CHIP PACKAGE STRUCTURE

Abstract
A chip package structure including a chip, a leadframe, multiple bonding wires and an encapsulant is provided. The chip has an active surface and multiple contacts. The contacts are located on one side of the active surface. The chip is fixed under the leadframe. The leadframe has multiple first inner leads located on the active surface, and multiple second leads, wherein one end of each first inner lead and one end of each second inner lead are at near outside of one of the contacts. The bonding wires respectively connect the first inner leads and the second inner leads to the contacts. The encapsulant wraps the chip, the first inner leads, the second inner leads and the bonding wires. Because the contacts are located on one side of the active surface, the possibility of collapse of the bonding wires is reduced.
Description

BRIEF DESCRIPTION OF THE DRAWINGS

The accompanying drawings are included to provide a further understanding of the invention, and are incorporated in and constitute a part of this specification. The drawings illustrate embodiments of the invention and, together with the description, serve to explain the principles of the invention.



FIG. 1 is a cross-sectional view, schematically illustrating a conventional chip package structure.



FIG. 2 is a cross-sectional view, schematically illustrating a chip package structure, according to an embodiment of the invention.



FIG. 3 is a drawing, schematically illustrating a process for fabricating a chip package structure, according to an embodiment of the invention.



FIG. 4 is a cross-sectional view, schematically illustrating a chip package structure, according to an embodiment of the invention.



FIG. 5 is a cross-sectional view, schematically illustrating a chip package structure, according to an embodiment of the invention.





DESCRIPTION OF THE PREFERRED EMBODIMENTS


FIG. 2 is a cross-sectional view, schematically illustrating a chip package structure, according to an embodiment of the invention. Referring to FIG. 2, the chip package structure 200 includes a chip 210, a leadframe 220, multiple first bonding wires 230 and an encapsulant 240. The chip 210 has an active surface 212 and multiple first contacts 214, located at one side of the active surface 212. In more detail, the first contacts 214 are adjacent to the active surface 212 at one side.


The chip 210 is fixed under the leadframe 220. The leadframe 220 has multiple first inner leads 220a and multiple second inner leads 220b. The first inner leads 220a are located on the active surface 212. One end of each first inner lead 220a and one end of each second lead 220b are adjacent to corresponding one of the first contacts 214.


In FIG. 2, although the first inner leads 220a and the second inner leads 220b are located above the active surface 212, FIG. 2 is just for describing the invention but not for limiting the invention. In other embodiments of the invention, the second inner leads 220b can be at near outside of the chip 210.



FIG. 3 is a drawing, schematically illustrating a process for fabricating a chip package structure, according to an embodiment of the invention. In FIG. 3, a chip 210 is provided. Then, a leadframe 220 without being cut is disposed on the active surface 212 of the chip 210, wherein the first inner leads 220a of the leadframe 220 is disposed over the active surface 212, the second inner leads 220b are disposed at near outside of the chip 210. In addition, each one end of the first inner leads 220a and the second inner leads 220b is located at near outside of the first contact 214. The second inner leads 220b is on the same plane of the active surface 212 of the chip 210 as a coplanar arrangement, for example. Then, a chip package structure 200′, as shown in FIG. 4, is formed by the subsequent processes of bonding process, encapsulating process, and cutting process for cutting the leadframe 220, which is not cut yet. FIG. 4 is a cross-sectional view, schematically illustrating a chip package structure, according to an embodiment of the invention. For easy descriptions, the structure of the encapsulant 240 can be schematically seen in FIG. 4. In FIG. 4, a portion of the first bonding wire 230 is electrically connected between the first inner leads 220a and the first contacts 214. The other portion of the first bonding wire 230 is electrically connected between the second inner leads 220b and the first contacts 214.


Remarkably, in the foregoing implementation, the first inner leads 220a are disposed above the active surface 212, the second inner leads 220b are disposed at near outside of the chip 210, and each one end of the inner leads 220a and the second inner leads 220b is at near outside of the first contact 214. As a result, the invention in comparing with conventional technology can at least reduce the distance between the first inner leads 220a and the first contacts 214, and reduce the distance between the second inner leads 220b and the first contacts 214.


In addition, chip 210 can further include at least one second contact 216 and at least one third contact 218. The second contacts 216 can be a grounding pad or a power source pad. The third contact 218 can be grounding pad or a power source pad. Remarkably, the first contacts 214, the second contact 216, and the third contact 218 are located at the same side of the active surface 212.


