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G01N2223/076
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PHYSICS
G01
Measuring instruments
G01N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G01N2223/00
Investigating materials by wave or particle radiation
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G01N2223/076
X-ray fluorescence
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Patents Grants
last 30 patents
Information
Patent Grant
Inspection apparatus and inspection method
Patent number
11,977,038
Issue date
May 7, 2024
Canon Anelva Corporation
Takeo Tsukamoto
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Inspection apparatus and inspection method
Patent number
11,971,370
Issue date
Apr 30, 2024
Canon Anelva Corporation
Takeo Tsukamoto
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Portable assessment kit and method for measuring metal content of a...
Patent number
11,965,838
Issue date
Apr 23, 2024
3AWater Oy
Tuomo Nissinen
G01 - MEASURING TESTING
Information
Patent Grant
Method and system for acquiring elastic modulus of rock containing...
Patent number
11,965,839
Issue date
Apr 23, 2024
INST. OF GEOL. & GEOPHYS., CN ACAD. OF SCIENCES
Beixiu Huang
G01 - MEASURING TESTING
Information
Patent Grant
Ore component analysis device and method
Patent number
11,953,455
Issue date
Apr 9, 2024
SHANDONG UNIVERSITY
Chen Liu
G01 - MEASURING TESTING
Information
Patent Grant
Biological imaging method using X-ray fluorescence
Patent number
11,946,884
Issue date
Apr 2, 2024
SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
Peiyan Cao
G01 - MEASURING TESTING
Information
Patent Grant
Radiation detection device, recording medium, and positioning method
Patent number
11,940,397
Issue date
Mar 26, 2024
Horiba, Ltd.
Tomoki Aoyama
G01 - MEASURING TESTING
Information
Patent Grant
Inspection apparatus and inspection method
Patent number
11,940,394
Issue date
Mar 26, 2024
Canon Anelva Corporation
Takeo Tsukamoto
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Sample mounting system for an X-ray analysis apparatus
Patent number
11,927,550
Issue date
Mar 12, 2024
Malvern Panalytical B.V.
Jaap Boksem
G01 - MEASURING TESTING
Information
Patent Grant
Inspection apparatus and inspection method
Patent number
11,927,554
Issue date
Mar 12, 2024
Canon Anelva Corporation
Takeo Tsukamoto
G01 - MEASURING TESTING
Information
Patent Grant
Inspection apparatus and inspection method
Patent number
11,921,059
Issue date
Mar 5, 2024
Canon Anelva Corporation
Takeo Tsukamoto
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
XFR analyzer instrument
Patent number
11,898,973
Issue date
Feb 13, 2024
Hitachi High-Tech Analytical Science Finland Oy
Oleg Shirokobrod
G01 - MEASURING TESTING
Information
Patent Grant
X-ray sequential array wavelength dispersive spectrometer
Patent number
11,885,755
Issue date
Jan 30, 2024
Sigray, Inc.
Wenbing Yun
G01 - MEASURING TESTING
Information
Patent Grant
Advanced X-ray emission spectrometers
Patent number
11,874,239
Issue date
Jan 16, 2024
UChicago Argonne, LLC
Chengjun Sun
G01 - MEASURING TESTING
Information
Patent Grant
System and method for detection and identification of foreign eleme...
Patent number
11,867,645
Issue date
Jan 9, 2024
Security Matters LTD.
Yair Grof
G01 - MEASURING TESTING
Information
Patent Grant
Deposition system and method
Patent number
11,823,964
Issue date
Nov 21, 2023
Taiwan Semiconductor Manufacturing Co., Ltd
Wen-Hao Cheng
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Grant
Data-driven solutions for inverse elemental modeling
Patent number
11,821,857
Issue date
Nov 21, 2023
Baker Hughes Oilfield Operations LLC
Robert Krumm
E21 - EARTH DRILLING MINING
Information
Patent Grant
X-ray fluorescence analyzer and a method for performing an x-ray fl...
Patent number
11,815,480
Issue date
Nov 14, 2023
Outotec (Finland) Oy
Tommi Koskinen
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Integrated, portable sample analysis system and method
Patent number
11,796,486
Issue date
Oct 24, 2023
Spectro Scientific, Inc.
Patrick F. Henning
G01 - MEASURING TESTING
Information
Patent Grant
X-ray spectroscopic analysis apparatus and elemental analysis method
Patent number
11,796,491
Issue date
Oct 24, 2023
Shimadzu Corporation
Shinji Miyauchi
G01 - MEASURING TESTING
Information
Patent Grant
Compact insertable x-ray fluorescence device for pipe inspection
Patent number
11,796,494
Issue date
Oct 24, 2023
VIKEN DETECTION CORPORATION
Peter J. Rothschild
G01 - MEASURING TESTING
Information
Patent Grant
Apparatuses and methods for combined simultaneous analyses of mater...
Patent number
11,796,492
Issue date
Oct 24, 2023
INEL S.A.S.
