Patent Application
20240213130
This application claims benefit of priority to Japanese Patent Application No. 2022-205845, filed Dec. 22, 2022, the entire content of which is incorporated herein by reference.
The present disclosure relates to a compound component device and a method of manufacturing the compound component device.
Conventional vertically stacked system in package structures include a vertical stack system in package (vertical stack SiP) disclosed in
Meanwhile, the inventor found that such a vertical stack SiP as described above had problems as follows. That is, in the second molding compound (155) in which the pair of dies (142) is stacked back to back, there is a fear that increase in amount of resin due to lamination of the dies (142) in a vertical direction may cause increase in internal stresses in the second molding compound (155) which may cause a warpage.
Additionally, the vertical stack SiP is manufactured with sequential stacking of the molding compounds. Heating that is carried out for formation of each of the molding compounds makes heat in a package resist being released and makes the dies (142) prone to undergo thermal damage. Then, the thermal damage is accumulated without alteration and thus there is a fear that deterioration of the dies and decrease in lives of components may cause decrease in long-term reliability of the vertical stack SiP.
Further, the heating is carried out for the formation of each of the molding compounds as described above and thus the molding compounds that have been already formed are heated a plurality of times. Thus, there is a fear that the long-term reliability of the vertical stack SiP may be decreased by accumulation of thermal history.
Therefore, the present disclosure provides a compound component device by which occurrence of a warpage can be curbed. Also, the present disclosure provides a method of manufacturing a compound component device by which occurrence of a warpage may be curbed and which has high long-term reliability.
The inventor diligently conducted investigations in view of the above problems and has obtained a finding that, in a compound component device including a plurality of first compound component layers, a stress which occurs in a first compound component layer can be canceled out by a stress which occurs in an adjoining first compound component layer. Based on such a technical finding, the present disclosure including an inverted layer for which a plurality of first compound component layers are paired so as to face each other has been conceived. That is, the present disclosure includes following aspects.
A compound component device according to an aspect of the present disclosure is a compound component device including a plurality of laminated first compound component layers housing first electronic components. The first compound component layers each include an electronic component layer, including a first main surface and a second main surface opposed to the first main surface, and a redistribution layer provided on the first main surface. At least two of the plurality of first compound component layers configure an inverted layer for which the first compound component layers are paired and formed so that the second main surfaces face each other. The electronic component layer includes the first electronic component, a first resin sealing portion to seal the first electronic component, a side wall portion that is placed so as to enclose the first electronic component, and electronic component layer piercing vias to pierce the side wall portion and to electrically connect with the redistribution layer, and the first electronic component is directly joined to the redistribution layer.
In the compound component device according to the aspect of the present disclosure, the plurality of first compound component layers configure the inverted layer for which the first compound component layers are paired and placed so that the second main surfaces of the first compound component layers face each other. Such configuration of the inverted layers by a set of first compound component layers enables separation of a resin sealing portion into two portions. Thus, internal stresses can be reduced, so that occurrence of a warpage in the entire compound component device can be curbed.
Further, the configuration of the inverted layer by the set of first compound component layers makes the internal stresses which occur in the first compound component layers in the inverted layer prone to have opposite directions and thus makes the internal stresses in the inverted layer prone to be canceled out, so that the occurrence of a warpage in the entire compound component device is curbed.
Accordingly, the compound component device according to the present aspect is capable of curbing the occurrence of a warpage.
A method of manufacturing a compound component device according to another aspect of the present disclosure is a method of manufacturing the above-described compound component device. The method includes an electronic component bonding step of bonding the first electronic component onto a silicon base layer so that component electrodes of the first electronic component come into contact with a bottom surface portion of the silicon base layer having a grid-like side wall portion and the bottom surface portion, with an electronic component bonding layer interposed therebetween. The method also includes an electronic component sealing step of forming a resin sealing portion by sealing of the first electronic component with resin; an electronic component layer precursor producing step of producing an electronic component layer precursor by removal of the silicon base layer and the electronic component bonding layer such that entirety of surfaces of the component electrodes is exposed; and an electronic component layer precursor bonding step of producing a pair of electronic component layer precursors by bonding of the two electronic component layer precursors such that main surfaces of the two electronic component layer precursors on which the component electrodes are not exposed face each other. The method further includes an inverted layer precursor producing step of producing an inverted layer precursor by formation of electronic component layer piercing vias that pierce the side wall portions of the pair of electronic component layer precursors and a redistribution layer on one main surface of the pair of electronic component layer precursors on which the component electrodes are exposed; and an inverted layer producing step of forming an inverted layer by formation of a redistribution layer on the other main surface of the inverted layer precursor that is located on a side opposed to the one main surface. In addition, the method includes a laminating step of laminating the pair of electronic component layer precursors produced separately and one of the electronic component layer precursors produced separately on the redistribution layer of the inverted layer precursor; and an interconnection forming step of forming electronic component layer piercing vias and a redistribution layer in or on the laminated pair of electronic component layer precursors and the laminated one of the electronic component layer precursors. A step in which the laminating step and the interconnection forming step are combined is carried out zero or more times.
In the method of manufacturing the compound component device according to the present aspect, the electronic component layer precursors can be machined in parallel. Therefore, the inverted layer or the compound component layers that have been laminated in the laminating step and the interconnection forming step resist accumulation of thermal history. Thus, deterioration of the electronic components can be curbed by curbing on thermal damage to the electronic components.
Accordingly, the method of manufacturing the compound component device according to the present aspect is capable of providing the compound component device having high long-term reliability.
According to the compound component device of the aspect of the present disclosure, the occurrence of a warpage can be curbed. According to the method of manufacturing the compound component device of the other aspect of the present disclosure, the compound component device having high long-term reliability can be manufactured.
Hereinbelow, a compound component device that is an aspect of the present disclosure will be described in detail with reference to embodiments illustrated in the drawings. Incidentally, the drawings may include schematic ones and may lack reflection of actual dimensions or proportions.
In the present disclosure, “contact” means that an intended member is in physical touch with another member with a different member not interposed therebetween (directly) or interposed therebetween (indirectly).
In the present disclosure, “join” means that an intended member is physically jointed to another member with a different member not interposed therebetween (directly) or interposed therebetween (indirectly).
