This invention relates to the field of encapsulating electronic assemblies and more particularly to forming edge connections and other conductive features on and through encapsulated electronic assemblies including encapsulated power converters.
Contemporary electronic power systems require power converters capable of deployment at the point of load. Competing considerations require increasing power density, decreasing mounting area on customer motherboard, and lower cost.
An encapsulated electronic module, such as an electronic power converter module for example, may comprise a printed circuit assembly over-molded with an encapsulant to form some or all of the package and exterior structure or surfaces of the module. Encapsulation in this manner may aid in conducting heat out of the over-molded components, i.e., components that are mounted on the printed circuit assembly and covered with encapsulant. In the case of an electronic power converter module, the printed circuit assembly may include one or more inductive components, such as inductors and transformers. Encapsulated electronic power converters capable of being surface mount soldered to a customer motherboard are described in Vinciarelli et al., Power Converter Package and Thermal Management, U.S. Pat. No. 7,361,844, issued Apr. 22, 2008, (the “SAC Package Patent”) (assigned to VLT, Inc. of Sunnyvale, Calif., the entire disclosure of which is incorporated herein by reference). Encapsulated electronic modules having at least one surface of a magnetic core structure exposed and methods for manufacturing the same are described in Vinciarelli et al., Encapsulation Method and Apparatus for Electronic Modules, U.S. Pat. No. 8,427,269 issued Apr. 23, 2013, (the “Exposed Core Patent”) (assigned to VI Chip Inc. of Andover, Mass., the entire disclosure of which is incorporated herein by reference).
Methods of over-molding both sides of a printed circuit board assembly while leaving opposing regions on both sides of the printed circuit board free of encapsulant are described in Saxelby, et al., Circuit Encapsulation Process, U.S. Pat. No. 5,728,600, issued Mar. 17, 1998 and Saxelby, et al., Circuit Encapsulation, U.S. Pat. No. 6,403,009, issued Jun. 11, 2002 (collectively the “Molding Patents”) (both assigned to VLT, Inc. of Sunnyvale, Calif. and incorporated by reference in their entirety).
Leads for connecting the encapsulated power converter substrate to the customer motherboard are described in Vinciarelli et al., Surface Mounting A Power Converter, U.S. Pat. No. 6,940,013, issued Sep. 6, 2005 (the “J-Lead Patent”) (assigned to VLT, Inc. of Sunnyvale, Calif., the entire disclosure of which is incorporated herein by reference).
Encapsulation of electronic assemblies as panels and forming electrical contacts, e.g. bar codes, along vertical edges of portions of the panels, e.g. during singulation into modules, for establishing electrical connections to the circuitry inside each module are described in Vinciarelli et al., Panel-Molded Electronic Assemblies, U.S. Pat. No. 8,966,747, issued on Mar. 3, 2015 (the “Bar Code Patent”); and in Vinciarelli et al., Panel-Molded Electronic Assemblies, U.S. patent application Ser. No. 14/116,642, filed on Nov. 8, 2013, which is a national stage application of PCT/US2012/037495, filed on May 11, 2012 (the “PM CIP”), now U.S. Pat. No. 9,402,319, issued on Jul. 26, 2016; and three-dimensional contacts for establishing robust solder connections to the bar codes is described in Vinciarelli et al., Electronic Assemblies Having Components With Edge Connectors, U.S. patent application Ser. No. 14/596,914, filed on Jan. 14, 2015 (the “3D Bar Code Application”); (collectively “the Panel Mold Disclosures”) (all of which are assigned to VLT, Inc. of Sunnyvale, Calif., and are incorporated in their entirety herein by reference).
In general, in one aspect, a method of electrically interconnecting circuit assemblies is provided. The method includes assembling an encapsulated panel including a substrate having electronic components mounted to the substrate and one or more conductive features enclosed within the panel and unexposed to an exterior surface of the panel, the panel including one or more electronic modules having boundaries defined by one or more predetermined cut lines, and the one or more conductive features having portions that are located along the cut lines. The method includes selectively forming holes in the panel at predetermined locations along the cut lines exposing within selected holes respective portions of the one or more conductive features; selectively forming one or more conductive metal layers on selected surfaces of the panel including within the selected holes, each selected hole having a respective portion of the one or more conductive metal layers within the selected holes being in electrical contact with the respective portions of the one or more conductive features; and cutting the panel through the holes and along the one or more cut lines singulating the one or more electronic modules, each electronic module having electrical contacts formed along a perimeter edge of the module.
