At the point where an integrated circuit (IC) device with leads/terminations is joined to a circuit board, suitable means must be provided for making satisfactory electrical and mechanical connections between the leads/terminations and the circuit board. A lead is the metal wiring protruding from the integrated circuit package which is used to create an electrical connection with the circuit board upon which the integrated circuit will be mounted. A termination is a surface that is used to create an electrical connection between any electrical or electronic elements. A connection is deemed satisfactory when it meets industry defined requirements of visual properties of wetting and filleting and furnishes a path that does not alter the intended electrical characteristics of signals that are transmitted through it. Wetting is the ability of a liquid to spread over or cover over a solid surface with which it makes contact. Filleting is a description of the volume, height, area and circumference of a joining material used to connect two surfaces. The connection must also be mechanically permanent.
These permanent connections are usually made by soldering. In soldering, two metal surfaces are united when a solder junction is formed between them. Solder is a metal or metal composition which melts at a fairly low temperature (approximately 200 C) and wets the surfaces to which it is applied in the molten state. Solder is an alloy, such as zinc and copper, or tin and lead. Upon cooling, solder forms a permanent mechanical and electrical connection between the surface of the semiconductor lead/termination and the surface of the circuit board.
Improving the mechanical connection so as to maximize the amount of solder wetting and filleting between soldered surfaces has always been desired in the art of soldering. Others have attempted to improve the soldered connection of tin/solder plating by using special bathing processes or special plating process/fixturing techniques. Our invention is directed toward a method of manufacturing leads/terminations so as to improve their solderability. Solderability is the ability of a material or surface to be wetted with molten solder under specified conditions.
The manufacturing processing of making a packaged IC includes the application of a lead/termination finish to the metal leads/terminations to preserve and enhance the inherent solderability of the underlying basis metal leads/terminations. This lead/termination finish is typically applied as a thin coating. The lead/termination finish preserves the metal leads/terminations and allows the packaged IC or electrical/electronic component to be readily soldered into the circuit board. There are two common ways of applying the lead/termination finish: (1) a tin/lead soldering plating lead finish process, or (2) a molten hot solder dip process. These two aforementioned processes are well-known in the art of soldering and IC manufacturing.
Both methods of applying the lead/termination finish have their advantages and disadvantages. Molten hot dip processes provide a high quality finish, but controlling the coating thickness distribution is difficult. The maximum coating thickness attained is limited due to liquid surface tension considerations. Plating processes are much more easily controlled with respect to coating thickness distribution. The maximum coating thickness achievable is unbounded. However, the solderability, or the ability of a surface to be wetted by molten solder, of plating is typically not as good as molten hot dip lead/terminations finishes.
We have developed an improved method of manufacturing IC packaging so that the leads have a higher degree of solderability. This improvement has been measured and tested using steam aging and wetting balance measurements. The method of making a lead finish incorporates mechanically flattening the plated coating of the leads. This may be accomplished by mechanical means such as rolling, stamping, peening (surface-hardening a piece of metal by hammering or bombarding with a hard shot), coining (forming metals by squeezing between two dies so as to impress well-defined imprints on both surfaces of the work), forging (using compressive force to shape metal by plastic deformation) or other suitable flattening techniques. Of these techniques, we found rolling produces superior results. By flattening the coating of the leads, the surface becomes less porous and the overall surface area is minimized requiring less work to be required to wet the lead/termination surface. Also, flattening the coating minimizes the deleterious effects of amorphous ridges and grooves which results in superior solderabiity. Amorphous ridges and grooves can be associated with the grain structure of commonly applied lead/termination finishes.
Our invention is not only directed to IC packaging, but to all plated electronic terminations. This includes, but is not limited to, semiconductor components, discrete passive components, connectors, lugs, terminals, wires and any coated surface that may be involved in a joining operation utilizing a liquid phase material to provide the joining medium between two or more surfaces. Our invention can be used on existing plating lines with no changes required to the electroplating process chemistry or electroplating process. This process could be applied to other types of plating such as silver plating, gold plating, nickel palladium plating and tin plating.
a) is a photo micrograph of the coated surface of a lead that was flattened on the left hand side but not the right and magnified 3,000 times.
b) is a photo micrograph of the coated surface of a lead that was flattened on the left hand side but not the right and magnified 500 times.
a) is a photo micrograph of the coated surface of a lead that was not flattened and magnified 3,000 times.
b) is a photo micrograph of the coated surface of a lead that was not flattened and magnified 500 times.
a) is a photo micrograph of the coated surface of a lead that was partially flattened by hammering and magnified 3,000 times.
b) is a photo micrograph of the coated surface of a lead that was partially flattened by hammering and magnified 500 times.
a) is a schematic representation of a lead frame with a bottom layer of copper, a middle layer of nickel plating, and a top layer of solder plating.
b) is a schematic representation of a lead frame with a bottom layer of copper, a middle layer of nickel plating, and a top layer of gold plating.
c) is a schematic representation of a lead frame with a bottom layer of copper, a middle layer of nickel plating, and a top layer of palladium plating.