In the present disclosure, “bond” means that an intended member is physically connected to another member with a different member not interposed therebetween (directly) or interposed therebetween (indirectly).
In the present disclosure, “electrically connect” means that an intended member has conductivity to another member with a different member not interposed therebetween (directly) or interposed therebetween (indirectly).
A compound component device according to a first embodiment is a compound component device including a plurality of laminated first compound component layers housing first electronic components. The first compound component layers each include an electronic component layer, including a first main surface and a second main surface opposed to the first main surface, and a redistribution layer provided on the first main surface. At least two of the plurality of first compound component layers configure an inverted layer for which the first compound component layers are paired and formed so that the second main surfaces face each other. The electronic component layer includes the first electronic component, a first resin sealing portion to seal the first electronic component, a side wall portion that is placed so as to enclose the first electronic component, and electronic component layer piercing vias to pierce the side wall portion and to electrically connect with the redistribution layer, and the first electronic component is directly joined to the redistribution layer.
The compound component device according to the first embodiment is capable of curbing occurrence of a warpage. Though there is no constraint imposed by a particular theory, a reason for that is inferred as follows.
In the compound component device according to the first embodiment, the plurality of first compound component layers configure the inverted layer for which the first compound component layers are paired and placed so that the second main surfaces of the first compound component layers face each other. Such configuration of the inverted layers by a set of first compound component layers enables separation of the first resin sealing portion into two portions. Thus, internal stresses can be reduced, so that occurrence of a warpage in the entire compound component device can be curbed.
Further, the configuration of the inverted layer by the set of first compound component layers makes the internal stresses which occur in the first compound component layers in the inverted layer prone to have opposite directions and thus makes the internal stresses in the inverted layer prone to be canceled out, so that the occurrence of a warpage in the entire compound component device is curbed.
Accordingly, the compound component device according to the first embodiment is capable of curbing the occurrence of a warpage.
Further, the compound component device according to the first embodiment is superior in rigidity. Though there is no constraint imposed by a particular theory, a reason for that is inferred as follows.
In the compound component device according to the first embodiment, the plurality of first compound component layers configure the inverted layer for which the first compound component layers are paired and placed so that the second main surfaces of the first compound component layers face each other and, further, the electronic component layer includes the side wall portion that is placed so as to enclose the first electronic component. Therefore, there is resistance to occurrence of deformation (dimension change: elongation and contraction, flexure, and torsion, for instance) in response to internal stresses.
Accordingly, the compound component device according to the first embodiment is superior in rigidity.
Configurations of the compound component device according to the first embodiment will be described with reference to
As illustrated in
The two adjoining first compound component layers 100, 200 configure an inverted layer 10 for which the first compound component layers 100, 200 are paired and placed so that second main surfaces 112, 212 face each other. In the inverted layer 10, the first compound component layer 100 and the first compound component layer 200 relate so as to face each other and thus, even if an internal stress occurs in each of the first compound component layers 100, 200, the internal stresses are prone to have opposite directions, so that the internal stresses in the inverted layer 10 are prone to cancel out each other. As a result, occurrence of a warpage is curbed in the entire compound component device 1.
In terms of further curbing on the occurrence of a warpage in the compound component device 1, the first compound component layer 100 and the first compound component layer 200 in the inverted layer 10 are preferably in symmetry (line symmetry) with each other with respect to a bonding layer 130 corresponding to an interface therebetween. That is because the internal stresses produced in the first compound component layers 100, 200 are prone to have opposite directions, so that the occurrence of a warpage is further curbed, on condition that at least one of configurations (more specifically, placement sites, numbers, types, dimensions, shapes, and the like of electronic component layers 110, 210, redistribution layers 120, 220, first electronic components 113, 213, side wall portions 115, 215, first resin sealing portions 117, 217, electronic component layer piercing vias 119, 219, and the bonding layer 130) of the first compound component layers 100, 200 is in line symmetry relation, for instance.
In terms of further curbing on the occurrence of a warpage in the compound component device 1, at least portions of materials configuring members in the first compound component layer 100 and the first compound component layer 200 in the inverted layer 10 are preferably identical on both sides of the bonding layer 130 that corresponds to the interface therebetween. That is because the internal stresses produced in the first compound component layers 100, 200 are prone to have opposite directions, so that the occurrence of a warpage is further curbed, on condition that the configurations of the first compound component layers 100, 200 are in the line symmetry relation and on condition that at least portions of the materials configuring the members (more specifically, materials configuring the first electronic components 113, 213, the side wall portions 115, 215, the first resin sealing portions 117, 217, the electronic component layer piercing vias 119, 219, and the bonding layer 130) are additionally identical, for instance.
Though the compound component device 1 includes the two first compound component layers 100, 200, the compound component device 1 may include three or more first compound component layers. The configurations of the first compound component layer 200 are substantially identical with those of the first compound component layer 100 in the first embodiment and thus the first compound component layer 100 will be cited as an example and will be described below. Portions that are different, however, will be described separately.
The first compound component layer 100 includes the electronic component layer 110 and the redistribution layer 120 provided on a first main surface 111 of the electronic component layer 110.
The electronic component layer 110 includes the first main surface 111 and the second main surface 112 opposed to the first main surface 111. The electronic component layer 110 bonds (joins) to the redistribution layer 120 on the first main surface 111 and bonds to the second main surface 212 of the first compound component layer 200 on the second main surface 112 with the bonding layer 130 interposed therebetween. The electronic component layer 210 includes a first main surface 211 and the second main surface 212 opposed to the first main surface 211. The electronic component layer 210 bonds to the redistribution layer 220 on the first main surface 211 and bonds to the second main surface 112 of the first compound component layer 100 on the second main surface 212 with the bonding layer 130 interposed therebetween. Herein, the redistribution layers 120, 220 are sheets or substrates that are multilayer interconnection layers, for instance, as will be described later and include interconnections (conducting interconnections) and dielectric film including inorganic material (inorganic insulator material), for instance.
The electronic component layer 110 includes the first electronic component 113, the first resin sealing portion 117 to seal the first electronic component 113, the side wall portion 115 that is placed so as to enclose the first electronic component 113, and the electronic component layer piercing vias 119 to pierce the side wall portion 115 and to electrically connect with the redistribution layer 120.