Implementations of the method may include one or more of the following features. The method can include preparing one or more surfaces of the encapsulated panel. Preparing one or more surfaces can include lapping the panel before selectively forming the holes. Preparing one or more surfaces can include lapping the panel after selectively forming the holes. Preparing one or more surfaces can include cleaning the panel ultrasonically in an aqueous solution before selectively forming the one or more metal layers. Preparing one or more surfaces can include laser etching the panel before selectively forming the one or more metal layers. Selectively forming one or more conductive metal layers can further include: (a) applying a seed layer including conductive particles to the surfaces of the panel, and subsequently (b) plating a layer of metal onto the seed layer. Applying the seed layer can include sputter coating the encapsulated panel with conductive particles. The sputtering can include sputtering copper particles. The sputtering can further include sputtering chromium particles. The method can further include coating the encapsulated panel with colloidal graphite and curing the graphite before the plating. The method can further include patterning the metal before cutting the panel. The patterning can include masking and subsequently etching the metal layer. The patterning can further include using a laser to expose or remove portions of the mask. The method can further include applying one or more finishing layers on top of the metal layer. Applying the seed layer can include applying conductive epoxy. Applying the seed layer can further include applying the conductive epoxy in a predetermined pattern. The method can further include coating the encapsulated panel with colloidal graphite and curing the graphite before the plating. The method can further include applying one or more finishing layers on top of the metal layer. The method can further include configuring the holes to provide gaps between adjacent contacts, in which the holes establish a pattern in the conductive metal layers along the perimeter edge of the one or more electronic modules. The method can further include patterning the one or more metal layers to form conductive pads on a selected surface of the one or more electronic modules, the pads providing a surface mounting area for one or more components. Patterning the metal layer can further include establishing electrical connections between respective ones of the pads to respective ones of the electrical contacts. The method can further include selectively forming auxiliary holes in the panel at predetermined locations spaced away from the cut lines; and selectively forming one or more conductive metal layers within the auxiliary holes to form thermal conduits for conducting heat from respective interior portions of the one or more electronic modules to an exterior surface. The auxiliary holes can be cut to a controlled depth without exposing within the auxiliary holes any components in the one or more electronic modules. The auxiliary holes can be cut through the entire thickness of the panel without exposing within the auxiliary holes any components in the one or more electronic modules. The cutting the auxiliary holes can expose within selected ones of the auxiliary holes respective portions of one or more auxiliary conductive features. The method can further include selectively forming auxiliary holes in the panel at predetermined locations spaced away from the cut lines exposing within selected ones of the auxiliary holes respective portions of one or more auxiliary conductive features; selectively forming one or more conductive metal layers within the auxiliary holes to form electrical connections to the auxiliary conductive features; and patterning the one or more metal layers to form conductive pads on a selected surface of the one or more electronic modules and electrical connections between selected ones of the pads and the one or more auxiliary conductive features, the pads providing a surface mounting area for one or more components.
In general, in another aspect, an apparatus includes a first circuit assembly having a first modular package including a first circuit board disposed between a top encapsulant and a bottom encapsulant, the first modular package having a perimeter edge connecting a top surface of the top encapsulant and a bottom surface of the bottom encapsulant, the perimeter edge having at least a first electrical contact electrically coupled to one or more conductive features embedded in the first circuit board. The first electrical contact extends along the perimeter edge from the first circuit board toward the top surface of the top encapsulant or toward the bottom surface of the bottom encapsulant such that the first electrical contact occupies a portion of the top or bottom encapsulant along the perimeter edge.
