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MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
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Industry
CPC
G01B
Parent Industries
G
PHYSICS
G01
Measuring instruments
Current Industry
G01B
MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
Sub Industries
G01B1/00
Measuring instruments characterised by the selection of material therefor
G01B11/00
Measuring arrangements characterised by the use of optical means
G01B13/00
Measuring arrangements characterised by the use of fluids
G01B15/00
Measuring arrangements characterised by the use of wave or particle radiation
G01B17/00
Measuring arrangements characterised by the use of subsonic, sonic or ultrasonic vibrations
G01B21/00
Measuring arrangements or details thereof in so far as they are not adapted to particular types of measuring means of the preceding groups
G01B2210/00
Aspects not specifically covered by any group under G01B
G01B2290/00
Aspects of interferometers not specifically covered by any group under G01B9/02
G01B3/00
Instruments as specified in the subgroups and characterised by the use of mechanical measuring means
G01B5/00
Measuring arrangements characterised by the use of mechanical means
G01B7/00
Measuring arrangements characterised by the use of electric or magnetic means
G01B9/00
Instruments as specified in the subgroups and characterised by the use of optical measuring means
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Patents Grants
last 30 patents
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Patent Grant
Laser welding device and laser welding method
Patent number
11,964,339
Issue date
Apr 23, 2024
PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
Toru Sakai
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
LIDAR waveform calibration system
Patent number
11,965,992
Issue date
Apr 23, 2024
AURORA OPERATIONS, INC.
Andrew Steil Michaels
B60 - VEHICLES IN GENERAL
Information
Patent Grant
Confocal sensor
Patent number
11,965,729
Issue date
Apr 23, 2024
Omron Corporation
Hisayasu Morino
G01 - MEASURING TESTING
Information
Patent Grant
Determining plastic or cellulose levels in composites
Patent number
11,965,737
Issue date
Apr 23, 2024
Continuus Materials Intellectual Property, LLC
Victoria L. Wan
G01 - MEASURING TESTING
Information
Patent Grant
Mobile railway asset monitoring apparatus and methods
Patent number
11,964,681
Issue date
Apr 23, 2024
Amsted Rail Company, Inc.
Todd Snyder
B61 - RAILWAYS
Information
Patent Grant
Endpoint detection system for enhanced spectral data collection
Patent number
11,965,798
Issue date
Apr 23, 2024
Applied Materials, Inc.
Pengyu Han
G01 - MEASURING TESTING
Information
Patent Grant
Method for measuring film thickness distribution of wafer with thin...
Patent number
11,965,730
Issue date
Apr 23, 2024
Shin-Etsu Handotai Co., Ltd.
Susumu Kuwabara
G01 - MEASURING TESTING
Information
Patent Grant
Package structure and measurement method for the package structure
Patent number
11,965,731
Issue date
Apr 23, 2024
Taiwan Semiconductor Manufacturing Company Ltd.
Kuei-Sung Chang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Optical sensor and geometry measurement apparatus
Patent number
11,965,733
Issue date
Apr 23, 2024
Mitutoyo Corporation
Takamitsu Watanabe
G01 - MEASURING TESTING
Information
Patent Grant
Measurement routine motion represented by 3D virtual model
Patent number
11,965,736
Issue date
Apr 23, 2024
Hexagon Metrology, Inc.
Michael Mariani
G01 - MEASURING TESTING
Information
Patent Grant
Image processing system and image processing method
Patent number
11,967,095
Issue date
Apr 23, 2024
Omron Corporation
Motoharu Okuno
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Inspection apparatus having a contactor for inspecting electrical c...
Patent number
11,965,911
Issue date
Apr 23, 2024
Kabushiki Kaisha Nihon Micronics
Satoshi Narita
G01 - MEASURING TESTING
Information
Patent Grant
Methods and sensor for measuring strain
Patent number
11,965,732
Issue date
Apr 23, 2024
Touch Netix Limited
Christopher Holmes
G01 - MEASURING TESTING
Information
Patent Grant
Imaging device provided with light source that emits pulsed light a...
Patent number
11,965,778
Issue date
Apr 23, 2024
PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
Toshiya Fujii
G01 - MEASURING TESTING
Information
Patent Grant
Intelligent piping inspection machine
Patent number
11,965,728
Issue date
Apr 23, 2024
Saudi Arabian Oil Company
Mazin M. Fathi
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method and system for monitoring a powder bed process in additive m...
Patent number
11,964,435
Issue date
Apr 23, 2024
Nanyang Technological University
Matteo Seita
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Lithographic apparatus, metrology systems, phased array illuminatio...
Patent number
11,966,169
Issue date
Apr 23, 2024
ASML Holding N.V.
Mohamed Swillam
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
System and method to adjust a kinetics model of surface reactions d...
Patent number
11,966,203
Issue date
Apr 23, 2024
KLA Corporation
Ankur Agarwal
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method and system for quantitatively evaluating surface roughness o...
Patent number
11,965,734
Issue date
Apr 23, 2024
NORTHEAST PETROLEUM UNIVERSITY
Shansi Tian
E21 - EARTH DRILLING MINING
Information
Patent Grant
Thickness measurement method, thickness measurement device, defect...