The electronic component layer 110 may include a plurality of first electronic components 113 per layer. On condition that the electronic component layer 110 includes a plurality of first electronic components 113 per layer, the first compound component layer 100 is enabled to function as an electronic substrate by the one layer alone. Accordingly, the compound component device 1 according to the first embodiment can be reduced in height. Further, on condition that the electronic component layer 110 includes a plurality of first electronic components 113 per layer, the plurality of first electronic components 113 may differ (in type).
One or more first electronic components 113 may be placed in the electronic component layer 110. The first electronic components 113 are sealed in the electronic component layer 110 with the first resin sealing portion 117. On condition that the plurality of first electronic components 113 exist in the electronic component layer 110, the first electronic components 113 may be identical or may be different. Thicknesses of the first electronic components 113 are 80 to 120 μm, for instance.
The first electronic components 113 are directly joined to the redistribution layer 120. In other words, all the first electronic components 113 in the electronic component layer 110 are placed in the electronic component layer 110 so that first surfaces 113a are positioned on a side of the redistribution layer 120 with respect to respective second surfaces 113b. Ditto for all the first electronic components 213 in the electronic component layer 210. In the compound component device 1, such simple interconnections enable lamination of not only two compound component layers but three or more compound component layers. That is, the compound component device according to the present disclosure facilitates multilayer configuration of the first compound component layers, thus facilitates adjustment of number of the layers in accordance with an application, and heightens degree of freedom of design.
The first electronic components 113 are electronic components in which one or more elements are integrated in a substance similar to a substance that configures the side wall portion 115, for instance. The first electronic components 113 are electronic components that are smaller in dimension (smaller electronic components) compared with a second electronic component 913 that will be described later. The first electronic components 113 are electronic components that are comparatively easy of reduction in dimensions and height because of a structure thereof and/or that generally generate comparatively large amounts of heat. Such first electronic components 113 are active components (more specifically, CPU, GPU, LSI, and the like) and passive components (more specifically, capacitors (further specifically, low-capacitance capacitors or the like), resistors, SAW, inductors, and the like), for instance.
The first electronic components 113 each include an electronic component main body portion 113c having the first surface 113a perpendicular to a thickness direction and the second surface 113b opposed to the first surface 113a and a plurality of component electrodes 113d placed on the first surface 113a and electrically connected to the redistribution layer 120. The first electronic components 113 each further include insulating portions 113e placed between the plurality of component electrodes 113d.
The electronic component main body portion 113c includes ceramic or semiconductor material (more specifically, silicon or the like), for instance.
The component electrodes 113d are directly joined to the redistribution layer 120 and are electrically connected to the redistribution layer 120. The component electrodes 113d have Cu, Ni, Sn, Al, and an alloy including those, for instance, as conductive material. Thicknesses of the component electrodes 113d are 1 to 30 μm, for instance, and 5 μm or less, preferably. The thicknesses of the component electrodes 113d can be made as thin as 1 to 5 μm. The thicknesses of the component electrodes 113d can be ¼ to ⅙ times a thickness of the electronic component main body portion 113c, for instance.
The insulating portions 113e function as a layer to make electrical insulation between the component electrodes 113d. Thicknesses of the insulating portions 113e are 1 to 30 μm, for instance, and 5 μm or less, preferably. The thicknesses of the insulating portions 113e can be made as thin as 1 to 5 μm. The thicknesses of the insulating portions 113e can be ¼ to ⅙ times the thickness of the electronic component main body portion 113c, for instance. The insulating portions 113e may be as thick as the component electrodes 113d and, in that case, surfaces of the insulating portions 113e are made flush with surfaces of the component electrodes 113d.
The first resin sealing portion 117 seals the first electronic components 113.
The first resin sealing portion 117 includes resin (epoxy resin, for instance) and is capable of integrating the first electronic components 113 with the resin. The first electronic components 113 can be integrated with the resin and thus two or more first electronic components 113 can be placed in the electronic component layer 110 even if the two or more first electronic components 113 differ in dimensions and shape. Thus, design with high degree of freedom is enabled so that two or more first electronic components 113 can be combined in accordance with an application. For instance, the compound component device 1 is capable of housing different types of first electronic components 113.
As epoxy resin to configure the first resin sealing portion 117, thermosetting resin containing a recurring unit derived from benzocyclobutene (BCB) (more specifically, 1,3-divinyl-1,1,3,3-tetramethyldisiloxane-bis-benzocyclobutene (DVS-bis-BCB) or the like) can be cited, for instance. As commercially available epoxy resin, “CYCLOTENE” manufactured by The Dow Chemical Company can be cited, for instance.
In the electronic component layers 110, 210, resins that configure the first resin sealing portions 117, 217 may be identical or may be different. Herein, being different encompasses being partially different. In a second embodiment, for instance, there are three electronic component layers 110, 210, 310. The above-described resins that are different in type encompass an aspect in which the resins that configure the first resin sealing portions 117, 217 are different from a resin that configures a first resin sealing portion 317 and an aspect in which the resin that configures the first resin sealing portion 117, the resin that configures the first resin sealing portion 217, and the resin that configures the first resin sealing portion 317 are different.
On condition that the resins configuring the first resin sealing portions 117, 217 are different in type, the first resin sealing portions 117, 217 may be provided with respective different functions (more specifically, high thermal conductivity (high heat radiation), thermal expansivity, low hygroscopicity, and the like) with the resins configuring the compound component layers made different, for instance. For instance, the first resin sealing portion 117 may be provided with the high thermal conductivity and the first resin sealing portion 217 may be provided with the low hygroscopicity. As commercially available resins with the high thermal conductivity, “CV8511” manufactured by Panasonic Corporation and “G780” manufactured by Sumitomo Bakelite Co., Ltd. can be cited, for instance.
Incidentally, “thermal expansivity of resin” mentioned above refers to a property through which a volume of resin expands with provision of heat for the resin, herein. As a physical property indicating the thermal expansivity, coefficient of linear expansion can be cited, for instance.
