This application claims benefit of priority to Korean Patent Application No. 10-2023-0157812 filed on Nov. 15, 2023 and Korean Patent Application No. 10-2023-0136403 filed on Oct. 13, 2023 in the Korean Intellectual Property Office, the disclosures of which are incorporated herein by reference in their entirety.
The present disclosure relates to a printed circuit board, for example, a package substrate.
Due to improved performance of a semiconductor chip, demand for a high-density package substrate has increased. Accordingly, it may be necessary to develop a package substrate which may reduce a bump pitch, may be multi-layered and have a large area, and may improve signal and power characteristics. In particular, the implementation of a fine circuit has been important to respond to the increasing number of input/output terminals. In the case in which a fine circuit of a substrate develops, a single chip package (SCP) and a single/multi-chip package (MCP) and also a 2.5D silicon interposer may be replaced.
An aspect of the present disclosure is to provide a multilayer printed circuit board including a fine circuit.
An aspect of the present disclosure is to provide a printed circuit board which may reduce manufacturing costs through high yield and a process efficiency.
An aspect of the present disclosure is to manufacture a multilayer printed circuit board by manufacturing a first substrate including a fine circuit and a second substrate, and bonding the first and second substrates using hybrid metal bonding.
For example, according to an example embodiment, a printed circuit board includes a first substrate including a first wiring layer; a second substrate disposed on the first substrate and including a second wiring layer; a metal layer disposed between the first and second substrates; and a bonding layer disposed between the first and second substrates. Each of the first and second substrates includes an organic material, and the bonding layer includes an inorganic material.
For example, according to an example embodiment, a printed circuit board includes a first substrate including a first wiring layer; a second substrate disposed on the first substrate and including a second wiring layer; a metal layer disposed between the first and second substrates; and a bonding layer disposed between the first and second substrates. A wiring line having a minimum line width among wiring lines of the second wiring layer has a line width smaller than a line width of a wiring line having a minimum line width among wiring lines of the first wiring layer.
For example, according to an example embodiment, a method of manufacturing a printed circuit board includes preparing a first substrate including a plurality of first wiring layers and having a first metal layer formed on an outermost side; forming a first inorganic insulating film covering at least a portion of the first metal layer on the outermost side of the first substrate; preparing a second substrate including a plurality of second wiring layers and having a second metal layer formed on an outermost side; forming a second inorganic insulating film covering at least a portion of the second metal layer on the outermost side of the second substrate; and bonding the first and second substrates to each other such that the first and second inorganic insulating films are bonded to each other and the first and second metal layers are bonded to each other, wherein each of the first and second substrates includes an organic material.
For example, according to an example embodiment, a printed circuit board includes a first substrate including a plurality of first insulating layers, a plurality of first wiring layers disposed on or in the plurality of first insulating layers, and a plurality of first via layers penetrating at least one of the plurality of first insulating layers, respectively; a second substrate disposed on the first substrate and including a plurality of second insulating layers, a plurality of second wiring layers disposed on or in the plurality of second insulating layers, respectively, and a plurality of second via layers penetrating at least one of the plurality of second insulating layers, respectively; a metal layer disposed between the first and second substrates to connect a via layer among the plurality of first via layers which is closest to the second substrate and a via layer among the plurality of second via layers which is closed to the first substrate to each other; and an insulating bonding layer disposed between the first and second substrates to connect to the first and second substrates to each other. The via layer among the plurality of first via layers which is closest to the second substrate and the plurality of second via layers are tapered in opposite directions.
For example, according to an example embodiment, a printed circuit board includes a first substrate including a plurality of first insulating layers, a plurality of first wiring layers disposed on or in the plurality of first insulating layers, and a plurality of first via layers penetrating at least one of the plurality of first insulating layers, respectively; a second substrate disposed on the first substrate and including a plurality of second insulating layers, a plurality of second wiring layers disposed on or in the plurality of second insulating layers, respectively, and a plurality of second via layers penetrating at least one of the plurality of second insulating layers, respectively; a metal layer disposed between the first and second substrates to connect a via layer among the plurality of first via layers which is closest to the second substrate and a via layer among the plurality of second via layers which is closed to the first substrate to each other; and an insulating bonding layer disposed between the first and second substrates to connect to the first and second substrates to each other. An outmost via layer of the plurality of second via layers, connected to an outmost wiring layer of the plurality of second wiring layers, has a tapered shape such that a width thereof increases in a direction towards the metal layer.
The above and other aspects, features, and advantages of the present disclosure will be more clearly understood from the following detailed description, taken in conjunction with the accompanying drawings, in which:
Hereinafter, embodiments of the present disclosure will be described as follows with reference to the attached drawings.
Referring to
The chip related components 1020 may include a memory chip such as a volatile memory (for example, a dynamic random access memory (DRAM)), a non-volatile memory (for example, a read only memory (ROM)), a flash memory, or the like; an application processor chip such as a central processor (for example, a central processing unit (CPU)), a graphics processor (for example, a graphics processing unit (GPU)), a digital signal processor, a cryptographic processor, a microprocessor, a microcontroller, or the like; and a logic chip such as an analog-to-digital (ADC) converter, an application-specific integrated circuit (ASIC), or the like. However, the chip related components 1020 are not limited thereto, and may also include other types of chip related components. Also, the chip related components 1020 may be combined with each other.
The network related components 1030 may include protocols such as wireless fidelity (Wi-Fi) (Institute of Electrical And Electronics Engineers (IEEE) 802.11 family, or the like), worldwide interoperability for microwave access (WiMAX) (IEEE 802.16 family, or the like), IEEE 802.20, long term evolution (LTE), evolution data only (Ev-DO), high speed packet access+(HSPA+), high speed downlink packet access+(HSDPA+), high speed uplink packet access+(HSUPA+), enhanced data GSM environment (EDGE), global system for mobile communications (GSM), global positioning system (GPS), general packet radio service (GPRS), code division multiple access (CDMA), time division multiple access (TDMA), digital enhanced cordless telecommunications (DECT), Bluetooth, 3G, 4G, and 5G protocols, and any other wireless and wired protocols, designated after the abovementioned protocols. However, the network related components 1030 are not limited thereto, and may also include a variety of other wireless or wired standards or protocols. Also, the network related components 1030 may be combined with each other, together with the chip related components 1020 described above.