Henry Pilliere
G01 - MEASURING TESTING
Information
Patent Grant
X-ray fluorescence analyzer comprising a measurement device, sample...
Patent number
11,788,977
Issue date
Oct 17, 2023
S himadzu Corporation
Yuji Morihisa
G01 - MEASURING TESTING
Information
Patent Grant
Quantitative analysis method, quantitative analysis program, and X-...
Patent number
11,782,000
Issue date
Oct 10, 2023
Rigaku Corporation
Yoshiyuki Kataoka
G01 - MEASURING TESTING
Information
Patent Grant
Diffraction analysis device and method for full-field x-ray fluores...
Patent number
11,774,380
Issue date
Oct 3, 2023
Sichuan University
Yuanjun Xu
G01 - MEASURING TESTING
Information
Patent Grant
Methods and systems for smart battery collection, sorting, and pack...
Patent number
11,747,290
Issue date
Sep 5, 2023
LI INDUSTRIES, INC.
David Young
G01 - MEASURING TESTING
Information
Patent Grant
X-ray analysis device including a spectrometer to detect characteri...
Patent number
11,740,190
Issue date
Aug 29, 2023
Shimadzu Corporation
Kenji Sato
G01 - MEASURING TESTING
Information
Patent Grant
System and method for predicting the presence of rare earth elements
Patent number
11,733,184
Issue date
Aug 22, 2023
MICROBEAM TECHNOLOGIES, INC.
Matthew Fuka
G01 - MEASURING TESTING
Information
Patent Grant
Fluorescent X-ray analysis apparatus comprising a plurality of X-ra...
Patent number
11,733,185
Issue date
Aug 22, 2023
Rigaku Corporation
Kiyoshi Ogata
G01 - MEASURING TESTING
Information
Patent Grant
X-ray instrument with ambient temperature detector
Patent number
11,719,654
Issue date
Aug 8, 2023
Evident Scientific, Inc.
Peter Hardman
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
LUBRICATING OIL ANALYSIS
Publication number
20240133859
Publication date
Apr 25, 2024
ExxonMobil Technology and Engineering Company
Andrew SATTERFIELD
G01 - MEASURING TESTING
Information
Patent Application
ELECTROSTATIC IMAGE DEVELOPER, PROCESS CARTRIDGE, IMAGE FORMING APP...
Publication number
20240103391
Publication date
Mar 28, 2024
FUJIFILM Business Innovation Corp.
Yosuke TSURUMI
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
METHOD OF USING A DISSOLVABLE DEPLOYMENT DEVICE FOR THE TRANSFER OF...
Publication number
20240093603
Publication date
Mar 21, 2024
Talgat Shokanov
E21 - EARTH DRILLING MINING
Information
Patent Application
Steerable X-Ray Fluorescence Inspection Device
Publication number
20240085354
Publication date
Mar 14, 2024
Viken Detection Corporation
Peter J. Rothschild
G01 - MEASURING TESTING
Information
Patent Application
Monitoring properties of X-ray beam during X-ray analysis
Publication number
20240077437
Publication date
Mar 7, 2024
BRUKER TECHNOLOGIES LTD.
Alexander Krokhmal
G01 - MEASURING TESTING
Information
Patent Application
AUTOMATED SOURCE ROCK NET THICKNESS PREDICTION SYSTEM AND METHOD
Publication number
20240053319
Publication date
Feb 15, 2024
Saudi Arabian Oil Company
Fatai A. Anifowose
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
XRS INSPECTION AND SORTING OF PLASTIC CONTAINING OBJECTS PROGRESSIN...
Publication number
20240035989
Publication date
Feb 1, 2024
Security Matters Ltd.
Haggai ALON
G01 - MEASURING TESTING
Information
Patent Application
METHODS AND SYSTEMS FOR SMART BATTERY COLLECTION, SORTING, AND PACK...
Publication number
20240027376
Publication date
Jan 25, 2024
Li Industries, Inc.
David YOUNG
B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information
Patent Application
X-RAY FLUORESCENCE WITH HEAVY ELEMENT TARGET AND METHODS OF USE THE...
Publication number
20240019386
Publication date
Jan 18, 2024
Bruce Kaiser
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR PREDICTING THE PRESENCE OF RARE EARTH ELEMENTS
Publication number
20240003836
Publication date
Jan 4, 2024
MICROBEAM TECHNOLOGIES, INC.
Matthew Fuka
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR MAPPING CHEMICAL ELEMENTS IN A SAMPLE
Publication number
20240003837
Publication date
Jan 4, 2024
Bar Ilan University
Sharon SHWARTZ
G01 - MEASURING TESTING
Information
Patent Application
XRF-IDENTIFIABLE BLACK POLYMERS
Publication number
20240002630
Publication date
Jan 4, 2024
Security Matters Ltd.
Haggai ALON
B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information
Patent Application
SAMPLE CELL FOR FLUID SAMPLE AND X-RAY FLUORESCENCE ANALYZER AND AN...