In terms of increase in thermal conductivity (heat radiation) of the first resin sealing portion 117, the first resin sealing portion 117 may further include filler. As a material of the filler to increase the thermal conductivity, inorganic material can be cited, for instance. Alumina (Al2O3), silicon oxide (SiO2), silicon nitride (Si3N4), boron nitride (BN), and aluminum nitride (AlN) can be cited as such inorganic materials, for instance, and aluminum nitride is desirable thereamong in terms of further increase in thermal conductivity of the first compound component layer 100. As a commercially available resin including inorganic filler, “R4507” (inorganic filler: SiO2) manufactured by Nagase ChemteX Corporation can be cited, for instance.
As illustrated in
The side wall portion 115 preferably includes a material (inorganic material, for instance) that has a smaller coefficient of linear expansion than the material (resin) of the first resin sealing portion 117 has. On condition that the side wall portion 115 includes a material that has a smaller coefficient of linear expansion than the material of the first resin sealing portion 117 has, an amount of resin to contract in the first resin sealing portion 117 can be reduced by an existing volume of the side wall portion 115 and thus the compound component device 1 is capable of curbing occurrence of a warpage.
More preferably, the side wall portion 115 is substantially made of silicon (Si) among the above inorganic materials. Herein, “substantially made of” means that an object (the side wall portion 115 in the above) includes a particular material (silicon in the above) at a content rate of 95% or more by mass, 97% or more by mass, 99% or more by mass, or 100% by mass. On condition that the side wall portion 115 is substantially made of silicon, silicon, which excels in workability, may form a worked surface that accurately reflects design. Thus, miniaturization of interconnection widths and decrease in connection resistance of the interconnections are enabled for the electronic component layer piercing vias 119 that pierce the side wall portion 115. On condition that the side wall portion 115 is substantially made of silicon, accordingly, the compound component device 1 according to the first embodiment has high reliability.
The electronic component layer piercing vias 119 are provided so as to be substantially parallel to a laminating direction (Z direction) for the first compound component layers 100, 200. More specifically, the electronic component layer piercing vias 119 pierce the electronic component layer 110 in Z direction and further pierce the bonding layer 130. As illustrated in
Preferably, the electronic component layer piercing vias 119 are substantially made of copper. On condition that the electronic component layer piercing vias 119 are substantially made of copper, electric resistance of the interconnections is decreased because copper is a satisfactory electrical conducting material.
With reference to
Herein, “place(ment) with alignment” refers to placement with arrangement at equal interval distances (which may be referred to as “distance L1” below) on orthogonal straight lines in plan view. On condition that a plurality of straight lines exist on one side in the orthogonal straight lines, the plurality of parallel straight lines adjoin spaced apart by the distance L1.
With reference to
On a left side on the sheet of
The redistribution layer 120 is formed on the first main surface 111 of the electronic component layer 110. The redistribution layer 120 is electrically connected to the component electrodes 113d of the first electronic components 113 and to the electronic component layer piercing vias 119. The redistribution layer 120 is directly joined to (the component electrodes 113d of) the first electronic components 113 and thus lengths of via interconnections between the redistribution layer 120 and the component electrodes 113d can be decreased. Accordingly, the compound component device 1 according to the first embodiment can be reduced in dimensions and height and electric resistance of the via interconnections can be decreased.
The redistribution layer 120 is a multilayer interconnection layer. The redistribution layer 120 includes the interconnections (conducting interconnections), the dielectric film substantially made of insulator material, and conductive vias to electrically connect the interconnections between different layers in the redistribution layer 120.
The interconnections and the conductive vias include conductive material. Examples of the conductive material are Cu, Ag, Au, and an alloy including those and Cu is desirable among those. The redistribution layer 120 may include a plurality of layers and includes two or more layers of the interconnections and one or more layers of the dielectric film, for instance. One layer of the interconnections and one layer of the dielectric film that configure the redistribution layer 120 have a thickness of 1.5 to 5.0 μm, for instance. In this configuration, a thickness of the redistribution layer 120 has a value (unit: μm) of the thickness (1.5 to 5.0 μm) of the one layer multiplied by a total number of layers in the redistribution layer 120.
The dielectric film includes inorganic insulator material or organic insulator material as insulator material, for instance, and, preferably, is substantially made of the inorganic insulator material or the organic insulator material. As the inorganic insulator material, silicon oxide (SiO2) and silicon nitride (SiN, Si3N4) can be cited, for instance. As the organic insulator material, epoxy resin, silicone resin, polyester, polypropylene, polyimide, acrylonitrile-butadiene-styrene (ABS) resin, acrylonitrile-styrene (AS) resin, methacrylic resin, polyamide, fluorine resin, liquid crystal polymer, polybutylene terephthalate, and polycarbonate can be cited, for instance.
On condition that the redistribution layer 120 includes the dielectric film (which may be referred to as “inorganic dielectric film” below) substantially made of the inorganic material (inorganic insulator material, for instance), widths of the interconnections (interconnection widths) in the redistribution layer 120 can be miniaturized and the compound component device 1 according to the first embodiment can be reduced in dimensions, compared with the dielectric film substantially made of the organic material (organic insulator material, for instance). That is because the inorganic dielectric film, having extreme smaller film surface roughness than the organic dielectric film, increases positional accuracy of a focus in a lithography step in interconnection formation, compared with the organic dielectric film. More specifically, focusing on nanometer order can be carried out for the inorganic dielectric film, while focusing on micrometer order can be carried out for the organic dielectric film. The interconnection widths of the interconnections in the redistribution layer 120 substantially made of the inorganic dielectric film can be about 1/10 of those of the interconnections in the redistribution layer 120 including the dielectric film substantially made of the organic insulator material. Thus, the compound component device 1 can be reduced in dimensions and height. Line and space (L/S) of the redistribution layer 120 including the dielectric film substantially made of the inorganic insulator material is 1 μm/1 μm, for instance.
A thickness of the inorganic dielectric film is 0.1 to 2 μm, for instance. The inorganic dielectric film may be multicomponent film containing two or more types of components. The multicomponent film may be multilayer film in which a plurality of layers are formed of respective components. A layer structure of the multilayer film is SiO2 (0.25 μm thick)/Si3N4 (0.1 μm thick)/SiO2 (0.25 μm thick)/Si3N4 (0.1 μm thick) in order of mention from a side of the electronic component layer 110, for instance.
