The accompanying drawings are included to provide a further understanding of the invention, and are incorporated in and constitute a part of this specification. The drawings illustrate embodiments of the invention and, together with the description, serve to explain the principles of the invention.
The chip 210 is fixed under the leadframe 220. The leadframe 220 has multiple first inner leads 220a and multiple second inner leads 220b. The first inner leads 220a are located on the active surface 212. One end of each first inner lead 220a and one end of each second lead 220b are adjacent to corresponding one of the first contacts 214.
In
Remarkably, in the foregoing implementation, the first inner leads 220a are disposed above the active surface 212, the second inner leads 220b are disposed at near outside of the chip 210, and each one end of the inner leads 220a and the second inner leads 220b is at near outside of the first contact 214. As a result, the invention in comparing with conventional technology can at least reduce the distance between the first inner leads 220a and the first contacts 214, and reduce the distance between the second inner leads 220b and the first contacts 214.
In addition, chip 210 can further include at least one second contact 216 and at least one third contact 218. The second contacts 216 can be a grounding pad or a power source pad. The third contact 218 can be grounding pad or a power source pad. Remarkably, the first contacts 214, the second contact 216, and the third contact 218 are located at the same side of the active surface 212.
When the chip 210 has at least one second contact 216 and at least one third contact 218, the chip package structure 200′ can further include at least one second bonding wire 232, at least one third bonding wire 234, at least one fourth bonding wire 236, and at least one fifth bonding wire 238. In addition, the leadframe 220 can further include at least one first bus bar 222 and at least one second bus bar 224. The first bus bar 222 is located above the active surface and located between the first inner leads 220a and the first contacts 214. The second bus bar 224 is located at near outside of the chip 210, and located between the second inner lead 220b and the first contact 214.
As a result, in the embodiment, the second bonding wire 232 can be connected between the second contact 216 and the first bus bar 222. The third bonding wire 234 can be connected between the first bus bar 222 and one of the first inner leads 220a. In addition, for an embodiment, the fourth bonding wire 236 can be connected between the third contact 218 and the second bus bar 224, and the fifth bonding wire 238 can be connected between the second bus bar 224 and one of the inner leads 220b. As a result, in the embodiment, the bonding wires can be formed via the first bus bar 222 and the bus bar 224, that are the first bonding wire 230, the second bonding wire 232, the third bonding wire 234, the fourth bonding wire 236, and the fifth bonding wire 238. The bonging process can be more easily performed.
In addition, in an embodiment of the invention, it can have a height difference between the second bus bar 224 and the second inner leads 220b.
In comparing with conventional technology, the contacts of the invention are at one side of the active surface, the first inner leads are disposed above the active surface. One end of each of the first inner leads and one end of each of the second inner leads are located at near outside of the contacts. As a result, the invention can reduce the distance between the inner leads (that are first inner leads and the second inner leads) and the contacts. The shorter bonding wires of the invention can be used to connect inner leads to the corresponding one of the contacts.
As described above, since the length of the bonding wire is reduced, the possibility of wire collapse can be reduced, and the possibility of broken wire due to filling the liquid encapsulant in to the mold can be reduced, too. The structure design of the embodiment of the invention can improve the yield in chip packaging process.
It will be apparent to those skilled in the art that various modifications and variations can be made to the structure of the present invention without departing from the scope or spirit of the invention. In view of the foregoing descriptions, it is intended that the present invention covers modifications and variations of this invention if they fall within the scope of the following claims and their equivalents.
Number | Date | Country | Kind |
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95125413 | Jul 2006 | TW | national |