Power semiconductor device with high radiating efficiency

Information

  • Patent Grant
  • 6765285
  • Patent Number
    6,765,285
  • Date Filed
    Wednesday, March 5, 2003
    21 years ago
  • Date Issued
    Tuesday, July 20, 2004
    20 years ago
Abstract
A discrete semiconductor device is vertically sandwiched between an upper wall of a case body and a case bottom plate to be fixed inside a case. The discrete semiconductor device is fitted in the case to be positioned on a predetermined portion inside the case with high accuracy. A space defined by a side surface of the discrete semiconductor device and an inner wall of the case forms a duct for a coolant used for cooling the discrete semiconductor device. The discrete semiconductor device, except main electrodes and signal terminals, is immersed in the coolant. With this structure provided is a power semiconductor device which allows an increase in radiating efficiency of a power semiconductor element and reduction in manufacturing cost.
Description




BACKGROUND OF THE INVENTION




1. Field of the Invention




The present invention relates to a power semiconductor device having a structure in which at least one discrete semiconductor device is disposed in a case.




2. Description of the Background Art




In a background-art power semiconductor device, a resin-sealed power semiconductor element is mounted on a cooling fin with grease interposed therebetween, to radiate the heat of the power semiconductor element (see e.g., Patent Document 1).




<Patent Document 1> Japanese Patent Application Laid Open Gazette No. 2001-250911.




The background-art power semiconductor device, however, has a problem that it is impossible to ensure sufficient heat radiation since the thermal conductivity of grease is low.




Further, since the flatness of a surface for mounting the fin has a great influence on the heat radiation, the fin mounting surface needs high-level flatness and this raises a problem that the manufacturing cost increases.




SUMMARY OF THE INVENTION




It is an object of the present invention to provide a power semiconductor device which allows an increase in radiating efficiency of a power semiconductor element and reduction in manufacturing cost.




The present invention is intended for a power semiconductor device. According to the present invention, the power semiconductor device includes a hollow case and a discrete semiconductor device having a terminal for external connection. The discrete semiconductor device is fitted in the case to be positioned and disposed on a predetermined portion inside the case with the terminal protruding outside from the case. A space defined by a surface of the discrete semiconductor device and an inner wall of the case forms a duct for a coolant used for cooling the discrete semiconductor device which is immersed therein.




The discrete semiconductor device is immersed in the coolant. Therefore, the discrete semiconductor device can be directly cooled by the coolant and this enhances the cooling efficiency of the discrete semiconductor device.




Further, the discrete semiconductor device is fitted in the case to be positioned and disposed on a predetermined portion inside the case. This enhances the mounting accuracy of a control circuit substrate and the like.




These and other objects, features, aspects and advantages of the present invention will become more apparent from the following detailed description of the present invention when taken in conjunction with the accompanying drawings.











BRIEF DESCRIPTION OF THE DRAWINGS





FIG. 1

is a top plan view showing a structure of a power semiconductor device in accordance with a first preferred embodiment of the present invention;





FIG. 2

is a cross section showing a cross-sectional structure taken along the line II—II of

FIG. 1

;





FIG. 3

is a cross section showing a cross-sectional structure taken along the line III—III of

FIG. 1

;





FIG. 4

is a cross section specifically showing a structure of a discrete semiconductor device;





FIG. 5

is a top plan view showing a variation of the first preferred embodiment of the present invention;





FIG. 6

is a circuit diagram showing a configuration of an inverter circuit;





FIG. 7

is a top plan view showing a structure of a power semiconductor device in accordance with a second preferred embodiment of the present invention;





FIG. 8

is a cross section showing a cross-sectional structure taken along the line VIII—VIII of

FIG. 7

;





FIG. 9

is a top plan view showing a state where busbars are connected to the structure of

FIG. 7

;





FIG. 10

is a cross section showing a cross-sectional structure taken along the line X—X of

FIG. 9

;





FIG. 11

is a top plan view showing a state where the structure of

FIG. 9

is covered with a case cover;





FIG. 12

is a cross section showing a cross-sectional structure taken along the line XII—XII of

FIG. 11

;





FIG. 13

is a top plan view showing a state where a control circuit substrate is mounted on the structure of

FIG. 9

;





FIG. 14

is a cross section showing a cross-sectional structure taken along the line XIV—XIV of

FIG. 13

;





FIG. 15

is a top plan view showing a state where the structure of

FIG. 13

is covered with a case cover;





FIG. 16

is a cross section showing a cross-sectional structure taken along the line XVI—XVI of

FIG. 15

;