On condition that the dielectric film is substantially made of the organic insulator material, the dielectric film can be formed with reduction in costs. That is because the dielectric film substantially made of the organic insulator material can be manufactured without use of such large-scale facilities as plasma-enhanced chemical vapor deposition (PECVD) device, compared with the dielectric film substantially made of the inorganic insulator material.
Line and space (L/S) of the redistribution layer 120 substantially made of the organic dielectric film is 10 μm/10 μm, for instance. A thickness of the dielectric film is 1 to 20 μm, for instance.
The bonding layer 130 forms a bond between the first compound component layers 100, 200. Material of the bonding layer 130 is thermosetting resin, for instance.
The compound component device 1 may further include the second compound component layer 900 as an outermost layer. The second compound component layer 900 is placed on the first compound component layer 200 that is an uppermost layer of the laminated first compound component layers 100, 200. The second compound component layer 900 includes the second electronic component 913 and a second resin sealing portion 917 to seal the second electronic component 913 and includes no side wall portion.
Herein, “outermost layer” refers to a layer having a main surface exposed on an object. In
On condition that the compound component device 1 further includes the second compound component layer 900 as the outermost layer, occurrence of burrs (more specifically, cracks, breakage, chipping, and the like) is curbed in a dicing step of a method of manufacturing the compound component device 1 that will be described later. Accordingly, such a configuration of the compound component device 1 according to the first embodiment accurately reflects design and has high reliability.
The occurrence of the burrs is curbed by reasons as follows. Without inclusion of the second compound component layer 900, a mother integrated body of the compound component device 1 is cut along the side wall portion 215 of the first compound component layer 200 placed as the outermost layer. The side wall portion 215 is substantially made of an inorganic substance (Si, for instance) under normal conditions and, accordingly, there is limitation on reduction in the occurrence of the burrs in cutting along the side wall portion 215, even if cutting conditions in the dicing step are adjusted. With the inclusion of the second compound component layer 900, by contrast, the mother integrated body of the compound component device 1 is cut at the second resin sealing portion 917 of the second compound component layer 900 placed as the outermost layer. The second resin sealing portion 917 is substantially made of resin under normal conditions and, accordingly, the occurrence of the burrs in cutting at the second resin sealing portion 917 can be reduced by adjustment of the cutting conditions in the dicing step.
The second electronic component 913 is electrically connected to the redistribution layer 220 of the first compound component layer 200 with solder 940 interposed therebetween. The second electronic component 913 is an electronic component that is larger in dimensions (larger electronic component) compared with the first electronic components 113, 213. The second electronic component 913 is an electronic component that is comparatively difficult of reduction in dimensions and height because of a structure thereof and/or that generally generates a comparatively large amount of heat. An electronic component that is comparatively difficult of reduction in dimensions and height because of a structure thereof is a multilayer ceramic capacitor (MLCC) or the like, for instance.
Electronic components that generally generate comparatively large amounts of heat are inductor (more specifically, power inductor or the like), power IC, and the like, for instance.
A method of manufacturing the compound component device 1 according to the first embodiment includes an electronic component bonding step of bonding the first electronic component onto a silicon base layer (Si base layer) so that component electrodes of the first electronic component come into contact with a bottom surface portion of the silicon base layer having a grid-like side wall portion and the bottom surface portion, with an electronic component bonding layer interposed therebetween; an electronic component sealing step of forming a resin sealing portion by sealing of the first electronic component with resin; and an electronic component layer precursor producing step of producing an electronic component layer precursor by removal of the silicon base layer and the electronic component bonding layer such that entirety of surfaces of the component electrodes is exposed. The method also includes an electronic component layer precursor bonding step of producing a pair of electronic component layer precursors by bonding of the two electronic component layer precursors such that main surfaces of the two electronic component layer precursors on which the component electrodes are not exposed face each other; an inverted layer precursor producing step of producing an inverted layer precursor by formation of electronic component layer piercing vias that pierce the side wall portions of the pair of electronic component layer precursors and a redistribution layer on one main surface of the pair of electronic component layer precursors on which the component electrodes are exposed; and an inverted layer producing step of forming an inverted layer by formation of a redistribution layer on the other main surface of the inverted layer precursor that is located on a side opposed to the one main surface. The method further includes a laminating step of laminating the pair of electronic component layer precursors produced separately and one of the electronic component layer precursors produced separately on the redistribution layer of the inverted layer precursor; and an interconnection forming step of forming electronic component layer piercing vias and a redistribution layer in or on the laminated pair of electronic component layer precursors and the laminated one of the electronic component layer precursors. A step in which the laminating step and the interconnection forming step are combined is carried out zero or more times.
The method of manufacturing the compound component device 1 according to the first embodiment may further include an insulating portion forming step of forming insulating portions between component electrodes of an electronic component; a silicon base layer preparing step of preparing a silicon base layer having a grid-like side wall portion and a bottom surface portion; a resin sealing portion thinning step of thinning the first resin sealing portion; a second compound component layer forming step of forming the second compound component layer; and a dicing step of individuating by dicing.
Specifically, an example of the method of manufacturing the compound component device 1 will be described with reference to
In the manufacturing method, the mother integrated body in which the compound component devices 1 are integrated is produced by the silicon base layer preparing step to the inverted layer producing step.
In the insulating portion forming step, as illustrated in
In the planarization processing, as illustrated in
In the silicon base layer preparing step, as illustrated in
A shape of the silicon base layer 182 may be cylindrical as seen looking down in plan view, whereas there is no limitation thereto. On condition that the shape of the silicon base layer 182 is cylindrical, a thickness of the silicon base layer 182 is 775 μm (diameter of Si wafer is φ 300 mm), 725 μm (φ 200 mm), 675 μm (φ 150 mm), and 525 μm (φ 100 mm), for instance. Incidentally, the silicon base layer preparing step may be carried out prior to the insulating portion forming step. Both the silicon base layer 182 and the side wall portion 115 are substantially made of Si.