Implementations of the apparatus may include one or more of the following features. The first electrical contact can extend to the top surface of the top encapsulant or to the bottom surface of the bottom encapsulant. The first electrical contact can further include a side contact surface generally parallel to the perimeter edge, and a first contact surface generally parallel to the top surface of the top encapsulant or a second contact surface generally parallel to the bottom surface of the bottom encapsulant. The apparatus can include a second circuit board having a top surface that has a conductive pad, in which the first electrical contact includes the second contact surface, the conductive pad of the second circuit board is electrically coupled to the second contact surface of the first electrical contact of the first circuit assembly, the top surface of the second circuit board faces the bottom surface of the first modular package and is generally parallel to the bottom surface of the first modular package, and the perimeter edge of the first modular package is generally perpendicular relative to the top surface of the circuit board. The first electrical contact can include the first contact surface, and the first circuit assembly can further include an inductive component and the first contact surface can cover a surface of the inductive component. The first contact surface can extend over 50% of the top surface of the top encapsulant. The second contact surface can extend over 50% of the bottom surface of the bottom encapsulant. The first electrical contact can extend to both the top surface of the top encapsulant and the bottom surface of the bottom encapsulant. The first circuit board can include a multilayer circuit board, and the first electrical contact of the first circuit assembly can be electrically coupled to conductive features in multiple layers of the multilayer circuit board. The first circuit assembly can further include a second electrical contact that extends along the perimeter edge from the first circuit board toward the top surface of the top encapsulant or toward the bottom surface of the bottom encapsulant such that the second electrical contact occupies a portion of the top or bottom encapsulant along the perimeter edge, the second electrical contact can be electrically coupled to one or more conductive features embedded in the first circuit board, in which the first electrical contact can include an input contact configured to receive an input signal for the first circuit assembly, and the second electrical contact can include an output contact configured to provide an output signal from the first circuit assembly. The apparatus can further include a second circuit assembly having a second modular package including a second circuit board disposed between a top encapsulant and a bottom encapsulant, the second modular package can have a perimeter edge connecting a top surface of the top encapsulant and a bottom surface of the bottom encapsulant, the perimeter edge can have at least a second electrical contact electrically coupled to one or more conductive features embedded in the second circuit board, wherein the second electrical contact of the second modular package can extend to the top surface of the top encapsulant of the second modular package and can include a first contact surface generally parallel to the top surface of the top encapsulant, wherein the first electrical contact of the first modular package can extend to the bottom surface of the bottom encapsulant of the first modular package and can include a second contact surface generally parallel to the bottom surface of the bottom encapsulant, wherein the first contact surface of the second electrical contact can be electrically coupled to the second contact surface of the first electrical contact, the top surface of the second modular package can face the bottom surface of the first modular package and be generally parallel to the bottom surface of the first modular package, and the perimeter edge of the second modular package can be generally parallel to the perimeter edge of the first modular package. In some examples, the top surface of the second modular package can have a length and a width that are larger than corresponding length and width of the bottom surface of the first modular package. In some examples, the top surface of the second modular package can have a length and a width that are the same as corresponding length and width of the bottom surface of the first modular package. The first electrical contact can further include a side contact surface generally parallel to the perimeter edge, and the side contact surface can be recessed from the perimeter edge.
The details of one or more embodiments of the invention are set forth in the accompanying drawings and description below. Other features, objects, and advantages of the invention will be apparent from the description and drawings, and from the claims.
Like references symbols in the various drawings indicate like elements.
Referring to
As shown in
Leadless modules such as leadless module 100 shown in
Referring to
Additionally portions of the top and bottom surfaces of the module 100, optionally including areas covering the magnetic cores (e.g., similar to 815C in
The preferred processes for making the leadless modules build upon the panel molding processes described in the Panel Mold Disclosures and will be described starting with an encapsulated PCB panel, such as panel 150 shown in
The preferred method of making the encapsulated PCB panel for use in the leadless panel mold process described herein is called direct molding as described in the PM CIP Application (PM CIP: ¶¶0139-0149). Direct molding may include preparing one or more surfaces of the encapsulated panel. For example, as described below, the optional lapping finishing described in the PM CIP (PM CIP: ¶0150) may be used before (or after) the first step (cutting slots and holes) in the leadless panel mold process. Lapping before cutting the slots and holes may be preferred for establishing rounded edges between the top and bottom surfaces and the sidewall contacts, e.g. improving adhesion of the metal layers on the edges.
Referring to
Referring to
In a first example which will be described in connections with
A. Castellation
Referring to
The slots and holes may be formed using a high pressure water jet to cut away the encapsulant and substrate layers. Alignment of the water jet to the panel may be achieved using the exposed PCB fiducials or tooling holes or both. Abrasives in the water may be used to facilitate cutting quality, accuracy, and speed. The cutting of slots and holes may be optimized from either the top 102-1 or bottom 103-1 sides of the panel. Preferably, the holes and slots are cut to have the desired castellation contours and extending completely through the panel which may facilitate cleaning, plating, and finishing in subsequent steps. Although the slots and holes may be cut using a water jet, the speed and accuracy of the process may be improved by first establishing a pilot hole, e.g. a 0.010″ diameter pilot hole using a laser. To avoid potential reflection of the laser by the buried interconnects, clearance holes may be provided in the buried interconnects in the region of the pilot hole, e.g. a 0.020-0.025″ diameter clearance. As described earlier, formation of the slots in the encapsulated panel 150 exposes the buried interconnects in the sidewall of the slots which are metalized in subsequent steps to form electrical contacts.