Patent number
11,965,735
Issue date
Apr 23, 2024
PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
Yousuke Irie
G01 - MEASURING TESTING
Information
Patent Grant
Multi-axis strain sensor
Patent number
11,959,819
Issue date
Apr 16, 2024
Electronics and Telecommunications Research Institute
Su Jae Lee
G01 - MEASURING TESTING
Information
Patent Grant
Assisted corrosion and erosion recognition
Patent number
11,959,739
Issue date
Apr 16, 2024
Baker Hughes Oilfield Operations LLC
George Sheri
F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information
Patent Grant
Devices and methods for rotary encoder calibration
Patent number
11,959,776
Issue date
Apr 16, 2024
Waymo LLC
Craig Robinson
G01 - MEASURING TESTING
Information
Patent Grant
Pipeline thickness measurement sensor device
Patent number
11,959,851
Issue date
Apr 16, 2024
Yokogawa Electric Corporation
Nobuo Okabe
G01 - MEASURING TESTING
Information
Patent Grant
Locating devices, systems, and methods using frequency suites for u...
Patent number
11,960,047
Issue date
Apr 16, 2024
SeeScan, Inc.
Mark S. Olsson
G01 - MEASURING TESTING
Information
Patent Grant
Method and a system for characterising structures etched in a subst...
Patent number
11,959,736
Issue date
Apr 16, 2024
UNITY SEMICONDUCTOR
Wolfgang Alexander Iff
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Optical triangulation measurement apparatus and method
Patent number
11,959,738
Issue date
Apr 16, 2024
Third Dimension Software Limited
Timothy Peter Monks
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Three-dimensional data creation method and three-dimensional data c...
Patent number
11,959,740
Issue date
Apr 16, 2024
Panasonic Intellectual Property Corporation of America
Takahiro Nishi
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Valley master 2020 device for cutting a metal roofing panel
Patent number
11,959,741
Issue date
Apr 16, 2024
Joseph Edward Martin
E04 - BUILDING
Information
Patent Grant
Systems, methods and apparatus for in-service tank inspections
Patent number
11,959,833
Issue date
Apr 16, 2024
Square Robot, Inc.
Jerome Vaganay
G05 - CONTROLLING REGULATING
Patents Applications
last 30 patents
Information
Patent Application
FILTERING FOR CO-SENSOR FUSION IN ATOMIC SENSORS
Publication number
20240125587
Publication date
Apr 18, 2024
Vector Atomic, Inc.
Jonathan Lynn KOHLER
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
IN-PROCESS DIAMETER MEASUREMENT GAGE
Publication number
20240125590
Publication date
Apr 18, 2024
GAGEMAKER, LP
Jimmy I. FRANK
G01 - MEASURING TESTING
Information
Patent Application
POSITION SENSOR DEVICES, METHODS AND SYSTEMS BASED ON MAGNETIC FIEL...
Publication number
20240125624
Publication date
Apr 18, 2024
Melexis Technologies SA
Nicolas DUPRE
G01 - MEASURING TESTING
Information
Patent Application
REDUCED OFFSET ERROR CONFIGURATION FOR A ROTARY INDUCTIVE SENSOR
Publication number
20240125586
Publication date
Apr 18, 2024
CTS Corporation
Xiaofeng Huang
B60 - VEHICLES IN GENERAL
Information
Patent Application
FILM THICKNESS MEASURING DEVICE AND FILM THICKNESS MEASURING METHOD
Publication number
20240125589
Publication date
Apr 18, 2024
Hamamatsu Photonics K.K.
Kenichi OHTSUKA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD AND SYSTEM FOR CAPTURING AND PROVIDING DATA FOR A PURCHASE O...
Publication number
20240125593
Publication date
Apr 18, 2024
Sikora AG
Harald Sikora
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
ADJUSTMENT SYSTEM AND METHOD THEREOF IN AN AGRICULTURAL SYSTEM
Publication number
20240125595
Publication date
Apr 18, 2024
Deere & Company
TROY M. HEIMS
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL ALIGNMENT APPARATUS AND METHOD FOR SURFACE MOUNTABLE OPTICA...
Publication number
20240126041
Publication date
Apr 18, 2024
ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE
HAECHUNG KANG
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS AND METHOD MONITORING SEMICONDUCTOR MANUFACTURING EQUIPMENT
Publication number
20240128102
Publication date
Apr 18, 2024
Samsung Electronics Co., Ltd.
SUNGHO JANG
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
INTEGRATED OPTICAL SENSOR CONTROLLER FOR DEVICEMANUFACTURING MACHINES
Publication number
20240128114
Publication date
Apr 18, 2024
Applied Materials, Inc.
Kiyki-Shiy Shang
B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information
Patent Application
TILT CALIBRATION FOR PROBE SYSTEMS
Publication number
20240125817
Publication date
Apr 18, 2024
The Boeing Company
Peter D. Brewer
G01 - MEASURING TESTING
Information
Patent Application
BEAM MEASURING DEVICE, SAMPLE PROCESSOR AND METHOD OF MEASURING BEAM
Publication number
20240125592
Publication date
Apr 18, 2024
Beckman Coulter Biotechnology (Suzhou) Co., Ltd.
