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Toshiyuki SAMESHIMA
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Fuchu-shi, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Photoinduced carrier lifetime measurement device and photoinduced c...
Patent number
10,126,253
Issue date
Nov 13, 2018
National University Corporation Tokyo University of Agriculture and Technology
Toshiyuki Sameshima
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Photoinduced carrier lifetime measuring method, light incidence eff...
Patent number
9,239,299
Issue date
Jan 19, 2016
National University Corporation Tokyo University of Agriculture and Technology
Toshiyuki Sameshima
G01 - MEASURING TESTING
Information
Patent Grant
Manufacturing method of thin film semiconductor substrate
Patent number
8,258,043
Issue date
Sep 4, 2012
National University Corporation Tokyo University of Agriculture and Technology
Toshiyuki Sameshima
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Process of manufacturing semiconductor device
Patent number
6,458,715
Issue date
Oct 1, 2002
Sony Corporation
Naoki Sano
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Process of manufacturing semiconductor devices
Patent number
6,291,366
Issue date
Sep 18, 2001
Sony Corporation
Naoki Sano
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Thin film transistor and manufacturing method of the thin film tran...
Patent number
5,910,015
Issue date
Jun 8, 1999
Sony Corporation
Toshiyuki Sameshima
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor device having first and second insulating layers
Patent number
5,894,159
Issue date
Apr 13, 1999
Sony Corporation
Hiroshi Mori
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor device having an improved thin film transistor
Patent number
5,889,292
Issue date
Mar 30, 1999
Sony Corporation
Toshiyuki Sameshima
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Insulation film-forming method for semiconductor device manufacturi...
Patent number
5,804,454
Issue date
Sep 8, 1998
Sony Corporation
Hiroshi Mori
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor device having an improved thin film transistor
Patent number
5,726,487
Issue date
Mar 10, 1998
Sony Corporation
Toshiyuki Sameshima
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and apparatus for fabricating a thin film semiconductor device
Patent number
5,648,276
Issue date
Jul 15, 1997
Sony Corporation
Masaki Hara
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Field effect transistor having channel with plural quantum boxes ar...
Patent number
5,608,231
Issue date
Mar 4, 1997
Sony Corporation
Ryuichi Ugajin
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Method of manufacturing Si-Ge thin film transistor
Patent number
5,591,653
Issue date
Jan 7, 1997
Sony Corporation
Toshiyuki Sameshima
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Heating method and manufacturing method for semiconductor device
Patent number
5,561,088
Issue date
Oct 1, 1996
Sony Corporation
Toshiyuki Sameshima
F27 - FURNACES KILNS OVENS RETORTS
Information
Patent Grant
Insulated-gate-type field effect transistor which has subgates that...
Patent number
5,446,304
Issue date
Aug 29, 1995
Sony Corporation
Toshiyuki Sameshima
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of forming semiconductor crystal and semiconductor device
Patent number
5,431,126
Issue date
Jul 11, 1995
Sony Corporation
Toshiyuki Sameshima
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Plasma system comprising hollow mesh plate electrode
Patent number
5,304,250
Issue date
Apr 19, 1994
Sony Corporation
Toshiyuki Sameshima
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Grant
Method of crystallizing a semiconductor thin film
Patent number
5,145,808
Issue date
Sep 8, 1992
Sony Corporation
Toshiyuki Sameshima
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
PHOTOINDUCED CARRIER LIFETIME MEASURING METHOD, LIGHT INCIDENCE EFF...
Publication number
20120310556
Publication date
Dec 6, 2012
NATIONAL UNIVERSITY CORPORATION TOKYO UNIVERSITY OF AGRICULTURE AND TECHNOLOGY
Toshiyuki Sameshima
G01 - MEASURING TESTING
Information
Patent Application
MANUFACTURING METHOD OF THIN FILM SEMICONDUCTOR SUBSTRATE
Publication number
20120077331
Publication date
Mar 29, 2012
NISSIN ION EQUIPMENT CO., LTD.
Toshiyuki SAMESHIMA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD OF HEAT-TREATING SEMICONDUCTOR
Publication number
20090253273
Publication date
Oct 8, 2009
Hightec Systems Corporation
Naoki Sano
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Pattern forming method for semiconductor manufacturing
Publication number
20010022387
Publication date
Sep 20, 2001
Naoki Sano
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Process of manufacturing semiconductor device
Publication number
20010019901
Publication date
Sep 6, 2001
Naoki Sano
H01 - BASIC ELECTRIC ELEMENTS