Starting at the pilot hole, slots having the desired length (length along the cut lines), width (thickness of the slot perpendicular to the cut line), and contours may be cut using the water jet to establish the desired castellation grooves in the modules. For example, slots 160 along cut lines 131, 132, and 133 are relatively long (along the cut lines) to produce contacts 120-1, 120-2 (
B. Seed Layer
To facilitate metalizing the slotted panel 150-1 (
Optionally, a graphite or carbon layer may be deposited either selectively in the slots and holes or over the entire panel for enhancing subsequent plating on the edges, i.e. the sidewalls of the slots and holes, between the buried interconnects (bar codes), which have been exposed within the slots and holes, and the metal on the top and bottom surfaces of the panel. For example, the panel may be dipped in a colloidal graphite solution (available from Electrochemicals Inc., Maple Plain, Minn. under the Shadow Graphite tradename; MacDermid, Inc., Waterbury, Conn. under the Blackhole tradename) which may then be cured prior to plating.
C. Plating
Using the seed layer, a thicker metal layer may be electrolessly or electrolytically plated onto the panel. However, a sputtered seed layer may be too porous to protect ferrite cores which may be exposed on the top and bottom surfaces of the panel (e.g. exposed ferrite core 815C in
After a first protective copper layer is applied, the rest of the metal layer, e.g. 0.006″ of copper (approximately 6 oz equivalent), may be electrolytically plated onto the existing copper layers in an acid solution. Referring to
D. Patterning
The metal layer 170 (
In an alternate additive patterning method, photo resist, which is resistant to plating solutions, may be applied over a continuous, or electrically connective, layer of copper. The photo resist may be patterned to expose the areas of copper which are to remain. Then an additional plating step may be used to deposit copper onto the exposed copper, i.e. through the mask openings, after which tin plating or other metals may be used on top of the exposed copper as an etch-resistant mask instead of or in addition to photoresist layer, e.g. to create finer features or spacing. A subsequent etch step removes the unprotected copper and leaves intact the tin plated or otherwise masked copper that was deposited in the intervening plating operation.
Referring to
E. Finish Plating
A finish such as gold may be plated onto the copper areas as is customary in the electronics industry. For example an electroless nickel-immersion gold (“ENIG”) plating process may be used to plate nickel, e.g. 200μ″ thick, and then gold, e.g. 1μ″ thick over the remaining metal.
After the finish plating, the panel may be labeled, e.g. using a laser, to mark each module with safety agency, manufacturer, serial number, lot number, and any desired information prior to singulation.
F. Singulation
After the panel is metalized in the above described manner, it may be cut along the cut lines to separate individual modules from the panel. It will be appreciated that the grooves or castellations in the sidewalls of the singulated modules, e.g. 100A, 100B (
Many modifications of the above described process are possible. For example, a grid pattern may optionally be etched, e.g. by laser, into the panel surface before the optional ultrasonic cleaning and subsequent seed layer steps to improve adhesion of the metal layers to the panel surfaces.
A. Conductive Epoxy Seed Alternative
In a first alternative example, step (b) above may be modified by applying a layer of conductive epoxy, e.g. a 0.0002-0.0006 inch thick layer of silver epoxy, instead of sputtering. In such an example, the process flow may include: (a) cutting the slots and holes; (b) applying a patterned layer of silver epoxy on the major surfaces of the panel (adjacent to but not in the slots or holes); (c) coat the panel with graphite or carbon, either the entire surface or selectively in the holes and groves; (d) electrolytic copper plating, e.g. 0.001-0.003 inches; (e) apply a patterned plating-resistant mask; (f) plate copper preferably 0.003 or thicker and then tin in unmasked areas; (g) remove mask; (h) etch exposed copper (copper without tin covering) (i) remove tin; (j) plate nickel, e.g. 200μ″, and gold, e.g. 1μ″; and (k) singulate. Additional optional steps include ultrasonic cleaning before application of the conductive epoxy, and optionally plating copper, e.g. electrolessly, onto the epoxy layer before applying graphite.