Other components 1040 may include a high frequency inductor, a ferrite inductor, a power inductor, ferrite beads, a low temperature co-fired ceramic (LTCC), an electromagnetic interference (EMI) filter, a multilayer ceramic capacitor (MLCC), or the like. However, other components 1040 are not limited thereto, and may also include passive components used for various other purposes, or the like. Also, other components 1040 may be combined with each other, together with the chip related components 1020 and/or the network related components 1030 described above.
Depending on a type of the electronic device 1000, the electronic device 1000 may include other components which may or may not be physically or electrically connected to the mainboard 1010. The other components may include, for example, a camera module 1050, an antenna module 1060, a display 1070, and a battery 1080. However, the other components are not limited thereto, and may include an audio codec, a video codec, a power amplifier, a compass, an accelerometer, a gyroscope, a speaker, a mass storage unit (for example, a hard disk drive), a compact disk (CD) drive, a digital versatile disk (DVD) drive, or the like. The other components may also include other components used for various purposes depending on a type of electronic device 1000.
The electronic device 1000 may be a smartphone, a personal digital assistant (PDA), a digital video camera, a digital still camera, a network system, a computer, a monitor, a tablet PC, a laptop PC, a netbook PC, a television, a video game machine, a smartwatch, an automotive component, or the like. However, the electronic device 1000 is not limited thereto, and may be any other electronic device processing data.
Referring to
Referring to the drawing, a printed circuit board 500A according to an example may include a first substrate 100 including a plurality of first wiring layers 121, 122, 123, 124, 125, and 126 and including a first metal layer M1 disposed on an upper side thereon, a second substrate 200 disposed on the first substrate 100, and including a plurality of second wiring layers 221, 222, 223, 224, 225, and 226 and a second metal layer M2 disposed on a lower side thereon, and an insulating layer 300 disposed between the first and second substrates 100 and 200 and burying at least a portion of each of the first and second metal layers M1 and M2. If desired, a first resist layer 150 disposed on a lower side of the first substrate 100 and having a plurality of first openings h1 exposing at least a portion of a 1-1 wiring layer 121, and a second resist layer 250 disposed on the second substrate 200 and having a plurality of second openings h2 exposing at least a portion of a 2-1 wiring layer 221 may be further included. Each of the first and second substrates 100 and 200 may be configured as a multilayer substrate, as described later. The second substrate 200 may be configured as a fine circuit substrate having a relatively fine pitch as compared to the first substrate 100. For example, the second substrate 200 may be configured as a circuit substrate having higher-density than that of the first substrate 100. The first and second metal layers M1 and M2 may be bonded to each other using hybrid metal bonding along with the insulating layer 300. For example, an upper surface of the first metal layer M1 and a lower surface of the second metal layer M2 may be bonded to each other. The first and second metal layers M1 and M2 may be bonded to each other and may be integrated into the metal layer M. A boundary between the first and second metal layers M1 and M2 may or may not be distinct. The bonding layer 300 may be disposed adjacent to the metal layer M.
To implement a fine circuit, the substrate may use a semi additive process (SAP) or buried trace substrate (ETS) method. For example, by the ETS method, a structure in which a pattern may be buried in an insulating material, and no undercut may occur when etching a seed layer of chemical copper plating, such that adhesive force between a pattern and an insulating material may be excellent. Accordingly, regardless of excellence of the SAP or ETS method, low yield of a layer in which a fine circuit may be implemented may affect overall yield.
The printed circuit board 500A according to one example may have a structure in which the first substrate 100 having a relatively large wiring density, and the second substrate 200 having a relatively small wiring density may be separately manufactured and may be bonded using hybrid metal bonding. In this case, even when a low-density substrate is manufactured with a high yield and a high-density substrate is manufactured with a lower yield, only good quality substrates may be bonded to each other, thereby reducing a decrease in final cumulative yield. Also, using an optimized process according to density of wiring, a line width of a wiring line and a distance between the wiring lines, and a pitch of a wiring pad, process efficiency may be increased and efficiency may be obtained in terms of costs. Also, since the first and second substrates 100 and 200 may be bonded to each other through hybrid metal bonding by the insulating layer 300 and the first and second metal layers M1 and M2, an overall thickness of the substrate may be reduced, bonding reliability may be improved, and since it may be necessary to form a bonding pad, design freedom may be increased.
In the description below, the components of the printed circuit board 500A according to an example may be described in greater detail with reference to the drawings.
The first substrate 100 may be configured as a multilayer printed circuit board. For example, the first substrate 100 may include a plurality of first insulating layer 111, 112, 113, 114, and 115, a plurality of first wiring layers 121, 122, 123, 124, 125, and 126 disposed on or in the plurality of first insulating layer 111, 112, 113, 114, and 115, respectively, and a plurality of first via layers 131, 132, 133, 134, and 135 penetrating at least one of the plurality of first insulating layers 111, 112, 113, 114, and 115, respectively. Among the plurality of first wiring layers 121, 122, 123, 124, 125, and 126, a wiring layer 1-6 disposed on an uppermost side may include the first metal layer M1. The first substrate 100 may be configured as a coreless-type multilayer printed circuit board not including a core layer. At least one of the plurality of first insulating layers 111, 112, 113, 114, and 115 may include an organic material.
The plurality of first insulating layers 111, 112, 113, 114, and 115 may be configured as an organic insulating layer. For example, the plurality of first insulating layers 111, 112, 113, 114, and 115 may include an organic insulating material. The organic insulating material may include a thermosetting resin such as an epoxy resin, a thermoplastic resin such as polyimide, or a material including an inorganic filler, an organic filler, and/or glass fiber (glass cloth, glass fabric) along with resin. For example, the organic insulating material may be a non-photosensitive insulating material such as copper clad laminate (CCL), Ajinomoto build-up film (ABF), or prepreg (PPG), but an example embodiment example thereof is not limited thereto, and other polymer materials may be used. The glass core layer may include glass. If desired, at least one of the plurality of first insulating layers 111, 112, 113, 114, and 115 may include other types of insulating materials other than an organic insulating material such as glass and ceramic. However, even in this case, other layers may include an organic insulating material.
