BRIEF DESCRIPTION OF THE DRAWINGS
FIG. 1 is a plan view schematically showing the construction of a substrate processing apparatus according to an embodiment of the present invention;
FIGS. 2A and 2B are sectional views of a second processing unit appearing in FIG. 1; specifically:
FIG. 2A is a sectional view taken along line II-II in FIG. 1; and
FIG. 2B is an enlarged view of a portion A shown in FIG. 2A;
FIG. 3 is a sectional view of a third processing unit appearing in FIG. 1;
FIG. 4 is a plan view schematically showing the construction of an oxygen gas supply ring appearing in FIG. 3;
FIG. 5 is a plan view schematically showing the construction of a slot electrode appearing in FIG. 3;
FIGS. 6A, 6B, and 6C are plan views showing variations of the slot electrode shown in FIG. 5; specifically:
FIG. 6A is a view showing a first variation;
FIG. 6B is a view showing a second variation; and
FIG. 6C is a view showing a third variation;
FIG. 7 is a perspective view schematically showing the construction of a second process ship appearing in FIG. 1;
FIG. 8 is a diagram schematically showing the construction of a unit-driving dry air supply system for a second load lock unit appearing in FIG. 7;
FIG. 9 is a diagram schematically showing the construction of a system controller for the substrate processing apparatus shown in FIG. 1;
FIG. 10 is a flowchart of a deposit film removal process as a substrate processing method according to the above embodiment;
FIG. 11 is a plan view schematically showing the construction of a first variation of the substrate processing apparatus according to the above embodiment;
FIG. 12 is a plan view schematically showing the construction of a second variation of the substrate processing apparatus according to the above embodiment; and
FIG. 13 is a sectional view showing a deposit film comprised of an SiOBr layer, a CF-type deposit layer, and an SiOBr layer.