DEVICE EMBEDDED WITH SEMICONDUCTOR CHIP AND STACK STRUCTURE OF THE SAME

Abstract

A circuit board stack structure embedded with semiconductor components includes two circuit boards, each of which having an opening; circuit layers formed on top and bottom surfaces of the circuit boards, each of the circuit layers having a plurality of conductive structures and electrical connecting pads; two semiconductor components embedded in the openings respectively, each of the semiconductor components having a plurality of electrode pads electrically connected to a portion of the conductive structures; a plurality of conductive bumps implanted on the electrical connecting pads of at least one of the circuit boards; and a plurality of solder balls formed on the electrical connecting pads on the other of the circuit boards that is free of the conductive bumps, allowing the conductive bumps of the one of the circuit boards to be engaged with the solder balls of the other of the circuit boards.

Description

BRIEF DESCRIPTION OF DRAWINGS

The invention can be more fully understood by reading the following detailed description of the preferred embodiments, with reference made to the accompanying drawings, wherein:

FIG. 1 is a cross-sectional view of a multi-chip semiconductor package disclosed in U.S. Pat. No. 5,323,060;

FIG. 2 is a cross-sectional view of a carrier board embedded with a semiconductor chip according to the prior art;

FIG. 3A is a cross-sectional view of a circuit board stack structure embedded with semiconductor components of the preferred embodiment according to the present invention;

FIG. 3B is a cross-sectional view of a conductive bump of one circuit board engaged with a solder ball of another circuit board shown in FIG. 3A;

FIG. 4A is a decomposed schematic diagram of a circuit board stack structure embedded with semiconductor components shown in FIG. 3B; and

FIG. 4B is an assembly schematic diagram of the circuit board stack structure shown in FIG. 4A.

DETAILED DESCRIPTION OF PREFERRED EMBODIMENTS

The following illustrative embodiments are provided to illustrate the disclosure of the present invention, these and other advantages and effects can be apparently understood by those in the art after reading the disclosure of this specification. The present invention can also be performed or applied by other different embodiments. The details of the specification may be on the basis of different points and applications, and numerous modifications and variations can be devised without departing from the spirit of the present invention.

FIGS. 3A to 4B are four drawings depicted according to the preferred embodiment of a circuit board stack structure embedded with semiconductor components according to the present invention.

As shown in FIG. 3A, a carrier structure 3 having at least a semiconductor component embedded therein comprises at least a circuit board 31 having at least an opening 311, at least two circuit layers 33 respectively formed on the top and bottom surfaces of the circuit board 31, at least a semiconductor component 35 received in the opening 311 of the circuit board 31, at least one conductive bump 37 formed on the circuit layers 33 on the top surface of the circuit board 31. According to one preferred embodiment, the circuit board 31 may be a printed circuit board or an integrated circuit (IC) package substrate.

Furthermore, a plurality of electrical connecting pads 331 are respectively formed on the top and bottom surfaces on each of the circuit layers 33. A plurality of conductive structures such as conductive blind vias 333 are further formed on the circuit layer 33 and electrically connected to the electrical connecting pads 331. The circuit board 31 may further comprises a plurality of electroplated through holes (not shown) for electrically connecting to the conductive structures that are not electrically connected to the semiconductor components, so as to form electrical connections between the circuit layers on the top and bottom surfaces of the carrier structure 33.

The semiconductor component 35 may be an active component such as a central processing unit (CPU), a memory (DRAM, SRAM, SDRAM) and the like, or a passive component such as a capacitors, resistor, inductor and the like. According to one preferred embodiment, the semiconductor component 35 may comprise a plurality of electrode pads 351 electrically connected to the conductive blind vias 333 of the circuit layer 33.

Moreover, according to one preferred embodiment, the conductive bump 37 is formed on a surface of the electrical connecting pad 331 of the circuit layer 33 on the top surface of the circuit board 31, wherein the conductive bumps may be made of a material selected from the group consisting of copper (Cu), silver (Ag), gold (Au), nickel/gold (Ni—Au) and nickel/lead/gold (Ni—Pb—Au). Preferably, the conductive bump 37 is made of copper added up with any one of the foregoing materials.