Each of the plurality of first wiring layers 121, 122, 123, 124, 125, and 126 may include a metal. The metal may include copper (Cu), aluminum (Al), silver (Ag), tin (Sn), gold (Au), nickel (Ni), lead (Pb), titanium (Ti), and/or alloys thereof. Preferably, copper (Cu) may be included, but an embodiment example thereof is not limited thereto. Each of the plurality of first wiring layers 121, 122, 123, 124, 125, and 126 may perform various functions depending on a design. For example, a signal pattern, a power pattern, and a ground pattern may be included. The patterns may have various forms such as a line form, a plain form, and a pad form. Each of the plurality of first wiring layers 121, 122, 123, 124, 125, and 126 may include a seed layer and a plating layer formed on the seed layer. The seed layer may be an electroless plating layer (or chemical copper) and/or a sputtering layer, and the plating layer may be an electrolytic plating layer (or electrical copper), but an embodiment example thereof is not limited thereto. A 1-1 wiring layer 121 may be buried in a lower side of the 1-1 insulating layer 111, such that the lower surface may be exposed from a lower surface of the 1-1 insulating layer 111-1. The 1-2 wiring layer 122 may be disposed on an upper surface of the 1-1 insulating layer 111 and buried in the 1-2 insulating layer 112. The 1-3 wiring layer 123 may be disposed on an upper surface of the 1-2 insulating layer 112 and may be buried in the 1-3 insulating layer 113. The 1-4 wiring layer 124 may be disposed on an upper surface of the 1-3 insulating layer 113 and may be buried in the 1-4 insulating layer 114. The 1-5 wiring layer 125 may be disposed on an upper surface of the 1-4 insulating layer 114 and may be buried in the 1-5 insulating layer 115. The 1-6 wiring layer 126 may be disposed on an upper surface of the 1-5 insulating layer 115. However, an embodiment example thereof is not limited thereto.
The first metal layer M1 may include various types of conductor patterns. The first metal layer M1 may be disposed in a position substantially corresponding to the second metal layer M2, and the conductor pattern of the first metal layer M1 may have a shape substantially corresponding to a conductor pattern of the second metal layer M2. The 1-6 wiring layer 126 including the first metal layer M1 may be planarized as in a process described later, and may have a thickness smaller than those of the other 1-1, 1-2, 1-3, 1-4, and 1-5 wiring layers 121, 122, 123, 124, and 125.
Each of the plurality of first via layers 131, 132, 133, 134, and 135 may include a metal. The metal may include copper (Cu), aluminum (Al), silver (Ag), tin (Sn), gold (Au), nickel (Ni), lead (Pb), titanium (Ti), and/or alloys thereof. Preferably, copper (Cu) may be included, but an embodiment example thereof is not limited thereto. Each of the plurality of first via layers 131, 132, 133, 134, and 135 may include a filled via filling a via hole, or may also include a conformal via disposed along a wall of the via hole. The plurality of first via layers 131, 132, 133, 134, and 135 may perform various functions depending on a design. For example, a ground via, a power via, and a signal via may be included. Each of the plurality of first via layers 131, 132, 133, 134, and 135 may include an electroless plating layer (or chemical copper) and an electrolytic plating layer (or electric copper). A sputtering layer may be included instead of an electroless plating layer (or chemical copper), and, if desired, both may be included. Each of the 1-1, 1-2, 1-3, 1-4, and 1-5 and the via layers 131, 132, 133, 134, and 135 may have a tapered shape in the same direction in a cross-section. For example, an upper end may be greater than a lower end in each cross-section.
The second substrate 200 may be configured as a multilayer printed circuit board. For example, the second substrate 200 may include a plurality of second insulating layers 211, 212, 213, 214, and 215, a plurality of second wiring layers 221, 222, 223, 224, 225, and 226 disposed on or in the plurality of second insulating layers 211, 212, 213, 214, and 215, respectively, and a plurality of second via layers 231, 232, 233, 234, and 235 penetrating at least one of the plurality of second insulating layers 211, 212, 213, 214, and 215, respectively. Among the plurality of second wiring layers 221, 222, 223, 224, 225, and 226, a 2-6 wiring layer 226 disposed on a lowermost side may include the second metal layer M2. The second substrate 200 may be configured as a coreless type multilayer printed circuit board not including a core layer. At least one of the plurality of second insulating layers 211, 212, 213, 214, and 215 may include an organic material.
The plurality of second insulating layers 211, 212, 213, 214, and 215 may be an organic insulating layer. For example, the plurality of second insulating layers 211, 212, 213, 214, and 215 may include an organic insulating material. The organic insulating material may include a thermosetting resin such as an epoxy resin, a thermoplastic resin such as polyimide, or a material including an inorganic filler, an organic filler, and/or glass fiber (glass cloth, glass fabric) along with resin. For example, the organic insulating material may be a non-photosensitive insulating material such as copper clad laminate (CCL), Ajinomoto build-up film (ABF), or prepreg (PPG), but an example embodiment example thereof is not limited thereto, and other polymer materials may be used. If desired, plurality of second insulating layers 211, 212, 213, 214, and 215 may each include a photosensitive insulating material such as a photoimageable dielectric (PID). If desired, the plurality of second insulating layers 211, 212, 213, 214, and 215 may include other types of insulating materials other than an organic insulating material such as glass and ceramic. However, even in this case, the other layers may include an organic insulating material.
