3445650

Information

• Patent Grant
• 3445650

• References
• Source

• Patent Number

  3,445,650

• Date Filed

  Not available

• Date Issued

  Tuesday, May 20, 1969
  55 years ago

• CPC

  • H01J49/30 - using magnetic analysers
  • H01J29/58 - Arrangements for focusing or reflecting ray or beam
  • H01J37/05 - Electron or ion-optical arrangements for separating electrons or ions according to their energy or mass
  • H01J37/252 - Tubes for spot-analysing by electron or ion beams Microanalysers
  • H01J37/256 - using scanning beams
  • H01J49/022 - Circuit arrangements
  • H01J49/142 - using a solid target which is not previously vapourised
  • H01J49/20 - Magnetic deflection
  • H01J49/286 - with energy analysis
  • H01J49/32 - using double focusing
  • H01J49/322 - with a magnetic sector of 90 degrees

• US Classifications

  • 250 - Radiant energy