by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence

Industry

CPC
G01N23/223

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N23/00Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00

Current Industry

G01N23/223by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence

Industries

Patents Grantslast 30 patents

Information Patent Grant
Inspection apparatus and inspection method
- Patent number 11,977,038
- Issue date May 7, 2024
- Canon Anelva Corporation
- Takeo Tsukamoto
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 11,971,370
- Issue date Apr 30, 2024
- Canon Anelva Corporation
- Takeo Tsukamoto
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Enhanced security threat detection
- Patent number 11,966,004
- Issue date Apr 23, 2024
- VIKEN DETECTION CORPORATION
- Peter J. Rothschild
- G01 - MEASURING TESTING
Information Patent Grant
Portable assessment kit and method for measuring metal content of a...
- Patent number 11,965,838
- Issue date Apr 23, 2024
- 3AWater Oy
- Tuomo Nissinen
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for acquiring elastic modulus of rock containing...
- Patent number 11,965,839
- Issue date Apr 23, 2024
- INST. OF GEOL. & GEOPHYS., CN ACAD. OF SCIENCES
- Beixiu Huang
- G01 - MEASURING TESTING
Information Patent Grant
Surface analyzer
- Patent number 11,965,841
- Issue date Apr 23, 2024
- Shimadzu Corporation
- Akira Ogoshi
- G01 - MEASURING TESTING
Information Patent Grant
System for optimization of hydrocarbon production
- Patent number 11,965,413
- Issue date Apr 23, 2024
- GRANT PRIDECO, INC.
- Salim Deshmukh
- E21 - EARTH DRILLING MINING
Information Patent Grant
Ore component analysis device and method
- Patent number 11,953,455
- Issue date Apr 9, 2024
- SHANDONG UNIVERSITY
- Chen Liu
- G01 - MEASURING TESTING
Information Patent Grant
Biological imaging method using X-ray fluorescence
- Patent number 11,946,884
- Issue date Apr 2, 2024
- SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
- Peiyan Cao
- G01 - MEASURING TESTING
Information Patent Grant
Radiation detection device, recording medium, and positioning method
- Patent number 11,940,397
- Issue date Mar 26, 2024
- Horiba, Ltd.
- Tomoki Aoyama
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 11,940,394
- Issue date Mar 26, 2024
- Canon Anelva Corporation
- Takeo Tsukamoto
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Semiconductor device
- Patent number 11,935,963
- Issue date Mar 19, 2024
- Semiconductor Energy Laboratory Co., Ltd.
- Junichi Koezuka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 11,927,554
- Issue date Mar 12, 2024
- Canon Anelva Corporation
- Takeo Tsukamoto
- G01 - MEASURING TESTING
Information Patent Grant
Method for statistical distribution characterization of dendritic s...
- Patent number 11,927,511
- Issue date Mar 12, 2024
- NCS TESTING TECHNOLOGY CO., LTD
- Dongling Li
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 11,921,059
- Issue date Mar 5, 2024
- Canon Anelva Corporation
- Takeo Tsukamoto
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Integrated system for assessing and modeling integrity of wheels an...
- Patent number 11,921,084
- Issue date Mar 5, 2024
- CleanSolv International LTD
- Thomas Shumka
- B60 - VEHICLES IN GENERAL
Information Patent Grant
X-ray fluorescence spectrometer
- Patent number 11,921,065
- Issue date Mar 5, 2024
- Rigaku Corporation
- Shinya Hara
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for non-destructive metrology of thin layers
- Patent number 11,906,451
- Issue date Feb 20, 2024
- Nova Ltd.
- Wei Ti Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
XFR analyzer instrument
- Patent number 11,898,973
- Issue date Feb 13, 2024
- Hitachi High-Tech Analytical Science Finland Oy
- Oleg Shirokobrod
- G01 - MEASURING TESTING
Information Patent Grant
Method for examining biological fluid
- Patent number 11,885,756
- Issue date Jan 30, 2024
- Yoshitane Kojima
- G01 - MEASURING TESTING
Information Patent Grant
Method for identifying the lithological layer of an excavated mater...
- Patent number 11,879,858
- Issue date Jan 23, 2024
- EIFFAGE GC INFRA LINEAIRES
- Laurence Boulangé
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for interpreting high energy interactions
- Patent number 11,874,240
- Issue date Jan 16, 2024
- Decision Tree, LLC
- Brandon Lee Goodchild Drake
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Advanced X-ray emission spectrometers
- Patent number 11,874,239
- Issue date Jan 16, 2024
- UChicago Argonne, LLC
- Chengjun Sun
- G01 - MEASURING TESTING
Information Patent Grant
Total reflection x-ray fluorescence spectrometer
- Patent number 11,867,646
- Issue date Jan 9, 2024
- Rigaku Corporation
- Makoto Kambe
- G01 - MEASURING TESTING
Information Patent Grant
Determining ore characteristics
- Patent number 11,867,608
- Issue date Jan 9, 2024
- X Development LLC
- Thomas Peter Hunt
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for detection and identification of foreign eleme...
- Patent number 11,867,645
- Issue date Jan 9, 2024
- Security Matters LTD.
- Yair Grof
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for detecting slurry spread volume using terahertz wave,...
- Patent number 11,846,584
- Issue date Dec 19, 2023
- Hyundai Motor Company
- Ha Seung Seong
- G01 - MEASURING TESTING
Information Patent Grant
X-ray fluorescence spectrometer
- Patent number 11,832,981
- Issue date Dec 5, 2023
- Rigaku Corporation
- Yoshiyuki Kataoka
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Deposition system and method
- Patent number 11,823,964
- Issue date Nov 21, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd
- Wen-Hao Cheng
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Data-driven solutions for inverse elemental modeling
- Patent number 11,821,857
- Issue date Nov 21, 2023
- Baker Hughes Oilfield Operations LLC
- Robert Krumm
- E21 - EARTH DRILLING MINING

