The present invention relates to apparatuses and methods for distributing a liquid onto a surface of an item. Specific embodiments of the invention relate to apparatuses and methods for controlling a chemical reaction at a surface of an item (such as during an etching process) by spraying a liquid containing a reagent, e.g., an etchant onto a material being processed.
As used herein, the term “wiring board” includes a structure having a dielectric element and a set of wiring patterns therein or thereon, as exposed at one or more major or “primary” external surfaces thereof. Alternatively, or in addition thereto, wiring patterns may be disposed internally within the dielectric element. Wiring boards come in different forms, which include, without limitation, a board, card, substrate, flexible tape, ceramic module and the like. A process is known for manufacturing wiring boards in which a dry film resist layer is photolithographically patterned to expose certain portions of metal layers of a flexible wiring board such as one including a flexible tape. The flexible tape may be such as one including a sheet of polymeric material, for example, polyimide. When the metal layers exposed through the patterned resist film are etched, portions of the metal layers which remain become the wiring patterns.
For good productivity, it is evident that the opposing surfaces of the wiring board should be processed simultaneously. The wiring patterns at both opposing surfaces of the dielectric element can be formed simultaneously by etching the metal layers, using patterned resist films on both opposing surfaces as masks. For example, Japanese Published Unexamined Patent Application Publication No. 2003-276596 describes equipment used to simultaneously etch the opposing surfaces of a wiring board.
However, there are problems with the processing apparatus shown in
The differences in the etch rates appear to be caused by accumulation of the etching solution at particular locations of the substrate. In order for etching to proceed uniformly, fresh etching solution d must be supplied constantly to the top surface of the substrate a by spraying. In addition, used etching solution needs to be removed rapidly.
However, in the prior art apparatus illustrated in
By contrast, in the case of the bottom surface, the etching solution d is sprayed upwards onto the bottom surface of the substrate a. There, the etching solution f drips off the bottom surface under its own weight such that it leaves the bottom surface relatively quickly. Consequently, fresh etching solution is supplied more quickly to the bottom surface than it is to the top surface, causing the etch rate for the bottom surface to be faster than that of the top surface.
A further source of non-uniformity arises due to interference between the etching solution that is supplied by adjacent sprayers c to the major surfaces of the substrate a. Specifically, a portion of the etching solution d supplied by one of the sprayers c can travel along a surface of the substrate towards the adjacent sprayer and mingle with the portion of etching solution freshly supplied by the adjacent sprayer. The fresh etching solution supplied by the adjacent sprayer becomes mixed with the more used etching solution that travels there from nearby. This phenomenon, referred to as “interference,” makes the etching solution less effective at that location, and causes the depth of etching to vary.
Japanese Unexamined Patent Application Publication No. 2001-68826 describes an approach to remedying the above problems. That application describes a multilayer substrate having copper cladding in which the substrate is bent into a convex shape such that left and right sides of the substrate are lower than a higher ridge in the middle of the substrate. Etching solution is provided to both left and right portions of the substrate's surface while the substrate is moved along the processing path. The convex shape of the substrate makes the etch solution less prone to accumulating in puddles at the top or apex of the substrate. However, frequently, an imbalance exists in the amount of etching solution supplied to the left and right portions the surface. Therefore, Japanese Unexamined Patent Application Publication No. 2001-68826 fails to adequately address the problems of non-uniform etch rates.
Accordingly, in an embodiment of the invention, an apparatus is provided for processing an item by distributing a liquid onto a surface of the item. The apparatus includes a conveyor which defines an undulating path which varies in vertical position relative to the direction of movement of the item conveyable along the path. Thus, the path has at least one apex at a location of the path higher than other locations in the direction of movement along the path. A sprayer, i.e., a first sprayer, is operable to spray the liquid onto the surface of the item at a location that is substantially aligned to the apex of the path.
According to a preferred aspect of the invention, the conveyor includes a plurality of rollers which support the item, the rollers being disposed at different locations along a direction of movement through the conveyor.
The apparatus can include a second sprayer and the path may further include at least one trough at a location of the path that is lower than other locations in the direction of movement along the path. In such case, the first sprayer is operable to spray the liquid onto a top surface of the item and the second sprayer is operable to spray the liquid onto a bottom surface of the item at a location substantially aligned to the trough.
In a particular embodiment, the conveyor includes a plurality of rollers, i.e., first rollers, for supporting the item. The rollers are disposed at different locations along a direction of movement along the conveyer and define a path supporting the item from below the item. The apparatus further includes second rollers overlying the first rollers. The first and second rollers simultaneously contact the bottom and top surfaces of the item, respectively, and control movement of the item along the path of the conveyor.
Preferably, the liquid which the apparatus is operable to spray includes an etchant for etching a material exposed at the surface of the item contacted by the liquid. For example, the liquid may include an etchant for etching a material exposed at the top and bottom surfaces of the item contacted by the liquid. In such case, the material exposed at the top and bottom surfaces is simultaneously etched using the sprayed liquid.