FIG. 17

is a top plan view showing a variation of the second preferred embodiment of the present invention;





FIG. 18

is a cross section showing a cross-sectional structure taken along the line XVIII—XVIII of

FIG. 17

;





FIG. 19

is a top plan view showing a state where the structure of

FIG. 17

is covered with a case cover;





FIG. 20

is a cross section showing a cross-sectional structure taken along the line XX—XX of

FIG. 19

;





FIG. 21

is a cross section showing a structure of a power semiconductor device in accordance with a third preferred embodiment of the present invention;





FIG. 22

is a cross section showing a structure of a power semiconductor device in accordance with a fourth preferred embodiment of the present invention;





FIG. 23

is a top plan view showing a structure of a power semiconductor device in accordance with a fifth preferred embodiment of the present invention;





FIG. 24

is a cross section showing a cross-sectional structure taken along the line XXIV—XXIV of

FIG. 23

;





FIG. 25

is a top plan view showing a structure of a power semiconductor device in accordance with a sixth preferred embodiment of the present invention;





FIG. 26

is a cross section showing a cross-sectional structure taken along the line XXVI—XXVI of

FIG. 25

;





FIG. 27

is a top plan view showing a state where a control circuit substrate is mounted on the structure of FIG.


25


and this structure is covered with a case cover;





FIG. 28

is a cross section showing a cross-sectional structure taken along the line XXVIII—XXVIII of

FIG. 27

;





FIG. 29

is a cross section showing a structure of a discrete semiconductor device in accordance with a seventh preferred embodiment of the present invention;





FIG. 30

is a top plan view showing a structure of a power semiconductor device in accordance with the seventh preferred embodiment of the present invention;





FIG. 31

is a cross section showing a cross-sectional structure taken along the line XXXI—XXXI of

FIG. 30

;





FIG. 32

is a top plan view showing a state where busbars are connected to the structure of

FIG. 30

;





FIG. 33

is a cross section showing a cross-sectional structure taken along the line XXXIII—XXXIII of

FIG. 32

;





FIG. 34

is a top plan view showing a state where a control circuit substrate is mounted on the structure of FIG.


32


and this structure is covered with a case cover;





FIG. 35

is a cross section showing a cross-sectional structure taken along the line XXXV—XXXV of

FIG. 34

;





FIG. 36

is a top plan view showing a structure of a power semiconductor device in accordance with an eighth preferred embodiment of the present invention;





FIG. 37

is a cross section showing a variation of the eighth preferred embodiment of the present invention; and





FIG. 38

is a cross section showing a structure of a power semiconductor device in accordance with a ninth preferred embodiment of the present invention.











DESCRIPTION OF THE PREFERRED EMBODIMENTS




First Preferred Embodiment





FIG. 1

is a top plan view showing a structure of a power semiconductor device in accordance with a first preferred embodiment of the present invention, and

FIGS. 2 and 3

are cross sections showing cross-sectional structures taken along the lines II—II and III—III of

FIG. 1

, respectively. In

FIG. 1

, an upper wall of a case is not shown.




Referring to

FIGS. 1

to


3


, the power semiconductor device of the first preferred embodiment has a case consisting of a case body


5


and a case bottom plate


7


and a discrete semiconductor device


1


. The discrete semiconductor device


1


has a structure in which a power semiconductor element such as an IGBT is sealed with a mold resin. This enhances the water resistance of the power semiconductor element against a coolant discussed later. The case body


5


and the case bottom plate


7


are fixed to each other with screws


8


. Instead of the resin, the power semiconductor element may be sealed with other material.




The discrete semiconductor device


1


has terminals for external connection (main electrodes


2


A and


2


B and signal terminals


3


). All the main electrodes


2


A and


2


B and the signal terminals


3


protrude from one surface (herein, an upper surface) of the discrete semiconductor device


1


. This allows an easy mounting of busbars or a control circuit substrate discussed later.




The discrete semiconductor device


1


is vertically sandwiched between the upper wall of the case body


5


and the case bottom plate


7


, to be fixed inside the case. This allows an easy fixing of the discrete semiconductor device


1


and the case and ensures downsizing of the discrete semiconductor device


1


since there is no need to provide the discrete semiconductor device


1


with tapped holes. The discrete semiconductor device


1


has a positioning structure


21


to be fitted in the shape of the upper wall of the case body


5


. The upper wall of the case body


5


is provided with an insertion hole in which the shape of a top of the discrete semiconductor device


1


is fitted. The case bottom plate


7


is provided with a V-shaped groove in which the shape of a bottom of the discrete semiconductor device


1


is fitted. With these structures, the discrete semiconductor device


1


is fitted in the case to be positioned on a predetermined portion inside the case with high accuracy. This enhances the accuracy of mounting the control circuit substrate and the like discussed later. The main electrodes


2


A and


2


B and the signal terminals


3


protrude out of the case.




