Aspects of interferometers not specifically covered by any group under G01B9/02

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G01B2290/00

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Industries

Patents Grantslast 30 patents

Information Patent Grant
Interferometer and optical instrument with integrated optical compo...
- Patent number 11,933,609
- Issue date Mar 19, 2024
- Yokogawa Electric Corporation
- Nobuhide Yamada
- G01 - MEASURING TESTING
Information Patent Grant
Quantum interferometer with improved entangled photon identification
- Patent number 11,933,608
- Issue date Mar 19, 2024
- Qubit Moving and Storage, LLC
- Gary Vacon
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and methods for determining the position of a target stru...
- Patent number 11,927,891
- Issue date Mar 12, 2024
- ASML Netherlands B.V.
- Nitesh Pandey
- G01 - MEASURING TESTING
Information Patent Grant
System and method for correcting optical path length measurement er...
- Patent number 11,920,928
- Issue date Mar 5, 2024
- Tokyo Electron Limited
- Kenji Nagai
- G01 - MEASURING TESTING
Information Patent Grant
Non-contact angle measuring apparatus
- Patent number 11,903,755
- Issue date Feb 20, 2024
- Weng-Dah Ken
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device and method for measuring thickness and refractive index of m...
- Patent number 11,906,281
- Issue date Feb 20, 2024
- Korea Research Institute of Standards and Science
- Young-Sik Ghim
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems of holographic interferometry
- Patent number 11,892,292
- Issue date Feb 6, 2024
- RD Synergy Ltd.
- Dov Furman
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Device for interferometric distance measurement
- Patent number 11,885,607
- Issue date Jan 30, 2024
- Dr. Johannes Heidenhain GmbH
- Herbert Huber-Lenk
- G01 - MEASURING TESTING
Information Patent Grant
Laser interferometer having a vibrator to modulate light for displa...
- Patent number 11,879,730
- Issue date Jan 23, 2024
- Seiko Epson Corporation
- Jun Kitagawa
- G02 - OPTICS
Information Patent Grant
Mirror unit and optical module
- Patent number 11,879,731
- Issue date Jan 23, 2024
- Hamamatsu Photonics K.K.
- Tomofumi Suzuki
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Interferometric measurement method and interferometric measurement...
- Patent number 11,879,721
- Issue date Jan 23, 2024
- Carl Zeiss SMT GmbH
- Alexander Wolf
- G01 - MEASURING TESTING
Information Patent Grant
Optomechanical inertial reference mirror for atom interferometer an...
- Patent number 11,867,713
- Issue date Jan 9, 2024
- Arizona Board of Regents on behalf of the University of Arizona
- Felipe Guzmán
- G01 - MEASURING TESTING
Information Patent Grant
Heterodyne one-dimensional grating measuring device and measuring m...
- Patent number 11,860,057
- Issue date Jan 2, 2024
- Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of...
- Wenhao Li
- G01 - MEASURING TESTING
Information Patent Grant
System for precision displacement measurement based on self-traceab...
- Patent number 11,802,758
- Issue date Oct 31, 2023
- Tongji University
- Xiao Deng
- G01 - MEASURING TESTING
Information Patent Grant
System and method for measuring using multiple modalities
- Patent number 11,802,760
- Issue date Oct 31, 2023
- Hexagon Metrology, Inc.
- Milan Kocic
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Simultaneous phase-shift point diffraction interferometer and metho...
- Patent number 11,788,829
- Issue date Oct 17, 2023
- Shanghai Institute of Optics And Fine Mechanics, Chinese Academy of Sciences
- Peng Feng
- G01 - MEASURING TESTING
Information Patent Grant
Axial length measurement monitor
- Patent number 11,779,206
- Issue date Oct 10, 2023
- Acucela Inc.
- Ryo Kubota
- G01 - MEASURING TESTING
Information Patent Grant
Thin films and surface topography measurement using polarization re...
- Patent number 11,761,753
- Issue date Sep 19, 2023
- Svarog LLC
- Boris V. Kamenev
- G01 - MEASURING TESTING
Information Patent Grant
Multi-environment Rayleigh interferometer
- Patent number 11,761,750
- Issue date Sep 19, 2023
- Aaron Pung
- G01 - MEASURING TESTING
Information Patent Grant
Micro optic assemblies and optical interrogation systems
- Patent number 11,761,754