The plurality of second insulating layers 211, 212, 213, 214, and 215 may have the same number of layers as the plurality of first insulating layers 111, 112, 113, 114, and 115, and an overall thickness may be substantially the same. Also, the plurality of second wiring layers 221, 222, 223, 224, 225, and 226 may have the same number of layers as the plurality of first wiring layers 121, 122, 123, 124, 125, and 126. Also, the plurality of second insulating layers 211, 212, 213, 214, and 215 may include substantially the same insulating material as that of the plurality of first insulating layers 111, 112, 113, 114, and 115. For example, the first and second substrates 100 and 200 may have an approximately symmetrical structure. However, but an embodiment example thereof is not limited thereto, and the plurality of second insulating layers 211, 212, 213, 214, and 215 may include an insulating material different from that of the plurality of first insulating layers 111, 112, 113, 114, and 115. For example, the plurality of first insulating layers 111, 112, 113, 114, and 115 may include non-photosensitive insulating materials such as ABF (Ajinomoto Build-up Film) and PPG (Prepreg), whereas each of the plurality of second insulating layers 211, 212, 213, 214, and 215 may include a photosensitive insulating material such as a photoimageable dielectric (PID). In this case, the plurality of 2-1, 2-2, 2-3, 2-4, and 2-5 insulating layers 211, 212, 213, 214, and 215 may have thicknesses of the plurality of 1-1, 1-2, 1-3, 1-4, and 1-5 insulating layers 111, 112, 113, 114, and 115, respectively, but an embodiment example thereof is not limited thereto. Also, in this case, the plurality of 2-1, 2-2, 2-3, 2-4, and 2-5, 2-6 wiring layers 221, 222, 223, 224, 225, and 226 may have thicknesses of the plurality of 1-1, 1-2, 1-3, 1-4, and 1-5, 1-6 wiring layer 121, 122, 123, 124, 125, and 126, respectively, but an embodiment example thereof is not limited thereto.
The plurality of second wiring layers 221, 222, 223, 224, 225, and 226 may include a metal. The metal may include copper (Cu), aluminum (Al), silver (Ag), tin (Sn), gold (Au), nickel (Ni), lead (Pb), titanium (Ti), and/or alloys thereof. Preferably, copper (Cu) may be included, but an embodiment example thereof is not limited thereto. Each of the plurality of second wiring layers 221, 222, 223, 224, 225, and 226 may perform various functions depending on a design. For example, a signal pattern, a power pattern, and a ground pattern may be included. Each of the patterns may have various forms such as a line form, a plain form, and a pad form. Each of the plurality of second wiring layers 221, 222, 223, 224, 225, and 226 may include a seed layer and a plating layer formed on the seed layer. The seed layer may be an electroless plating layer (or chemical copper) and/or a sputtering layer, and the plating layer may be an electrolytic plating layer (or electrical copper), but an embodiment example thereof is not limited thereto. The 2-1 wiring layer 221 may be buried in an upper side of the 2-1 insulating layer 211, such that an upper surface may be exposed from an upper surface of the 2-1 insulating layer 211-1. The 2-2 wiring layer 222 may be disposed on a lower surface of the 2-1 insulating layer 211 and may be buried in the 2-2 insulating layer 212. The 2-3 wiring layer 223 may be disposed on a lower surface of the 2-2 insulating layer 212 and may be buried in the 2-3 insulating layer 213. The 2-4 wiring layer 224 may be disposed on a lower surface of the 2-3 insulating layer 213 and may be buried in the 2-4 insulating layer 214. The 2-5 wiring layer 225 may be disposed on a lower surface of the 2-4 insulating layer 214 and may be buried in the 2-5 insulating layer 215. The 2-6 wiring layer 226 may be disposed on a lower surface of the 2-5 insulating layer 215. However, an embodiment example thereof is not limited thereto.
At least one of the plurality of second wiring layers 221, 222, 223, 224, 225, and 226, for example, the 2-1, 2-2, and 2-3 wiring layers 221, 222, and 223, may include a fine circuit pattern P. The fine circuit pattern P may have a line/space (L/S) of 10 μm/10 μm or less, for example, 2 μm/2 μm or less. For example, the 2-1, 2-2, 2-3 wiring layers 221, 222, and 223 may have a minimum line width of a wiring line, a minimum distance between wiring lines, and a minimum pitch of a wiring pad smaller than those of at least one of plurality of first wiring layers 121, 122, 123, 124, 125, and 126, preferably, the plurality of first wiring layers 121, 122, 123, 124, 125, and 126, respectively, and density of the wiring thereof may be higher. For example, the 2-1, 2-2, 2-3 wiring layers 221, 222, and 223 may have a line/space (L/S) of a line pattern for signal connection smaller than that of at least one of the plurality of first wiring layers 121, 122, 123, 124, 125, and 126, preferably, the plurality of first wiring layers 121, 122, 123, 124, 125, and 126, respectively.
The second metal layer M2 may include various types of conductor patterns. The second metal layer M2 may be disposed in a position substantially corresponding to the first metal layer M1, and a conductor pattern of the second metal layer M2 may have a shape substantially corresponding to a conductor pattern of the first metal layer M1. The 2-6 wiring layer 226 including the second metal layer M2 may be planarized as in a process described later, and accordingly, may be thinner than the other 2-1, 2-2, 2-3, 2-4, and 2-5 wiring layers 221, 222, 223, 224, and 225, respectively.
Each of the plurality of second via layers 231, 232, 233, 234, and 235 may include a metal. The metal may include copper (Cu), aluminum (Al), silver (Ag), tin (Sn), gold (Au), nickel (Ni), lead (Pb), titanium (Ti), and/or alloys thereof. Preferably, copper (Cu) may be included, but an embodiment example thereof is not limited thereto. Each of the plurality of second via layers 231, 232, 233, 234, and 235 may include a filled via filling the via hole, or may also include a conformal via disposed along a wall surface of the via hole. The plurality of second via layers 231, 232, 233, 234, and 235 may perform various functions depending on a design. For example, a ground via, a power via, and a signal via may be included. Each of the plurality of second via layers 231, 232, 233, 234, and 235 may include an electroless plating layer (or chemical copper) and an electrolytic plating layer (or electric copper). A sputtering layer may be included instead of an electroless plating layer (or chemical copper), and, if desired, both may be included. Each of the 2-1, 2-2, 2-3, 2-4, and 2-5 via layers 231, 232, 233, 234, and 235 may have a tapered shape in the same direction in a cross-section. For example, a lower end may be greater than an upper end in each cross-section. For example, the 1-1, 1-2, 1-3, 1-4, and 1-5 via layers 131, 132, 133, 134, and 135 and the 2-1, 2-2, 2-3, 2-4, and 2-5 via layers 231, 232, 233, 234, and 235 may be tapered in opposite directions on a cross-section, respectively.