Publication number
20230417691
Publication date
Dec 28, 2023
HITACHI HIGH-TECH SCIENCE CORPORATION
Yuki KANAZAWA
G01 - MEASURING TESTING
Information
Patent Application
X-RAY FLUORESCENCE ANALYZER
Publication number
20230408428
Publication date
Dec 21, 2023
Shimadzu Corporation
Yasuyuki OKAMOTO
G01 - MEASURING TESTING
Information
Patent Application
DEPOSITION SYSTEM AND METHOD
Publication number
20230386942
Publication date
Nov 30, 2023
Taiwan Semiconductor Manufacturing Co., Ltd.
Wen-Hao CHENG
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Application
SYSTEM AND METHOD FOR DETERMINING MASS FRACTIONS IN A TEST SAMPLE W...
Publication number
20230366840
Publication date
Nov 16, 2023
Bruker AXS GmbH
Dominique Porta
G01 - MEASURING TESTING
Information
Patent Application
TRACKING HIDE AND LEATHER IN A SUPPLY CHAIN PROCESS
Publication number
20230358723
Publication date
Nov 9, 2023
Security Matters Ltd.
Yifat BAREKET
C14 - SKINS HIDES PELTS LEATHER
Information
Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
Publication number
20230349841
Publication date
Nov 2, 2023
Canon ANELVA Corporation
Takeo TSUKAMOTO
G01 - MEASURING TESTING
Information
Patent Application
SOLIDS ANALYSIS OF DRILLING AND COMPLETION FLUIDS
Publication number
20230272710
Publication date
Aug 31, 2023
Board of Regents, The University of Texas System
Eric VAN OORT
E21 - EARTH DRILLING MINING
Information
Patent Application
X-RAY FLUORESCENCE ANALYZER, DATA PROCESSING METHOD, AND RECORDING...
Publication number
20230251215
Publication date
Aug 10, 2023
SHIMADZU CORPORATION
Yuta SAITO
G01 - MEASURING TESTING
Information
Patent Application
X-RAY ANALYSIS SYSTEM AND METHOD WITH MULTI-SOURCE DESIGN
Publication number
20230236143
Publication date
Jul 27, 2023
Shenzhen Angstrom Excellence Technology Co. Ltd
Xuena ZHANG
G01 - MEASURING TESTING
Information
Patent Application
Petro-Steering Methodologies During Under Balanced Coiled Tubing (U...
Publication number
20230221267
Publication date
Jul 13, 2023
Saudi Arabian Oil Company
Ferney Geovany Moreno Sierra
E21 - EARTH DRILLING MINING
Information
Patent Application
PORTABLE XRF DATA SCREENING METHOD FOR HEAVY METAL CONTAMINATED SOIL
Publication number
20230204526
Publication date
Jun 29, 2023
BEIJING MUNICIPAL RESEARCH INSTITUTE OF ENVIRONMENTAL PROTECTION
Lina ZHANG
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND SYSTEM FOR DETERMINING PHYSICAL PROPERTIES OF ROCKY FORM...
Publication number
20230184702
Publication date
Jun 15, 2023
GEOLOG S.r.l.
Antonio CALLERI
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS AND METHODS FOR DETERMINING THE MINERALOGY OF DRILL SOLIDS
Publication number
20230184705
Publication date
Jun 15, 2023
SCHLUMBERGER TECHNOLOGY CORPORATION
Jonathan Mitchell
E21 - EARTH DRILLING MINING
Information
Patent Application
GEOLOGICAL ANALYSIS SYSTEM, DEVICES AND METHODS USING X-RAY FLUORES...
Publication number
20230175992
Publication date
Jun 8, 2023
Enersoft Inc.
Yannai Z. R. Segal
G01 - MEASURING TESTING
Information
Patent Application
DEVICE FOR CLOSING THE INPUT OPENING IN THE SAMPLE CHAMBER IN AN X-...
Publication number
20230143497
Publication date
May 11, 2023
Bruker AXS GmbH
Wolfgang GEHRLEIN
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR PROBABILITY-BASED DETERMINATION OF STRATIGRAP...
Publication number
20230130034
Publication date
Apr 27, 2023
CGG SERVICES SAS
Joseph EMMINGS
E21 - EARTH DRILLING MINING
Information
Patent Application
X-RAY FLUORESCENCE SPECTROSCOPY ANALYSIS
Publication number
20230128930
Publication date
Apr 27, 2023
SCHLUMBERGER TECHNOLOGY CORPORATION
Sergey Mikailovich Makarychev-Mikhailov
G01 - MEASURING TESTING
Information
Patent Application
QUANTITATIVE ANALYSIS METHOD, QUANTITATIVE ANALYSIS PROGRAM, AND X-...
Publication number
20230060446
Publication date
Mar 2, 2023
Rigaku Corporation
Yoshiyuki KATAOKA
G01 - MEASURING TESTING