A space defined by a side surface of the discrete semiconductor device


1


and an inner wall of the case forms a duct


9


for the coolant (e.g., cold water) used for cooling the discrete semiconductor device


1


. The discrete semiconductor device


1


, except the main electrodes


2


A and


2


B and the signal terminals


3


, is immersed in the coolant. Providing a sealing material


6


at a contact between the discrete semiconductor device


1


and the case body


5


prevents the coolant from leaking out of the case from the upper wall of the case.




A fin


4


is provided on the side surface of the discrete semiconductor device


1


and immersed in the coolant. This enhances the cooling efficiency of the discrete semiconductor device


1


. When the fin


4


is made of a mold resin, the fin


4


is also formed in a resin sealing process for the power semiconductor element and this ensures reduction in manufacturing cost. By providing the side surface of the discrete semiconductor device


1


with a lot of irregularities, instead of forming the fin


4


on the side surface of the discrete semiconductor device


1


, the area of contact between the discrete semiconductor device


1


and the coolant increases and this enhances the cooling efficiency of the discrete semiconductor device


1


. Referring to

FIG. 1

, as indicated by the arrow X, the coolant flows from a coolant inlet


50


A into the case, going along the duct


9


while cooling the discrete semiconductor device


1


, and then flows out of the case from a coolant outlet


50


B.





FIG. 4

is a cross section specifically showing a structure of the discrete semiconductor device


1


. A substrate is formed by layering a metal film


51


made of copper or the like, an insulating layer


52


made of resin, ceramic or the like and a metal substrate


53


made of copper or the like in this order. The metal film


51


is exposed at the side surface of the discrete semiconductor device


1


. The fin


4


is joined to the metal film


51


. On the metal substrate


53


, the power semiconductor element such as an IGBT


54


and a free wheel diode


55


are mounted. The IGBT


54


and the free wheel diode


55


are connected to each other with a wire


57


. The signal terminal


3


and the IGBT


54


are connected to each other with a wire


56


.





FIG. 5

is a top plan view showing a variation of the first preferred embodiment, correspondingly to FIG.


1


. Though the duct


9


for the coolant is linear in the case of

FIG. 1

, the duct


9


has a U shape in the case of FIG.


5


. As indicated by the arrow X, the coolant flows from the coolant inlet


50


A into the case, going along the duct


9


while cooling a first side surface of the discrete semiconductor device


1


(the side surface on which the fin


4


is provided), then makes a U-turn, further going along the duct


9


while cooling a second side surface of the discrete semiconductor device


1


(the side surface on which the fin


4


is not provided), and flows out of the case from the coolant outlet


50


B. This enhances the cooling efficiency of the discrete semiconductor device


1


as compared with the case of FIG.


1


. The fin


4


may be also provided on the second side surface of the discrete semiconductor device


1


.




Thus, in the power semiconductor device of the first preferred embodiment, the discrete semiconductor device


1


is immersed in the coolant. The discrete semiconductor device


1


can be thereby directly cooled by the coolant and this enhances the cooling efficiency of the discrete semiconductor device


1


as compared with the background-art case. The surface on which the fin


4


is mounted does not need the flatness level as high as that of the background-art device, and this ensures reduction in manufacturing cost.




Second Preferred Embodiment





FIG. 6

is a circuit diagram showing a configuration of an inverter circuit as an example of a power circuit. The inverter circuit consists of six IGBTs


54




1


to


54




6


and six free wheel diodes


55




1


to


55




6


. Referring to

FIG. 4

, one IGBT


54


and one free wheel diode


55


are incorporated in one discrete semiconductor device


1


. Therefore, in order to constitute the inverter circuit of

FIG. 6

, six discrete semiconductor devices


1




1


to


1




6


are needed.





FIG. 7

is a top plan view showing a structure of a power semiconductor device in accordance with a second preferred embodiment of the present invention, and

FIG. 8

is a cross section showing a cross-sectional structure taken along the line VIII—VIII of FIG.