Among the plurality of first via layers 131, 132, 133, 134, and 135, the 1-5 via layer 135 disposed on an uppermost side may include a first connection via connected to the first metal layer M1, and among the plurality of second via layer 231, 232, 233, 234, and 235, the 2-5 via layer 235 disposed on a lowermost side may include a second connection via connected to the second metal layer M2, wherein the first and second connection vias may be tapered in opposite directions. For example, a width of an upper end of a first connection via may be greater than a width of a lower end in a cross-section. A width of a lower end of the second connection via may be greater than a width of an upper end in the cross-section.
The insulating layer 300 may include an insulating material which may be used for hybrid metal bonding. For example, the insulating layer 300 may include an inorganic insulating material. The inorganic insulating material may include, for example, at least one of SiO2, SiN and SiCN, but an embodiment example thereof is not limited thereto. The insulating layer 300 may bury at least a portion of each of the first and second metal layers M1 and M2. For example, the insulating layer 300 may cover at least a portion of a side surface of each of the first and second metal layers M1 and M2. However, the insulating layer 300 may be spaced apart from a lower surface of the first metal layer M1 and an upper surface of the second metal layer M2. A thickness of the bonding layer 300 may be substantially the same as a thickness of the metal layer M.
The first and second resist layers 150 and 250 may include a liquid or film-type solder resist, but an embodiment example thereof is not limited thereto, and may include other organic insulating materials such as ABF. The first and second resist layers 150 and 250 may have first and second openings h1 and h2, respectively. A plurality of the first and second openings h1 and h2 may be provided. The first and second openings h1 and h2 may be formed as solder mask defined (SMD) and/or non-solder mask defined (NSMD). The first and second openings h1 and h2 may expose at least a portion of the 1-1 and 2-1 wiring layers 121 and 221, respectively, and a surface treatment layer may be disposed on an exposed surface of the pattern. The surface treatment layer may be formed by electrolytic gold plating, electroless gold plating, organic solderability preservative (OSP) or electroless tin plating, electroless silver plating, electroless nickel plating/substituted gold plating, direct immersion gold (DIG) plating, and hot air solder leveling (HASL), but an embodiment example thereof is not limited thereto.
Referring to the drawing, differently from the printed circuit board 500A, the printed circuit board 600A according to the modified example may further include a plurality of first connection metals 410 disposed on a plurality of first openings h1 of a first resist layer 150 and connected to at least portions of the 1-1 wiring layers 121, respectively, a plurality of second connection metals 420 disposed on at least portions of the plurality of second openings h2 of the second resist layer 250, respectively, and connected to at least portions of the 2-1 wiring layers 221, and a semiconductor chip 450 surface mounted on the second resist layer 250 through the plurality of second connection metals 420. For example, the printed circuit board 500A according to one example may have a package substrate structure, and the printed circuit board 600A according to a modified example may have a semiconductor package structure including the same. The printed circuit board 600A according to the modified example may be connected to and/or mounted on another substrate 900, such as a motherboard, through the plurality of second connection metals 420.
Each of the first and second connection metals 410 and 420 may be formed using a low melting point metal, for example, solder such as tin (Sn)-aluminum (Al)-copper (Cu), but an example embodiment thereof is not limited thereto, and the material thereof is not particularly limited thereto. The first and second connection metals 410 and 420 may be balls, pins, or the like. The first and second connection metals 410 and 420 may be formed as multiple layers or a single layer. When formed as multiple layers, a copper pillar and solder may be included, and when formed as a single layer, tin-silver solder may be included, but an example embodiment example thereof is not limited thereto. A plurality of the first and second connection metals 410 and 420 may be provided, and the number of the first and second connection metals 410 and 420 is not limited to any particular example.
The semiconductor chip 450 may include an integrated circuit (IC) die in which hundreds to millions of elements are integrated into a chip. In this case, the integrated circuit may be configured as, for example, a logic chip such as a central processor (e.g., CPU), graphics processor (e.g., GPU), field programmable gate array (FPGA), digital signal processor, cryptographic processor, microprocessor, microcontroller, application processor, (e.g., AP), an analog-to-digital converter, or an application-specific IC (ASIC), but an example embodiment thereof is not limited thereto, and the integrated circuit may be configured as a memory chip such as volatile memory (e.g. DRAM), non-volatile memory (e.g. ROM), flash memory, High Bandwidth Memory (HBM), or other types such as power management IC (PMIC). The semiconductor chip 160 may be formed based on an active wafer, and in this case, silicon (Si), germanium (Ge), gallium arsenide (GaAs), or the like, may be used as a base material for each body. Various circuits may be formed in the body. A connection pad may be formed on the body, and the connection pad may include a conductive material such as aluminum (Al) or copper (Cu). The semiconductor chip 450 may be configured as a bare die, and in this case, a metal bump may be disposed on the connection pad. The semiconductor chip 450 may be configured as a packaged die, and in this case, an additional redistribution layer may be formed on the connection pad, and a metal bump may be disposed on the redistribution layer. A plurality of semiconductor chips 450 may be provided, and in this case, the semiconductor chips 450 may be of the same or different type.
If desired, an electronic component (not illustrated) may be further surface-mounted on the second resist layer 250 through the plurality of second connection metals 420. The electronic component (not illustrated) may be a chip-type component, such as a high frequency inductor, a ferrite inductor, a power inductor, ferrite beads, a low temperature co-fired ceramic (LTCC), an electromagnetic interference (EMI) filter, a multilayer ceramic capacitor (MLCC), or the like, but an embodiment example thereof is not limited thereto. A plurality of electronic components (not illustrated) may be provided, and in this case, the electronic components (not illustrated) may be of the same or different type.
The other descriptions may be substantially the same as the descriptions described in the printed circuit board 500A according to the aforementioned example. Accordingly, overlapping descriptions will not be provided.