- Issue date Sep 19, 2023
- Intuitive Surgical Operations, Inc.
- Mark E. Froggatt
- G01 - MEASURING TESTING
Information Patent Grant
Demodulation of fiber optic interferometric sensors
- Patent number 11,747,133
- Issue date Sep 5, 2023
- Board of Trustees of Michigan State University
- Ming Han
- G01 - MEASURING TESTING
Information Patent Grant
Laser interferometer
- Patent number 11,733,027
- Issue date Aug 22, 2023
- Seiko Epson Corporation
- Kohei Yamada
- G01 - MEASURING TESTING
Information Patent Grant
Atom interferometer
- Patent number 11,725,926
- Issue date Aug 15, 2023
- Nomad Atomics Pty Ltd
- Kyle Sage Hardman
- G01 - MEASURING TESTING
Information Patent Grant
Interferometer system, method of determining a mode hop of a laser...
- Patent number 11,719,529
- Issue date Aug 8, 2023
- ASML Netherlands B.V.
- Maarten Jozef Jansen
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems of holographic interferometry
- Patent number 11,719,531
- Issue date Aug 8, 2023
- RD Synergy Ltd.
- Dov Furman
- G02 - OPTICS
Information Patent Grant
Systems, methods, and media for multiple reference arm spectral dom...
- Patent number 11,713,961
- Issue date Aug 1, 2023
- The General Hospital Corporation
- Guillermo J. Tearney
- G01 - MEASURING TESTING
Information Patent Grant
Interferometry with pulse broadened diode laser
- Patent number 11,680,787
- Issue date Jun 20, 2023
- Carl Zeiss Meditec, Inc.
- Alexandre R. Tumlinson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optical deflector parameter measurement device, method, and program
- Patent number 11,656,073
- Issue date May 23, 2023
- Nippon Telegraph and Telephone Corporation
- Masahiro Ueno
- G01 - MEASURING TESTING
Information Patent Grant
System and method of phase-locked fiber interferometry
- Patent number 11,644,301
- Issue date May 9, 2023
- National Technology & Engineering Solutions of Sandia, LLC
- Aaron Michael Katzenmeyer
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Optical module
- Patent number 11,635,290
- Issue date Apr 25, 2023
- Hamamatsu Photonics K.K.
- Tomofumi Suzuki
- B81 - MICRO-STRUCTURAL TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR MEASUREMENT APPARATUS
- Publication number 20240133673
- Publication date Apr 25, 2024
- Samsung Electronics Co., Ltd.
- Garam CHOI
- G01 - MEASURING TESTING
Information Patent Application
LEVEL SENSOR AND SUBSTRATE PROCESSING APPARATUS INCLUDING THE SAME
- Publication number 20240118072
- Publication date Apr 11, 2024
- Samsung Electronics Co., Ltd.
- Sungho Jang
- G01 - MEASURING TESTING
Information Patent Application
ULTRA-PRECISION TIMING CLOCK METHOD AND APPARATUS
- Publication number 20240115222
- Publication date Apr 11, 2024
- Weng-Dah Ken
- G04 - HOROLOGY
Information Patent Application
PHOTOLITHOGRAPHY MASK AND PHOTOLITHOGRAPHY SYSTEM COMPRISING SAID P...
- Publication number 20240085776
- Publication date Mar 14, 2024
- TECHNOLOGIES DIGITHO INC.
- Richard BEAUDRY
- G01 - MEASURING TESTING
Information Patent Application
MULTIPHASE OPTICAL COHERENCE MICROSCOPY IMAGING
- Publication number 20240061226
- Publication date Feb 22, 2024
- THE BOARD OF TRUSTEES OF THE UNIVERSITY OF ILLINOIS
- Stephen A. Boppart
- G02 - OPTICS
Information Patent Application
SYSTEM AND METHOD FOR MEASURING USING MULTIPLE MODALITIES
- Publication number 20240027181
- Publication date Jan 25, 2024
- Hexagon Metrology, Inc.
- Milan Kocic
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR MEASURING USING MULTIPLE MODALITIES
- Publication number 20240019241
- Publication date Jan 18, 2024
- Hexagon Metrology, Inc.
- Milan Kocic
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
QUANTUM SENSOR AND SYNXAPPS ARRAY
- Publication number 20240011763
- Publication date Jan 11, 2024
- Demond Adams
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MICRO OPTIC ASSEMBLIES AND OPTICAL INTERROGATION SYSTEMS
- Publication number 20230417541
- Publication date Dec 28, 2023
- Intuitive Surgical Operations, Inc.
- Mark E. Froggatt
- G02 - OPTICS
Information Patent Application
INTERFEROMETER DISPLACEMENT MEASUREMENT SYSTEM AND METHOD
- Publication number 20230417532
- Publication date Dec 28, 2023
- BEIJING U-PRECISION TECH CO., LTD.
- Guohua SUN
- G01 - MEASURING TESTING
Information Patent Application
AXIAL LENGTH MEASUREMENT MONITOR