7


. In

FIG. 7

, the upper wall of the case is not shown. Referring to

FIG. 7

, a plurality of discrete semiconductor devices


1




1


to


1




6


constituting the inverter circuit of

FIG. 6

are arranged side by side in a matrix with two rows and three columns in the case. By housing a plurality of discrete semiconductor devices


1




1


to


1




6


constituting a desired power circuit in one case


5


, it is possible to improve convenience in use. In the case, the meandering duct


9


is defined among the discrete semiconductor devices


1




1


to


1




6


. The IGBTs


54




1


to


54




6


and the free wheel diodes


55




1


to


55




6


are incorporated in the discrete semiconductor devices


1




1


to


1




6


, respectively. Other element may be also incorporated therein.




Referring to

FIG. 8

, the case has the case body


5


and the case bottom plate


7


which are fixed to each other with screws


8


. In an assembly process for the power semiconductor device, a plurality of discrete semiconductor devices


1




1


to


1




6


are vertically sandwiched between the upper wall of the case body


5


and the case bottom plate


7


to be fixed inside the case. This allows an easy assembly of the power semiconductor device.




When there is a difference in calorific value among the discrete semiconductor devices


11


to


16


, it is preferable that the discrete semiconductor devices


1




1


to


1




6


should be disposed from an upstream side of the duct


9


for the coolant (nearer to the coolant inlet


50


A) in descending order of calorific value. Specifically, one of the discrete semiconductor devices


1




1


to


1




6


which has the largest calorific value is disposed at the portion where the discrete semiconductor device


14


is disposed in FIG.


7


. This allows an effective cooling where the discrete semiconductor devices


1


having a larger calorific value can be cooled by the coolant of low temperature.





FIG. 9

is a top plan view showing a state where busbars are connected to the structure of

FIG. 7

, and

FIG. 10

is a cross section showing a cross-sectional structure taken along the line X—X of FIG.


9


. In

FIG. 9

, the upper wall of the case is not shown. An input busbar


10


P is connected in common to main electrodes


2


A


1


to


2


A


3


and an input busbar


10


N is connected in common to main electrodes


2


A


4


to


2


A


6


. Since the discrete semiconductor devices


1




1


to


16


are arranged so that the main electrodes


2


A


1


to


2


A


3


and the main electrodes


2


A


4


to


2


A


6


should be opposed to each other, the busbars


10


P and


10


N are disposed adjacently and parallelly to each other. Since the flows of currents in the busbars


10


P and


10


N are inverse in direction, providing the busbars


10


P and


10


N adjacently to each other can reduce the inductance between the busbars


10


P and


10


N.




Output busbars


11


U


1


,


11


V


1


,


11


W


1


,


11


U


2


,


11


V


2


and


11


W


2


are connected to the main electrodes


2


B


1


,


2


B


2


,


2


B


3


,


2


B


4


,


2


B


5


and


2


B


6


, respectively.





FIG. 11

is a top plan view showing a state where the structure of

FIG. 9

is covered with a case cover


12


, and

FIG. 12

is a cross section showing a cross-sectional structure taken along the line XII—XII of FIG.


11


. By providing the case cover


12


, a module of the power semiconductor device is obtained.




The case body


5


, the case bottom plate


7


and the case cover


12


may be made of a metal such as aluminum alloy. This avoids both an effect of noise emanating from the power semiconductor device to the outside and an effect of noise given to the power semiconductor device from the outside.





FIG. 13

is a top plan view showing a state where a control circuit substrate


13


is mounted on the structure of

FIG. 9

, and

FIG. 14

is a cross section showing a cross-sectional structure taken along the line XIV—XIV of FIG.


13


. In

FIG. 13

, the upper wall of the case is not shown. On the control circuit substrate


13


, a control circuit (not shown) is formed to control the discrete semiconductor devices


1




1


to


1




6


. The control circuit substrate


13


is electrically connected to the discrete semiconductor devices


1




1


to


1




6


through the signal terminals


3


(not shown in FIGS.


13


and


14


). A connector


14


is provided on the control circuit substrate


13


. The control circuit substrate


13


is disposed so that the discrete semiconductor devices


1




1


to


1




6


and the control circuit substrate


13


should be perpendicular to each other, and this ensures downsizing of the device.





FIG. 15

is a top plan view showing a state where the structure of

FIG. 13

is covered with a case cover


15


, and

FIG. 16

is a cross section showing a cross-sectional structure taken along the line XVI—XVI of FIG.


15


. By providing the case body


5


with the case cover


15


, a product (IPM) is obtained.




The case body


5


, the case bottom plate


7


and the case cover


15


may be made of a metal such as aluminum alloy. This avoids both an effect of electromagnetic noise emanating from the power semiconductor device to the outside and an effect of electromagnetic noise given to the power semiconductor device from the outside.





