYSTEM FOR OPTIMIZING OPTICAL INSPECTION OF PATTERNED ST...
Publication number
20230401690
Publication date
Dec 14, 2023
NOVA LTD
Boaz BRILL
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
INTRAORAL SCANNING APPARATUS
Publication number
20230403387
Publication date
Dec 14, 2023
3SHAPE A/S
Rune FISKER
G01 - MEASURING TESTING
Information
Patent Application
SEMICONDUCTOR MEASUREMENT APPARATUS
Publication number
20230400404
Publication date
Dec 14, 2023
Samsung Electronics Co., Ltd.
Garam Choi
G01 - MEASURING TESTING
Information
Patent Application
CALCULATION METHOD, IMAGE-CAPTURING METHOD, AND IMAGE-CAPTURING APP...
Publication number
20230392919
Publication date
Dec 7, 2023
Lasertec Corporation
Yoshihiro NISHIMURA
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS, DEVICES, AND METHODS FOR UNMANNED POWER LINE DIAMETER MEAS...
Publication number
20230384078
Publication date
Nov 30, 2023
BEIROBOTICS LLC
Michael Kenneth BEIRO
B64 - AIRCRAFT AVIATION COSMONAUTICS
Information
Patent Application
SEMICONDUCTOR MEASUREMENT APPARATUS
Publication number
20230375463
Publication date
Nov 23, 2023
Samsung Electronics Co., Ltd.
Seoyeon JEONG
G02 - OPTICS
Information
Patent Application
Instance segmentation imaging system
Publication number
20230358533
Publication date
Nov 9, 2023
iSee, Inc.
Jonah Philion
B60 - VEHICLES IN GENERAL
Information
Patent Application
MEASUREMENT METHOD AND MEASUREMENT APPARATUS FOR MEASURING THICKNES...
Publication number
20230349688
Publication date
Nov 2, 2023
SANTEC CORPORATION
Hiroyuki ITOH
G01 - MEASURING TESTING
Information
Patent Application
DEVICE FOR ASSISTING WITH POSITIONING A STEERING WHEEL OF A VEHICLE...
Publication number
20230331300
Publication date
Oct 19, 2023
Fréderic LAURENS
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR ISOLATION OF SPECIFIC FOURIER PUPIL FREQUENCY...
Publication number
20230314344
Publication date
Oct 5, 2023
Yuri Paskover
G01 - MEASURING TESTING
Information
Patent Application
PERIPHERAL EDGE PROCESSING APPARATUS, PERIPHERAL EDGE PROCESSING ME...
Publication number
20230314960
Publication date
Oct 5, 2023
TOKYO ELECTRON LIMITED
Masashi ENOMOTO
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
LINE-SCANNING CHROMATIC CONFOCAL SENSOR
Publication number
20230314125
Publication date
Oct 5, 2023
HEBERSON TECHNOLOGY (SHENZHEN) CO., LTD
Qiancheng WANG
G01 - MEASURING TESTING
Information
Patent Application
SCANNING SCATTEROMETRY OVERLAY METROLOGY
Publication number
20230314319
Publication date
Oct 5, 2023
Amnon Manassen
G01 - MEASURING TESTING
Information
Patent Application
MEASURING PANEL FOR VEHICLE MEASUREMENT
Publication number
20230296375
Publication date
Sep 21, 2023
Beissbarth GmbH
Stefanie PETERS
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
UNDERGROUND THREE-DIMENSIONAL DISPLACEMENT MEASUREMENT SYSTEM AND M...
Publication number
20230288180
Publication date
Sep 14, 2023
China Jiliang University
Nanying SHENTU
G01 - MEASURING TESTING