The apparatus may further include a plurality of axles disposed at different locations in the direction of movement along the path. In such case, each of at least some of the plurality of axles carries a plurality of the rollers.
In accordance with another embodiment of the invention, a method is provided for processing an item by distributing a liquid onto a surface of the item. Such method includes moving the item along a conveyor having an undulating path which varies in vertical position relative to the direction of movement of the item conveyable along the path. The path is such that it has at least one apex at a location of the path higher than other locations in the direction of movement along the path and the liquid is sprayed onto a top surface of the item at a location substantially aligned to the apex of the path.
Preferably, the path further includes at least one trough at a location of the path lower than other locations in the direction of movement along the path. Preferably, the method further includes spraying the liquid onto a bottom surface of the item at a location substantially aligned to the trough of the path.
In a preferred embodiment, the liquid includes an etchant for etching a material exposed at the top surface of the item and the method further includes etching the exposed material using the sprayed liquid. For example, the liquid may include an etchant for etching a material exposed at the top and bottom surfaces of the item, and the method may further include simultaneously etching the material exposed at the top and bottom surfaces using the sprayed liquid.
Accordingly, embodiments of the invention described herein address problems including etch rate nonuniformity as described above in the background.
In accordance with embodiments of the invention described below, imbalances in the etch rate between the top and bottom surfaces are addressed without causing imbalance in the etch rate between left and right portions of the top surface or of the bottom surface. In addition, embodiments of the invention described herein address the aforementioned problem of interference between portions of the liquid, e.g., an etching liquid, that are supplied by different sprayers.
As depicted in the side elevational view of
In addition, as seen in the plan view of
In certain locations 141 of the conveyor 8 no rollers are present, such that a liquid, for example, an etchant or etching solution 20 can be sprayed by sprayers 16 onto exposed portions of the top surface and the bottom surface of the substrate 10 opposite the top surface. As depicted in
In a particular embodiment, when the liquid contains an etchant or etching solution, etching is performed using the liquid distributed onto the surface or the top and bottom surfaces. In such case, fresh etchant is supplied more quickly to the top surface, thus making the rate of etching the top surface more uniform across the top surface and more uniform with respect to the rate of etching the bottom surface. In addition, because the etching solution flows quickly downwardly away from each of the areas 141 where it is applied to the substrate 10, the portions of etching solution supplied by adjacent sprayers 16 are less likely to become mixed. Thus, the spraying of the etching solution 141 at the apexes of the substrate 10 significantly reduces the aforementioned problem of interference.
With the etch rate of the top surface of the substrate increased and made more uniform, the etch rate of the top surface is made more uniform with respect to that of the bottom surface of the substrate.
In addition, because the substrate being processed does not need to be bent between left and right edges, as viewed in the direction of travel along the conveyor, it is not likely to exhibit different etch rates between the left and right portions of the substrate. Consequently, there is less need to vary the pressure of the spray exiting particular sprayers to adjust for such etch rate variations, i.e., for such imbalance.
As also seen from
Again, when the liquid contains an etchant or etching solution, etching is performed using the liquid distributed onto the surface or the top and bottom surfaces. In such case, fresh etchant is supplied more quickly to portions of the bottom surface than before, making the rate of etching the bottom surface more uniform across the bottom surface. In addition, because the etching solution sheds quickly away from each of the areas 142 where it is applied to the bottom surface of the substrate 10, the portions of etching solution supplied by adjacent sprayers 18 are less likely to become mixed. Thus, the spraying of the etching solution onto areas 142 of the substrate 10 at the troughs significantly reduces the aforementioned problem of interference.
Accordingly, it is seen that the aforementioned problems of spatially nonuniform etch rates and interference are addressed by the embodiments of the invention described herein.
Embodiments of the invention are applicable to processing in which a liquid is supplied to a surface of an item to be processed, for example by etching or other processing using distribution of a liquid, especially a liquid which reacts with a material present at an exposed surface of the item. More particularly, embodiments of the invention find application in the simultaneous processing, e.g., etching of metal layers, exposed at respective opposite surfaces of a substrate, for example in the manufacture of a wiring circuit board. In addition, embodiments of the invention can be further applied to the etching of a metal layer selectively to an underlying etch stop layer or etching barrier layer, such as, for example, in the fabrication of conductive bumps projecting above the underlying substrate. In addition, the principles of the embodiments described herein can be applied to the fabrication of an interconnection circuit board fabrication member having a three-layer structure including metal wiring patterns that are formed by etching selectively to a material of an underlying etching barrier layer.
Number | Date | Country | Kind |
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2005-56121 | Mar 2005 | JP | national |
The present application is a continuation of U.S. patent application Ser. No. 11/363,401, filed Feb. 27, 2006, which is based upon and claims the benefit of priority from Japanese Patent Application No. 2005-056121, filed Mar. 1, 2005, the entire contents of which is incorporated herein by reference.
Number | Date | Country | |
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Parent | 11363401 | Feb 2006 | US |
Child | 11585287 | Oct 2006 | US |