FIG. 17

is a top plan view showing a variation of the second preferred embodiment, correspondingly to

FIG. 9

, and

FIG. 18

is a cross section showing a cross-sectional structure taken along the line XVIII—XVIII of FIG.


17


. The main electrodes


2


B


1


and


2


B


4


are connected to the busbar


11


U, the main electrodes


2


B


2


and


2


B


5


are connected to the busbar


11


V and the main electrodes


2


B


3


and


2


B


6


are connected to the busbar


11


W. In order to avoid the contact between the busbars


11


U to


11


W and the busbars


10


P and


10


N, the busbars


11


U to


11


W are disposed above the busbars


10


P and


10


N. In other words, the busbars


11


U to


11


W and the busbars


10


P and


10


N grade-separately intersect each other. In order to avoid the contact between the busbars


11


U to


11


W and the main electrodes


2


A


1


to


2


A


6


, the busbars


11


U to


11


W each have a meandering shape in plan view. In the structure of

FIG. 17

, it is possible to draw the output busbars


11


U to


11


W out from one side.





FIG. 19

is a top plan view showing a state where the structure of

FIG. 17

is covered with the case cover


12


, and

FIG. 20

is a cross section showing a cross-sectional structure taken along the line XX—XX of FIG.


19


. By providing the case cover


12


, a module of the power semiconductor device is obtained. Like in

FIGS. 15 and 16

, by providing the control circuit substrate


13


and the case cover


15


, an IPM is obtained.




Third Preferred Embodiment





FIG. 21

is a cross section showing a structure of a power semiconductor device in accordance with a third preferred embodiment of the present invention, correspondingly to FIG.


8


. Instead of the case body


5


and the case bottom plate


7


which are fixed to each other with the screws


8


, a case body


5




a


and a case top plate


7




a


which are fixed to each other with screws


8




a


are provided. The case body


5




a


forms side walls and a bottom wall of the case as one unit.




In the structure of

FIG. 8

, the coolant contacts the case body


5


and the case bottom plate


7


which are physically separated. Therefore, the thermal resistance at the contact between the case body


5


and the case bottom plate


7


avoids the reflux of heat (indicated by the arrow Y) through the case. In contrast to this, the coolant contacts the case body


5




a


formed as one unit in the power semiconductor device of the third preferred embodiment. Therefore, the reflux of heat caused by the difference between the temperature near the coolant inlet


50


A and that near the coolant outlet


50


B is effectively made through the case. As a result, it is possible to suppress variation in temperature distribution in the case and ensure equalization in cooling efficiency. If at least the case body


5




a


is made of a metal such as aluminum alloy, the above effect becomes remarkable.




Fourth Preferred Embodiment





FIG. 22

is a cross section showing a structure of a power semiconductor device in accordance with a fourth preferred embodiment of the present invention, correspondingly to

FIG. 16. A

metallic shield plate


16


is provided between the busbar


10


P and the control circuit substrate


13


. The shield plate


16


is disposed across the case in plan view. The shield plate


16


is connected to the cover


15


which is part of the case and the potential of the shield plate


16


is thereby kept at the grand level.




Thus, in the power semiconductor device of the fourth preferred embodiment, by providing the shield plate


16


, it is possible to avoid an effect of electromagnetic noise emanating from the discrete semiconductor devices


1




1


to


1




6


and the busbars


10


P and


10


N and


11


U to


11


W on the control circuit and prevent a malfunction.




Fifth Preferred Embodiment





FIG. 23

is a top plan view showing a structure of a power semiconductor device in accordance with a fifth preferred embodiment of the present invention, correspondingly to

FIG. 9

, and

FIG. 24

is a cross section showing a cross-sectional structure taken along the line XXIV—XXIV of FIG.


23


. Referring to

FIG. 23

, a busbar


17


is provided instead of the busbars


10


P and


10


N of FIG.


9


. Referring to

FIG. 24

, the busbar


17


has busbars


17


P and


17


N. The busbars


17


P and


17


N are each planar, and opposed to each other while being electrically insulated from each other by an insulating film


18


. The busbar


17


P is electrically connected to the main electrodes


2


A


1


to


2


A


3


, and the busbar


17


N is electrically connected to the main electrodes


2


A


4


to


2


A


6


.




Thus, in the power semiconductor device of the fifth preferred embodiment, by providing the planar busbars


17


P and


17


N to be opposed to each other, it is possible to reduce the inductance between the busbars


17


P and


17


N as compared with that in the structure of FIG.


9


.