B. Direct Metallization Alternative
In a second alternative example, the panel may be directly metallized instead of sputtering or applying conductive epoxy as seed layers. Such a process may include the following steps (after the encapsulated panel is lapped and cleaned): (a) polymer coat/treat the panel; (b) direct metallization of 0.5 mils copper layer; (c) cut the slots and holes; (d) apply shadow graphite; (e) copper plate to a desired thickness, e.g. 6 mils; (f) pattern the copper, e.g. using the photolithographic etch processes described above; (g) finish plate the remaining copper, e.g. ENIG and laser mark the panel; (h) cut the panel along the cut lines to singulate the modules.
A typical polymer coating process may include a plasma cleaning activation of the encapsulated panel; application of an adhesion promoter; application of a polymer layer, e.g. having a thickness of 1,000 angstroms to a few microns; thermal treatment of the polymer and adhesion promoter; activation of the polymer for electroless metal deposition, e.g., by application of a catalyst or oxidation of the polymer; and electroless metal deposition.
C. Improved Bar Code Connections
In a third alternative example in which the top and bottom surfaces of the panel need not be plated, the process described above may be used to form contacts over the bar codes only. Alternatively, the holes may be cut by drill or laser; the walls of the hole may be de-smeared; sensitize the walls of the hole, e.g. using chemicals, to attract a catalyst; activate the walls of the holes with a catalyst such as a Palladium based chemical; electrolessly plate copper or nickel metal; finish the plated metal, e.g. using ENIG plating.
Alternatively, the exposed interconnects of singulated modules [e.g., singulated module 815 (
D. Thermal Conduits
The leadless panel mold process described above in connection with
E. Carrier Surface Connections
Although the leadless module 100 has been described having surface metal (e.g. top and bottom shields 122-2 and 122-3) well adapted for improving electromagnetic shielding and thermal performance, it should be appreciated by those of skill in the art that many variations are possible. For example, the metal on one or more surfaces, e.g. preferably the top surface, may be patterned in a manner that would allow one or more components to be mounted onto and electrically connected to the module or to external circuitry via the module. Referring to
In some implementations, the carrier module 300 includes a circuit board 301 disposed between cured encapsulants 302 and 303. The metallization layer 322 on the top surface 302-1 of carrier module 300 may be patterned to provide pads aligned with respective electrical contacts on the leadless electronic module 100. For example, pads 322-0, 322-1, 322-2, 322-3 as shown (
As shown, the pads 322 may be connected to, or form part of, conductive runs that connect to respective contacts along the side of module 300 which may in turn be electrically connected to lands on the printed circuit board 900. For example, pads 322-1 are shown connected to side contacts 322-1A which in turn may be connected to respective lands 921A on PCB 900. Similarly, pads 322-0, 322-2 and 322-3 are configured to connect to respective lands 920, 922, and 923 on PCB 900. The side contacts of module 300 may, or may not, be electrically connected to circuitry within module 300 and not all side contacts need to connect to a respective pads on top of module 300, e.g., side contacts 321 are shown connecting to lands 921 on PCB 900 but not to any pads on top of module 300. Although the details of the conductive runs of PCB 900 are not shown for simplicity, it is understood that each land provided on PCB 900 for module 300 may be connected to external circuitry via conductive runs in PCB 900, may be connected to other selected lands on PCB 900 providing a bridge between side contacts, or remain isolated from other lands and circuitry providing mechanical support without further electrical connection within the system. Thus, each electrical contact on the side of module 300 may be used to connect to module 100, to PCB 900, to both module 100 and PCB 900, or neither, flexibly allowing each contact in module 100 to be connected directly to PCB 900 without any connection to circuitry in module 300, or to be connected to circuitry in module 100, either with a connection to PCB 900 or without.
A number of embodiments of the invention have been described. Nevertheless, it will be understood that various modifications may be made without departing from the spirit and scope of the invention. For example, the grooves may be completely filled during the metallization process to form smooth sidewalls on the module after singulation by eletrolessly plating leads to the holes (using above process), then plating up electrolytically to fill the hole, and cutting through the filled hole to leave a smooth sidewall. Although the stacked arrangement is shown with the lower module 300 having a larger footprint, i.e. larger in length and width, than the upper module 100, it should be appreciated that the stacked modules may have similarly or identically sized footprints. The thermal conduits may alternatively form electrical connections to pads on the surface of the module. In
Accordingly, other embodiments are within the scope of the following claims.