- Publication number 20230414097
- Publication date Dec 28, 2023
- Acucela Inc.
- Ryo KUBOTA
- G01 - MEASURING TESTING
Information Patent Application
HETERODYNE FIBER INTERFEROMETER DISPLACEMENT MEASURING SYSTEM AND M...
- Publication number 20230408250
- Publication date Dec 21, 2023
- BEIJING U-PRECISION TECH CO.. LTD.
- Guohua SUN
- G01 - MEASURING TESTING
Information Patent Application
Quantum Interferometer with Improved Entangled Photon Identification
- Publication number 20230375327
- Publication date Nov 23, 2023
- Qubit Moving and Storage, LLC
- Gary Vacon
- G01 - MEASURING TESTING
Information Patent Application
THREE-DIMENSIONAL MEASUREMENT DEVICE
- Publication number 20230366668
- Publication date Nov 16, 2023
- CKD CORPORATION
- Hiroyuki Ishigaki
- G01 - MEASURING TESTING
Information Patent Application
HETERODYNE GRATING INTERFEROMETRY SYSTEM BASED ON SECONDARY DIFFRAC...
- Publication number 20230366667
- Publication date Nov 16, 2023
- TSINGHUA UNIVERSITY
- Yu ZHU
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETER SYSTEM AND LITHOGRAPHIC APPARATUS
- Publication number 20230332880
- Publication date Oct 19, 2023
- ASML NETHERLANDS B.V.
- Maarten Jozef JANSEN
- G01 - MEASURING TESTING
Information Patent Application
BROADBAND INTERFEROMETRY AND METHOD FOR MEASUREMENT RANGE EXTENSION...
- Publication number 20230324165
- Publication date Oct 12, 2023
- Automated Precision Inc.
- Yongwoo PARK
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETER SYSTEM, METHOD OF DETERMINING A MODE HOP OF A LASER...
- Publication number 20230324164
- Publication date Oct 12, 2023
- ASML NETHERLANDS B.V.
- Maarten Jozef JANSEN
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
COMPACT SHEAROGRAPHY SYSTEM WITH ADJUSTABLE SHEAR DISTANCE
- Publication number 20230296368
- Publication date Sep 21, 2023
- Nikon Corporation
- Eric Peter Goodwin
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL COMPLEX AMPLITUDE MEASUREMENT DEVICE AND OPTICAL COMPLEX AM...
- Publication number 20230288182
- Publication date Sep 14, 2023
- Nippon Telegraph and Telephone Corporation
- Hiroki SAKUMA
- G01 - MEASURING TESTING
Information Patent Application
THREE-DIMENSIONAL MEASUREMENT DEVICE
- Publication number 20230243643
- Publication date Aug 3, 2023
- CKD CORPORATION
- Hiroyuki Ishigaki
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL DEVICE
- Publication number 20230221106
- Publication date Jul 13, 2023
- HAMAMATSU PHOTONICS K. K.
- Tomofumi Suzuki
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
COMPACT SNAPSHOT DUAL-MODE INTERFEROMETRIC SYSTEM
- Publication number 20230168075
- Publication date Jun 1, 2023
- Arizona Board of Regents on behalf of The University of Arizona
- Rongguang Liang
- G01 - MEASURING TESTING
Information Patent Application
TRUNCATED NONLINEAR INTERFEROMETER-BASED SENSOR SYSTEM
- Publication number 20230161220
- Publication date May 25, 2023
- UT-Battelle, LLC
- Raphael C. Pooser
- B82 - NANO-TECHNOLOGY
Information Patent Application
Polarization-Separated, Phase-Shifted Interferometer
- Publication number 20230160682
- Publication date May 25, 2023
- Massachusetts Institute of Technology
- Noah GILBERT
- G01 - MEASURING TESTING
Information Patent Application
MINIATURE 3D POSITION-TO-OPTICAL DISPLACEMENT SENSOR
- Publication number 20230160685
- Publication date May 25, 2023
- THE CURATORS OF THE UNIVERSITY OF MISSOURI
- Genda CHEN
- G01 - MEASURING TESTING
Information Patent Application
FOUR-QUADRANT INTERFEROMETRY SYSTEM BASED ON AN INTEGRATED ARRAY WA...
- Publication number 20230127285
- Publication date Apr 27, 2023
- National Institute of Metrology,China
- Xiaofei Diao
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR CONCURRENT MEASUREMENTS OF INTERFEROMETRIC...
- Publication number 20230098439
- Publication date Mar 30, 2023
- ALLAGI INC.
- Michael J. Darwin
- G01 - MEASURING TESTING
Information Patent Application
HETERODYNE LIGHT SOURCE FOR USE IN METROLOGY SYSTEM
- Publication number 20230062525
- Publication date Mar 2, 2023
- MITUTOYO CORPORATION
- Nick HARTMANN
- G01 - MEASURING TESTING
Information Patent Application
POLARIZING FIZEAU INTERFEROMETER
- Publication number 20230068859
- Publication date Mar 2, 2023
- Mitutoyo Corporation
- Shimpei Matsuura
- G01 - MEASURING TESTING