Sixth Preferred Embodiment





FIG. 25

is a top plan view showing a structure of a power semiconductor device in accordance with a sixth preferred embodiment of the present invention, correspondingly to

FIG. 9

, and

FIG. 26

is a cross section showing a cross-sectional structure taken along the line XXVI—XXVI of FIG.


25


. An electronic component (a smoothing capacitor


20


in the case of

FIG. 25

) constituting the power circuit together with the discrete semiconductor devices


1




1


to


1




6


is housed in the case together with the discrete semiconductor devices


1




1


to


1




6


. The case consisting of case bodies


5


and


22


and the case bottom plate


7


which are fixed to each other with screws


8


and


23


, and the smoothing capacitor


20


is disposed inside the case body


22


. In the case body


22


formed is a duct


210


which is connected to the duct


9


for the coolant in the case body


5


. As indicated by the arrow Z, the coolant flows from the coolant inlet


50


A into the case body


5


, going along the duct


9


while cooling the discrete semiconductor devices


1


, and then flows into the case body


22


, going along the duct


210


while cooling the smoothing capacitor


20


. After that, the coolant flows out of the case body


22


from the coolant outlet


50


B.





FIG. 27

is a top plan view showing a state where the control circuit substrate


13


is mounted on the structure of FIG.


25


and this structure is covered with the case cover


15


, and

FIG. 28

is a cross section showing a cross-sectional structure taken along the line XXVIII—XXVIII of FIG.


27


. By providing the control circuit substrate


13


and the case cover


15


, an IPM is obtained.




Thus, in the power semiconductor device of the sixth preferred embodiment, with the structure in which the smoothing capacitor


20


is cooled by the coolant used for cooling the discrete semiconductor devices


1




1


to


1




6


, it is possible to ensure simplification and downsizing of the device.




Seventh Preferred Embodiment





FIG. 29

is a cross section showing a structure of a discrete semiconductor device


100


in accordance with a seventh preferred embodiment of the present invention, correspondingly to FIG.


3


. The discrete semiconductor device


100


is different from the discrete semiconductor device


1


of

FIG. 3

in that the main electrode


2


A serving as an input terminal and the main electrode


2


B serving as an output terminal are disposed inversely.





FIG. 30

is a top plan view showing a structure of a power semiconductor device in accordance with the seventh preferred embodiment of the present invention, correspondingly to

FIG. 7

, and

FIG. 31

is a cross section showing a cross-sectional structure taken along the line XXXI—XXXI of FIG.


30


. Referring to

FIG. 30

, the six discrete semiconductor devices


1


and


100


constituting the inverter circuit of

FIG. 6

are arranged side by side in a matrix with one row and six columns inside the case. The discrete semiconductor devices


1


and the discrete semiconductor devices


100


are disposed alternately. The main electrodes


2


A included in the discrete semiconductor devices


1


and


100


are arranged side by side along a first side L


1


of the case. The main electrodes


2


B included in the discrete semiconductor devices


1


and


100


are arranged side by side along a second side L


2


of the case. In the case, the meandering duct


9


is defined among the discrete semiconductor devices


1


and


100


.





FIG. 32

is a top plan view showing a state where busbars are connected to the structure of

FIG. 30

, and

FIG. 33

is a cross section showing a cross-sectional structure taken along the line XXXIII—XXXIII of FIG.


32


. In

FIG. 32

, the upper wall of the case is not shown.

FIG. 33

shows busbars


30


P and


30


N which are not actually seen in the cross section taken along the line XXXIII—XXXIII, together with the cross-sectional structure.




The input busbar


30


P is connected in common to the main electrodes


2


A included in the discrete semiconductor devices


1


and the input busbar


30


N is connected in common to the main electrodes


2


A included in the discrete semiconductor devices


100


. The busbars


30


P and


30


N may be layered with an insulating film interposed therebetween, like in the structure of the above-discussed fifth preferred embodiment. Output busbars


31


U,


31


V and


31


W are each connected to the main electrode


2


B of the discrete semiconductor device


1


and the main electrode


2


B of the discrete semiconductor device


100


.





FIG. 34

is a top plan view showing a state where the control circuit substrate


13


is mounted on the structure of FIG.


32


and this structure is covered with the case cover


15


, and

FIG. 35

is a cross section showing a cross-sectional structure taken along the line XXXV—XXXV of FIG.


34


. In

FIG. 34

, the upper wall of the case is not shown.

FIG. 35

shows the main electrodes


2


B and the busbars


30


P,


30


N,


31


U,


31


V and


31


W which are not actually seen in the cross section taken along the line XXXV—XXXV, together with the cross-sectional structure. By providing the case body


5


with the control circuit substrate


13


and the case cover


15


, an IPM is obtained.