Patents Applicationslast 30 patents

Information Patent Application
DETECTION METHOD, SURFACE DENSITY DEVICE, DETECTION MEANS, AND STOR...
- Publication number 20240151521
- Publication date May 9, 2024
- CONTEMPORARY AMPEREX TECHNOLOGY CO., LIMITED
- Qiangjun WANG
- G01 - MEASURING TESTING
Information Patent Application
CORRECTION TECHNIQUES FOR MATERIAL CLASSIFICATION
- Publication number 20240133830
- Publication date Apr 25, 2024
- Sortera Technologies Inc.
- Lakshmi Chellappan
- G01 - MEASURING TESTING
Information Patent Application
LUBRICATING OIL ANALYSIS
- Publication number 20240133859
- Publication date Apr 25, 2024
- ExxonMobil Technology and Engineering Company
- Andrew SATTERFIELD
- G01 - MEASURING TESTING
Information Patent Application
Systems And Methods For Interpreting High Energy Interactions
- Publication number 20240125717
- Publication date Apr 18, 2024
- DECISION TREE, LLC
- Brandon Lee Goodchild Drake
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Inspection System and Non-Transitory Computer-Readable Medium
- Publication number 20240127417
- Publication date Apr 18, 2024
- HITACHI HIGH-TECH CORPORATION
- Takehiro HIRAI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ELECTROSTATIC IMAGE DEVELOPER, PROCESS CARTRIDGE, IMAGE FORMING APP...
- Publication number 20240103391
- Publication date Mar 28, 2024
- FUJIFILM Business Innovation Corp.
- Yosuke TSURUMI
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD OF USING A DISSOLVABLE DEPLOYMENT DEVICE FOR THE TRANSFER OF...
- Publication number 20240093603
- Publication date Mar 21, 2024
- Talgat Shokanov
- E21 - EARTH DRILLING MINING
Information Patent Application
SIGNAL PROCESSING DEVICE FOR X-RAY ANALYSIS
- Publication number 20240094149
- Publication date Mar 21, 2024
- Shimadzu Corporation
- Yuta SAITO
- G01 - MEASURING TESTING
Information Patent Application
X-RAY FLUORESCENCE ANALYSIS DEVICE
- Publication number 20240085353
- Publication date Mar 14, 2024
- Shimadzu Corporation
- Yuta SAITO
- G01 - MEASURING TESTING
Information Patent Application
FEED-FORWARD OF MULTI-LAYER AND MULTI-PROCESS INFORMATION USING XPS...
- Publication number 20240085174
- Publication date Mar 14, 2024
- NOVA MEASURING INSTRUMENTS INC.
- Heath POIS
- G01 - MEASURING TESTING
Information Patent Application
Steerable X-Ray Fluorescence Inspection Device
- Publication number 20240085354
- Publication date Mar 14, 2024
- Viken Detection Corporation
- Peter J. Rothschild
- G01 - MEASURING TESTING
Information Patent Application
Small-angle x-ray scatterometry
- Publication number 20240077435
- Publication date Mar 7, 2024
- BRUKER TECHNOLOGIES LTD.
- Alex Dikopoltsev
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS AND METHOD FOR INSPECTING A COMPONENT
- Publication number 20240077438
- Publication date Mar 7, 2024
- GENERAL ELECTRIC COMPANY
- Richard DiDomizio
- G01 - MEASURING TESTING
Information Patent Application
Monitoring properties of X-ray beam during X-ray analysis
- Publication number 20240077437
- Publication date Mar 7, 2024
- BRUKER TECHNOLOGIES LTD.
- Alexander Krokhmal
- G01 - MEASURING TESTING
Information Patent Application
Enhanced Security Threat Detection
- Publication number 20240077638
- Publication date Mar 7, 2024
- Viken Detection Corporation
- Peter J. Rothschild
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED SOURCE ROCK NET THICKNESS PREDICTION SYSTEM AND METHOD