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Referring to the drawings, the method of manufacturing a printed circuit board according to an example may include forming a first substrate portion (S1), forming a second substrate portion (S2), and bonding the first and second substrate portions to each other (S3). The forming the first substrate portion (S1) may include preparing a first substrate including a plurality of first wiring layers and a first metal layer (S1-1), forming a first insulating film covering the first metal layer on the first substrate (S1-2), and exposing the first metal layer (S1-3). The forming the second substrate portion (S2) may include preparing a second substrate including a plurality of second wiring layers and a second metal layer (S2-1), forming a second insulating film covering the second metal layer on the second substrate (S2-2), and exposing the second metal layer (S2-3).
In the description below, the method of manufacturing a printed circuit board according to an example may be described in greater detail with reference to the drawings.
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Referring to
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Through a series of processes, the first substrate portion 100-1 may be prepared. Other descriptions may be substantially the same as the descriptions of the printed circuit board 500A according to the aforementioned example, and overlapping descriptions will not be provided.
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Through a series of processes, the second substrate portion 200-1 may be prepared. Other descriptions may be substantially the same as the descriptions of the printed circuit board 500A according to the aforementioned example, and overlapping descriptions will not be provided.
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Through a series of processes, the printed circuit board 500A according to the aforementioned example may be manufactured. Other descriptions may be substantially the same as the descriptions of the printed circuit board 500A according to the aforementioned example, and overlapping descriptions will not be provided.
Referring to the drawing, first and second insulating films 310 and 320 may be in contact with each other, and also first and second metal layers M1 and M2 may be in contact with each other. Before contact, surfaces of the first and second insulating films 310 and 320 and the first and second metal layers M1 and M2 may be treated by wet cleaning or plasma activation. In this case, an inwardly curved recess may be formed on a surface of each of the first and second metal layers M1 and M2. The first and second insulating films 310 and 320 and the first and second metal layers M1 and M2 may be in contact with each other at room temperature RT. Thereafter, the first and second insulating films 310 and 320 may be bonded to each other at a first temperature. For example, at the first temperature T1, the first and second insulating films 310 and 320 may be directly bonded to each other and may be integrated into the insulating layer 300. The first temperature T1 may be lower than a second temperature T2. Thereafter, the first and second metal layers M1 and M2 may be bonded to each other at a second temperature T2. For example, at the second temperature T2, the first and second metal layers M1 and M2 may be directly bonded to each other and a metal layer M may be formed. For example, during an annealing process at the second temperature T2, each metal may be directly bonded to each other by increasing a grain size. The second temperature T2 may be a higher temperature than the first temperature T1.
Through a series of processes, the aforementioned first and second substrates portions 100-1 and 100-2 may be bonded to each other. Other descriptions may be substantially the same as descriptions of the printed circuit board 500A according to the aforementioned example, and overlapping descriptions will not be provided.
Referring to the drawing, the bonding the aforementioned first and second substrates portions 100-1 and 100-2 to each other may further include applying metal paste M3′ including a metal different from that of the first and second metal layers M1 and M2 between the first and second metal layers M1 and M2. For example, before allowing the first and second insulating films 310 and 320 and the first and second metal layers M1 and M2 to be in contact with each metal other, metal paste M3′ may be applied on an upper surface of the first metal layer M1 and/or a lower surface of the second metal layer M2. Thereafter, through the aforementioned thermal compression process, the first and second insulating films 310 and 320 may be bonded directly to each other, and the first and second metal layers M1 and M2 may also be bonded to each other through the third metal layer M3. Accordingly, an insulating layer 300 and a metal layer M may be formed.
Through a series of processes, the aforementioned first and second substrates portions 100-1 and 100-2 may be bonded to each other. Other descriptions may be substantially the same as descriptions of the printed circuit board 500A according to the aforementioned example, and overlapping descriptions will not be provided.
Referring to the drawing, the first and second metal layers M1 and M2 may be formed of nano-twinned copper instead of general copper, and the insulating layer 300 may be formed of non-conductive paste. For example, the non-conductive paste 300′ may be applied on the first metal layer M1 formed of a nano-twinned copper film, the second metal layer M2 formed of a nano-twinned copper film may be pressed thereon, may be bonded at a high temperature, and the first and second metal layers M1 and M2 may be bonded directly to each other. Alternatively, the non-conductive paste 300′ may be applied on the second metal layer M2 formed of a nano-twinned copper film, the first metal layer M1 formed of a nano-twinned copper film may be pressed thereon, may be bonded at a high temperature and the first and second metal layers M1 and M2 may be bonded directly to each other. Accordingly, the metal layer M2 and the insulating layer 300 burying the same may be formed. If desired, the non-conductive paste 300′ may be applied while the first insulating film 310 and/or the second insulating film 320 described above are formed, and in this case, the insulating layer 300 may include a first insulating film 310 and/or a second insulating film 320.
Through a series of processes, the aforementioned first and second substrates portions 100-1 and 100-2 may be bonded to each other. Other descriptions may be substantially the same as descriptions of the printed circuit board 500A according to the aforementioned example, and overlapping descriptions will not be provided.