Wei SHI
G01 - MEASURING TESTING
Information
Patent Application
Method for Determining Foldable Screen Included Angle and Associate...
Publication number
20240125596
Publication date
Apr 18, 2024
Honor Device Co., Ltd.
Xiaowu Zhang
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
TEMPERATURE COMPENSATION FOR MACHINE TOOL
Publication number
20240125584
Publication date
Apr 18, 2024
HEXAGON TECHNOLOGY CENTER GMBH
Claudio ISELI
G01 - MEASURING TESTING
Information
Patent Application
TRIBOELECTRIC NANOGENERATOR AND PREPARATION METHOD, SELF-POWERED SE...
Publication number
20240128895
Publication date
Apr 18, 2024
Shenzhen University
Longbiao HUANG
B33 - ADDITIVE MANUFACTURING TECHNOLOGY
Information
Patent Application
SYSTEM AND METHOD FOR EFFICIENT MATERIAL MEASUREMENT AND CONVERSION
Publication number
20240123522
Publication date
Apr 18, 2024
SOLUTION MAVERICKS, LLC
Joel WILLE
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Application
DRESSING BOARD AND SHAPE DETERMINING METHOD
Publication number
20240123575
Publication date
Apr 18, 2024
Disco Corporation
Katsubumi IIDA
B24 - GRINDING POLISHING
Information
Patent Application
SENSOR ASSEMBLY FOR A ROTARY SENSOR
Publication number
20240125625
Publication date
Apr 18, 2024
Honeywell International Inc.
James C. FALK
G01 - MEASURING TESTING
Information
Patent Application
Projection Mapping System and Apparatus
Publication number
20240129442
Publication date
Apr 18, 2024
NEWTONOID TECHNOLOGIES, L.L.C.
FIELDING B. STATON
G01 - MEASURING TESTING
Information
Patent Application
COMPENSATION FOR SLURRY COMPOSITION IN IN-SITU ELECTROMAGNETIC INDU...
Publication number
20240123565
Publication date
Apr 18, 2024
Applied Materials, Inc.
Kun Xu
B24 - GRINDING POLISHING
Information
Patent Application
HOLOGRAPHIC MICROSCOPE
Publication number
20240126206
Publication date
Apr 18, 2024
KOREA PHOTONICS TECHNOLOGY INSTITUTE
Seon Kyu YOON
G01 - MEASURING TESTING
Information
Patent Application
STALK-DIAMETER SENSING SYSTEM WITH STALK FEELER DAMPER
Publication number
20240125585
Publication date
Apr 18, 2024
Deere & Company
TROY M. HEIMS
G01 - MEASURING TESTING
Information
Patent Application
NIRAF Calibration Packaging Phantom
Publication number
20240125588
Publication date
Apr 18, 2024
Canon U.S.A., Inc.
Emily Chernich
G01 - MEASURING TESTING
Information
Patent Application
WIDE FIELD-OF-VIEW METASURFACE OPTICS, SENSORS, CAMERAS AND PROJECTORS
Publication number
20240125591
Publication date
Apr 18, 2024
2Pi Inc.
Tian GU
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND SYSTEM FOR DETERMINING A THREE-DIMENSIONAL DEFINITION OF...
Publication number
20240125594
Publication date
Apr 18, 2024
VIRELUX INSPECTION SYSTEMS SARL
Tom REICHERT
G01 - MEASURING TESTING
Information
Patent Application
STRETCHABLE STRAIN SENSOR, COMBINATION SENSOR, AND DISPLAY PANEL AN...
Publication number
20240118149
Publication date
Apr 11, 2024
Samsung Electronics Co., Ltd.
Gae Hwang LEE
G01 - MEASURING TESTING
Information
Patent Application
CONCRETE SURFACE MAPPING ROBOTS, SYSTEMS, AND METHODS FOR PROCESSIN...
Publication number
20240118715
Publication date
Apr 11, 2024
HUSQVARNA AB
Andreas Jönsson
B24 - GRINDING POLISHING
Information
Patent Application
STRAIN RESISTANCE FILM, PHYSICAL QUANTITY SENSOR, AND METHOD FOR MA...
Publication number
20240117474
Publication date
Apr 11, 2024
TDK Corporation
Kohei NAWAOKA
C22 - METALLURGY FERROUS OR NON-FERROUS ALLOYS TREATMENT OF ALLOYS OR NON-FER...
Information
Patent Application
STRAIN SENSOR, METHOD OF MANUFACTURING STRAIN SENSOR, AND STRAIN ME...
Publication number
20240118071
Publication date
Apr 11, 2024
Hyundai Motor Company
Mi Yong Lee
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
VEHICLE WHEEL THEFT DETECTION SYSTEMS AND METHODS USING WHEEL SENSO...
Publication number
20240119817
Publication date
Apr 11, 2024
FORD GLOBAL TECHNOLOGIES, L.L.C.
Jonathan Engels
G08 - SIGNALLING