Aspects of interferometers not specifically covered by any group under G01B9/02

Industry

Parent Industries

Current Industry

Sub Industries

Patents Grantslast 30 patents

Interferometer and optical instrument with integrated optical compo...

Quantum interferometer with improved entangled photon identification

Apparatus and methods for determining the position of a target stru...

System and method for correcting optical path length measurement er...

Non-contact angle measuring apparatus

Device and method for measuring thickness and refractive index of m...

Methods and systems of holographic interferometry

Device for interferometric distance measurement

Laser interferometer having a vibrator to modulate light for displa...

Mirror unit and optical module

Interferometric measurement method and interferometric measurement...

Optomechanical inertial reference mirror for atom interferometer an...

Heterodyne one-dimensional grating measuring device and measuring m...

System for precision displacement measurement based on self-traceab...

System and method for measuring using multiple modalities

Simultaneous phase-shift point diffraction interferometer and metho...

Axial length measurement monitor

Thin films and surface topography measurement using polarization re...

Multi-environment Rayleigh interferometer

Micro optic assemblies and optical interrogation systems

Demodulation of fiber optic interferometric sensors

Laser interferometer

Atom interferometer

Interferometer system, method of determining a mode hop of a laser...

Methods and systems of holographic interferometry

Systems, methods, and media for multiple reference arm spectral dom...

Interferometry with pulse broadened diode laser

Optical deflector parameter measurement device, method, and program

System and method of phase-locked fiber interferometry

Optical module

Patents Applicationslast 30 patents

SEMICONDUCTOR MEASUREMENT APPARATUS

LEVEL SENSOR AND SUBSTRATE PROCESSING APPARATUS INCLUDING THE SAME

ULTRA-PRECISION TIMING CLOCK METHOD AND APPARATUS

PHOTOLITHOGRAPHY MASK AND PHOTOLITHOGRAPHY SYSTEM COMPRISING SAID P...

MULTIPHASE OPTICAL COHERENCE MICROSCOPY IMAGING

SYSTEM AND METHOD FOR MEASURING USING MULTIPLE MODALITIES

SYSTEM AND METHOD FOR MEASURING USING MULTIPLE MODALITIES

QUANTUM SENSOR AND SYNXAPPS ARRAY

MICRO OPTIC ASSEMBLIES AND OPTICAL INTERROGATION SYSTEMS

INTERFEROMETER DISPLACEMENT MEASUREMENT SYSTEM AND METHOD

AXIAL LENGTH MEASUREMENT MONITOR

HETERODYNE FIBER INTERFEROMETER DISPLACEMENT MEASURING SYSTEM AND M...

Quantum Interferometer with Improved Entangled Photon Identification

THREE-DIMENSIONAL MEASUREMENT DEVICE

HETERODYNE GRATING INTERFEROMETRY SYSTEM BASED ON SECONDARY DIFFRAC...

INTERFEROMETER SYSTEM AND LITHOGRAPHIC APPARATUS

BROADBAND INTERFEROMETRY AND METHOD FOR MEASUREMENT RANGE EXTENSION...

INTERFEROMETER SYSTEM, METHOD OF DETERMINING A MODE HOP OF A LASER...

COMPACT SHEAROGRAPHY SYSTEM WITH ADJUSTABLE SHEAR DISTANCE

OPTICAL COMPLEX AMPLITUDE MEASUREMENT DEVICE AND OPTICAL COMPLEX AM...

THREE-DIMENSIONAL MEASUREMENT DEVICE

OPTICAL DEVICE

COMPACT SNAPSHOT DUAL-MODE INTERFEROMETRIC SYSTEM

TRUNCATED NONLINEAR INTERFEROMETER-BASED SENSOR SYSTEM

Polarization-Separated, Phase-Shifted Interferometer

MINIATURE 3D POSITION-TO-OPTICAL DISPLACEMENT SENSOR

FOUR-QUADRANT INTERFEROMETRY SYSTEM BASED ON AN INTEGRATED ARRAY WA...

SYSTEMS AND METHODS FOR CONCURRENT MEASUREMENTS OF INTERFEROMETRIC...

HETERODYNE LIGHT SOURCE FOR USE IN METROLOGY SYSTEM

POLARIZING FIZEAU INTERFEROMETER