- Publication number 20240053319
- Publication date Feb 15, 2024
- Saudi Arabian Oil Company
- Fatai A. Anifowose
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
X-RAY SOURCE AND OPERATING METHOD THEREFOR
- Publication number 20240055216
- Publication date Feb 15, 2024
- Helmut Fischer GmbH Institut fuer Elektronik und Messtechnik
- Martin Leibfritz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COMBINED XRF ANALYSIS DEVICE
- Publication number 20240044821
- Publication date Feb 8, 2024
- Shenzhen Angstrom Excellence Technology Co. Ltd
- Xuena ZHANG
- G01 - MEASURING TESTING
Information Patent Application
XRS INSPECTION AND SORTING OF PLASTIC CONTAINING OBJECTS PROGRESSIN...
- Publication number 20240035989
- Publication date Feb 1, 2024
- Security Matters Ltd.
- Haggai ALON
- G01 - MEASURING TESTING
Information Patent Application
POLARIZED, ENERGY DISPERSIVE X-RAY FLUORESCENCE SYSTEM AND METHOD
- Publication number 20240035990
- Publication date Feb 1, 2024
- X-Ray Optical Systems, Inc.
- Zewu CHEN
- G01 - MEASURING TESTING
Information Patent Application
XRF QUANTITATIVE ANALYSIS METHOD OF HEAVY METAL ELEMENTS BASED ON L...
- Publication number 20240035991
- Publication date Feb 1, 2024
- Yangtze Delta Region Institute (Huzhou), University of Electronic Science and...
- Fusheng LI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS FOR INSPECTION OF PRESS-HARDENING STEEL SURFACES PRIOR TO S...
- Publication number 20240027421
- Publication date Jan 25, 2024
- GM GLOBAL TECHNOLOGY OPERATIONS LLC
- Hassan GHASSEMI-ARMAKI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
AUTOMATED ANALYZER
- Publication number 20240027375
- Publication date Jan 25, 2024
- Shimadzu Corporation
- Kohji OKADA
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR SMART BATTERY COLLECTION, SORTING, AND PACK...
- Publication number 20240027376
- Publication date Jan 25, 2024
- Li Industries, Inc.
- David YOUNG
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Application
X-RAY FLUORESCENCE WITH HEAVY ELEMENT TARGET AND METHODS OF USE THE...
- Publication number 20240019386
- Publication date Jan 18, 2024
- Bruce Kaiser
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR PREDICTING THE PRESENCE OF RARE EARTH ELEMENTS
- Publication number 20240003836
- Publication date Jan 4, 2024
- MICROBEAM TECHNOLOGIES, INC.
- Matthew Fuka
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR MAPPING CHEMICAL ELEMENTS IN A SAMPLE
- Publication number 20240003837
- Publication date Jan 4, 2024
- Bar Ilan University
- Sharon SHWARTZ
- G01 - MEASURING TESTING
Information Patent Application
XRF-IDENTIFIABLE BLACK POLYMERS
- Publication number 20240002630
- Publication date Jan 4, 2024
- Security Matters Ltd.
- Haggai ALON
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Application
DETECTION METHOD AND DETECTION DEVICE
- Publication number 20230417692
- Publication date Dec 28, 2023
- Shimadzu Corporation
- Takashi NYU
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE CELL FOR FLUID SAMPLE AND X-RAY FLUORESCENCE ANALYZER AND AN...
- Publication number 20230417691
- Publication date Dec 28, 2023
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Yuki KANAZAWA
- G01 - MEASURING TESTING

by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Inspection apparatus and inspection method

