1. Field of the Invention
The invention relates to circuit boards (CBs), e.g., printed circuit boards, imprinted boards, and any other support substrate. More particularly, to an apparatus and method for improving coupling between signals routed across plane discontinuities on CBs.
2. Description of the Related Art
CBs are typically manufactured with a plurality of layers, each layer being permanently affixed to an adjoining layer through a structural, non-conductive material.
Signal lines are primarily routed on the first and fourth layers 112 and 124, respectively. Oftentimes, signal lines must be routed from the first layer 112 to the fourth layer 124 through the reference layers 116 and 120. When this occurs, the power layer 116 and the ground layer 120 must be split, cutout, or slotted (the result is collectively termed a discontinuity) to avoid a short circuit between the signal lines being cross-routed and the reference layers. Signals routed around the cross-routed signal must necessarily be laid out across the discontinuity.
High-speed signals that span discontinuities in adjacent reference planes, like signal 210, generate electromagnetic (EM) radiation because of the electrical break caused by the plane discontinuity. This EM radiation adversely affects electromagnetic containment (EMC) and signal integrity (SI). For one, the discontinuity increases the electrical ground path increasing loop inductance. And the larger inductance might cause signal distortion and phase shifts.
To avoid these issues, CB designers avoid routing high-speed signals over discontinuities. But these constraints are often difficult to maintain as CB real estate shrinks or as signal density increases. Another way CB designers avoid these problems is to use stitching capacitors across discontinuities, e.g., stitching capacitor 212. The stitching capacitor 212 electrically couples the plane 208 to the plane 206 through vias 214. The stitching capacitor 212 provides alternating current (AC) coupling that reduces EM radiation at the discontinuity reducing, in turn, adverse EMC and SI effects. The addition of stitching capacitors, however, is costly. One stitching capacitor is required for each signal crossing a discontinuity. Thus, the CB component count increases, increasing cost. More components require additional CB real estate, also increasing cost.
Accordingly, a need remains for an apparatus and method of improving coupling across plane discontinuities on circuit boards.
The foregoing and other objects, features, and advantages of the invention will become more readily apparent from the detailed description of an embodiment that references the following drawings.
Referring to
A reference plane (or layer) 316 is formed on the core 318. A reference plane 320 is likewise formed on the core 318. The reference planes 316 and 320 might provide a ground (e.g., GND) or a predetermined power supply voltage (e.g., VCC) to signal traces routed on signal layers 312 and 324, as explained further below. The reference planes 316 and 320 might comprise 1-ounce copper. A person of reasonable skill in the art should recognize other suitable materials for the reference planes 316 and 320. A person of reasonable skill in the art should recognize well-known methods for forming the reference planes 316 and 320 on core 318, e.g., electroless or electroplating processes.
Discontinuities are formed in the reference planes, e.g., discontinuity 330 formed on voltage reference plane 316. A person of reasonable skill in the art should recognize well-known methods for forming discontinuities 330 in the reference plane 316, e.g., standard copper etching processes that chemically etch and define patterns, planes, lines, and the like on conductive layers such as reference plane 316.
Referring to FIGS. 3 and 4A-C, one embodiment of the discontinuity 330 is a split 406, that is, where a first portion 402 is separated from end to end from a second portion 404 of the reference plane 416. Another embodiment of the discontinuity 330 is as a slot 408 (
Referring to
A dielectric barrier layer 326 is formed on the reference plane including the discontinuity, e.g., reference plane 316. The barrier layer 326 prevents electrical shorts across the discontinuity 330. The dielectric barrier layer 326 comprises a non-conductive epoxy material, e.g., 1060 pre-preg or a liquid curable epoxy. A person of reasonable skill in the art should recognize other suitable materials for the dielectric barrier layer 326. A person of reasonable skill in the art should recognize well-known methods for forming the dielectric barrier 326 on the reference plane 316.
The dielectric barrier layer 326 is opened on one side of the discontinuity 330 to expose a portion of the reference plane 316. The opening 328 might have a variety of shapes depending, e.g., on the process or type of equipment (e.g., laser) used to create it. The opening might be slotted or created using vias. A person of reasonable skill in the art should recognize a variety of processes and equipment to create the opening 328 in a variety of well-known shapes including drilling blind or buried vias, laser drilling vias or slots, or photodefining openings on dielectric materials such as curable liquid epoxies or solder masks.
A conductive layer 332 spanning the length and width of the discontinuity 330 is formed on the dielectric layer 326. The conductive layer 332 includes a first portion 338 connecting the conductive layer 332 to the reference plane 316 through the opening 328. A second portion 336 bridges or spans the discontinuity 330. A third portion 334 extends across the reference plane 316 on another side of the discontinuity 330 as shown in
The conductive layer 332 increases AC signal coupling between the signal layers and underlying reference planes. The conductive layer 332, therefore, improves signal strength over a broad frequency spectrum without requiring additional components, e.g., stitching capacitors. The conductive layer 332 minimizes EMC and SI problems relaxing CB signal routing constraints, improving CB surface area usage, and reducing component cost.
The conductive layer 332 might be a carbon material, e.g., graphite or carbon black. A person of reasonable skill in the art should recognize other suitable materials for the conductive layer 332 including conductive materials not necessarily including carbon. The conductive layer 332 might be deposited on the CB using a variety of well-known commercial processes, e.g., processes available to deposit carbon materials to enhance adhesion for electroless copper plating of vias. The conductive properties of carbon along with the ability to apply them in very thin layers (e.g., <1 mil thick), lend themselves to improve coupling across plane discontinuities as described herein.
A pre-preg epoxy layer 314, the signal layers 312 and 324, and solder mask 340 and 342 complete the CB stack up. A person of reasonable skill in the art should recognize well-known methods of forming the pre-preg layers 314, the signal layers 312 and 324, and the solder masks 340 and 342.
The graph lines in
The simulation results shown in
Having illustrated and described the principles of our invention, it should be readily apparent to those skilled in the art that the invention can be modified in arrangement and detail without departing from such principles. We claim all modifications coming within the spirit and scope of the accompanying claims.
This application is a divisional of prior U.S. Ser. No. 10/329,188, filed Dec. 23, 2002.
Number | Name | Date | Kind |
---|---|---|---|
4520228 | Hoffmann | May 1985 | A |
5065228 | Foster et al. | Nov 1991 | A |
5108553 | Foster et al. | Apr 1992 | A |
5171709 | Donelon et al. | Dec 1992 | A |
5182230 | Donelon et al. | Jan 1993 | A |
5357050 | Baran et al. | Oct 1994 | A |
5436203 | Lin | Jul 1995 | A |
5734270 | Buchanan | Mar 1998 | A |
5898564 | Mayer et al. | Apr 1999 | A |
6219255 | Teshome | Apr 2001 | B1 |
6349038 | Hailey | Feb 2002 | B1 |
6392898 | Asai et al. | May 2002 | B1 |
6727774 | Novak | Apr 2004 | B1 |
6738249 | Anthony et al. | May 2004 | B1 |
6779262 | Gales et al. | Aug 2004 | B1 |
6825743 | Rumpf et al. | Nov 2004 | B2 |
7047515 | Vitek et al. | May 2006 | B1 |
20020156538 | Chang | Oct 2002 | A1 |
Number | Date | Country | |
---|---|---|---|
20050082088 A1 | Apr 2005 | US |
Number | Date | Country | |
---|---|---|---|
Parent | 10329188 | Dec 2002 | US |
Child | 10990740 | US |