The structure of

FIG. 9

needs electrical connections between the busbars


11


U


1


and


11


U


2


, between the busbars


11


V


1


and


11


V


2


and between the busbars


11


W


1


and


11


W


2


outside the case. Further, since the structure of

FIG. 17

needs the grade-separated intersection of the busbars


11


U,


11


V and


11


W and the busbars


10


P and


10


N, the interconnection becomes complicate. In contrast to these, the power semiconductor device of the seventh preferred embodiment eliminates such inconveniences and ensures simplification in device structure and interconnection.




Eighth Preferred Embodiment





FIG. 36

is a top plan view showing a structure of a power semiconductor device in accordance with an eighth preferred embodiment of the present invention, correspondingly to FIG.


1


. Instead of the resin fin


4


of

FIG. 1

, a fin


40


made of a metal such as copper is provided. This enhances the radiating efficiency of the discrete semiconductor device


1


as compared with the above-discussed first preferred embodiment.





FIG. 37

is a cross section showing a variation of the eighth preferred embodiment of the present invention, correspondingly to FIG.


2


. Instead of the fin


40


of

FIG. 36

, an elastic member


41


made of a metal such copper is disposed in the duct


9


for the coolant, being pressed by the side surface of the discrete semiconductor device


1


. Specifically, the member


41


is sandwiched between the side surface of the discrete semiconductor device


1


and the inner wall of the case body


5


while being pressed, and presses the side surface of the discrete semiconductor device


1


with its elastic restoring force. The member


41


thereby surely contacts the side surface of the discrete semiconductor device


1


and therefore the heat from the discrete semiconductor device


1


is transferred to the coolant through the member


41


. Though the fins


4


and


40


needs to join to the discrete semiconductor device


1


by soldering or the like, the member


41


only has to be inserted between the discrete semiconductor device


1


and the case body


5


. Therefore, using the member


41


instead of the fin


4


or


40


allows an easy manufacture of the power semiconductor device.




Further, when the member


41


is used in the structure of

FIG. 7

instead of the fin


4


, the member


41


is sandwiched between the side surface of the discrete semiconductor device


1


and the inner wall of the case body


5


or between the side surfaces of the discrete semiconductor device


1


.




Ninth Preferred Embodiment





FIG. 38

is a cross section showing a structure of a power semiconductor device in accordance with a ninth preferred embodiment of the present invention, correspondingly to FIG.


2


. At least a portion of the surface of the discrete semiconductor device


1


which contacts the coolant is covered with a metal film


42


. The metal film


42


is formed by plating, soldering or the like.




Thus, in the power semiconductor device of the ninth preferred embodiment, by providing the metal film


42


, it is possible to enhance the heat radiation of the discrete semiconductor device


1


and the water resistance thereof against the coolant.




Though discussion has been made on the case of discrete semiconductor device having one-in-one function where a pair of input and output are provided, a multifunctional discrete semiconductor device having two-in-one function, six-in-one function, seven-in-one function or the like or a discrete semiconductor device including the function of an IC or the like may be used.




While the invention has been shown and described in detail, the foregoing description is in all aspects illustrative and not restrictive. It is therefore understood that numerous modifications and variations can be devised without departing from the scope of the invention.