In the electronic component bonding step, the first electronic components 113 are bonded onto the silicon base layer 182 so that the plurality of component electrodes 113d of the first electronic components 113 come into contact with the bottom surface portion of the silicon base layer 182 having the grid-like side wall portion 115 and the bottom surface portion, with an electronic component bonding layer 172 interposed therebetween. Specifically, in the electronic component bonding step as illustrated in
A method of coating with the coating film is spin coating, for instance. The coating is preferably carried out with control such that a thickness of the coating film is within the range from the thickness of the component electrodes 113d of the first electronic components 113 to 10 μm. The adhesive is thermosetting resin, for instance. Such a thermosetting resin is a thermosetting resin containing a recurring unit derived from benzocyclobutene (BCB), for instance, and can be obtained by polymerization of 1,3-divinyl-1,1,3,3-tetramethyldisiloxane-bis-benzocyclobutene (DVS-bis-BCB), for instance. A commercialized product is “CYCLOTENE” manufactured by The Dow Chemical Company, for instance.
The first electronic components 113 are placed on the coating film with use of a device including a vacuum chamber. More particularly, an electronic component integrated wafer (wafer in which the plurality of first electronic components 113 are integrated) is stuck on the silicon base layer 182 (the silicon base layer 182 including the side wall portion 115). Pressures are applied in two-way directions along the laminating direction for the first electronic components 113 and heating is carried out. Specifically, the silicon base layer 182 is set on a lower stage in the vacuum chamber of the device. The component electrodes 113d of the first electronic components 113 are directed so as to face the coating film and vacuum suction (or decompression suction) of the first electronic components 113 is exerted on an upper stage in the vacuum chamber. A cognitive mark of the silicon base layer 182 is used for positioning between the silicon base layer 182 and the electronic component integrated wafer, for instance. The one or more first electronic components 113 are placed on a side of the coating film on the silicon base layer 182. Pressures are applied in two-way directions along directions in which the upper and lower stages face each other and heating is carried out.
The electronic component integrated wafer is bonded onto the silicon base layer 182 so that the component electrodes 113d and the insulating portions 113e face the silicon base layer 182 with the electronic component bonding layer 172 interposed therebetween.
In the electronic component sealing step, the first resin sealing portion 117 is formed by sealing of the first electronic components 113 with resin. In the electronic component sealing step as illustrated in
In the resin sealing portion thinning step, the first resin sealing portion 117 is thinned. In the resin sealing portion thinning step as illustrated in
In the electronic component layer precursor producing step, the silicon base layer 182 and the electronic component bonding layer 172 are removed so that entirety of surfaces of the component electrodes 113d is exposed and an electronic component layer precursor is thereby produced. In the electronic component layer precursor producing step as illustrated in
A purpose of provision of the first Si support 184 is to prevent occurrence of a harmful effect (more specifically, decrease in strength or the like) due to thinness of layers in manufacturing processes, compared with conventional configurations, in following removal of the silicon base layer 182 and the electronic component bonding layer 172. As illustrated in
In the electronic component layer precursor bonding step, as illustrated in
As illustrated in
Subsequently, the electronic component layer precursor 210′ is produced as with the electronic component layer precursor 110′. Bonding by the bonding layer 130 is carried out so that the main surfaces 112′, 212′ of the two electronic component layer precursors 110′, 210′ on which the component electrodes 113d, 213d are not exposed face each other. After that, the second Si support and the bonding layer that support the electronic component layer precursor 210′ are removed by being ground. Thus, the pair of electronic component layer precursors 10″ is produced.
In the inverted layer precursor producing step, as illustrated in
In the inverted layer precursor producing step, the electronic component layer piercing vias 119, 219 and the redistribution layer 220 can be produced with use of a photolithographic method. Production of the electronic component layer piercing vias 119, 219 and the redistribution layer 220 will be described with reference to a sectional view into which a portion B in
Subsequently, the electronic component layer piercing vias 119, 219 are formed in the through-holes 115f, 215f, 130f. As illustrated in
Subsequently, the redistribution layer 220 is formed. In formation of the redistribution layer 220, specifically, the dielectric film and the interconnections that have specified patterns are formed by the photolithographic method and the etching that have been described above, so that the redistribution layer 220 is formed as illustrated in
In the formation of the redistribution layer 220, the inorganic dielectric film (0.1 to 0.2 μm thick) can be formed with use of a chemical vapor deposition (CVD) method such as PECVD, for instance. The inorganic dielectric film may be formed in one or more layers. In case where the inorganic dielectric film is formed in four layers, for instance, SiO2: 0.25 μm/Si3N4: 0.1 μm/SiO2: 0.25 μm/Si3N4: 0.1 μm may be provided, for instance, in order of mention from a side of a main surface 211′ of the electronic component layer precursor 210′ on which the component electrodes 213d are exposed.
In the second compound component layer forming step, the second compound component layer is formed. In the second compound component layer forming step as illustrated in
In the inverted layer producing step, as illustrated in
In the dicing step, as illustrated in
As illustrated in
With reference to
An inverted layer 10A is placed on at least a center side with respect to a laminating direction for a plurality of first compound component layers 100, 200, 300. Herein, “placement on a center side” refers to placement in middle of a total number of layers (the first compound component layers 100, 200, 300 and the second compound component layer 900) that configure the compound component device 1A or placement in layers including middle layers. The inverted layer 10A includes the first compound component layers 200, 300 that are middle layers among the total number of layers of four and that are in second and third places from bottom of the compound component device 1A. Thus, the inverted layer 10A is placed on the center side in the compound component device 1A.
With this configuration, the inverted layer 10A whose internal stresses are prone to cancel out each other is placed on the center side in the compound component device 1A and thus the occurrence of a warpage is further curbed in the entire compound component device 1A.
Though the total number of layers is even in the second embodiment, “placement on a center side” will be further described herein with citation of a compound component device 1B having an odd total number of layers and according to a third embodiment (to be described later), as an example. The compound component device 1B includes five layers in total (four first compound component layers 100 to 400 and one second compound component layer 900). Accordingly, an inverted layer 10B includes the first compound component layers 300, 400 that include the first compound component layer 300 which is a middle layer and that are in third and fourth places from the bottom. Thus, the inverted layer 10B is placed on the center side in the compound component device 1B.