I have discovered that flattening the lead of an electronic device, most notably the lead of an integrated circuit, increases the solderability of the lead. Flattening may be accomplished by rolling, stamping, peening, coining, forging or other suitable flattening techniques.
Packaged integrated circuits are manufactured using metal lead frames that have substantially flat surfaces. The integrated circuit in chip (die) form is attached to the lead frame (which may have a special silver or copper spot plated on it for die attachment), wire bonded and either transfer molded, furnace sealed or welded to produce an encapsulated (Packaged) integrated circuit with leads protruding from the package body.
The integrated circuits chips are spaced interstitially and mounted upon IC die pads 12 which conform substantially to the shape of the be chip attached (e.g., rectangular as shown). Flat metal leads 14 make an electrical contact with the bond pads of the integrated circuit with thin bond wires (not shown) extending from the lead to a bond pad on the IC. As seen in
Adjacent leads are held together and are held on the frame by dam bars 30. The die pad 12 is connected to rails 34 by the tie bars 32. After the dies (not shown) are attached to the die pad 12, the lead frame is placed in the mold. Molten plastic is transfer molded into the mold to enclose the die and the leads inside the perimeter formed by the rails 34 and damn bars 30. After the molded devices cool, the dam bars 30 and the tie bars 32 are severed from the rails 34 in a conventional lead trim operation. The leads 14 may then be bent to a desired angle in a conventional forming operation. This results in frames for individual IC packages. Preferably before the chip is attached, but at least before the insertion into the circuit board, the coating of the metal leads 14 are flattened. This may be accomplished by mechanical means such as rolling, stamping, peening, coining, forging or other suitable flattening techniques. The bent metal leads 14 are inserted in and soldered to the circuit board.
Both prior to and after flattening, the coating on the leads have a thickness of about 10 microinches to about 1000 micoinches, with the solderability surface contact area representing about 10–100% of the total surface area of the coating. The lead thickness of reduced form 0.1% to about 10% of its original size prior to flattening. In one embodiment, the lead is flattened until there is a reduction of about 0.1% to about 10% in coating thickness. Further in another embodiment, the lead is flattened until there is a reduction of about 80% to 90% in the porosity.
a) and 2(a) should be contrasted with
Prior to flattening, the lead coating in this specific embodiment comprises consist of 80/20 Tin/Lead. These leads are used for devices packaged in the Harris TO-220 package.
a), 5(b) and 5(c) shows varying lead frames and their coatings.
While the aforementioned materials and methods are preferred, the use of other soldering lead materials is contemplated within the scope of the invention as claimed.
Number | Name | Date | Kind |
---|---|---|---|
4045869 | Hartmann et al. | Sep 1977 | A |
4055062 | Martin et al. | Oct 1977 | A |
4089733 | Zimmerman | May 1978 | A |
4214120 | Jones, Jr. et al. | Jul 1980 | A |
4717948 | Sakai et al. | Jan 1988 | A |
4797726 | Manabe | Jan 1989 | A |
5059455 | Hasselbach et al. | Oct 1991 | A |
5151846 | Sedigh et al. | Sep 1992 | A |
5218229 | Farnworth | Jun 1993 | A |
5235743 | Endo et al. | Aug 1993 | A |
5256598 | Farnworth et al. | Oct 1993 | A |
5258331 | Masumoto et al. | Nov 1993 | A |
5259111 | Watanabe | Nov 1993 | A |
5274911 | Toro | Jan 1994 | A |
5307562 | Denlinger et al. | May 1994 | A |
5360991 | Abys et al. | Nov 1994 | A |
5522133 | Kawauchi | Jun 1996 | A |
5548160 | Corbett et al. | Aug 1996 | A |
5548890 | Tada et al. | Aug 1996 | A |
5959347 | Grigg et al. | Sep 1999 | A |
5964904 | Jin et al. | Oct 1999 | A |
6194777 | Abbott et al. | Feb 2001 | B1 |
6336973 | Moden et al. | Jan 2002 | B1 |
Number | Date | Country |
---|---|---|
1065711 | Mar 2001 | EP |
60 225455 | Nov 1985 | JP |
61 048951 | Mar 1986 | JP |
61 234554 | Oct 1986 | JP |
63 072895 | Apr 1988 | JP |
63 306648 | Dec 1988 | JP |
03230556 | Oct 1991 | JP |
03274756 | Dec 1991 | JP |
04268055 | Sep 1992 | JP |
05 315511 | Nov 1993 | JP |
06 302938 | Oct 1994 | JP |
08139251 | May 1996 | JP |
09092763 | Apr 1997 | JP |
Number | Date | Country | |
---|---|---|---|
20020029473 A1 | Mar 2002 | US |