Claims
  • 1. A power semiconductor device, comprising:a hollow case; and a discrete semiconductor device having a terminal for external connection, wherein said discrete semiconductor device is fitted in said case to be positioned and disposed on a predetermined portion inside said case with said terminal protruding outside from said case, and a space defined by a surface of said discrete semiconductor device and an inner wall of said case forms a duct for a coolant used for cooling said discrete semiconductor device which is immersed therein.
  • 2. The power semiconductor device according to claim 1, whereinsaid case has a case body and a case bottom plate which are fixed to each other, and said discrete semiconductor device is sandwiched between said case bottom plate and said case body to be fixed inside said case.
  • 3. The power semiconductor according to claim 1, whereinsaid discrete semiconductor device includes a plurality of discrete semiconductor devices, said case has a case body and a case bottom plate which are fixed to each other, and said plurality of discrete semiconductor devices are sandwiched between said case bottom plate and said case body to be fixed inside said case.
  • 4. The power semiconductor device according to claim 1, whereinsaid discrete semiconductor device has a structure in which a power semiconductor element is sealed with a resin.
  • 5. The power semiconductor device according to claim 1, whereinsaid terminal includes a plurality of terminals, and all said plurality of terminals protrude from one surface of said discrete semiconductor device.
  • 6. The power semiconductor device according to claim 1, whereinsaid discrete semiconductor device further has a positioning structure to be fitted in said case, for defining an arrangement position in said case.
  • 7. The power semiconductor device according to claim 1, further comprisingan elastic member made of a metal, being disposed in said space while being pressed by said surface of said discrete semiconductor device.
  • 8. The power semiconductor device according to claim 1, further comprisinga fin disposed on said surface of said discrete semiconductor device.
  • 9. The power semiconductor device according to claim 1, further comprisinga metallic film covering said surface of said discrete semiconductor device.
  • 10. The power semiconductor device according to claim 1, whereinsaid discrete semiconductor device includes a plurality of discrete semiconductor devices, said plurality of discrete semiconductor devices constitute a predetermined power circuit, and said plurality of discrete semiconductor devices are arranged side by side in said case.
  • 11. The power semiconductor device according to claim 10, whereinsaid terminal includes a first input terminal and a second input terminal, said plurality of discrete semiconductor devices each have said first input terminal and said second input terminal, said first input terminals included in said plurality of discrete semiconductor devices are electrically connected to each other with a first busbar, said second input terminals included in said plurality of discrete semiconductor devices are electrically connected to each other with a second busbar, and said first busbar and said second busbar are disposed adjacently to each other.
  • 12. The power semiconductor device according to claim 11, whereinboth said first and second busbars are planar, and said first and second busbars are insulated from each other and opposed to each other.
  • 13. The power semiconductor device according to claim 10, whereinsaid plurality of discrete semiconductor devices are disposed from an upstream side of said duct for said coolant in descending order of calorific value.
  • 14. The power semiconductor device according to claim 10, whereinsaid terminal includes a predetermined input terminal and a signal terminal, said plurality of discrete semiconductor devices each have said input terminal and said signal terminal, and said input terminals included in said plurality of discrete semiconductor devices are electrically connected to each other with a busbar, said power semiconductor device further comprising: a control circuit substrate electrically connected to said plurality of discrete semiconductor devices through said signal terminals, on which a control circuit is former to control said plurality of discrete semiconductor devices; and a shield plate disposed between said control circuit substrate and said busbar, being connected to said case.
  • 15. The power semiconductor device according to claim 10, whereinsaid terminal includes a predetermined input terminal and a predetermine output terminal, said plurality of discrete semiconductor devices each have said input terminal and said output terminal, said input terminals included in said plurality of discrete semiconductor device are arranged side by side along a first side of said case, and said output terminals included in said plurality of discrete semiconductor devices are arranged side by side along a second side of said case which is opposed to said first side.
  • 16. The power semiconductor device according to claim 1, further comprisingan electronic component constituting a predetermined power circuit, together with said discrete semiconductor device, wherein said electronic component is disposed in said case and cooled by said coolant.
  • 17. The power semiconductor device according to claim 1, whereinsaid case has a case body forming side walls and a bottom wall of said case as one unit and a case top plate fixed to said case body.
  • 18. The power semiconductor device according to claim 17, whereinsaid case body is made of a metal.
  • 19. The power semiconductor device according to claim 1, further comprising:a coolant outlet disposed in linear relationship with the coolant inlet such that the coolant only cools the first side surface of the discrete semiconductor element.
  • 20. The power semiconductor device according to claim 1, further comprising:a coolant outlet dispersed on a same side of the coolant inlet, wherein the duct comprises a U-shape such that the coolant flows into the coolant inlet, through the U-shaped duct, and out of the coolant outlet such that both side surfaces of the discrete semiconductor element are cooled.
  • 21. The power semiconductor device according to claim 1, further comprising:a coolant inlet disposed substantially in parallel with the duct and the discrete semiconductor device such that the coolant flows along a first side surface of the discrete semiconductor element.
Priority Claims (1)
Number Date Country Kind
2002-280665 Sep 2002 JP
US Referenced Citations (6)
Number Name Date Kind
4928207 Chrysler et al. May 1990 A
4996589 Kajiwara et al. Feb 1991 A
5198889 Hisano et al. Mar 1993 A
5672548 Culnane et al. Sep 1997 A
6313520 Yoshida et al. Nov 2001 B1
20020185718 Mikubo et al. Dec 2002 A1
Foreign Referenced Citations (5)
Number Date Country
60-37756 Feb 1985 JP
61-59741 Mar 1986 JP
2-166758 Jun 1990 JP
10-51169 Feb 1998 JP
2001-250911 Sep 2001 JP