This application is a divisional application of and claims priority to U.S. patent application Ser. No. 14/731,287, filed on Jun. 4, 2015, the entire contents of which are herein incorporated by reference.
Number | Name | Date | Kind |
---|---|---|---|
3409805 | Whippl | Nov 1968 | A |
4326765 | Brancaleone | Apr 1982 | A |
4366342 | Breedlove | Dec 1982 | A |
4551747 | Gilbert et al. | Nov 1985 | A |
5027255 | Zeitlin | Jun 1991 | A |
5241133 | Mullen et al. | Aug 1993 | A |
5471366 | Ozawa | Nov 1995 | A |
5481436 | Werther | Jan 1996 | A |
5557142 | Gilmore | Sep 1996 | A |
5728600 | Saxelby, Jr. et al. | Mar 1998 | A |
5776796 | Distefano | Jul 1998 | A |
5864092 | Gore et al. | Jan 1999 | A |
5952909 | Umeno et al. | Sep 1999 | A |
5990776 | Jitaru | Nov 1999 | A |
6031726 | Vinciarelli et al. | Feb 2000 | A |
6073339 | Levin | Jun 2000 | A |
6184585 | Martinez et al. | Feb 2001 | B1 |
6229216 | Ma et al. | May 2001 | B1 |
6262600 | Haigh et al. | Jul 2001 | B1 |
6391685 | Hikita et al. | May 2002 | B1 |
6403009 | Saxelby, Jr. et al. | Jun 2002 | B1 |
6501364 | Hui et al. | Dec 2002 | B1 |
6734552 | Combs | May 2004 | B2 |
6765469 | Sortor | Jul 2004 | B2 |
6830959 | Estacio | Dec 2004 | B2 |
6838754 | Kim | Jan 2005 | B2 |
6888438 | Hui et al. | May 2005 | B2 |
6903938 | Waffenschmidt | Jun 2005 | B2 |
6940013 | Vinciarelli et al. | Sep 2005 | B2 |
7015587 | Poddar | Mar 2006 | B1 |
7030469 | Mahadevan et al. | Apr 2006 | B2 |
7049682 | Mathews | May 2006 | B1 |
7198987 | Warren | Apr 2007 | B1 |
7283345 | Liu | Oct 2007 | B2 |
7298038 | Filoteo et al. | Nov 2007 | B2 |
7361844 | Vinciarelli et al. | Apr 2008 | B2 |
7420262 | Bauer et al. | Sep 2008 | B2 |
7468547 | Harvey | Dec 2008 | B2 |
7494843 | Lin et al. | Feb 2009 | B1 |
7554181 | Satou et al. | Jun 2009 | B2 |
7701051 | Bayerer et al. | Apr 2010 | B2 |
7701731 | Dhuyvetter et al. | Apr 2010 | B2 |
7741943 | Fouquet et al. | Jun 2010 | B2 |
7767494 | Sasaki | Aug 2010 | B2 |
7768371 | Hui et al. | Aug 2010 | B2 |
7915992 | de Rooij et al. | Mar 2011 | B2 |
7952879 | Vinciarelli | May 2011 | B1 |
7972143 | Smejtek | Jul 2011 | B2 |
7989928 | Liao | Aug 2011 | B2 |
7994888 | Ikriannikov | Aug 2011 | B2 |
8138584 | Wang | Mar 2012 | B2 |
8188806 | Ho et al. | May 2012 | B2 |
8299882 | Ikriannikof | Oct 2012 | B2 |
8354740 | Liu et al. | Jan 2013 | B2 |
8385043 | Ng et al. | Feb 2013 | B2 |
8427269 | Vinciarelli | Apr 2013 | B1 |
8592944 | Santangelo et al. | Nov 2013 | B2 |
8896111 | Vinciarelli | Nov 2014 | B2 |
8963676 | Hoang | Feb 2015 | B1 |
8966747 | Vinciarelli | Mar 2015 | B2 |
9439297 | Vinciarelli | Sep 2016 | B2 |
20020096348 | Saxelby et al. | Jul 2002 | A1 |
20030011054 | Jeun et al. | Jan 2003 | A1 |
20030058628 | Boylan | Mar 2003 | A1 |
20030095026 | Kawanobe | May 2003 | A1 |
20040100778 | Vinciarelli et al. | May 2004 | A1 |
20040157410 | Yamaguchi | Aug 2004 | A1 |
20040259330 | Fujii et al. | Dec 2004 | A1 |
20050037618 | Lee et al. | Feb 2005 | A1 |
20050156699 | Hui et al. | Jul 2005 | A1 |
20050167814 | Beroz et al. | Aug 2005 | A1 |
20050206014 | Sakamoto et al. | Sep 2005 | A1 |