The compound component device 1A according to the second embodiment further includes the first compound component layer 100 in addition to the inverted layer 10A including the first compound component layers 200, 300. The first compound component layer 100 is joined to the redistribution layer 220 of the first compound component layer 200 with the bonding layer 130 interposed therebetween on a side of the second main surface 112. In the compound component device 1A, the first compound component layer that does not configure the inverted layer 10A is placed as an outermost layer.
The electronic component layer piercing vias 119A include side wall portion piercing vias piercing the side wall portion 115 and conducting vias (not illustrated) piercing the bonding layer 130. The electronic component layer piercing vias 119A are electrically connected to the redistribution layer 220 by the conducting vias. In a plane perpendicular to a thickness direction of the compound component device 1A, as with the first embodiment illustrated in
The electronic component layer piercing vias 119A, 219A, 319A are placed so as to be arranged on one straight line in at least one pair of adjoining first compound component layers among the plurality of first compound component layers 100, 200, 300. In the sectional (ZX section) view illustrated in
Therefore, the compound component device according to the present disclosure enables selection of an arrangement of the electronic component layer piercing vias in accordance with an application thereof and thus heightens the degree of freedom of design.
An example of a method of manufacturing the compound component device 1A according to the second embodiment will be described.
The method of manufacturing the compound component device 1A according to the second embodiment further includes, in addition to the method of manufacturing the compound component device 1 according to the first embodiment, for instance, a laminating step of laminating an electronic component layer precursor produced separately on the inverted layer precursor, and an interconnection forming step of forming the electronic component layer piercing vias and the redistribution layer in or on the laminated electronic component layer precursor.
That is, a step in which the laminating step and the interconnection forming step are combined is carried out one time in the method of manufacturing the compound component device 1A according to the second embodiment.
Specifically, an example of the method of manufacturing the compound component device 1A will be described with reference to
In the laminating step, the electronic component layer precursor 110′ produced separately is laminated on the redistribution layer 220 of an inverted layer precursor 10A′. In the laminating step, specifically, the inverted layer precursor 10A′ is produced as with the first embodiment (refer to
In the inverted layer producing step, as illustrated in
In the inverted layer producing step as illustrated in
In the second compound component layer forming step as illustrated in
In the interconnection forming step, the electronic component layer piercing vias 119A and the redistribution layer 120 are formed in or on the laminated electronic component layer precursor 110′. In the interconnection forming step as illustrated in
The compound component device 1A is manufactured through the dicing step.
As illustrated in
With reference to
The compound component device 1B according to the third embodiment further includes the inverted layer 20B including the first compound component layers 100, 200 in addition to the inverted layer 10B including the first compound component layers 300, 400. The compound component device 1B includes the plurality of inverted layers 10B, 20B. By including the plurality of inverted layers 10B, 20B in which internal stresses in the first compound component layers 100, 200, 300, 400 are prone to cancel out each other, the compound component device 1B is capable of effectively curbing the occurrence of a warpage and thus enables further multilayer configuration of the first compound component layers. Therefore, the compound component device according to the present disclosure enables the adjustment of number of layers in accordance with an application thereof and thus heightens the degree of freedom of design.
The two adjoining inverted layers 10B, 20B of the plurality of inverted layers 10B, 20B are joined together with a bonding layer 230 interposed therebetween. Joining of the pair of adjoining inverted layers 10B, 20B with the bonding layer 230 interposed therebetween further decreases the internal stresses occurring in the inverted layers 10B, 20B and thereby enables further multilayer configuration of the first compound component layers. Therefore, the compound component device according to the present disclosure enables the adjustment of number of layers in accordance with an application thereof and thus heightens the degree of freedom of design.
The plurality of first compound component layers 100, 200, 300, 400 configure the even number of (specifically, two) inverted layers 10B, 20B and the even number of inverted layers 10B, 20B are symmetrical with respect to a center thereof in the laminating direction.
Herein, “symmetry” (“symmetrical”) means that configurations (more specifically, placement sites, numbers, types, dimensions, shapes, and the like of electronic component layers 110, 210, 310, 410, redistribution layers 120, 220, 320, 420, first electronic components 113B, 213B, 313B, 413B, side wall portions 115, 215, 315, 415, first resin sealing portions 117B, 217B, 317B, 417B, and electronic component layer piercing vias 119, 219, 319, 419) of the inverted layers 10B, 20B are in line symmetry with respect to an interface (corresponding to the bonding layer 230) between the laminated inverted layers 10B, 20B. For instance, it is meant that the electronic component layers 310, 410 configuring the inverted layer 10B are in line symmetry with the electronic component layers 110, 210 configuring the inverted layer 20B with respect to the bonding layer 230.
On condition that the even number of inverted layers 10B, 20B are symmetrical with respect to the center thereof in the laminating direction, the internal stresses occurring in the inverted layers 10B, 20B are prone to oppose and cancel out each other. In the compound component device 1B according to the third embodiment, therefore, the occurrence of a warpage is further curbed.
The electronic component layer piercing vias 319 further include inter-inverted layer conducting vias (not illustrated) that pierce the bonding layer 230 joining the inverted layers 10B, 20B together to make electrical connections between the inverted layers 10B, 20B, in addition to side wall portion piercing vias that pierce the side wall portion 315 and conducting vias that pierce a bonding layer 330 to make electrical connections to the electronic component layer piercing vias 419.
In sections perpendicular to a laminating direction of the first compound component layers 100, 200, 300, 400, a cross-sectional area of the inter-inverted layer conducting via is larger than a cross-sectional area of the side wall portion piercing via. In such a configuration, the electrical connections between the inverted layers 10B, 20B are made by the inter-inverted layer conducting vias each having a larger connection area and thus the compound component device 1B has high reliability.
The plurality of first compound component layers 100, 200 are joined together by the bonding layer 130 and the second surfaces 113b of the electronic component main body portions 113c are in contact with the bonding layer 130. That is, a first resin sealing portion 117B has no resin on a side of the second surfaces 113b of the electronic component main body portions 113c. In this manner, the amount of resin in which a warpage may occur is reduced, so that the occurrence of the warpage is further curbed in the compound component device 1B according to the third embodiment.