Although the carrier structure 3 comprising the semiconductor component of the present embodiment mainly comprises the circuit board 31, the circuit layers 33, the semiconductor component 35 and the conductive bumps 37, alternatively, according to another preferred embodiments at least one solder ball 39 may be further implanted on a surface of one of the electrical connecting pads 331 on the circuit layer 33 on the bottom surface of the circuit board 31, as shown in FIG. 3B.

Moreover, referring to FIG. 4A, when the carrier structure 3 is to be stacked over another carrier structure to form a circuit board stack structure 30, a solder ball 39 may be implanted on the electrical connecting pad 331 of the circuit layer 33 on the bottom surface of the circuit board 31. The conductive bumps 37 and solder balls 39 are welded, so as to form electrical connection between the two carrier structures 3.

As shown in FIG. 4B, the circuit board stack structure 30 comprises at least two circuit boards 31, each of the circuit boards 31 having at least two the circuit layers 33 and at least an opening 311, wherein each of the circuit boards 31 comprises a plurality of electrical connecting pads 331 and conductive structures; a plurality of conductive bumps 37 implanted on the electrical connecting pads 331 of the circuit layers 33; at least two semiconductor components 35 embedded in the openings 311 and having at least one electrode pad 351; and a plurality of solder joints 39 formed on the electrical connecting pads 331 of one of the circuit layers 33 that is free of the conductive bump 37.

In one preferred embodiment, each of the circuit layer 33 comprises a plurality of electrical connecting pads 331 and conductive blind vias 333. The electrode pads 351 of the semiconductor components 35 are electrically connected to the circuit layers 33 via the conductive blind vias 333. Furthermore, the conductive bumps 37 are correspondingly electrically connected to the solder joints 39, so as to form electrical connection between the circuit boards 31.

Likewise, through the use of the corresponding conductive bumps 37 and the solder joints 39, a plurality of the carrier structures 3 can be stacked over each other for forming the stack structure 30 having multiple carrier structures. It is obvious that a circuit build-up structure (not shown) can be further formed on external surfaces of the two stacked circuit boards 31, so as to form a structure having multiple layers of circuit boards.

Moreover, the solder joints 39 formed on the outmost layer of the stack structure 30 may be correspondingly disposed and electrically connected to conductive bumps of a circuit board, or serve as conductive structures for electrically connecting to external electronic devices (not shown).

In summary, the circuit board stack structure having semiconductor components embedded therein comprises at least a conductive bump formed on at least one of the electrical connecting pads on at least a circuit board and disposed in position corresponding to at least a solder joint of another circuit board. The conductive bump and solder ball are welded to form a conductive path for electrically connecting a plurality of stacked circuit boards and semiconductor components embedded in the circuit boards, so as to simplify a manufacturing process, and thereby strengthen electric requirements and functionalities of a whole structure and overcome the drawbacks of the prior art.

The foregoing descriptions of the detailed embodiments are only illustrated to disclose the features and functions of the present invention and not restrictive of the scope of the present invention. It should be understood to those in the art that all modifications and variations according to the spirit and principle in the disclosure of the present invention should fall within the scope of the appended claims.

Claims

1. A circuit board stack structure embedded with semiconductor components, comprising: at least two circuit boards, each of the circuit boards having at least an opening;at least two circuit layers respectively formed on two surfaces of each of the circuit boards, each of the circuit layers having a plurality of conductive structures and electrical connecting pads;at least two semiconductor components received in the openings of the circuit boards and formed with a plurality of electrode pads for being electrically connected to the circuit layers via the conductive structures;a plurality of conductive bumps implanted on the electrical connecting pads of at least one of the circuit boards; anda plurality of solder joints implanted on the electrical connecting pads on a surface of one of the circuit board that is not formed with the conductive bumps, wherein the solder joints of one of the circuit boards are correspondingly electrically connected to the conductive bumps of the other of the circuit boards, so as to form electrical connections between the circuit boards.

2. The circuit board stack structure of claim 1, wherein the circuit board is one selected from the group consisting of a printed circuit board and IC package substrate.

3. The circuit board stack structure of claim 1, wherein the conductive bump comprises at least one selected from the group consisting of copper, silver, gold and lead.

4. The circuit board stack structure of claim 2, wherein each of the semiconductor components is one selected from the group consisting of an active component and a passive component.

5. The circuit board stack structure of claim 1, wherein the conductive structures are conductive blind vias.

6. The circuit board stack structure of claim 1, wherein each of the circuit board further comprises electroplated through holes electrically connected to the upper and lower circuit layers.