20060097831 | Lotfi et al. | May 2006 | A1 |
20060133041 | Belady | Jun 2006 | A1 |
20060133042 | Belady | Jun 2006 | A1 |
20070107935 | Hash et al. | May 2007 | A1 |
20070215990 | San Antonio et al. | Sep 2007 | A1 |
20070241440 | Hoang et al. | Oct 2007 | A1 |
20090140394 | Bathan et al. | Jun 2009 | A1 |
20090236708 | Shi et al. | Sep 2009 | A1 |
20090321956 | Sasaki et al. | Dec 2009 | A1 |
20090321957 | Sasaki et al. | Dec 2009 | A1 |
20090325345 | Sasaki et al. | Dec 2009 | A1 |
20100072604 | Komatsu et al. | Mar 2010 | A1 |
20100197150 | Smejtek | Aug 2010 | A1 |
20100246152 | Lin et al. | Sep 2010 | A1 |
20100259909 | Ho et al. | Oct 2010 | A1 |
20110050292 | Hui et al. | Mar 2011 | A1 |
20110128033 | Ohsawa | Jun 2011 | A1 |
20120287582 | Vinciarelli et al. | Nov 2012 | A1 |
20130050226 | Shenoy et al. | Feb 2013 | A1 |
20140001616 | Daniels et al. | Jan 2014 | A1 |
20140134799 | Daniels et al. | May 2014 | A1 |
20140218155 | Akre | Aug 2014 | A1 |
20140355218 | Vinciarelli et al. | Dec 2014 | A1 |
20160365795 | Madsen | Dec 2016 | A1 |
Number | Date | Country |
---|---|---|
4293293 | Oct 1992 | JP |
WO 1995027308 | Oct 1995 | WO |
WO 2012155036 | Nov 2012 | WO |
Entry |
---|
AFM Microelectronics Inc., “General Purpose Capacitors,” www.afmmicroelectronics.com, 14 pages, published on or before Jul. 26, 2010. |
Analog Devices, “ADM2490E: 5 kV Signal Isolated, High Speed (16 Mbps), ESD Protected, Full Duplex RS-485 Transceiver”, 2 pages, downloaded Sep. 30, 2011. |
Analog Devices, “High Speed, ESD-Protected, Full-Duplex, iCoupler Isolated RS-485 Transceiver”, 16 pages, 2006-2008. |
Analog Devices, “iCoupler® Digital Isolation—Unparalleled Performance and Integration”, downloaded Aug. 31, 2011. |
Application Notes, Connectors for LED Lighting Applications, Mill-Max Mfg. Corp., Jun. 20, 2014. |
Avago Technologies, “ACML-7400, ACML-7410 and ACML-7420 3.3V/5V 100 MBd High Speed CMOS Digital Isolator”, 13 pages, May 16, 2011. |
Avago Technologies, “Parametric Search: digital Isolator”, 2 pages, 2005-2011. |
Bhat, Shriram N., et al., “Enhancement of via Integrity in High-Tg Multilayer Printed Wiring Boards,” Feb. 19, 2013, IEEE, 7 pgs. |
Braun et al.; “Opportunities of Wafer Level Embedded Technologies for MEMS Devices”; SEMI MEMS Tech Seminar; (possibly published on Sep. 26, 2013); 22 pp. |
Business Wire, “Analog Devices Introduces First Digital Isolator Packaging that Meets Safety Requirements in Medical and Industrial Applications”, www.businesswire.com/news/home/20111005005026/en/anaglog-Devices-Introduc . . . , 3 pages, Oct. 12, 2011. |
Edge Mount Q-Strip/Q-Pairs Interconnects Application Overview, TecTalk, Samtec, Inc. Dec. 2012. |
GradConn, “Planar board to board connectors,” accessed online http://gradconn.com/right-angle/board-connectors.asp Jun. 20, 2014. |
Hui et al., “Optimal Operation of Coreless PCB Transformer-Isolated Gate Drive Circuits with Wide Switching Frequency Range,” IEEE Transactions on Power Electronics, vol. 14, No. 3, 506-514, May 1999. |
Hui et al., “Some Electromagnetic Aspects of Coreless PCB Transformers”, IEEE Transactions on Power Electronics, vol. 15, No. 4, pp. 805-810, Jul. 2000. |