An example of a method of manufacturing the compound component device 1B according to the third embodiment will be described.
The method of manufacturing the compound component device 1B according to the third embodiment further includes, in addition to the method of manufacturing the compound component device according to the first embodiment, for instance, a laminating step of laminating a pair of electronic component layer precursors produced separately on the inverted layer precursor, an interconnection forming step of forming the electronic component layer piercing vias and the redistribution layer in or on the laminated pair of electronic component layer precursors, and a step in which the laminating step and the interconnection forming step are combined is carried out one time.
Specifically, an example of the method of manufacturing the compound component device 1B will be described with reference to
In the resin sealing portion thinning step, as illustrated in
In the inverted layer precursor producing step, as illustrated in
In the laminating step, as illustrated in
In the interconnection forming step, the electronic component layer piercing vias and the redistribution layer are formed in or on the laminated pair of electronic component layer precursors 10B″. In the interconnection forming step as illustrated in
In the second compound component layer forming step as illustrated in
In the inverted layer producing step, as illustrated in
In the inverted layer producing step, specifically, the second Si support 186 and the bonding layer 174 are initially removed. Subsequently, the redistribution layer 120 is produced on the exposed main surface (corresponding to the first main surface 111 of the electronic component layer 110) of the inverted layer precursor 10B′. Thus, the inverted layer 20B is produced.
The compound component device 1B is manufactured through the dicing step.
The present disclosure is not limited to the embodiments described above and design thereof may be modified to an extent not departing from purport of the present disclosure. Further, the configurations of the first to third embodiments may be combined variously.
Though the electronic component layer piercing vias 119 are provided to be placed with alignment in plan view (XY sectional view in
Herein, “zigzag placement” refers to placement with arrangement at equal interval distances (which may be referred to as “distance L2” below) on straight lines intersecting at an angle of 60° in plan view. On condition that a plurality of straight lines exist on one side configuring intersections at the angle of 60°, the plurality of parallel straight lines adjoin spaced apart by a distance L2×√{square root over (3/2)}. Therefore, the electronic component layer piercing vias 119D can be further integrated by the zigzag placement, compared with the placement with alignment.
In the first embodiment, the resin configuring the first resin sealing portion 117 of the one first compound component layer 100 may be different from the resin configuring the first resin sealing portion 217 of the different first compound component layer 200. In the second embodiment, among the resins that configure the first resin sealing portions 117, 217, 317 of the three first compound component layers 100, 200, 300, all the three may be different or two may be different. In the third embodiment, among the resins that configure the first resin sealing portions 117B, 217B, 317B, 417B of the four first compound component layers 100, 200, 300, 400, all the four may be different or three or two may be different.
Though the resins that configure the first resin sealing portions 117, 217 of the plurality of electronic component layers 110, 210 in the first embodiment are different (that is, the resins that configure the two first resin sealing portions 117, 217 are different), there is no limitation thereto. In the second embodiment, among the resins that configure the three first resin sealing portions 117, 217, 317, two resins or three resins may be different, for instance. In the third embodiment, among the resins that configure the four first resin sealing portions 117B, 217B, 317B, 417B, two to four resins may be different. Resins that differ in type may be employed for the first compound component layers in this manner and thus a particular resin type can be selected in accordance with an application for the compound component device. For instance, the compound component layers may be provided with respective different functions of the first resin sealing portions. Therefore, the compound component device according to the present disclosure heightens the degree of freedom of design.
Though the compound component devices 1, 1A, 1B of the first to third embodiments each include the two to four first compound component layers, there is no limitation thereto. For instance, the compound component device may include five or more first compound component layers. In the method of manufacturing the compound component device with such a configuration, the step in which the laminating step and the interconnection forming step are combined is carried out two or more times. In the compound component device according to the present disclosure, the configurations of the first compound component layers that are substantially identical curb complication of interconnection design and facilitate electrical connection between the first compound component layers. Therefore, the interconnections can be easily formed even if five or more first compound component layers are laminated. Accordingly, limitations on number, types, or the like of the first electronic components to be housed in circuit design are prone to be relieved and the degree of freedom of design is heightened. Therein, diverse circuit configurations are made available and a range of applications thereof is further broadened.
On condition that the step in which the laminating step and the interconnection forming step are combined is carried out two or more times in the method of manufacturing the compound component device, order of the laminating step, the inverted layer producing step, the second compound component layer forming step, and the interconnection forming step can be altered to such an extent that the compound component device can be manufactured, as described in relation to the second and third embodiments.
Though the compound component devices of the first to third embodiments each include the three electronic components in each of the first compound component layers, there is no limitation thereto. For instance, the compound component device may include one, two, or four or more first electronic components in each of the first compound component layers. Further, the compound component device may include a different number of first electronic components in each of the first compound component layers. Accordingly, limitations on number, types, or the like of the electronic components to be housed in circuit design are prone to be relieved and the degree of freedom of design is heightened. Therein, diverse circuit configurations are made available and a range of applications thereof is further broadened.
Though so-called face up method in which molding is carried out with direct coating with liquid resin on the silicon base layer 182 having the first electronic components 113 installed thereon is employed for the electronic component sealing step in the first to third embodiments, there is no limitation thereto. For instance, so-called face down method may be employed and the molding may be carried out with coating of a separate sheet with liquid resin and bonding thereto of the silicon base layer 182 having the first electronic components 113 installed thereon. Further, granular resin or sheet resin may be used in place of the liquid resin.
Though the bonding layer 174 is removed in the electronic component layer precursor bonding step in the first embodiment, there is no limitation thereto. Instead of removal of the bonding layer 174, entirety or a portion of the bonding layer 174 may be made to remain. On condition that the bonding layer 174 remains, smoothness of surfaces of the electronic component layer precursors can be improved. Thus, the redistribution layer 120 that more accurately reflets design can be formed.
Aspects of the compound component device and the method of manufacturing the compound component device according to the present disclosure are as follows.
The compound component device according to the present disclosure can be installed in various types of electronic equipment in order to be utilized.
| Number | Date | Country | Kind |
|---|---|---|---|
| 2022-205845 | Dec 2022 | JP | national |