Referring to the drawings, differently from the printed circuit board 500A according to the aforementioned example and the printed circuit board 600A according to the modified example, in the printed circuit board 500B according to another example and the printed circuit board 600B according to the modified example, a first substrate 100 and a second substrate 200 may have an asymmetric structure. For example, a thickness of the second substrate 200 may be smaller than that of the first substrate 100. For example, the number of the plurality of second insulating layers 211, 212, and 215 may be less than the number of the plurality of first insulating layers 111, 112, 113, 114, and 115, and an overall thickness of the plurality of second insulating layers 211, 212, and 215 may also be smaller. Also, the number of the plurality of second wiring layers 221, 222, 223, and 226 may be less than the number of the plurality of first wiring layers 121, 122, 123, 124, 125, and 126. Also, the number of the plurality of second via layers 231, 232, and 235 may be less than the number of the plurality of first via layers 131, 132, 133, 134, 135, and 136. Thicknesses of the plurality of 2-1, 2-2, and 2-5 insulating layers 211, 212, 215 may be smaller than those of the plurality of 1-1, 1-2, 1-3, 1-4, and 1-5 insulating layers 111, 112, 113, 114, and 115. Also, thicknesses of the plurality of 2-1, 2-2, 2-3, 2-6 wiring layers 221, 222, 223, and 226 may be smaller than those of the plurality of 1-1, 1-2, 1-3, 1-4, and 1-5, 1-6 wiring layer 121, 122, 123, 124, 125, and 126. Also, widths of upper ends and widths of lower ends of the plurality of 2-1, 2-2, 2-5 via layers 231, 232, and 235 may smaller than those of the plurality of 1-1, 1-2, 1-3, 1-4, and 1-5 via layer 131, 132, 133, 134, and 135. Wirings of the plurality of 2-1, 2-2, 2-3, and 2-6 wiring layers 221, 222, 223, and 226 may have a finer pitch than those of wirings of the plurality of 1-1, 1-2, 1-3, 1-4, and 1-5, 1-6 wiring layer 121, 122, 123, 124, 125, and 126. Also, a via of each of the plurality of 2-1, 2-2, and 2-5 via layer 231, 232, and 235 may have a finer pitch than those of vias of the plurality of 1-1, 1-2, 1-3, 1-4, and 1-5 via layer 131, 132, 133, 134, and 135. For example, the first and second substrates 100 and 200 may have an asymmetric structure with different numbers of layers.
Other descriptions may be substantially the same as descriptions of the printed circuit board 500A according to the aforementioned example and the printed circuit board 600A according to the modified example. Accordingly, overlapping descriptions will not be provided.
Referring to the drawings, differently from the printed circuit board 500A according to the aforementioned example and the printed circuit board 600A according to the modified example, in the printed circuit board 500C according to another example and the printed circuit board 600C according to the modified example, the first substrate 100 may be a core-type multilayer printed circuit board rather than a coreless type multilayer printed circuit board. For example, the first substrate 100 may include a 1-1 insulating layer 111, 1-1 and 1-2 wiring layers 121, 122 disposed on a lower surface and an upper surface of the 1-1 insulating layer 111, respectively, a first via layer 131 penetrating the 1-1 insulating layer 111 and connecting 1-1 and 1-2 wiring layers 121 and 122 to each other, a 1-2 insulating layer 112 disposed on a lower surface of 1-1 insulating layer 111 and covering the 1-1 wiring layer 121, a 1-3 wiring layer 123 disposed on a lower surface of 1-2 insulating layer 112, a second via layer 132 penetrating the 1-2 insulating layer 112 and connecting the 1-1 and 1-3 wiring layers 121 and 123 to each other, a 1-3 insulating layer 113 disposed on an upper surface of the 1-1 insulating layer 111 and covering the 1-2 wiring layer 122, a 1-4 wiring layer 124 disposed on an upper surface of the 1-3 insulating layer 113, a third via layer 133 penetrating the 1-3 insulating layer 113 and connecting the 1-2 and 1-4 wiring layers 122 and 124 to each other, a 1-4 insulating layer 114 disposed on a lower surface of the 1-2 insulating layer 112 and covering the 1-3 wiring layer 123, a fourth via layer 134 penetrating the 1-5 wiring layer 125 and the 1-4 insulating layer 114 disposed on a lower surface of the 1-4 insulating layer 114 and connecting the 1-3 and 1-5 wiring layers 123 and 125 to each other, a 1-5 insulating layer 115 disposed on an upper surface of the 1-3 insulating layer 113 and covering the 1-4 wiring layer 124, a 1-6 wiring layer 126 disposed on an upper surface of the 1-5 insulating layer 115, and a fifth via layer 135 penetrating the 1-5 insulating layer 115 and connecting the 1-4 and 1-6 wiring layers 124 and 126 to each other. The first insulating film 310 may be disposed on the upper surface of the 1-5 insulating layers 115 and may cover at least a portion of the first metal layer M1. The first resist layer 150 may be disposed on the lower surface of the 1-4 insulating layer 114 and may cover at least a portion of the 1-5 wiring layer 125. The plurality of first openings h1 may expose at least a portion of each of the 1-5 wiring layers 125. As described above, the first substrate 100, a low-density substrate having relatively small wiring density, may be manufactured as a core-type multilayer printed circuit board, and the second substrate 200, a high-density substrate having relatively high wiring density, may be manufactured as a coreless type multilayer printed circuit board. The 1-1 insulating layer 111 may be a core layer, and the 1-2, 1-3, 1-4, and 1-5 insulating layers 112, 113, 114, and 115 may be build-up layers. The 1-1 insulating layer 111 may have a thickness greater than those of the 1-2, 1-3, 1-4, and 1-5 insulating layers 112, 113, 114, and 115. The 1-1 insulating layer 111 may include copper clad laminate (CCL), and each of the 1-2, 1-3, 1-4, and 1-5 insulating layers 112, 113, 114, and 115 may include Ajinomoto build-up film (ABF) or prepreg (PPG), but an embodiment example thereof is not limited thereto. The 1-1 insulating layer 111 may include types of insulating materials other than organic insulating materials such as glass and ceramic. If desired, the component may also include a metal covered with an insulating film. The 1-1 via layer 131 may have an hourglass shape or a pillar shape in a cross-section. Also, the 1-2 and 1-4 via layers 132 and 134 may have a tapered shape of which a width of a lower end may be greater than a width of an upper end in a cross-section. Also, the 1-3 and 1-5 via layers 133 and 135 may have a tapered shape of which a width of a lower end may be less than a width of an upper end in a cross-section. However, an embodiment example thereof is not limited thereto, and various forms of via structures may be applied.
Other descriptions may be substantially the same as descriptions of the printed circuit board 500A according to the aforementioned example and the printed circuit board 600A according to the modified example. Accordingly, overlapping descriptions will not be provided.