Ideas for attaching / connecting / stacking one PCB onto another with no gap; http://electronics.stackexchange.com/questions/45733/ideas-for -attaching-connecting-stacking-one-PCB-onto-another-with-no-gap; accessed on Jun. 3, 2015; 5 pages. |
International Search Report and Written Opinion, PCT/US2012/37495, dated May 6, 2013, 18 pages. |
Isolator vs. Optocoupler Technology, Silicon Labs, downloaded Feb. 22, 2013, 21 pages, www.silabs.com/products/power/isolators. |
Kahn, “Technical Information: Multilayer Ceramic Capacitors—Materials and Manufacture,” Microelectronics Inc., 8 pages, published on or before Jul. 26, 2010. |
Lee et al., “Multilayer Stacked Coreless Printed Spiral Winding Inductor With Wide Frequency Bandwidth”, IEEE Energy Conversion Congress and Exposition, pp. 1002-1009, 2009. |
Minteer, Design of a New Transformer-Isolated Analog Acquisition System, IEEE Transactions on Power Delivery vol. 24, No. 3, pp. 1054-1062, Jul. 2009. |
Mohan et al., “Power Electronics-Converters, Applications and Design”, 2nd Edition, John Wiley and Sons, pp. 708-709, 1995. |
NVE Corporation, “Isolator Product Application”, 3 pages downloaded Sep. 30, 2011. |
NVE Corporation, IL600 Series, 21 pages, Sep. 2010. |
One Piece Card Edge, Series 9159, AVX, Jun. 12, 2014. |
Reply to Action in U.S. Appl. No. 13/105,696, dated Mar. 25, 2014, 10 pages. |
Reply to Action in U.S. Appl. No. 14/116,642, dated May 9, 2016, 16 pages. |
Reply to Action in U.S. Appl. No. 14/635,420, dated Nov. 13, 2015, 9 pages. |
Reply to Ex Parte Quayle Action in U.S. Appl. No. 14/635,467, dated May 6, 2016, 5 pages. |
Silicon Labs, “Discrete ISOvolt-EVB”, 14 pages, Rev. 02 Sep. 2011. |
Silicon Labs, “SI8410/20/21”, 30 pages, Mar. 2011. |
Silicon Labs, “Si84xx Digital Isolators”, downloaded Sep. 30, 2011. |
Tang et al., “Evaluation of the Shielding Effects on Printed-Circuit-Board Transformers Using Ferrite Plates and Copper Sheets”, IEEE Transactions on Power Technology, vol. 17, No. 6, pp. 1080-1088, Nov. 2002. |
Texas Instruments, “Application Report ISO72x Digital Isolator Magnetic-Field Immunity”, 6 pages Jan. 2006—Revised Feb. 2006. |
U.S. Appl. No. 12/493,773, entitled “Encapsulation Method and Apparatus for Electronic Modules”, Application and Preliminary Amendment filed Jun. 29, 2009, 63 pages. |
USPTO Ex Parte Quayle Office Action in U.S. Appl. No. 14/635,467, dated Mar. 11, 2016, 5 pages. |
USPTO Notice of Allowance in U.S. Appl. No. 13/105,696, dated Nov. 18, 2014, 6 pages. |
USPTO Notice of Allowance in U.S. Appl. No. 14/116,642, dated Jun. 3, 2016. |
USPTO Notice of Allowance in U.S. Appl. No. 14/635,420, dated Feb. 17, 2016, 6 pages. |
USPTO Office Action in U.S. Appl. No. 13/105,696, dated Sep. 25, 2013, 8 pages. |
USPTO Office Action in U.S. Appl. No. 14/116,642, dated Feb. 9, 2016, 15 pages. |
USPTO Office Action in U.S. Appl. No. 14/635,420, dated Oct. 22, 2015, 6 pages. |
USPTO Supplemental Notice of Allowance in U.S. Appl. No. 14/635,420, dated Apr. 27, 2016, 6 pages. |
Number | Date | Country | |
---|---|---|---|
Parent | 14731287 | Jun 2015 | US |
Child | 15969882 | US |