When the chip 210 has at least one second contact 216 and at least one third contact 218, the chip package structure 200′ can further include at least one second bonding wire 232, at least one third bonding wire 234, at least one fourth bonding wire 236, and at least one fifth bonding wire 238. In addition, the leadframe 220 can further include at least one first bus bar 222 and at least one second bus bar 224. The first bus bar 222 is located above the active surface and located between the first inner leads 220a and the first contacts 214. The second bus bar 224 is located at near outside of the chip 210, and located between the second inner lead 220b and the first contact 214.


As a result, in the embodiment, the second bonding wire 232 can be connected between the second contact 216 and the first bus bar 222. The third bonding wire 234 can be connected between the first bus bar 222 and one of the first inner leads 220a. In addition, for an embodiment, the fourth bonding wire 236 can be connected between the third contact 218 and the second bus bar 224, and the fifth bonding wire 238 can be connected between the second bus bar 224 and one of the inner leads 220b. As a result, in the embodiment, the bonding wires can be formed via the first bus bar 222 and the bus bar 224, that are the first bonding wire 230, the second bonding wire 232, the third bonding wire 234, the fourth bonding wire 236, and the fifth bonding wire 238. The bonging process can be more easily performed.


In addition, in an embodiment of the invention, it can have a height difference between the second bus bar 224 and the second inner leads 220b. FIG. 5 is a cross-sectional view, schematically illustrating a chip package structure, according to an embodiment of the invention. In FIG. 5, the chip package structure 200″ is similar to the chip package structure 200′. The difference between them is that the second bus bar 224 of the chip package structure 200″ is designed by down-set manner, so as to maintain a height difference from the second inner leads 220b. As a result, in the embodiment, the complexity of bonding process can be simplified by the second bus bar 224. Further, the down-set design can reduce the gap between the second inner leads 220b and the chip 210.


In comparing with conventional technology, the contacts of the invention are at one side of the active surface, the first inner leads are disposed above the active surface. One end of each of the first inner leads and one end of each of the second inner leads are located at near outside of the contacts. As a result, the invention can reduce the distance between the inner leads (that are first inner leads and the second inner leads) and the contacts. The shorter bonding wires of the invention can be used to connect inner leads to the corresponding one of the contacts.


As described above, since the length of the bonding wire is reduced, the possibility of wire collapse can be reduced, and the possibility of broken wire due to filling the liquid encapsulant in to the mold can be reduced, too. The structure design of the embodiment of the invention can improve the yield in chip packaging process.


It will be apparent to those skilled in the art that various modifications and variations can be made to the structure of the present invention without departing from the scope or spirit of the invention. In view of the foregoing descriptions, it is intended that the present invention covers modifications and variations of this invention if they fall within the scope of the following claims and their equivalents.

Claims
  • 1. A chip package structure, comprising: a chip, having an active surface and a plurality of first contacts disposed on the active surface, the first contacts being located at one side of the active surface;a leadframe, the chip being adhered under the leadframe, the leadframe having a plurality of first inner leads and a plurality of second inner leads, wherein the first inner leads are located on the active surface and each one end of the first inner leads and the second inner leads is located at near outside of the first contacts;a plurality of first bonding wires, respectively connected between the first inner leads and the first contacts, and between the second inner leads and the first contacts; andan encapsulant, wrapping the chip, the first inner leads, the second inner leads and the first bonding wires.
  • 2. The chip package structure of claim 1, wherein the second inner leads are located at near outside of the chip and adjacent to the first contacts.
  • 3. The chip package structure of claim 2, wherein the second inner leads and the chip are coplanar.
  • 4. The chip package structure of claim 1, wherein the leadframe further comprises at least one first bus bar and at least one second bus bar, respectively located between the first inner leads and the first contacts, and between the second inner leads and the first contacts.
  • 5. The chip package structure of claim 4, further comprising at least one second bonding wire and at least one third bonding wire, the chips further comprising at least one second contact, wherein the second contact and the first contacts are located at the same side of the active surface, the second bonding wire is connected between the second contact and the first bus bar, and the third bonding wire is connected between the first bus bar and one of the first inner leads.
  • 6. The chip package structure of claim 4, further comprising at least one fourth bonding wire and at least one fifth bonding wire, the chips further comprising at least one third contact, wherein the third contact and the first contacts are located at the same side of the active surface, the fourth bonding wire is connected between the third contact and the second bus bar, and the fifth bonding wire is connected between the second bus bar and one of the second inner leads.
  • 7. The chip package structure of claim 4, wherein the first bus bar is located above the active surface, and the second bus bar is located at outside of the chip.
  • 8. The chip package structure of claim 5, wherein a height difference is between the second bus bar and the second inner leads, and the second bus bar is a down-set design.
Priority Claims (1)
Number Date Country Kind
95125413 Jul 2006 TW national