Referring to the drawings, differently from the printed circuit board 500C according to another example described above and printed circuit board 600C according to the modified example, in the printed circuit board 500D according to another example and printed circuit board 600D according to the modified example, the first substrate 100 and the second substrate 200 may have asymmetric structure in various forms. For example, the first substrate 100 may be a core-type multilayer printed circuit board, the second substrate 200 may be a coreless type multilayer printed circuit board, the number of the plurality of second insulating layer 211, 212, and 215 may be less than the number of the plurality of first insulating layer 111, 112, 113, 114, and 115, and overall thicknesses may also be smaller. Also, the number of the plurality of second wiring layers 221, 222, 223, and 226 may be less than the number of the plurality of first wiring layers 121, 122, 123, 124, 125, and 126. Also, the number of the plurality of second via layers 231, 232, and 235 may be less than the number of the plurality of first via layers 131, 132, 133, 134, 135, and 136. Also, a thickness of the second substrate 200 may be smaller than that of the first substrate 100. The plurality of 2-1, 2-2, and 2-5 insulating layers 211, 212, and 215 may have thicknesses smaller than those of the plurality of 1-1, 1-2, 1-3, 1-4, and 1-5 insulating layers 111, 112, 113, 114, and 115. Also, the plurality of 2-1, 2-2, 2-3, and 2-6 wiring layers 221, 222, 223, and 226 may have thicknesses smaller than those of the plurality of 1-1, 1-2, 1-3, 1-4, 1-5, and 1-6 wiring layers 121, 122, 123, 124, 125, and 126. Also, widths of upper ends and widths of lower ends of the plurality of 2-1, 2-2, 2-5 via layers 231, 232, and 235 may be smaller than those of the plurality of 1-1, 1-2, 1-3, and 1-4, and 1-5 via layer 131, 132, 133, 134, and 135. Wirings of the plurality of 2-1, 2-2, 2-3, and 2-6 wiring layers 221, 222, 223, and 226 may have a finer pitch than that of the plurality of 1-1, 1-2, 1-3, 1-4, 1-5, and 1-6 wiring layers 121, 122, 123, 124, 125, and 126. Also, vias of the plurality of 2-1, 2-2, and 2-5 via layer 231, 232, and 235 may have a finer pitch than that of the plurality of 1-1, 1-2, 1-3, 1-4, and 1-5 via layer 131, 132, 133, 134, and 135. For example, the first and second substrates 100 and 200 may have different asymmetric structures with different numbers of layers.
Other descriptions may be the same as those of the printed circuit board 500A according to the aforementioned example, the printed circuit board 600A according to the modified example, the printed circuit board 500C according to another example described above and the printed circuit board 600C according to the modified example. Accordingly, overlapping descriptions will not be provided.
According to the aforementioned example embodiments, a multilayer printed circuit board including a fine circuit may be provided.
Also, a printed circuit board which may reduce manufacturing costs by high yield and a process efficiency may be provided.
In the present disclosure, the term “covering” may include the configuration in which the component is entirely covered and at least a portion of the component is covered, or the component is directly or indirectly covered. Also, the term “fill” may include the configuration in which the component is completely filled, and also at least a portion of the component is filled, and the component is almost filled. For example, a void may be present. Also, the term “surrounding” may include the configuration in which the component is completely surrounded, and is also almost surrounded. Also, the term “exposing” may include the configuration in which the component is completely exposed or a portion thereof is exposed, and the exposing may refer to exposing from the buried component. For example, the configuration in which the opening may expose a pad may include exposing a pad from the resist layer, and a surface treatment layer may be further disposed on the exposed pad.
In the example embodiment, the configuration in which the component is disposed in a through-portion or a through-hole may include the configuration in which the component is completely disposed in the through-portion or through-hole, and also the configuration in which the component partially protrudes to an upper side or a lower side on a cross-section. For example, in the case in which the component is disposed in a through-portion or through-hole on a plane, the configuration may be understood in a broader sense.
In the present disclosure, the term “cross-section” refers to the cross-sectional shape when the object is cut vertically, or the cross-sectional shape when the object is cut vertically, or the cross-sectional shape when the object is viewed from the side. Also, the configuration in which the components are on a plane may indicate a planar shape when the object is cut horizontally, or a planar shape when the object is viewed from above or below.
In the present disclosure, the terms “lower side,” “lower portion,” and “lower surface” may be used to refer to a downward direction based on the cross-section of the drawing, and “upper side,” “upper portion,” “upper surface” may be used to refer to the opposite direction. However, this direction is defined for ease of description, and the scope of the patent claims is not particularly limited by the description of the direction, and the terms “upper and lower sides” may be relative terms.
In the example embodiments, the term “connected” may not only refer to “directly connected” but also include “indirectly connected” by may refer to of an adhesive layer, or the like. Also, the term “electrically connected” may include both the case in which elements are “physically connected” and the case in which elements are “not physically connected.” Further, the terms “first,” “second,” and the like may be used to distinguish one element from the other, and may not limit a sequence and/or an importance, or others, in relation to the elements. In some cases, a first element may be referred to as a second element, and similarly, a second element may be referred to as a first element without departing from the scope of right of the example embodiments.
A thickness, width, length, depth, line width, distance, pitch, and the like, may be measured using a scanning microscope or an optical microscope based on a cross section of a printed circuit board which may be polished or cut. The cross-section may be a vertical cross-section or a horizontal cross-section, and each value may be measured based on the required cross-section. For example, a width of an upper end and/or lower end of a via may be measured on a cross-section cut along a central axis of the via. In this case, when the value is not constant, the value may be determined as an average value of the values measured at five random points. A minimum value may be determined as the smallest value measured on the corresponding layer or region.
In the example embodiments, the term “example embodiment” may not refer to one same example embodiment, and may be provided to describe and emphasize different unique features of each example embodiment. The above suggested example embodiments may be implemented do not exclude the possibilities of combination with features of other example embodiments. For example, even though the features described in an example embodiment are not described in the other example embodiment, the description may be understood as relevant to the other example embodiment unless otherwise indicated.
An expression used in the singular encompasses the expression of the plural, unless it has a clearly different meaning in the context.
While the example embodiments have been illustrated and described above, it will be apparent to those skilled in the art that modifications and variations could be made without departing from the scope of the present disclosure as defined by the appended claims.
Number | Date | Country | Kind |
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10-2023-0136403 | Oct 2023 | KR | national |
10-2023-0157812 | Nov 2023 | KR | national |