Inspection apparatus and inspection method

Enhanced security threat detection

Portable assessment kit and method for measuring metal content of a...

Method and system for acquiring elastic modulus of rock containing...

Surface analyzer

System for optimization of hydrocarbon production

Ore component analysis device and method

Biological imaging method using X-ray fluorescence

Radiation detection device, recording medium, and positioning method

Inspection apparatus and inspection method

Semiconductor device

Inspection apparatus and inspection method

Method for statistical distribution characterization of dendritic s...

Inspection apparatus and inspection method

Integrated system for assessing and modeling integrity of wheels an...

X-ray fluorescence spectrometer

Method and system for non-destructive metrology of thin layers

XFR analyzer instrument

Method for examining biological fluid

Method for identifying the lithological layer of an excavated mater...

Systems and methods for interpreting high energy interactions

Advanced X-ray emission spectrometers

Total reflection x-ray fluorescence spectrometer

Determining ore characteristics

System and method for detection and identification of foreign eleme...

Apparatus for detecting slurry spread volume using terahertz wave,...

X-ray fluorescence spectrometer

Deposition system and method

Data-driven solutions for inverse elemental modeling

Patents Applicationslast 30 patents

DETECTION METHOD, SURFACE DENSITY DEVICE, DETECTION MEANS, AND STOR...

CORRECTION TECHNIQUES FOR MATERIAL CLASSIFICATION

LUBRICATING OIL ANALYSIS

Systems And Methods For Interpreting High Energy Interactions

Inspection System and Non-Transitory Computer-Readable Medium

ELECTROSTATIC IMAGE DEVELOPER, PROCESS CARTRIDGE, IMAGE FORMING APP...

METHOD OF USING A DISSOLVABLE DEPLOYMENT DEVICE FOR THE TRANSFER OF...

SIGNAL PROCESSING DEVICE FOR X-RAY ANALYSIS

X-RAY FLUORESCENCE ANALYSIS DEVICE

FEED-FORWARD OF MULTI-LAYER AND MULTI-PROCESS INFORMATION USING XPS...

Steerable X-Ray Fluorescence Inspection Device

Small-angle x-ray scatterometry

INSPECTION APPARATUS AND METHOD FOR INSPECTING A COMPONENT

Monitoring properties of X-ray beam during X-ray analysis

Enhanced Security Threat Detection

AUTOMATED SOURCE ROCK NET THICKNESS PREDICTION SYSTEM AND METHOD

X-RAY SOURCE AND OPERATING METHOD THEREFOR

COMBINED XRF ANALYSIS DEVICE

XRS INSPECTION AND SORTING OF PLASTIC CONTAINING OBJECTS PROGRESSIN...

POLARIZED, ENERGY DISPERSIVE X-RAY FLUORESCENCE SYSTEM AND METHOD

XRF QUANTITATIVE ANALYSIS METHOD OF HEAVY METAL ELEMENTS BASED ON L...

METHODS FOR INSPECTION OF PRESS-HARDENING STEEL SURFACES PRIOR TO S...

AUTOMATED ANALYZER

METHODS AND SYSTEMS FOR SMART BATTERY COLLECTION, SORTING, AND PACK...

X-RAY FLUORESCENCE WITH HEAVY ELEMENT TARGET AND METHODS OF USE THE...

SYSTEM AND METHOD FOR PREDICTING THE PRESENCE OF RARE EARTH ELEMENTS

SYSTEM AND METHOD FOR MAPPING CHEMICAL ELEMENTS IN A SAMPLE

XRF-IDENTIFIABLE BLACK POLYMERS

DETECTION METHOD AND DETECTION DEVICE

SAMPLE CELL FOR FLUID SAMPLE AND X-RAY FLUORESCENCE ANALYZER AND AN...